Functional Fiber Junctions for Circuit Routing in E-Textiles: Deterministic Alignment of MEMS Layout With Fabric Structure

2021 ◽  
Author(s):  
Sushmita Challa ◽  
M. Shafquatul Islam ◽  
Danming Wei ◽  
Jasmin Beharic ◽  
Dan O. Popa ◽  
...  
Keyword(s):  
Microelectromechanical Systems ◽  
Flexible Substrate ◽  
Fibrous Materials ◽  
Mems Devices ◽  
Image Processing Algorithm ◽  
Mems Packaging ◽  
Alignment Procedure ◽  
Fabric Structure ◽  
Parallel Transfer ◽  
Functional Fiber

Abstract Fabrics and fibrous materials offer a soft, porous, and flexible substrate for microelectromechanical systems (MEMS) packaging in breathable, wearable formats that allow airflow. Device-on-fiber systems require developments in the field of E-Textiles including smart fibers, functional fiber intersections, textile circuit routing, and alignment methods that adapt to irregular materials. In this paper, we demonstrate a MEMS-on-fabric layout workflow that obtains fiber intersection locations from high-resolution fabric images. We implement an image processing algorithm to drive the MEMS layout software, creating an individualized MEMS “gripper” layout designed to grasp fibers on a specific fabric substrate during a wafer-to-fabric parallel transfer step. The efficiency of the algorithm in terms of a number of intersections identified on the complete image is analyzed. The specifications of the MEMS layout design such as the length of the MEMS gripper, spatial distribution, and orientation are derivable from the MATLAB routine implemented on the image. Furthermore, the alignment procedure, tolerance, and hardware setup for the alignment method of the framed sample fabric to the wafer processed using the custom gripper layout are discussed along with the challenges of the release of MEMS devices from the Si substrate to the fabric substrate.

A Review on Laser Processing in Electronic and MEMS Packaging

2017 ◽  
Vol 139 (3) ◽  
Author(s):  
Kaysar Rahim ◽  
Ahsan Mian
Keyword(s):  
Laser Processing ◽  
Microelectromechanical Systems ◽  
Mechanical Effect ◽  
Future Trend ◽  
Small Scale ◽  
Attractive Alternative ◽  
Mems Devices ◽  
Processing Technologies ◽  
Mems Packaging ◽  
Heating And Cooling

The packaging of electronic and microelectromechanical systems (MEMS) devices is an important part of the overall manufacturing process as it ensures mechanical robustness as well as required electrical/electromechanical functionalities. The packaging integration process involves the selection of packaging materials and technology, process design, fabrication, and testing. As the demand of functionalities of an electronic or MEMS device is increasing every passing year, chip size is getting larger and is occupying the majority of space within a package. This requires innovative packaging technologies so that integration can be done with less thermal/mechanical effect on the nearby components. Laser processing technologies for electronic and MEMS packaging have potential to obviate some of the difficulties associated with traditional packaging technologies and can become an attractive alternative for small-scale integration of components. As laser processing involves very fast localized and heating and cooling, the laser can be focused at micrometer scale to perform various packaging processes such as dicing, joining, and patterning at the microscale with minimal or no thermal effect on surrounding material or structure. As such, various laser processing technologies are currently being explored by researchers and also being utilized by electronic and MEMS packaging industries. This paper reviews the current and future trend of electronic and MEMS packaging and their manufacturing processes. Emphasis is given to the laser processing techniques that have the potential to revolutionize the future manufacturing of electronic and MEMS packages.

Developments in Microelectromechanical Systems (MEMS): A Manufacturing Perspective

2003 ◽  
Vol 125 (4) ◽  
pp. 816-823 ◽  
Author(s):  
Srinivas A. Tadigadapa ◽  
Nader Najafi
Keyword(s):  
Microelectromechanical Systems ◽  
Process Development ◽  
Reliability Testing ◽  
Mems Devices ◽  
Manufacturing Strategy ◽  
Cad Tools ◽  
Fragile State ◽  
Mems Packaging ◽  
Overall Performance

