Alternative Strengthening of Jewelry Tools Using Chemical-Thermal and Local Surface Treatments

2021 ◽  
Vol 1038 ◽  
pp. 68-76
Author(s):  
Oleg Volkov ◽  
Sergey Knyazev ◽  
Alexey Vasilchenko ◽  
Evgen Doronin
Keyword(s):  
Sample Preparation ◽  
Cross Section ◽  
Surface Profile ◽  
Curved Surface ◽  
Structure And Properties ◽  
Local Surface ◽  
Processing Methods ◽  
Surface Strengthening ◽  
Different Types ◽  
Experimental Researches

The study is aimed at surface strengthening of jewelry tools. Samples in the form of a tool with a flat and curved surface profile are considered. Macrophotographs of jewelry korneisen at different stages of wear, as well as after restoration and strengthening are given. The results of the influence of chemical-thermal and thermo-friction treatments on the structure and properties of U7 and U8A steels used for jewelry tools are presented. The methodology of experimental researches is given. The equipment used for each of the hardening methods investigated in this work is considered. Auxiliary media and features of sample preparation for the experiment are also described. Photos of samples and some equipment at different stages of the study are given. Data on the distribution of microhardness, photographs of microstructures in cross section of samples after different types of hardening are presented. A comparison of the strengthening efficiency of the samples after the use of different processing methods is performed.

A technique for preparing semiconductor cross sections for both TEM and SEM analysis

1989 ◽  
Vol 47 ◽  
pp. 712-713
Author(s):  
Stanley J. Klepeis ◽  
J.P. Benedict ◽  
R.M Anderson
Keyword(s):  
Sample Preparation ◽  
Cross Section ◽  
Cross Sections ◽  
Sem Analysis ◽  
Preparation Technique ◽  
Ion Milling ◽  
Tem Analysis ◽  
Polished Cross Section ◽  
Area Of Interest ◽  
Polished Side

The ability to prepare a cross-section of a specific semiconductor structure for both SEM and TEM analysis is vital in characterizing the smaller, more complex devices that are now being designed and manufactured. In the past, a unique sample was prepared for either SEM or TEM analysis of a structure. In choosing to do SEM, valuable and unique information was lost to TEM analysis. An alternative, the SEM examination of thinned TEM samples, was frequently made difficult by topographical artifacts introduced by mechanical polishing and lengthy ion-milling. Thus, the need to produce a TEM sample from a unique,cross-sectioned SEM sample has produced this sample preparation technique.The technique is divided into an SEM and a TEM sample preparation phase. The first four steps in the SEM phase: bulk reduction, cleaning, gluing and trimming produces a reinforced sample with the area of interest in the center of the sample. This sample is then mounted on a special SEM stud. The stud is inserted into an L-shaped holder and this holder is attached to the Klepeis polisher (see figs. 1 and 2). An SEM cross-section of the sample is then prepared by mechanically polishing the sample to the area of interest using the Klepeis polisher. The polished cross-section is cleaned and the SEM stud with the attached sample, is removed from the L-shaped holder. The stud is then inserted into the ion-miller and the sample is briefly milled (less than 2 minutes) on the polished side. The sample on the stud may then be carbon coated and placed in the SEM for analysis.

The Novel TEM Sample Preparation Approach for Targeted via with Barrier/Cu Seed Layer Inspection

2009 ◽  
Author(s):  
Wen-Fei Hsieh ◽  
Shih-Hsiang Tseng ◽  
Bo Min She
Keyword(s):  
Sample Preparation ◽  
Cross Section ◽  
Seed Layer ◽  
Target Location ◽  
Process Development ◽  
Process Integration ◽  
Ion Beam ◽  
Main Tool ◽  
Dual Beam ◽  
Sample Preparation Procedure

Abstract In this study, an FIB-based cross section TEM sample preparation procedure for targeted via with barrier/Cu seed layer is introduced. The dual beam FIB with electron beam for target location and Ga ion beam for sample milling is the main tool for the targeted via with barrier/Cu seed layer inspection. With the help of the FIB operation and epoxy layer protection, ta cross section TEM sample at a targeted via with barrier/Cu seed layer could be made. Subsequent TEM inspection is used to verify the quality of the structure. This approach was used in the Cu process integration performance monitor. All these TEM results are very helpful in process development and yield improvement.

