Ultra-fine-grain field-programmable VLSI using multiple-valued source-coupled logic

Author(s):  
H.M. Munirul ◽  
M. Kameyama
2021 ◽  
Vol 18 (3) ◽  
pp. 1-25
Author(s):  
George Charitopoulos ◽  
Dionisios N. Pnevmatikatos ◽  
Georgi Gaydadjiev

Executing complex scientific applications on Coarse-Grain Reconfigurable Arrays ( CGRAs ) promises improvements in execution time and/or energy consumption compared to optimized software implementations or even fully customized hardware solutions. Typical CGRA architectures contain of multiple instances of the same compute module that consist of simple and general hardware units such as ALUs, simple processors. However, generality in the cell contents, while convenient for serving a wide variety of applications, penalizes performance and energy efficiency. To that end, a few proposed CGRAs use custom logic tailored to a particular application’s specific characteristics in the compute module. This approach, while much more efficient, restricts the versatility of the array. To date, versatility at hardware speeds is only supported with Field programmable gate arrays (FPGAs), that are reconfigurable at a very fine grain. This work proposes MC-DeF, a novel Mixed-CGRA Definition Framework targeting a Mixed-CGRA architecture that leverages the advantages of CGRAs by utilizing a customized cell array, and those of FPGAs by incorporating a separate LUT array used for adaptability. The framework presented aims to develop a complete CGRA architecture. First, a cell structure and functionality definition phase creates highly customized application/domain specific CGRA cells. Then, mapping and routing phases define the CGRA connectivity and cell-LUT array transactions. Finally, an energy and area estimation phase presents the user with area occupancy and energy consumption estimations of the final design. MC-DeF uses novel algorithms and cost functions driven by user defined metrics, threshold values, and area/energy restrictions. The benefits of our framework, besides creating fast and efficient CGRA designs, include design space exploration capabilities offered to the user. The validity of the presented framework is demonstrated by evaluating and creating CGRA designs of nine applications. Additionally, we provide comparisons of MC-DeF with state-of-the-art related works, and show that MC-DeF offers competitive performance (in terms of internal bandwidth and processing throughput) even compared against much larger designs, and requires fewer physical resources to achieve this level of performance. Finally, MC-DeF is able to better utilize the underlying FPGA fabric and achieves the best efficiency (measured in LUT/GOPs).


2010 ◽  
Vol 2010 ◽  
pp. 1-9 ◽  
Author(s):  
Tobias Becker ◽  
Peter Jamieson ◽  
Wayne Luk ◽  
Peter Y. K. Cheung ◽  
Tero Rissa

This paper proposes a benchmarking methodology for characterising the power consumption of the fine-grain fabric in reconfigurable architectures. This methodology is part of the GroundHog 2009 power benchmarking suite. It covers active and inactive power as well as advanced low-power modes. A method based on random number generators is adopted for comparing activity modes. We illustrate our approach using five field-programmable gate arrays (FPGAs) that span a range of process technologies: Xilinx Virtex-II Pro, Spartan-3E, Spartan-3AN, Virtex-5, and Silicon Blue iCE65. We find that, despite improvements through process technology and low-power modes, current devices need further improvements to be sufficiently power efficient for mobile applications. The Silicon Blue device demonstrates that performance can be traded off to achieve lower leakage.


Author(s):  
B.GOPI CHANDRA KUMAR ◽  
MOHAMMAD HAYATH RAJVEE

Field Programmable Gate Array (FPGA) is an effective device to realize real- time parallel processing of vast amounts of video data because of the fine-grain reconfigurable structures. This paper presents a kind of parallel processing construction of Sobel edge detection enhancement algorithm, which can quickly get the result of one pixel in only one clock periods. The algorithm is designed with a FPGA chip called XC3S200- 5ft256, and it can process 1024×1024×8 Gray Scale Image successfully. The design can locate the edge of the gray image quickly and efficiently.


Author(s):  
R. Sinclair ◽  
B.E. Jacobson

INTRODUCTIONThe prospect of performing chemical analysis of thin specimens at any desired level of resolution is particularly appealing to the materials scientist. Commercial TEM-based systems are now available which virtually provide this capability. The purpose of this contribution is to illustrate its application to problems which would have been intractable until recently, pointing out some current limitations.X-RAY ANALYSISIn an attempt to fabricate superconducting materials with high critical currents and temperature, thin Nb3Sn films have been prepared by electron beam vapor deposition [1]. Fine-grain size material is desirable which may be achieved by codeposition with small amounts of Al2O3 . Figure 1 shows the STEM microstructure, with large (∽ 200 Å dia) voids present at the grain boundaries. Higher quality TEM micrographs (e.g. fig. 2) reveal the presence of small voids within the grains which are absent in pure Nb3Sn prepared under identical conditions. The X-ray spectrum from large (∽ lμ dia) or small (∽100 Ǻ dia) areas within the grains indicates only small amounts of A1 (fig.3).


