scholarly journals Towards electrically conductive, self-healing materials

2007 ◽  
Vol 4 (13) ◽  
pp. 359-362 ◽  
Author(s):  
Kyle A Williams ◽  
Andrew J Boydston ◽  
Christopher W Bielawski
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Solid State ◽  
Thermal Treatment ◽  
Heterocyclic Carbenes ◽  
Organometallic Polymers ◽  
Self Healing ◽  
Electrically Conductive ◽  
Scanning Electron

A novel class of organometallic polymers comprising N -heterocyclic carbenes and transition metals was shown to have potential as an electrically conductive, self-healing material. These polymers were found to exhibit conductivities of the order of 10 −3  S cm −1 and showed structurally dynamic characteristics in the solid-state. Thin films of these materials were cast onto silicon wafers, then scored and imaged using a scanning electron microscopy (SEM). The scored films were subsequently healed via thermal treatment, which enabled the material to flow via a unique depolymerization process, as determined by SEM and surface profilometry. A method for incorporating these features into a device that exhibits electrically driven, self-healing functions is proposed.

Growth and Characterization of Vapor Deposited Polyimide Thin Films

2013 ◽  
Vol 774-776 ◽  
pp. 824-827
Author(s):  
Fu Tong Chu ◽  
Chuan Li, ◽  
Li Jun He ◽  
Xing Zhao Liu
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Fourier Transform ◽  
Infrared Spectroscopy ◽  
Thermal Treatment ◽  
Vapor Deposition ◽  
Polymerization Temperature ◽  
Scanning Electron

In this paper, we report on the preparation and characterization of polyimide (PI) thin films through vapor deposition polymerization (VDP). PI thin films were formed by vapour co-deposition of the precursor monomers pyromellitic dianhydride (PMDA) and 4,4-oxydianiline (ODA) following a thermal treatment at a temperature of over 300°C. The effects of the polymerization temperature on the characterization of PI films were investigated using scanning electron microscopy and Fourier transform infrared spectroscopy. The results showed that the deposited polyamic acid (PAA, a precursor of polyimide) with imidization in the temperature interval of 300-400°C are smooth, uniformly thick and form without shrinkage.

Imaging magnetic microstructure with SEMPA

1993 ◽  
Vol 51 ◽  
pp. 1032-1033
Author(s):  
M. H. Kelley ◽  
J. Unguris ◽  
R. J. Celotta ◽  
D. T. Pierce
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Sandwich Structure ◽  
Magnetic Coupling ◽  
Polarization Analysis ◽  
Secondary Electrons ◽  
Magnetic Microstructure ◽  
Escape Depth ◽  
Scanning Electron

By measuring the spin polarization of secondary electrons generated in a scanning electron microscope, scanning electron microscopy with polarization analysis (SEMPA) can directly image the magnitude and direction of a material’s magnetization. Because the escape depth of the secondaries is only on the order of 1 nm, SEMPA is especially well-suited for investigating the magnetization of ultra-thin films and surfaces. We have exploited this feature of SEMPA to study the magnetic microstrcture and magnetic coupling in ferromagnetic multilayers where the layers may only be a few atomic layers thick. For example, we have measured the magnetic coupling in Fe/Cr/Fe(100) and Fe/Ag/Fe(100) trilayers and have found that the coupling oscillates between ferromagnetic and antiferromagnetic as a function of the Cr or Ag spacer thickness.The SEMPA apparatus has been described in detail elsewhere. The sample consisted of a magnetic sandwich structure with a wedge-shaped interlayer as shown in Fig. 1.

Fabrication of Ultra Thick Ferromagnetic Structures in Silicon

2004 ◽  
Author(s):  
Debbie G. Jones ◽  
Albert P. Pisano
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Saturation Magnetization ◽  
Silicon Wafer ◽  
Fabrication Process ◽  
Sem Images ◽  
Deep Reactive Ion Etching ◽  
Scanning Electron

A novel fabrication process is presented to create ultra thick ferromagnetic structures in silicon. The structures are fabricated by electroforming NiFe into silicon templates patterned with deep reactive ion etching (DRIE). Thin films are deposited into photoresist molds for characterization of an electroplating cell. Results show that electroplated films with a saturation magnetization above 1.6 tesla and compositions of approximately 50/50 NiFe can be obtained through agitation of the electrolyte. Scanning electron microscopy (SEM) images show that NiFe structures embedded in a 500 μm thick silicon wafer are realized and the roughening of the mold sidewalls during the DRIE aids in adhesion of the NiFe to the silicon.

