Characterization of Surfaces and Interfaces

2021 ◽  
pp. 557-591
Author(s):  
Thomas Berger ◽  
Oliver Diwald
Keyword(s):  
Surfaces And Interfaces

Wet-Chemical Conditioning of H-Terminated Silicon Solar Cell Substrates Investigated by Surface Photovoltage Measurements

2012 ◽  
Vol 195 ◽  
pp. 301-304 ◽  
Author(s):  
Heike Angermann ◽  
U. Stürzebecher ◽  
J. Kegel ◽  
C. Gottschalk ◽  
K. Wolke ◽  
...  
Keyword(s):  
Solar Cell ◽  
Silicon Solar Cell ◽  
Energy Conversion Efficiency ◽  
Charge Carriers ◽  
Surface Charges ◽  
Surfaces And Interfaces ◽  
Wet Chemical ◽  
Substrate Surfaces ◽  
Non Destructive

For further enhancement of solar energy conversion efficiency the passivation of silicon (Si) substrate surfaces and interfaces of Si-based solar cell devices is a decisive precondition to reduce recombination losses of photogenerated charge carriers. These losses are mainly controlled by surface charges, the density and the character of rechargeable interface states (Dit) [], which are induced by defects localised in a small interlayer extending over only few Å. Therefore, the application of fast non-destructive methods for characterization of the electronic interface properties directly during the technological process has received an increasing interest in recent years.

X-RAY DIFFRACTION FOR SURFACES AND BURIED INTERFACES

2000 ◽  
Vol 07 (04) ◽  
pp. 437-446 ◽  
Author(s):  
G. RENAUD
Keyword(s):  
Grazing Incidence ◽  
X Rays ◽  
X Ray Diffraction ◽  
X Ray ◽  
Grain Sizes ◽  
Buried Interfaces ◽  
Surfaces And Interfaces ◽  
Coherent Interfaces

The application of X-rays to the structural characterization of surfaces and interfaces, in situ and in UHV, is discussed on selected examples. Grazing incidence X-ray diffraction is not only a very powerful technique for quantitatively investigating the atomic structure of surfaces and interfaces, but is also very useful for providing information on the interfacial registry for coherent interfaces or on the strain deformation, island and grain sizes for incoherent epilayers.

Current Chemistry: Characterization of Thin-Film Surfaces and Interfaces Using Neutron Reflectometry

2001 ◽  
Vol 54 (8) ◽  
pp. 487 ◽  
Author(s):  
Michael James
Keyword(s):  
Thin Film ◽  
Data Analysis ◽  
Experimental Design ◽  
Extreme Environments ◽  
Neutron Reflectometry ◽  
Buried Interfaces ◽  
Surfaces And Interfaces ◽  
Wide Range ◽  
Non Destructive

Neutron reflectometry has become an increasingly important technique in the characterization of thin-film surfaces and interfaces. Recent advances in instrumentation, experimental design, sample environments and methods of data analysis now make it possible to obtain an angstrom-precision depth profile of the film composition. Neutrons are non-destructive and highly penetrating which makes them ideal probes for the study of buried interfaces as well as surfaces under a wide range of extreme environments. Isotopic H/D substitution (particularly in colloidal, polymeric or biological systems) provides a unique tool for selectively labelling different components of complex planar architectures. The fundamental aspects of neutron reflectometry are discussed, and the utility of this technique is illustrated by a review of several recent studies.

Photoluminescence characterization of non-radiative defect density on silicon surfaces and interfaces at room temperature

2000 ◽  
Vol 364 (1-2) ◽  
pp. 196-199 ◽  
Author(s):  
V.Yu. Timoshenko ◽  
A.B. Petrenko ◽  
Th. Dittrich ◽  
W. Füssel ◽  
J. Rappich
Keyword(s):  
Room Temperature ◽  
Defect Density ◽  
Silicon Surfaces ◽  
Surfaces And Interfaces ◽  
Radiative Defect
Sign in / Sign up

Export Citation Format

Share Document