Author(s):  
Harry Schaefer ◽  
Bruce Wetzel

High resolution 24mm X 36mm positive transparencies can be made from original black and white negatives produced by SEM, TEM, and photomicrography with ease, convenience, and little expense. The resulting 2in X 2in slides are superior to 3¼in X 4in lantern slides for storage, transport, and sturdiness, and projection equipment is more readily available. By mating a 35mm camera directly to an enlarger lens board (Fig. 1), one combines many advantages of both. The negative is positioned and illuminated with the enlarger and then focussed and photographed with the camera on a fine grain black and white film.Specifically, a Durst Laborator 138 S 5in by 7in enlarger with 240/200 condensers and a 500 watt Opale bulb (Ehrenreich Photo-Optical Industries, Inc., New York, NY) is rotated to the horizontal and adjusted for comfortable eye level viewing.


Author(s):  
P. J. Lee ◽  
D. C. Larbalestier

Several features of the metallurgy of superconducting composites of Nb-Ti in a Cu matrix are of interest. The cold drawing strains are generally of order 8-10, producing a very fine grain structure of diameter 30-50 nm. Heat treatments of as little as 3 hours at 300 C (∼ 0.27 TM) produce a thin (1-3 nm) Ti-rich grain boundary film, the precipitate later growing out at triple points to 50-100 nm dia. Further plastic deformation of these larger a-Ti precipitates by strains of 3-4 produces an elongated ribbon morphology (of order 3 x 50 nm in transverse section) and it is the thickness and separation of these precipitates which are believed to control the superconducting properties. The present paper describes initial attempts to put our understanding of the metallurgy of these heavily cold-worked composites on a quantitative basis. The composite studied was fabricated in our own laboratory, using six intermediate heat treatments. This process enabled very high critical current density (Jc) values to be obtained. Samples were cut from the composite at many processing stages and a report of the structure of a number of these samples is made here.


Author(s):  
K. Ogura ◽  
T. Suzuki ◽  
C. Nielsen

In spite of the complicated specimen preparation, Transmission Electron Microscopes (TEM) have traditionally been used for the investigation of the fine grain structures of sintered ceramics. Scanning Electron Microscopes (SEM) have not been used much for the same purpose as TEM because of poor results caused by the specimen charging effect, and also the lack of sufficient resolution. Here, we are presenting a successful result of high resolution imaging of sintered alumina (pure Al2O3) using the Specimen Heated and Electron Beam Induced Conductivity (SHEBIC) method, which we recently reported, in an ultrahigh resolution SEM (UHR-SEM). The JSM-6000F, equipped with a Field Emission Gun (FEG) and an in-lens specimen position, was used for this application.After sintered Al2O3 was sliced into a piece approximately 0.5 mm in thickness, one side was mechanically polished to get a shiny plane for the observation. When the observation was started at 20 kV, an enormous charging effect occured, and it was impossible to obtain a clear Secondary Electron (SE) image (Fig.1).


Author(s):  
Robert P. Apkarian

A multitude of complex ultrastructural features are involved in endothelial cell (EC) gating and sorting of lipid through capillaries and into steroidogenic cells of the adrenal cortex. Correlative microscopy is necessary to distinguish the structural identity of features involved in specific cellular pathways. In addition to diaphragmed fenestrae that frequently appear in clusters, other 60-80 nm openings; plasmalemma vesicles (PV), channels and pockets fitted with diaphragms of the same dimension, coexist on the thin EC surface. Non-diaphragmed coated pits (CP) (100-120 nm) involved in receptor mediated endocytosis were also present on the EC membrane. The present study employed HRSEM of cryofractured and chromium coated specimens and low voltage HRSTEM of 80 nm thick LX-112 embedded sections stained with 2.0% uranyl acetate. Both preparations were imaged at 25 kV with a Topcon DS-130 FESEM equipped with in-lens stage and STEM detector.HRSEM images of the capillary lumen coated with a lnm continuous fine grain Cr film, provided the ability to scan many openings and resolve (SE-I contrast) the fine structure of diaphragm spokes and central densities (Fig. 1).


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