Adhesion of polymer–inorganic interfaces by nanoindentation

2001 ◽  
Vol 16 (12) ◽  
pp. 3378-3388 ◽  
Author(s):  
Min Li ◽  
C. Barry Carter ◽  
Marc A. Hillmyer ◽  
William W. Gerberich
Keyword(s):  
Fracture Toughness ◽  
Atomic Force Microscopy ◽  
Fracture Surface ◽  
Surface Characterization ◽  
Process Zone ◽  
Crack Arrest ◽  
Force Microscopy ◽  
Atomic Force ◽  
Glass Interface ◽  
Good Agreement

Nanoindentation combined with atomic force microscopy was applied to measure the fracture toughness of polystyrene/glass interfaces. Film delamination occurs when the inelastic penetration depth approximately equals or exceeds the film thickness. The delamination size was accurately measured using atomic force microscopy. Using multilayer indentation and annular-plate analyses, the interfacial fracture toughness was then assessed. The values obtained from the two analyses are in good agreement with the fracture toughness of the interface being approximately 350 mJ/m2. By appropriate fracture surface characterization, it was shown that fracture occurs along the polystyrene/glass interface. Crack arrest marks were observed, and their possible cause discussed. On the basis of the morphology of the fracture surface, the fracture toughness was also evaluated using a process zone analysis. The result agrees well with those obtained from the other two analyses.

ATOMIC FORCE MICROSCOPY AND XRD ANALYSIS OF SILVER FILMS DEPOSITED BY THERMAL EVAPORATION

2006 ◽  
Vol 20 (02) ◽  
pp. 217-231 ◽  
Author(s):  
MUHAMMAD MAQBOOL ◽  
TAHIRZEB KHAN
Keyword(s):  
Atomic Force Microscopy ◽  
Grain Size ◽  
Surface Characterization ◽  
Room Temperature ◽  
Thermal Evaporation ◽  
Xrd Analysis ◽  
Force Microscopy ◽  
Atomic Force ◽  
Average Grain Size ◽  
20 Nm

Thin films of pure silver were deposited on glass substrate by thermal evaporation process at room temperature. Surface characterization of the films was performed using X-ray diffraction (XRD) and atomic force microscopy (AFM). Thickness of the films varied between 20 nm and 72.8 nm. XRD analysis provided a sharp peak at 38.75° from silver. These results indicated that the films deposited on glass substrates at room temperature are crystalline. Three-dimension and top view pictures of the films were obtained by AFM to study the grain size and its dependency on various factors. Average grain size increased with the thickness of the deposited films. A minimum grain size of 8 nm was obtained for 20 nm thick films, reaching 41.9 nm when the film size reaches 60 nm. Grain size was calculated from the information provided by the XRD spectrum and averaging method. We could not find any sequential variation in the grain size with the growth rate.

Nanofractography Of Composition B Fracture Surfaces with AFM

2003 ◽  
Vol 800 ◽  
Author(s):  
Y. D. Lanzerotti ◽  
J. Sharma ◽  
R. W. Armstrong ◽  
R. L. McKenney ◽  
T. R. Krawietz
Keyword(s):  
Atomic Force Microscopy ◽  
Tensile Strength ◽  
Fracture Surface ◽  
Surface Morphology ◽  
Fracture Surface Morphology ◽  
Fine Scale ◽  
Force Microscopy ◽  
Atomic Force ◽  
High Acceleration ◽  
Columnar Grains

ABSTRACTThe characteristics of TNT (trinitrotoluene) crystals in the fracture surface of Composition B (a melt-cast mixture of TNT and RDX) have been studied using atomic force microscopy (AFM). The size of TNT crystals has been examined by analyzing the surface structure that is exhibited after mechanical failure of the Composition B. The failure occurs when the material is subjected to high acceleration in an ultracentrifuge and the shear or tensile strength is exceeded. AFM examination of the topography of the Composition B fracture surface reveals fracture across columnar grains of the TNT. The width of the columnar TNT grains ranges in size from ∼ 1 μm to ∼ 2 μm. Their height ranges in size from ∼ 50 nm to ∼ 300 nm. Flat TNT columns alternate with TNT columns containing river patterns that identify the direction of crack growth. Steps in the river patterns are a few nanometers in depth. The TNT constitutent fracture surface morphology is shown to occur on such fine scale, beginning from adjacent columnar crystals only 1–2 μm in width, and including river marking step heights of only a few nanometers, that AFM-type resolution is required.

