Integrated quantitative PIXE analysis and EDX spectroscopy using a laser-driven particle source

Among the existing elemental characterization techniques, particle-induced x-ray emission (PIXE) and energy-dispersive x-ray (EDX) spectroscopy are two of the most widely used in different scientific and technological fields. Here, we present the first quantitative laser-driven PIXE and laser-driven EDX experimental investigation performed at the Centro de Láseres Pulsados in Salamanca. Thanks to their potential for compactness and portability, laser-driven particle sources are very appealing for materials science applications, especially for materials analysis techniques. We demonstrate the possibility to exploit the x-ray signal produced by the co-irradiation with both electrons and protons to identify the elements in the sample. We show that, using the proton beam only, we can successfully obtain quantitative information about the sample structure through laser-driven PIXE analysis. These results pave the way toward the development of a compact and multifunctional apparatus for the elemental analysis of materials based on a laser-driven particle source.

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Opportunities for Materials Analysis with Next Generation Synchrotron Sources

Advances in X-ray Analysis ◽

10.1154/s0376030800008983 ◽

1991 ◽

Vol 35 (A) ◽

pp. 329-332

Author(s):

Michael Hart

Keyword(s):

Thin Films ◽

Synchrotron Radiation ◽

Materials Science ◽

Grazing Incidence ◽

Third Generation ◽

New Techniques ◽

Materials Analysis ◽

X Ray ◽

Radiation Sources ◽

Radiation Laboratory

AbstractPolycrystalline and powder diffraction is the most commonly practised method of x-ray analysis. During the last decade the construction of dedicated synchrotron radiation sources has resulted in the renaissance of these x-ray analysis methods; ab initio structure analysis and refinement, quantitative analysis of the structure, composition and stress in thin films and on surfaces, have all been improved. New techniques providing extremely high resolution, using anomalous dispersion, diffraction and scattering at grazing incidence to control x-ray penetration depth, have been developed. This brief review of work with W. Parrish at Stanford Synchrotron Radiation Laboratory and R. J. Cernik at the Daresbury Synchrotron Radiation Source is extended to indicate how third generation sources might be exploited in materials science.

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’Quenching and Partitioning’ - An In Situ Approach to Characterize the Process Kinetics and the Final Microstructure of TRIP-Assisted Steel

Advanced Materials Research ◽

10.4028/www.scientific.net/amr.409.713 ◽

2011 ◽

Vol 409 ◽

pp. 713-718 ◽

Cited By ~ 9

Author(s):

Thomas Rieger ◽

Klaus Herrmann ◽

Dagmar Carmele ◽

Stephan Meyer ◽

Thomas Lippmann ◽

...

Keyword(s):

Heat Treatment ◽

Elevated Temperatures ◽

Materials Science ◽

High Strength ◽

Quantitative Information ◽

Characterization Methods ◽

Quenching And Partitioning ◽

X Ray ◽

Final Microstructure

The ‘Quenching and Partitioning’ (Q&P) concept aims to increase the strength level of conventional TRIP-assisted advanced high strength steel (AHSS) by replacing ferritic constituents by tempered martensite. The Q&P heat treatment process involves austenitization and interrupted quenching followed by carbon partitioning from martensite to austenite at elevated temperatures. The final microstructure is traditionally investigated at room temperature after metallographic preparation by microscopy and x-ray analysis with laboratory tubes. Besides other disadvantages the established characterization methods are not adequate to observe the development of the microstructure during Q&P treatment. In the present work the microstructural evolution during Q&P processing was monitored by in-situ diffraction experiments using very hard (100 keV) synchrotron x-ray radiation. Debye-Scherrer rings were recorded as a function of time and temperature during the heat treatment in a state-of-the-art dilatometer (type Bähr DIL805AD) at the Engineering Materials Science beamline HARWI-II (HZG outstation at Deutsches Elektronensynchrotron (DESY), Hamburg). The diffraction patterns contain quantitative information on the phases present in the sample (for more details cf. Abstract Carmele et al, this conference). The evolution of the austenite phase fraction during the partitioning treatment at the quench temperature (1-step Q&P) is discussed exemplarily for a Si-based TRIP steel with additions of Ni.

