Investigation of quantum-capacitance induced drain-current loss for multi-gate InGaAs n-MOSFETs
2021 ◽
2016 ◽
Vol 100
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pp. 458-467
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1988 ◽
Vol 49
(C4)
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pp. C4-223-C4-226
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2020 ◽
Vol 64
(1-4)
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pp. 959-967
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2009 ◽
Vol 129
(11)
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pp. 1022-1029
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Keyword(s):
2019 ◽
Vol 9
(2)
◽
pp. 291-297
Keyword(s):
Keyword(s):