On the correct interpretation of compression experiments of micropillars produced by a focused ion beam

2016 ◽  
Vol 25 (3-4) ◽  
pp. 83-87
Author(s):  
Avraam A. Konstantinidis ◽  
Konstantinos Michos ◽  
Elias C. Aifantis
Keyword(s):  
Metallic Glasses ◽  
Elastic Moduli ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Short Note ◽  
Threshold Value ◽  
Correct Interpretation ◽  
Brittle To Ductile Transition ◽  
Open Questions ◽  
Micropillar Compression

AbstractThe modest goal of this short note is to shed some light on the correct interpretation of micro/nanopillar compression experiments. We propose a modification of the way the stress-strain response in such experiments is calculated, aiming at answering open questions pertaining to discrepancies between the elastic moduli values calculated through micropillar compression experiments with those of the bulk materials, as well as the brittle-to-ductile transition in bulk metallic glasses (BMGs) when the size of the pillars is reduced below a certain threshold value.

scholarly journals Low-temperature rheology of calcite

2019 ◽  
Vol 221 (1) ◽  
pp. 129-141 ◽  
Author(s):  
Michael K Sly ◽  
Arashdeep S Thind ◽  
Rohan Mishra ◽  
Katharine M Flores ◽  
Philip Skemer
Keyword(s):  
Low Temperature ◽  
Yield Stress ◽  
Low Temperatures ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Polycrystalline Sample ◽  
Small Scale ◽  
Indentation Hardness ◽  
Micropillar Compression ◽  
Flow Laws

SUMMARY Low-temperature plastic rheology of calcite plays a significant role in the dynamics of Earth's crust. However, it is technically challenging to study plastic rheology at low temperatures because of the high confining pressures required to inhibit fracturing. Micromechanical tests, such as nanoindentation and micropillar compression, can provide insight into plastic rheology under these conditions because, due to the small scale, plastic deformation can be achieved at low temperatures without the need for secondary confinement. In this study, nanoindentation and micropillar compression experiments were performed on oriented grains within a polycrystalline sample of Carrara marble at temperatures ranging from 23 to 175 °C, using a nanoindenter. Indentation hardness is acquired directly from nanoindentation experiments. These data are then used to calculate yield stress as a function of temperature using numerical approaches that model the stress state under the indenter. Indentation data are complemented by uniaxial micropillar compression experiments. Cylindrical micropillars ∼1 and ∼3 μm in diameter were fabricated using a focused ion beam-based micromachining technique. Yield stress in micropillar experiments is determined directly from the applied load and micropillar dimensions. Mechanical data are fit to constitutive flow laws for low-temperature plasticity and compared to extrapolations of similar flow laws from high-temperature experiments. This study also considered the effects of crystallographic orientation on yield stress in calcite. Although there is a clear orientation dependence to plastic yielding, this effect is relatively small in comparison to the influence of temperature.

Revelation of the effect of structural heterogeneity on microplasticity in bulk metallic-glasses

2010 ◽  
Vol 25 (3) ◽  
pp. 563-575 ◽  
Author(s):  
Yong Yang ◽  
Jianchao Ye ◽  
Jian Lu ◽  
Qing Wang ◽  
Peter K. Liaw
Keyword(s):  
Metallic Glasses ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Shear Banding ◽  
Shear Bands ◽  
Bulk Metallic Glasses ◽  
Three Dimensional ◽  
Structural Heterogeneity ◽  
Submicron Scale ◽  
Three Dimensional Finite Element

In this article, the shear-banding behavior in bulk metallic-glasses (BMGs) is studied using a focused ion beam (FIB)-based nanoindentation method, which involves cylindrical nanoindentation of a FIB-milled BMG microlamella and is capable of revealing the subsurface shear-band patterns down to the submicron scale. The results of the current study on a Zr-based BMG clearly show that short shear bands, with the lengths of a few hundred nanometers, could be severely kinked before growing into a longer one, which implies that structural heterogeneity plays an important role in the microplasticity of BMGs. Furthermore, through the three-dimensional finite-element simulation combined with the theoretical calculation based on the Mohr–Coulomb law, it is found that the yield strengths exhibit a large scatter as a consequence of the structural heterogeneity when microplasticity occurs in the Zr-based BMG, which is consistent with our recent findings obtained from the microcompression experiments.

Micropillar Compression of MoSi2 Single Crystals

2015 ◽  
Vol 1760 ◽  
Author(s):  
Satoshi Nakatsuka ◽  
Kyosuke Kishida ◽  
Haruyuki Inui
Keyword(s):  
Slip System ◽  
Room Temperature ◽  
Focused Ion Beam ◽  
Size Dependence ◽  
Ion Beam ◽  
Edge Length ◽  
Approximate Power ◽  
Micropillar Compression ◽  
Temperature Activation ◽  
Image Position

ABSTRACTDeformation behavior of MoSi2 has been studied by micropillar compressions of single crystalline specimens prepared by focused ion beam (FIB) technique as a function of crystal orientation at room temperature. Activation of the {011}<100> and {01$\overline 3$}<331> slip systems were observed in the micropillars compressed along [$\overline 1$10] and [0 15 1], respectively. The CRSS values for each slip system exhibit an approximate power law relationship with the edge length of micropillar. The {01$\overline 3$}<331> slip exhibit much stronger size-dependence than the {011}<100> slip system.