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XRF and PIXE Analysis of light and Dark Adapted Ocular Tissue

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100053619 ◽

1982 ◽

Vol 40 ◽

pp. 190-191

Author(s):

B. J. Panessa ◽

H. W. Kraner ◽

J. B. Warren ◽

K. W. Jones

Keyword(s):

Trace Metals ◽

Pigment Epithelium ◽

Nerve Impulse ◽

Light Response ◽

Ocular Tissue ◽

Emission Spectrometry ◽

Retinol Dehydrogenase ◽

Pixe Analysis ◽

X Ray ◽

Optimal Function

During photoexcitation the retina requires specific electrolytes and trace metals for optimal function (Na, Mg, Cl, K, Ca, S, P, Cu and Zn). According to Hagins (1981), photoexcitation and generation of a nerve impulse involves the movement of Ca from the rhodopsin-ladened membranes of the rod outer segment (ROS) to the plasmalemma, which in turn decreases the in-flow of Na into the photoreceptor, resulting in hyperpolarization. In toad isolated retinas, the presence of Ba has been found to increase the amplitude and prolong the delay of the light response (Brown and Flaming, 1978). Trace metals such as Cu, Zn and Se are essential for the activity of the metalloenzymes of the retina and retina pigment epithelium (RPE) (i.e. carbonic anhydrase, retinol dehydrogenase, tyrosinase, glutathione peroxidase, superoxide dismutase...). Therefore the content and fluctuations of these elements in the retina and choroid are of fundamental importance for the maintenance of vision. This paper presents elemental data from light and dark adapted frog ocular tissues examined by electron beam induced x-ray microanalysis, x-ray fluorescence spectrometry (XRF) and proton induced x-ray emission spectrometry (PIXE).

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Energy Dispersive X-Ray Measurements of thin Metal Foils

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100092098 ◽

1976 ◽

Vol 34 ◽

pp. 426-427

Author(s):

J. Bentley ◽

E. A. Kenik

Keyword(s):

Materials Science ◽

Energy Dispersive Spectrometer ◽

Thin Foil ◽

Thin Metal ◽

Energy Dispersive ◽

Thin Specimen ◽

X Ray ◽

Metal Foils ◽

Small Probe ◽

Scanning Transmission

Instruments combining a 100 kV transmission electron microscope (TEM) with scanning transmission (STEM), secondary electron (SEM) and x-ray energy dispersive spectrometer (EDS) attachments to give analytical capabilities are becoming increasingly available and useful. Some typical applications in the field of materials science which make use of the small probe size and thin specimen geometry are the chemical analysis of small precipitates contained within a thin foil and the measurement of chemical concentration profiles near microstructural features such as grain boundaries, point defect clusters, dislocations, or precipitates. Quantitative x-ray analysis of bulk samples using EDS on a conventional SEM is reasonably well established, but much less work has been performed on thin metal foils using the higher accelerating voltages available in TEM based instruments.

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X-ray microprobe for materials science

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100168013 ◽

1994 ◽

Vol 52 ◽

pp. 56-57

Author(s):

G.E. Ice

Keyword(s):

Crystallographic Orientation ◽

Local Structure ◽

Materials Science ◽

Chemical Information ◽

X Ray Diffraction ◽

Ray Optics ◽

X Ray ◽

Novel Materials ◽

New Information ◽

Elemental Sensitivity

The increasing availability of synchrotron x-ray sources has stimulated the development of advanced hard x-ray (E≥5 keV) microprobes. With new x-ray optics these microprobes can achieve micron and submicron spatial resolutions. The inherent elemental and crystallographic sensitivity of an x-ray microprobe and its inherently nondestructive and penetrating nature will have important applications to materials science. For example, x-ray fluorescent microanalysis of materials can reveal elemental distributions with greater sensitivity than alternative nondestructive probes. In materials, segregation and nonuniform distributions are the rule rather than the exception. Common interfaces to whichsegregation occurs are surfaces, grain and precipitate boundaries, dislocations, and surfaces formed by defects such as vacancy and interstitial configurations. In addition to chemical information, an x-ray diffraction microprobe can reveal the local structure of a material by detecting its phase, crystallographic orientation and strain.Demonstration experiments have already exploited the penetrating nature of an x-ray microprobe and its inherent elemental sensitivity to provide new information about elemental distributions in novel materials.

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Electron holography of interfaces in electroceramics

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100151271 ◽

1993 ◽

Vol 51 ◽

pp. 1088-1089

Author(s):

Vinayak P. Dravid ◽

V. Ravikumar ◽

Richard Plass

Keyword(s):

Space Charge ◽

Direct Evidence ◽

Materials Science ◽

Theoretical Work ◽

Electron Holography ◽

Resolution Limit ◽

Interference Phenomenon ◽

X Ray ◽

Electron Sources ◽

Science Community

With the advent of coherent electron sources with cold field emission guns (cFEGs), it has become possible to utilize the coherent interference phenomenon and perform “practical” electron holography. Historically, holography was envisioned to extent the resolution limit by compensating coherent aberrations. Indeed such work has been done with reasonable success in a few laboratories around the world. However, it is the ability of electron holography to map electrical and magnetic fields which has caught considerable attention of materials science community.There has been considerable theoretical work on formation of space charge on surfaces and internal interfaces. In particular, formation and nature of space charge have important implications for the performance of numerous electroceramics which derive their useful properties from electrically active grain boundaries. Bonnell and coworkers, in their elegant STM experiments provided the direct evidence for GB space charge and its sign, while Chiang et al. used the indirect but powerful technique of x-ray microchemical profiling across GBs to infer the nature of space charge.