SYNTHESIS, MORPHOLOGY AND STRUCTURAL PROPERTIES OF (GD,ND)SR2RUCU2O8 SAMPLES

2003 ◽  
Vol 17 (04n06) ◽  
pp. 899-904 ◽  
Author(s):  
A. VECCHIONE ◽  
M. GOMBOS ◽  
C. TEDESCO ◽  
A. IMMIRZI ◽  
L. MARCHESE ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Solid State ◽  
Powder Diffraction ◽  
Solid State Reaction ◽  
X Ray ◽  
Structure And Morphology ◽  
Polycrystalline Powder ◽  
Scanning Electron

NdSr 2 RuCu 2 O x material has been prepared as polycrystalline powder by solid state reaction. The compound has been investigated by synchrotron x-ray powder diffraction and scanning electron microscopy. The experimental results show that the average crystal structure is a disordered cubic perovskite with Nd and Sr cations occupying the same site and the same substitution is found for Cu and Ru atoms. A comparison between the crystal structure and morphology of this compound and the superconducting tetragonal GdSr 2 RuCu 2 O 8 is also discussed.

Synthesis and Film Investigation of Titania

2013 ◽  
Vol 832 ◽  
pp. 128-131
Author(s):  
Sharipah Nadzirah ◽  
Uda Hashim
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Titanium Dioxide ◽  
Sol Gel ◽  
Titanium Butoxide ◽  
Before And After ◽  
Scanning Electron ◽  
Spin Coater

Titania or titanium dioxide (TiO2) thin film has been synthesized via sol-gel method with monoethanolamine (MEA) as a catalyst. The mixing of titanium butoxide as a precursor, ethanol as a solvent and MEA were stirred using magnetic stirrer under ambient temperature [. The TiO2solution prepared then was deposited on SiO2substrates using spin-coater and the coated films were annealed at 600°C. Finally, both before and after annealed TiO2thin films were characterized using Field Emission Scanning Electron Microscopy (FESEM). The obtained results show the different TiO2particles formation before and after annealed.

Analyse of Indium Loss in Preparation of CuInSe2 Flims for Solar Cells

2011 ◽  
Vol 183-185 ◽  
pp. 1837-1841
Author(s):  
Lei Sha ◽  
Yan Lai Wang ◽  
Shi Liang Ban
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Stainless Steel ◽  
Solar Cells ◽  
Surface Morphology ◽  
Energy Dispersive Spectroscopy ◽  
Titanium Substrates ◽  
Selenization Process ◽  
Scanning Electron

CuInSe2 thin films were obtained by selenization of the Cu-In precursors in the atmosphere of Se vapour, which were prepared on stainless steel and titanium substrates by electrodeposition. The films were characterized by XRD, scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS). The respective influences of composition, phases and surface morphology of Cu-In precursors on indium loss were investigated. The results indicate that the indium loss occurs in selenization process because of volatile In2Se arising. The indium loss is less in selenization process of Cu-In precursors contained CuIn, Cu2In and In phases.

Formation and Characterization of the Quasicrystal Films

2007 ◽  
Vol 546-549 ◽  
pp. 1699-1702
Author(s):  
Xi Ying Zhou ◽  
Liang He ◽  
Yan Hui Liu
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Electric Current ◽  
Wear Behavior ◽  
Micro Hardness ◽  
X Ray Diffraction ◽  
X Ray ◽  
Scanning Electron

Al-Cu-Fe quasicrystals powder was used to prepare the thin films on the surface of the A3 steel by the means of DMD-450 vacuum evaporation equipment. The thin films with different characterization were obtained through different parameters. The microstructures of the thin films were analyzed by Scanning Electron Microscopy (SEM) and X-ray Diffraction (XRD). Additionally, the nano-hardness and the modulus of the films are tested by MTS and Neophot micro-hardness meter. The results showed that the modulus of the films was about 160GPa. Nano hardness of the films was about 7.5 Gpa. The films consisted of CuAl2, AlCu3. The thickness and the micro-hardness of the films are improved. In same way, with the increase of the electric current, the thickness and the hardness of the films are also improved. Along with increase of the time and the electric current, the wear behavior of the films was improved. To some extent, the microstructure of films contained the quasicrystal phase of Al65Cu20Fe15.

EPITAXIALLY GROWN YBCO THIN FILMS ON LOW LOSS LaAlO3 SUBSTRATE

1990 ◽  
Vol 04 (05) ◽  
pp. 369-373 ◽  
Author(s):  
Y. Z. ZHANG ◽  
L. LI ◽  
Y. Y. ZHAO ◽  
B. R. ZHAO ◽  
Y. G. WANG ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
X Ray Diffraction ◽  
Dc Magnetron Sputtering ◽  
Low Loss ◽  
X Ray ◽  
Ybco Thin Films ◽  
Zero Resistance ◽  
Scanning Electron

A planar dc magnetron sputtering device was used to prepare high T c and high J c YBCO thin films. Both single crystal and polycrystal thin films were successfully grown on (100) oriented LaAlO 3 substrates. Zero resistance temperature T c0 = 92.3 K and critical current density J c (0) = 3.82 × 106 A/cm 2 at 77 K was obtained. The films were characterized by X-ray diffraction (XRD) and scanning electron microscopy (SEM).

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