Nanocomposite Polyurethane Foams Via POSS Blends

2002 ◽  
Vol 733 ◽  
Author(s):  
Brock McCabe ◽  
Steven Nutt ◽  
Brent Viers ◽  
Tim Haddad
Keyword(s):  
High Temperature ◽  
Sample Preparation ◽  
Room Temperature ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Polyurethane Foams ◽  
Development Projects ◽  
Polymer Systems ◽  
Polyurethane Resin ◽  
Military Development

AbstractPolyhedral Oligomeric Silsequioxane molecules have been incorporated into a commercial polyurethane formulation to produce nanocomposite polyurethane foam. This tiny POSS silica molecule has been used successfully to enhance the performance of polymer systems using co-polymerization and blend strategies. In our investigation, we chose a high-temperature MDI Polyurethane resin foam currently used in military development projects. For the nanofiller, or “blend”, Cp7T7(OH)3 POSS was chosen. Structural characterization was accomplished by TEM and SEM to determine POSS dispersion and cell morphology, respectively. Thermal behavior was investigated by TGA. Two methods of TEM sample preparation were employed, Focused Ion Beam and Ultramicrotomy (room temperature).

An Study of Influence of Imperfections on the Delamination of Diamond-Like Carbon Films

2002 ◽  
Vol 719 ◽  
Author(s):  
Myoung-Woon Moon ◽  
Kyang-Ryel Lee ◽  
Jin-Won Chung ◽  
Kyu Hwan Oh
Keyword(s):  
Cross Sections ◽  
Focused Ion Beam ◽  
Imaging System ◽  
Ion Beam ◽  
Carbon Films ◽  
Diamond Like Carbon ◽  
Glass Substrates ◽  
Atomic Force ◽  
Initiation And Propagation

AbstractThe role of imperfections on the initiation and propagation of interface delaminations in compressed thin films has been analyzed using experiments with diamond-like carbon (DLC) films deposited onto glass substrates. The surface topologies and interface separations have been characterized by using the Atomic Force Microscope (AFM) and the Focused Ion Beam (FIB) imaging system. The lengths and amplitudes of numerous imperfections have been measured by AFM and the interface separations characterized on cross sections made with the FIB. Chemical analysis of several sites, performed using Auger Electron Spectroscopy (AES), has revealed the origin of the imperfections. The incidence of buckles has been correlated with the imperfection length.

Low Energy Ar Ion Milling of FIB TEM Specimens from 14 nm and Future FinFET Technologies

2018 ◽  
Author(s):  
C.S. Bonifacio ◽  
P. Nowakowski ◽  
M.J. Campin ◽  
M.L. Ray ◽  
P.E. Fischione
Keyword(s):  
Field Effect Transistor ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Specimen Preparation ◽  
Ion Milling ◽  
Transmission Electron ◽  
High Resolution Tem ◽  
Effect Transistor ◽  
20 Nm ◽  
Argon Ion

Abstract Transmission electron microscopy (TEM) specimens are typically prepared using the focused ion beam (FIB) due to its site specificity, and fast and accurate thinning capabilities. However, TEM and high-resolution TEM (HRTEM) analysis may be limited due to the resulting FIB-induced artifacts. This work identifies FIB artifacts and presents the use of argon ion milling for the removal of FIB-induced damage for reproducible TEM specimen preparation of current and future fin field effect transistor (FinFET) technologies. Subsequently, high-quality and electron-transparent TEM specimens of less than 20 nm are obtained.

Automated Diagonal Slice and View Solution for 3D Device Structure Analysis

2018 ◽  
Author(s):  
Sang Hoon Lee ◽  
Jeff Blackwood ◽  
Stacey Stone ◽  
Michael Schmidt ◽  
Mark Williamson ◽  
...  
Keyword(s):  
Cross Section ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Image Data ◽  
Planar Surface ◽  
Device Structure ◽  
Cross Sectional ◽  
Device Structures ◽  
The Cross ◽  
Planar Analysis

Abstract The cross-sectional and planar analysis of current generation 3D device structures can be analyzed using a single Focused Ion Beam (FIB) mill. This is achieved using a diagonal milling technique that exposes a multilayer planar surface as well as the cross-section. this provides image data allowing for an efficient method to monitor the fabrication process and find device design errors. This process saves tremendous sample-to-data time, decreasing it from days to hours while still providing precise defect and structure data.

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