MICROSTRUCTURE AND PROPERTIES OF FERROELECTRIC Bi4Ti3O12 THIN FILMS
1999 ◽
Vol 13
(26)
◽
pp. 933-945
◽
Keyword(s):
The film morphology and defect structure of ferroelectric bismuth titanate thin films are studied by high resolution transmission electron microscopy. As-grown and RTA-processed thin films have similar defect structures, consisting of stacking faults and complex intergrowth defect structures. The as-grown specimens prepared at low temperature had smaller particle size with higher density of these defects compared to RTA-processed samples. Detailed atomic structure models for the stacking faults and intergrowth defect structures are proposed and the computer-simulated images are compared with experiment.
Transmission Electron Microscopy studies of texture of Cr underlayer of magnetic recording hard disk
1991 ◽
Vol 49
◽
pp. 580-581
1990 ◽
Vol 48
(2)
◽
pp. 336-337
1990 ◽
Vol 48
(4)
◽
pp. 68-69
1990 ◽
Vol 48
(4)
◽
pp. 574-575