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X-ray mapping without STEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s042482010017027x ◽

1994 ◽

Vol 52 ◽

pp. 508-509

Author(s):

Judith M. Brock ◽

Max T. Otten

Keyword(s):

Life Science ◽

Materials Science ◽

Chemical Elements ◽

Full Description ◽

Scanning System ◽

Elemental Distribution ◽

X Ray ◽

Transmission Electron ◽

Distribution Of Elements ◽

Made In

A knowledge of the distribution of chemical elements in a specimen is often highly useful. In materials science specimens features such as grain boundaries and precipitates generally force a certain order on mental distribution, so that a single profile away from the boundary or precipitate gives a full description of all relevant data. No such simplicity can be assumed in life science specimens, where elements can occur various combinations and in different concentrations in tissue. In the latter case a two-dimensional elemental-distribution image is required to describe the material adequately. X-ray mapping provides such of the distribution of elements.The big disadvantage of x-ray mapping hitherto has been one requirement: the transmission electron microscope must have the scanning function. In cases where the STEM functionality – to record scanning images using a variety of STEM detectors – is not used, but only x-ray mapping is intended, a significant investment must still be made in the scanning system: electronics that drive the beam, detectors for generating the scanning images, and monitors for displaying and recording the images.

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Electronic Package Failure Analysis Using TDR

ISTFA 2000: Conference Proceedings from the 26th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2000p0277 ◽

2000 ◽

Author(s):

Dima A. Smolyansky

Keyword(s):

Failure Analysis ◽

Fault Location ◽

Measurement Accuracy ◽

Time Domain Reflectometry ◽

Acoustic Imaging ◽

X Ray ◽

Analysis Techniques ◽

Bga Packages ◽

Impedance Profile ◽

Nature Of Time

Abstract The visual nature of Time Domain Reflectometry (TDR) makes it a very natural technology that can assist with fault location in BGA packages, which typically have complex interweaving layouts that make standard failure analysis techniques, such as acoustic imaging and X-ray, less effective and more difficult to utilize. This article discusses the use of TDR for package failure analysis work. It analyzes in detail the TDR impedance deconvolution algorithm as applicable to electronic packaging fault location work, focusing on the opportunities that impedance deconvolution and the resulting true impedance profile opens up for such work. The article examines the TDR measurement accuracy and the comparative package failure analysis, and presents three main considerations for package failure analysis. It also touches upon the goal and the task of the failure analysts and TDR's specific signatures for the open and short connections.

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Solvent-Controlled Self-Assembled Oligopyrrolic Receptor

Molecules ◽

10.3390/molecules26061771 ◽

2021 ◽

Vol 26 (6) ◽

pp. 1771

Author(s):

Fei Wang ◽

Kejiang Liang ◽

Mads Christian Larsen ◽

Steffen Bähring ◽

Masatoshi Ishida ◽

...

Keyword(s):

Materials Science ◽

Science Research ◽

Polymeric Chain ◽

Supramolecular System ◽

Receptor System ◽

One Dimensional ◽

X Ray ◽

Host Guest Complex ◽

Colorimetric Response ◽

Strong Acids

We report a fully organic pyridine-tetrapyrrolic U-shaped acyclic receptor 10, which prefers a supramolecular pseudo-macrocyclic dimeric structure (10)2 in a less polar, non-coordinating solvent (e.g., CHCl3). Conversely, when it is crystalized from a polar, coordinating solvent (e.g., N,N-dimethylformamide, DMF), it exhibited an infinite supramolecular one-dimensional (1D) “zig-zag” polymeric chain, as inferred from the single-crystal X-ray structures. This supramolecular system acts as a potential receptor for strong acids, e.g., p-toluenesulfonic acid (PTSA), methane sulfonic acid (MSA), H2SO4, HNO3, and HCl, with a prominent colorimetric response from pale yellow to deep red. The receptor can easily be recovered from the organic solution of the host–guest complex by simple aqueous washing. It was observed that relatively stronger acids with pKa < −1.92 in water were able to interact with the receptor, as inferred from 1H NMR titration in tetrahydrofuran-d8 (THF-d8) and ultraviolet–visible (UV–vis) spectroscopic titrations in anhydrous THF at 298 K. Therefore, this new dynamic supramolecular receptor system may have potentiality in materials science research.

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