This paper presents a discussion of some of the major issues that need to be considered for the successful commercialization of MEMS products. The diversity of MEMS devices and historical reasons have led to scattered developments in the MEMS manufacturing infrastructure. A good manufacturing strategy must include the complete device plan including package as part of the design and process development of the device. In spite of rapid advances in the field of MEMS there are daunting challenges that lie in the areas of MEMS packaging, and reliability testing. CAD tools for MEMS are starting to get more mature but are still limited in their overall performance. MEMS manufacturing is currently at a fragile state of evolution. In spite of all the wonderful possibilities, very few MEMS devices have been commercialized. In our opinion, the magnitude of the difficulty of fabricating MEMS devices at the manufacturing level is highly underestimated by both the current and emerging MEMS communities. A synopsis of MEMS manufacturing issues is presented here.

Key Reliability Factors for IC and MEMS Packaging

2000 ◽  
Author(s):  
Reza Ghaffarian
Keyword(s):  
Microelectromechanical Systems ◽  
Technology Development ◽  
High Reliability ◽  
Pressure Sensors ◽  
Cost Savings ◽  
Industrial Applications ◽  
Current Status ◽  
Mems Devices ◽  
Mems Packaging ◽  
Commercial Off The Shelf

Abstract During the last decade, research and development of microelectromechanical systems (MEMS) has shown a significant promise for a variety of commercial applications including automobile and medical purposes. For example, accelerometers are widely used for air bag in automobile and pressure sensors for various industrial applications. Some of the MEMS devices have potential to become the commercial-off-the-shelf (COTS) components. While high reliability/harsh environmental applications including aerospace require much more sophisticated technology development, they would achieve significant cost savings if they could utilize COTS components in their systems. This paper reviews the current status of IC and MEMS packaging technology with emphasis on reliability, compares the norm for IC packaging reliability evaluation and identifies challenges for development of reliability methodologies for MEMS, and finally proposes the use of COTS MEMS in order to start generating statistically meaningful reliability data as a vehicle for future standardization of reliability test methodology for MEMS packaging.

scholarly journals A Novel Seedless TSV Process Based on Room Temperature Curing Silver Nanowires ECAs for MEMS Packaging

Micromachines ◽  
2019 ◽  
Vol 10 (6) ◽  
pp. 351 ◽  
Author(s):  
Meng ◽  
Cheng ◽  
Yang ◽  
Sun ◽  
Luo
Keyword(s):  
Room Temperature ◽  
Microelectromechanical Systems ◽  
Silver Nanowires ◽  
Low Cost ◽  
Mems Devices ◽  
Filling Process ◽  
Conductive Adhesives ◽  
Mems Packaging ◽  
Wide Range ◽  
High Efficient

The through-silicon-vias (TSVs) process is a vital technology in microelectromechanical systems (MEMS) packaging. The current via filling technique based on copper electroplating has many shortcomings, such as involving multi-step processes, requiring sophisticated equipment, low through-put and probably damaging the MEMS devices susceptible to mechanical polishing. Herein, a room temperature treatable, high-efficient and low-cost seedless TSV process was developed with a one-step filling process by using novel electrically conductive adhesives (ECAs) filled with silver nanowires. The as-prepared ECAs could be fully cured at room temperature and exhibited excellent conductivity due to combining the benefits of both polymethyl methacrylate (PMMA) and silver nanowires. Complete filling of TSVs with the as-prepared 30 wt% silver nanowires ECAs was realized, and the resistivity of a fully filled TSV was as low as 10−3 Ω·cm. Furthermore, the application of such novel TSV filling process could also be extended to a wide range of different substrates, showing great potential in MEMS packaging, flexible microsystems and many other applications.

