Direct observation of stacking fault shrinkage in 4H-SiC at high temperatures by in-situ X-ray topography using monochromatic synchrotron radiation

2018 ◽  
Vol 113 (1) ◽  
pp. 012101 ◽  
Author(s):  
Fumihiro Fujie ◽  
Shunta Harada ◽  
Haruhiko Koizumi ◽  
Kenta Murayama ◽  
Kenji Hanada ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
High Temperatures ◽  
Direct Observation ◽  
Stacking Fault ◽  
X Ray ◽  
Monochromatic Synchrotron

scholarly journals Quick X-ray reflectivity using monochromatic synchrotron radiation for time-resolved applications

2018 ◽  
Vol 25 (3) ◽  
pp. 706-716 ◽  
Author(s):  
H. Joress ◽  
J. D. Brock ◽  
A. R. Woll
Keyword(s):  
Synchrotron Radiation ◽  
Film Growth ◽  
Sample Surface ◽  
High Energy ◽  
Time Resolved ◽  
Synchrotron Source ◽  
X Ray ◽  
Area Detector ◽  
Monochromatic Synchrotron

A new technique for the parallel collection of X-ray reflectivity (XRR) data, compatible with monochromatic synchrotron radiation and flat substrates, is described and applied to thein situobservation of thin-film growth. The method employs a polycapillary X-ray optic to produce a converging fan of radiation, incident onto a sample surface, and an area detector to simultaneously collect the XRR signal over an angular range matching that of the incident fan. Factors determining the range and instrumental resolution of the technique in reciprocal space, in addition to the signal-to-background ratio, are described in detail. This particular implementation records ∼5° in 2θ and resolves Kiessig fringes from samples with layer thicknesses ranging from 3 to 76 nm. The value of this approach is illustrated by showingin situXRR data obtained with 100 ms time resolution during the growth of epitaxial La0.7Sr0.3MnO3on SrTiO3by pulsed laser deposition at the Cornell High Energy Synchrotron Source (CHESS). Compared with prior methods for parallel XRR data collection, this is the first method that is both sample-independent and compatible with the highly collimated, monochromatic radiation typical of third-generation synchrotron sources. Further, this technique can be readily adapted for use with laboratory-based sources.

Direct Observation of Monolayer Zones in Al-wt 4% Cu

1990 ◽  
Vol 48 (1) ◽  
pp. 14-15
Author(s):  
B. Jouffrey ◽  
D. Dorignac ◽  
A. Bourret
Keyword(s):  
Solid Solution ◽  
Synchrotron Radiation ◽  
Direct Observation ◽  
Supersaturated Solid Solution ◽  
Original Model ◽  
X Ray ◽  
Image Position

Since the early works on GP zones and the model independently proposed by Preston and Guinier on the first steps of precipitation in supersaturated solid solution of aluminium containing a few percent of copper, many works have been performed to understand the structure of different stages in the sequence of precipitation.The scheme which is generally admitted can be drawn from a work by Phillips.In their original model Guinier and Preston analysed a GP zone as composed of a single (100) copperrich plane surrounded by aluminum atomic planes with a slightly shorter distance from the original plane than in the solid solution.From X-ray measurements it has also been shown that GP1 zones were not only copper monolayer zones. They could be up to a few atomic planes thick. Different models were proposed by Guinier, Gerold, Toman. Using synchrotron radiation, proposals have been recently made.

Temperature Dependence of Double Shockley Stacking Fault Behavior in Nitrogen-Doped 4h-Sic Studied by In-Situ Synchrotron X-Ray Topography

2020 ◽  
Author(s):  
Fumihiro Fujie ◽  
Shunta Harada ◽  
Kenji Hanada ◽  
Hiromasa Suo ◽  
Haruhiko Koizumi ◽  
...  
Keyword(s):  
Temperature Dependence ◽  
Stacking Fault ◽  
X Ray ◽  
Nitrogen Doped ◽  
Fault Behavior

scholarly journals Direct observation of the displacement field and microcracking in a glass by means of X-ray tomography during in situ Vickers indentation experiment

