Crystallization of Fe-Based Amorphous Alloys Studied In-Situ Using Synchrotron Radiation

2002 ◽  
Vol 14 ◽  
pp. 13-20
Author(s):  
Dílson S. dos Santos ◽  
D.R. dos Santos
Keyword(s):  
Synchrotron Radiation ◽  
Amorphous Alloys

Development of a long trace profiler in situ at National Synchrotron Radiation Research Center

2019 ◽  
Vol 90 (2) ◽  
pp. 021716 ◽  
Author(s):  
Shang-Wei Lin ◽  
Duan-Jen Wang ◽  
Huang-Wen Fu ◽  
Huang-Ming Tsai ◽  
Chih-Yu Hua ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Research Center ◽  
Radiation Research

Hydrogen-induced amorphization and embrittlement resistance in Ti-based in situ composite with bcc-phase in an amorphous matrix

2007 ◽  
Vol 22 (2) ◽  
pp. 428-436 ◽  
Author(s):  
S. Jayalakshmi ◽  
J.P. Ahn ◽  
K.B. Kim ◽  
E. Fleury
Keyword(s):  
Hydrogen Embrittlement ◽  
Amorphous Alloys ◽  
Amorphous Matrix ◽  
Mechanical Tests ◽  
High Concentration ◽  
High Hydrogen ◽  
In Situ Composite ◽  
Bcc Phase ◽  
Embrittlement Resistance

We report the hydrogenation characteristics and mechanical properties of Ti50Zr25Cu25 in situ composite ribbons, composed of β-Ti crystalline phase dispersed in an amorphous matrix. Upon cathodic charging at room temperature, high hydrogen absorption up to ∼60 at.% (H/M = ∼1.2) is obtained. At such a high concentration, hydrogen-induced amorphization occurs. Mechanical tests conducted on the composite with varying hydrogen concentrations indicate that the Ti50Zr25Cu25 alloy is significantly resistant to hydrogen embrittlement when compared to conventional amorphous alloys. A possible mechanism that would contribute toward hydrogen-induced amorphization and hydrogen embrittlement is discussed.

Crystallization of Amorphous Silicon-Aluminum thin Films: IN-SITU Observation and Thermal Analysis.

1991 ◽  
Vol 237 ◽  
Author(s):  
Toyohiko J. Konno ◽  
Robert Sinclair
Keyword(s):  
Activation Energy ◽  
Amorphous Alloys ◽  
Amorphous Matrix ◽  
In Situ Observation ◽  
Scanning Calorimetry ◽  
Transmission Electron ◽  
High Resolution Tem ◽  
Higher Temperature ◽  
Sputter Deposited

ABSTRACTThe crystallization of sputter-deposited Si/Al amorphous alloys was examined by transmission electron microscopy (TEM) and differential scanning calorimetry (DSC). In-situ high-resolution TEM reveals the existence of an Al layer between the amorphous matrix and the growing crystalline phase. The activation energy for the growth is about 1.2eV, roughly corresponding to the activation energy of Si diffusion in Al. These two observations support the view that a crystallization mechanism, in which an Al buffer layer provides the shortest reaction path, is responsible for the reaction. The product microstructure exhibits secondary crystallization at a higher temperature.

scholarly journals A large-solid-angle X-ray Raman scattering spectrometer at ID20 of the European Synchrotron Radiation Facility

2017 ◽  
Vol 24 (2) ◽  
pp. 521-530 ◽  
Author(s):  
S. Huotari ◽  
Ch. J. Sahle ◽  
Ch. Henriquet ◽  
A. Al-Zein ◽  
K. Martel ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Raman Scattering ◽  
Solid Angle ◽  
European Synchrotron Radiation Facility ◽  
Electronic Excitations ◽  
Raman Scattering Spectroscopy ◽  
X Ray ◽  
Area Detector ◽  
Spectroscopic Tool

An end-station for X-ray Raman scattering spectroscopy at beamline ID20 of the European Synchrotron Radiation Facility is described. This end-station is dedicated to the study of shallow core electronic excitations using non-resonant inelastic X-ray scattering. The spectrometer has 72 spherically bent analyzer crystals arranged in six modular groups of 12 analyzer crystals each for a combined maximum flexibility and large solid angle of detection. Each of the six analyzer modules houses one pixelated area detector allowing for X-ray Raman scattering based imaging and efficient separation of the desired signal from the sample and spurious scattering from the often used complicated sample environments. This new end-station provides an unprecedented instrument for X-ray Raman scattering, which is a spectroscopic tool of great interest for the study of low-energy X-ray absorption spectra in materials under in situ conditions, such as in operando batteries and fuel cells, in situ catalytic reactions, and extreme pressure and temperature conditions.

Combinatorial in situ Growth-and-Analysis with Synchrotron Radiation of Thin Films for Oxide Electronics

2007 ◽  
Author(s):  
M. Oshima ◽  
H. Kumigashira ◽  
K. Horiba ◽  
T. Ohnishi ◽  
M. Lippmaa ◽  
...  
Keyword(s):  
Thin Films ◽  
Synchrotron Radiation ◽  
In Situ Growth ◽  
Oxide Electronics

Applications of High-Resolution Powder X-Ray Diffraction

2007 ◽  
Vol 130 ◽  
pp. 7-14 ◽  
Author(s):  
Andrew N. Fitch
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Powder Diffraction ◽  
X Rays ◽  
X Ray Diffraction ◽  
Crystalline Materials ◽  
X Ray ◽  
Structural Characterisation ◽  
Pdf Analysis

The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components.

Machine Learning Powered by Principal Component Descriptors as the Key for Sorted Structural Fit of XANES

2021 ◽  
Author(s):  
Andrea Martini ◽  
Alexander A. Guda ◽  
Sergey A. Guda ◽  
Aram L. Bugaev ◽  
Olga V. Safonova ◽  
...  
Keyword(s):  
Machine Learning ◽  
Structural Analysis ◽  
Synchrotron Radiation ◽  
Free Electron Laser ◽  
Principal Component ◽  
Analytical Tool ◽  
X Ray ◽  
Radiation Sources ◽  
X Ray Absorption

Modern synchrotron radiation sources and free electron laser made X-ray absorption spectroscopy (XAS) an analytical tool for the structural analysis of materials under in situ or operando conditions. Fourier approach...

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