Cross-Section Sample Preparation Method for Imaging Dopant Related Anomalies Using Scanning Probe Microscopy Techniques

2014 ◽  
Author(s):  
Swaminathan Subramanian ◽  
Khiem Ly ◽  
Tony Chrastecky
Keyword(s):  
Sample Preparation ◽  
Failure Analysis ◽  
Cross Section ◽  
Scanning Probe Microscopy ◽  
Preparation Method ◽  
Fault Isolation ◽  
Scanning Probe ◽  
Sample Preparation Method ◽  
Probe Microscopy ◽  
Section Sample

Abstract Visualization of dopant related anomalies in integrated circuits is extremely challenging. Cleaving of the die may not be possible in practical failure analysis situations that require extensive electrical fault isolation, where the failing die can be submitted of scanning probe microscopy analysis in various states such as partially depackaged die, backside thinned die, and so on. In advanced technologies, the circuit orientation in the wafer may not align with preferred crystallographic direction for cleaving the silicon or other substrates. In order to overcome these issues, a focused ion beam lift-out based approach for site-specific cross-section sample preparation is developed in this work. A directional mechanical polishing procedure to produce smooth damage-free surface for junction profiling is also implemented. Two failure analysis applications of the sample preparation method to visualize junction anomalies using scanning microwave microscopy are also discussed.

The Use of Metallography for Examination of Causes of Surface Defects on Visual Parts

2017 ◽  
Vol 270 ◽  
pp. 107-111
Author(s):  
Zuzana Andršová ◽  
Pavel Kejzlar
Keyword(s):  
Sample Preparation ◽  
Cross Section ◽  
Surface Defects ◽  
Chemical Properties ◽  
Physical And Chemical Properties ◽  
Visual Appearance ◽  
Visual Defects ◽  
Physical And Chemical ◽  
Microscopic Techniques ◽  
And Chemical Properties

Many of currently manufactured components intended for automotive, must not only meet the requirements on functionality, but also considerable demands on the visual appearance. Parts are subjected to thorough inspection and suppliers are forced to deal with causes of a very slight visual defects. When examining the defects, it is necessary to use a whole range of advanced analytical methods and procedures previously used only for identification of the physical and chemical properties and structure of the material. This paper deals with several examples which have been solved. It focuses especially on the use of demanding metallographic sample preparation from components with surface defects, examining the defects on the cross-section using mainly microscopic techniques and determining the causes of their generation. These results then serve as a basis for modification of the technology and thus they are the tool for significant reduction of amount of NOK parts.

Development of a C12Im-Cl-assisted method for rapid sample preparation in proteomic application

2021 ◽  
Author(s):  
Chang Liu ◽  
Xiaoxia Si ◽  
Shumei Yan ◽  
Xinyuan Zhao ◽  
Xiaohong Qian ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Sample Preparation ◽  
Protein Extraction ◽  
Sample Processing ◽  
Processing Methods ◽  
Proteomic Analyses

Chromatography and mass spectrometry (MS) techniques have greatly improved the power of proteomic analyses. However, sample processing methods, including protein extraction and digestion, before MS remain as bottlenecks in the...

A Grinding/Polishing Tool for TEM Sample Preparation

1987 ◽  
Vol 115 ◽  
Author(s):  
S. J. Klepeis ◽  
J. P. Benedict ◽  
R. M. Anderson
Keyword(s):  
Sample Preparation ◽  
Cross Section ◽  
Ion Milling ◽  
Silicon Devices ◽  
Time Required ◽  
Polishing Tool ◽  
Rough Cut

ABSTRACTA grinding/polishing tool has been developed for preparing TEM samples. The hand-held tool is 2.50″ in diameter and 3.0″ high. Rough-cut samples, 300 to 600 microns thick, are routinely polished to 5 microns thick in four to six hours using this tool. As these 5 micron samples are so thin and uniform, a separate dimpling operation can be eliminated. Likewise, the time required to ion-mill the sample can be reduced to 0.5 to 2.0 hours – greatly reducing ion-milling artifacts and significantly increasing the area viewable by TEM. The process is equally effective for all classes of samples: Silicon devices, ceramics or metals – in either cross-section or planar views.