2019 ◽  
Vol 179 ◽  
pp. 424-433 ◽  
Author(s):  
Tanguy Lacondemine ◽  
Julien Réthoré ◽  
Éric Maire ◽  
Fabrice Célarié ◽  
Patrick Houizot ◽  
...  
Keyword(s):  
Direct Observation ◽  
Displacement Field ◽  
Vickers Indentation ◽  
X Ray ◽  
Indentation Experiment

scholarly journals X-ray reflectivity with a twist: Quantitative time-resolved X-ray reflectivity using monochromatic synchrotron radiation

2019 ◽  
Vol 114 (8) ◽  
pp. 081904 ◽  
Author(s):  
Howie Joress ◽  
Shane Q. Arlington ◽  
Timothy P. Weihs ◽  
Joel D. Brock ◽  
Arthur R. Woll
Keyword(s):  
Synchrotron Radiation ◽  
Time Resolved ◽  
X Ray ◽  
Monochromatic Synchrotron

scholarly journals A large-solid-angle X-ray Raman scattering spectrometer at ID20 of the European Synchrotron Radiation Facility

2017 ◽  
Vol 24 (2) ◽  
pp. 521-530 ◽  
Author(s):  
S. Huotari ◽  
Ch. J. Sahle ◽  
Ch. Henriquet ◽  
A. Al-Zein ◽  
K. Martel ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Raman Scattering ◽  
Solid Angle ◽  
European Synchrotron Radiation Facility ◽  
Electronic Excitations ◽  
Raman Scattering Spectroscopy ◽  
X Ray ◽  
Area Detector ◽  
Spectroscopic Tool

An end-station for X-ray Raman scattering spectroscopy at beamline ID20 of the European Synchrotron Radiation Facility is described. This end-station is dedicated to the study of shallow core electronic excitations using non-resonant inelastic X-ray scattering. The spectrometer has 72 spherically bent analyzer crystals arranged in six modular groups of 12 analyzer crystals each for a combined maximum flexibility and large solid angle of detection. Each of the six analyzer modules houses one pixelated area detector allowing for X-ray Raman scattering based imaging and efficient separation of the desired signal from the sample and spurious scattering from the often used complicated sample environments. This new end-station provides an unprecedented instrument for X-ray Raman scattering, which is a spectroscopic tool of great interest for the study of low-energy X-ray absorption spectra in materials under in situ conditions, such as in operando batteries and fuel cells, in situ catalytic reactions, and extreme pressure and temperature conditions.

Applications of High-Resolution Powder X-Ray Diffraction

2007 ◽  
Vol 130 ◽  
pp. 7-14 ◽  
Author(s):  
Andrew N. Fitch
Keyword(s):  
High Resolution ◽  
Synchrotron Radiation ◽  
Powder Diffraction ◽  
X Rays ◽  
X Ray Diffraction ◽  
Crystalline Materials ◽  
X Ray ◽  
Structural Characterisation ◽  
Pdf Analysis

The highly-collimated, intense X-rays produced by a synchrotron radiation source can be harnessed to build high-resolution powder diffraction instruments with a wide variety of applications. The general advantages of using synchrotron radiation for powder diffraction are discussed and illustrated with reference to the structural characterisation of crystalline materials, atomic PDF analysis, in-situ and high-throughput studies where the structure is evolving between successive scans, and the measurement of residual strain in engineering components.

Machine Learning Powered by Principal Component Descriptors as the Key for Sorted Structural Fit of XANES

2021 ◽  
Author(s):  
Andrea Martini ◽  
Alexander A. Guda ◽  
Sergey A. Guda ◽  
Aram L. Bugaev ◽  
Olga V. Safonova ◽  
...  
Keyword(s):  
Machine Learning ◽  
Structural Analysis ◽  
Synchrotron Radiation ◽  
Free Electron Laser ◽  
Principal Component ◽  
Analytical Tool ◽  
X Ray ◽  
Radiation Sources ◽  
X Ray Absorption

Modern synchrotron radiation sources and free electron laser made X-ray absorption spectroscopy (XAS) an analytical tool for the structural analysis of materials under in situ or operando conditions. Fourier approach...

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