MEMS Post-Packaging by Localized Heating

2000 ◽  
Author(s):  
Liwei Lin
Keyword(s):  
Vapor Deposition ◽  
Microelectromechanical Systems ◽  
Chemical Vapor ◽  
Research Subject ◽  
Major Research ◽  
Research Directions ◽  
Mems Packaging ◽  
Fusion Bonding ◽  
Localized Heating ◽  
Pressure Chemical

Abstract This work addresses important post-packaging issues for microelectromechanical systems (MEMS) and introduces specific research directions by means of localized heating and bonding. MEMS packaging has become a major research subject due to the stringent packaging requirements in the emerging filed of MEMS. Establishing a versatile post-packaging process not only advances the field scientifically but also helps product commercialization in industry. An innovative post-packaging approach by localized heating and bonding is proposed and presented in this paper. Various post-packaging processes are demonstrated, including an integrated LPCVD (Low Pressure Chemical Vapor Deposition) sealing process, localized silicon-gold eutectic bonding, localized silicon-glass fusion bonding, localized solder bonding and localized CVD bonding processes.

The IP Landscape for MEMS Packaging

2009 ◽  
Author(s):  
Charles E. Bauer ◽  
Raymond A. Fillion ◽  
Herbert J. Neuhaus ◽  
Marc Papageorge
Keyword(s):  
Citation Analysis ◽  
Strategic Alliance ◽  
Market Development ◽  
Mems Devices ◽  
Strategic Framework ◽  
Mems Packaging ◽  
Thermal Requirements ◽  
Unique Mapping ◽  
Wide Range ◽  
On Line

Early MEMS devices employed packages developed for conventional semiconductor microelectronics. Today, MEMS packages reflect the unique environment, mechanical, chemical and thermal requirements of MEMS devices themselves. A casual search of on-line databases reveals nearly 40,000 patents worldwide containing the words “MEMS” and “package.” While not all relevant, the number of IP documents easily overwhelms researchers, investors and IP practitioners. The authors systematically analyze the relevant IP and organize it by generic technology categories. A unique mapping methodology provides greater understanding of the landscape of IP in the MEMS packaging arena across a wide range of considerations including geography, IP development and ownership trends, infrastructure implications and application concepts. The authors also present a rudimentary valuation of IP within the MEMS packaging field based on citation analysis. Finally, the authors demonstrate a method to develop a strategic framework based on the IP landscape useful for investment, market development and strategic alliance planning.

Microsensors, MEMS and NEMS Based Complex Adaptive Smart Devices and Systems

2001 ◽  
Author(s):  
Vijay K. Varadan
Keyword(s):  
Self Assembly ◽  
Communication Systems ◽  
Microelectromechanical Systems ◽  
System Level ◽  
Smart Devices ◽  
Mems Devices ◽  
Wafer Level ◽  
Sensors And Actuators ◽  
Complex Adaptive ◽  
Microelectronics Industry

Abstract The microelectronics industry has seen explosive growth during the last thirty years. Extremely large markets for logic and memory devices have driven the development of new materials, and technologies for the fabrication of even more complex devices with features sizes now down at the sub micron level. Recent interest has arisen in employing these materials, tools and technologies for the fabrication of miniature sensors and actuators and their integration with electronic circuits to produce smart devices and MicroElectroMechanical Systems (MEMS). This effort offers the promise of: 1. Increasing the performance and manufacturability of both sensors and actuators by exploiting new batch fabrication processes developed for the IC and microelectronics industry. Examples include micro stereo lithographic and micro molding techniques. 2. Developing novel classes of materials and mechanical structures not possible previously, such as diamond like carbon, silicon carbide and carbon nanotubes, micro-turbines and micro-engines. 3. Development of technologies for the system level and wafer level integration of micro components at the nanometer precision, such as self-assembly techniques and robotic manipulation. 4. Development of control and communication systems for MEMS devices, such as optical and RF wireless, and power delivery systems.

MEMS-Enabled Smart Beam-Steering Antennas

2014 ◽  
pp. 183-203
Author(s):  
Hadi Mirzajani ◽  
Habib Badri Ghavifekr ◽  
Esmaeil Najafi Aghdam
Keyword(s):  
Microelectromechanical Systems ◽  
Rf Mems ◽  
Beam Steering ◽  
Smart Antennas ◽  
Phase Shifters ◽  
Rapid Rate ◽  
Mems Devices ◽  
Batch Fabrication ◽  
Mems Technology ◽  
Smart Beam