EVALUATION OF THE MICROSTRUCTURE OF ZIRCONIUM DIOXIDE DURING ITS PROCESSING WITH VARIOUS TYPES OF DIAMOND TOOLS FOR FIXED PROSTHETICS IN DENTISTRY

2021 ◽  
pp. 57-64
Author(s):  
Богдан Романович Шумилович ◽  
Владимир Владимирович Ростовцев ◽  
Олеся Борисовна Попова ◽  
Светлана Николаевна Крюкова ◽  
Евгений Сергеевич Станиславчук ◽  
...  
Keyword(s):  
Zirconium Dioxide ◽  
Diamond Tool ◽  
Synthetic Diamond ◽  
Mechanical Action ◽  
Structure And Properties ◽  
Single Application ◽  
Diamond Tools ◽  
Ceramic Samples ◽  
Different Types

Цель: определить характер механического воздействия на структуру образцов из керамики на основе диоксида циркония при её обработке различными алмазными инструментами, и оценка пригодности инструмента с различным способом фиксации абразива при многократном применении для дальнейшего использования. Материал и методы. Материал исследования - образцы на основе метастабильного тетрагонального диоксида циркония, изготовленные в зуботехнической лаборатории и стандартизированные по толщине (1 мм). Оценку влияния механических напряжений на структуру и свойства исходного материала проводили методом перфорации образца алмазными борами, содержащими специальный абразив для обработки циркония. Исследовались боры с различным типом фиксации абразива: № 1 - алмазный бор c синтетическим абразивом, закрепленным по типу ERA; №2 - алмазный бор с композитной фиксацией абразива импортного производства; №3 - отечественный алмазный бор с нанесением и фиксацией абразива методом гальванопластики. Методом сканирующей электронной микроскопии получали изображения результатов механического воздействия боров на образцы диоксида циркония при однократном и пятикратном использовании бора. Исследование структуру самого алмазного инструмента на предмет его пригодности для дальнейшего использования. Результаты. При однократном применении все представленные боры сохраняют микроструктуру диоксида циркония, что позволяет в дальнейшем работать с образцами с использованием адгезивной техники. При пятой обработке боры № 3 не пригодными для работы с керамическим образцом, боры № 2 остаются частично пригодными, боры №1 сохраняют свою пригодность для дальнейшего использования. Заключение. Керамические образцы на основе на основе диоксида циркония изменяются в процессе механического воздействия, что зависит от вида применяемого бора и кратности его применения. Боры с синтетическим алмазным абразивом на базе ERA остаются работоспособными даже после их пятикратного применения, боры с композитной фиксацией абразива к пятому применению остаются относительно работоспособными, а боры с гальванопластической фиксацией абразива к пятому применению приходят в полную негодность Purpose: to determine the nature of the mechanical impact on the structure of samples made of ceramides based on zirconium dioxide when it is processed with various diamond tools, and to assess the suitability of tools with different methods of fixing the abrasive with multiple applications for further use. Material and methods. The material of the study is samples based on metastable tetragonal zirconium dioxide manufactured in a dental laboratory and standardized in thickness (1 mm). The influence of mechanical stresses on the structure and properties of the source material was evaluated by perforating the sample with diamond bores containing a special abrasive for processing zirconium. Bores with different types of abrasive fixation were studied: № 1-diamond boron with synthetic abrasive fixed by ERA type; № 2-diamond boron with composite fixing of imported abrasive; № 3 - edematous diamond boron with applying and fixing the abrasive by electroplating. Scanning electron microscopy was used to obtain images of the results of mechanical action of boron on samples of zirconium dioxide with a single and five-fold use of boron. Investigation of the structure of the diamond tool itself for its suitability for further use. Results. With a single application, all the presented burs preserve the microstructure of the samples, which makes it possible to preserve the suitability of the sample for further work using adhesive technology. At the fifth processing, boron № 3 is not suitable for working with a ceramic sample, boron № 2 remains partially suitable, boron № 1 retains its suitability for further use. Conclusion. Ceramic samples based on zirconium dioxide change in the process of mechanical action, which depends on the type of boron used and the multiplicity of its application. Bores with synthetic diamond abrasives based on ERA remain workable even after their five-time application, bores with composite Abrasive fixation remain relatively workable by the fifth application, and bores with electro plastic fixation of the abrasive by the fifth application become completely unusable

The study of neutron capture processes in AlN nanoparticles

2021 ◽  
pp. 2150127
Author(s):  
T. G. Naghiyev
Keyword(s):  
Computer Modeling ◽  
Cross Section ◽  
Neutron Capture ◽  
Absorption Cross Section ◽  
Effective Cross Section ◽  
Absorption Cross ◽  
Effective Absorption ◽  
Different Types ◽  
N Isotopes

The neutron capture processes in the AlN nanoparticles were investigated by computer modeling. Neutrons absorption were separately investigated for aluminum (Al) and nitrogen (N) atoms in the AlN nanoparticles. The modeling was performed separately for each stable Al and N isotopes, because the effective absorption cross-section of different types of isotopes of Al and N atoms is different. Moreover, effective cross-section spectra of neutron capture for aluminum and nitrogen atoms were comparatively investigated.

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