Gamma Irradiation Effects on 4H-SiC MOS Capacitors and MOSFETs
2006 ◽
Vol 527-529
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pp. 1063-1066
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Keyword(s):
The effects of gamma radiation on field effect mobility and threshold voltage have been studied for lateral n-channel 4H-SiC MOSFETs passivated with nitric oxide. MOS capacitors (n and p) and n-channel lateral MOSFETs were irradiated unbiased (floating contacts) for a total gamma dose of 6.8Mrad (Si). The MOS capacitors were used to study the radiation-induced interface traps and fixed oxide charge that affect the performance of the MOSFETs. Radiationinduced interface traps were observed near the SiC valence band edge and just above mid-gap, and field effect channel mobility was reduced by 18-20% following irradiation. Even so, 4HMOSFETs appear to be more radiation tolerant than Si devices.
2006 ◽
Vol 527-529
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pp. 961-966
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2018 ◽
Vol 924
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pp. 502-505
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2016 ◽
Vol 858
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pp. 671-676
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2005 ◽
Vol 483-485
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pp. 697-700
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Keyword(s):
2011 ◽
Vol 679-680
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pp. 338-341
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2013 ◽
Vol 740-742
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pp. 723-726
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Keyword(s):
2005 ◽
Vol 483-485
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pp. 829-832
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2009 ◽
Vol 615-617
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pp. 773-776
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