In recent years, Microelectromechanical Systems (MEMS) technology has seen a rapid rate of evolution because of its great potential for advancing new products in a broad range of applications. The RF and microwave devices and components fabricated by this technology offer unsurpassed performance such as near-zero power consumption, high linearity, and cost effectiveness by batch fabrication in respect to their conventional counterparts. This chapter aims to give an in-depth overview of the most recently published methods of designing MEMS-based smart antennas. Before embarking into the different techniques of beam steering, the concept of smart antennas is introduced. Then, some fundamental concepts of MEMS technology such as micromachining technologies (bulk and surface micromachining) are briefly discussed. After that, a number of RF MEMS devices such as switches and phase shifters that have applications in beam steering antennas are introduced and their operating principals are completely explained. Finally, various configurations of MEMS-enabled beam steering antennas are discussed in detail.

A Renewal Weakest-Link Model of Strength Distribution of Polycrystalline Silicon MEMS Structures

2019 ◽  
Vol 86 (8) ◽  
Author(s):  
Zhifeng Xu ◽  
Roberto Ballarini ◽  
Jia-Liang Le
Keyword(s):  
Experimental Data ◽  
Polycrystalline Silicon ◽  
Microelectromechanical Systems ◽  
Strength Distribution ◽  
Material Strength ◽  
Mems Devices ◽  
Efficient Computation ◽  
Weakest Link ◽  
Large Size ◽  
The Stability

Experimental data have made it abundantly clear that the strength of polycrystalline silicon (poly-Si) microelectromechanical systems (MEMS) structures exhibits significant variability, which arises from the random distribution of the size and shape of sidewall defects created by the manufacturing process. Test data also indicated that the strength statistics of MEMS structures depends strongly on the structure size. Understanding the size effect on the strength distribution is of paramount importance if experimental data obtained using specimens of one size are to be used with confidence to predict the strength statistics of MEMS devices of other sizes. In this paper, we present a renewal weakest-link statistical model for the failure strength of poly-Si MEMS structures. The model takes into account the detailed statistical information of randomly distributed sidewall defects, including their geometry and spacing, in addition to the local random material strength. The large-size asymptotic behavior of the model is derived based on the stability postulate. Through the comparison with the measured strength distributions of MEMS specimens of different sizes, we show that the model is capable of capturing the size dependence of strength distribution. Based on the properties of simulated random stress field and random number of sidewall defects, a simplified method is developed for efficient computation of strength distribution of MEMS structures.

scholarly journals Stability Improvement of Flexible Shallow Shells Using Neutron Radiation

Materials ◽  
2020 ◽  
Vol 13 (14) ◽  
pp. 3187
Author(s):  
Anton V. Krysko ◽  
Jan Awrejcewicz ◽  
Irina V. Papkova ◽  
Vadim A. Krysko
Keyword(s):  
Temperature Field ◽  
Neutron Irradiation ◽  
Microelectromechanical Systems ◽  
Neutron Radiation ◽  
Middle Surface ◽  
Aviation Industry ◽  
Irradiation Effect ◽  
Structural Members ◽  
Mems Devices ◽  
Shallow Shells

Microelectromechanical systems (MEMS) are increasingly playing a significant role in the aviation industry and space exploration. Moreover, there is a need to study the neutron radiation effect on the MEMS structural members and the MEMS devices reliability in general. Experiments with MEMS structural members showed changes in their operation after exposure to neutron radiation. In this study, the neutron irradiation effect on the flexible MEMS resonators’ stability in the form of shallow rectangular shells is investigated. The theory of flexible rectangular shallow shells under the influence of both neutron irradiation and temperature field is developed. It consists of three components. First, the theory of flexible rectangular shallow shells under neutron radiation in temperature field was considered based on the Kirchhoff hypothesis and energetic Hamilton principle. Second, the theory of plasticity relaxation and cyclic loading were taken into account. Third, the Birger method of variable parameters was employed. The derived mathematical model was solved using both the finite difference method and the Bubnov–Galerkin method of higher approximations. It was established based on a few numeric examples that the irradiation direction of the MEMS structural members significantly affects the magnitude and shape of the plastic deformations’ distribution, as well as the forces magnitude in the shell middle surface, although qualitatively with the same deflection the diagrams of the main investigated functions were similar.

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