Surface Characterization of Fe-Ag Thin Films by Atomic Force Microscopy

2004 ◽  
Vol 20-21 ◽  
pp. 611-616
Author(s):  
José M. Barandiarán ◽  
Iñaki Orue ◽  
M.L. Fdez-Gubieda ◽  
A. García Prieto
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Surface Characterization ◽  
Force Microscopy ◽  
Atomic Force

Chemisorptive electron emission and atomic force microscopy as probes of plastic deformation during fracture at a metal/glass interface

1995 ◽  
Vol 10 (8) ◽  
pp. 2033-2041 ◽  
Author(s):  
Sumio Nakahara ◽  
S.C. Langford ◽  
J.T. Dickinson
Keyword(s):  
Plastic Deformation ◽  
Atomic Force Microscopy ◽  
Electron Emission ◽  
Metallic Phase ◽  
Ductile Deformation ◽  
Strongly Correlated ◽  
Force Microscopy ◽  
Atomic Force ◽  
Glass Interface ◽  
Reactive Gas

We examine the use of chemisorptive emission (electron emission accompanying the adsorption of a reactive gas on a metal surface) and atomic force microscopy as measures of plastic deformation during fracture along a metallic Mg/glass interface. Localized ductile deformation in the metallic phase enhances the fracture energy, exposes metallic Mg to the reactive O2 atmosphere, and produces intense emissions. The number of electrons emitted following fracture in low-pressure oxygen atmospheres is strongly correlated with the total energy expended during failure (peel energy). The presence of localized ductile deformation is verified by atomic force microscopy (AFM): voids are observed on surfaces yielding significant cmissions and enhanced fracture energies. These voids are not observed on samples yielding the lowest peel energies and emission intensities, i.e., where the contribution of deformation to the peel energy is negligible. Quantitative use of roughness data derived from the AFM images is, however, problematic. The potential for chemisorptive electron emission as a probe of deformation along interfaces involving Mg, Ti, Zr, and Al is promising.

In situ microscopic surface characterization studies of polymeric thin films during tensile deformation using atomic force microscopy

2001 ◽  
Vol 16 (3) ◽  
pp. 844-855 ◽  
Author(s):  
M. S. Bobji ◽  
Bharat Bhushan
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Characterization ◽  
Tensile Deformation ◽  
Tensile Tests ◽  
Control Area ◽  
Polymeric Thin Films ◽  
Force Microscopy ◽  
Atomic Force ◽  
Different Strains

Atomic force microscopy (AFM) has been used to study the cracks developed on thin-film coatings on a polymer substrate subjected to external tension. To conduct in situ tensile tests in AFM, a special stage has been built. A new technique to image the same control area at different strains was developed and used to study the propagation of a crack with increasing strain in magnetic tapes. Metal particulate tapes developed numerous cracks of shorter length, perpendicular to the loading direction. In contrast, metal-evaporated tapes developed cracks that extend edge to edge. The variation of the crack width and the spacing with strain were measured and explained with the help of models based on elasticity.

scholarly journals Atomic Force Microscopy on Biological Materials Related to Pathological Conditions

Scanning ◽  
2019 ◽  
Vol 2019 ◽  
pp. 1-25 ◽  
Author(s):  
Andreas Stylianou ◽  
Stylianos-Vasileios Kontomaris ◽  
Colin Grant ◽  
Eleni Alexandratou
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Surface Characterization ◽  
Amyloid Fibrils ◽  
Biological Materials ◽  
Force Microscopy ◽  
Fibrous Protein ◽  
Atomic Force ◽  
Pathological Conditions ◽  
Wide Range

Atomic force microscopy (AFM) is an easy-to-use, powerful, high-resolution microscope that allows the user to image any surface and under any aqueous condition. AFM has been used in the investigation of the structural and mechanical properties of a wide range of biological matters including biomolecules, biomaterials, cells, and tissues. It provides the capacity to acquire high-resolution images of biosamples at the nanoscale and allows at readily carrying out mechanical characterization. The capacity of AFM to image and interact with surfaces, under physiologically relevant conditions, is of great importance for realistic and accurate medical and pharmaceutical applications. The aim of this paper is to review recent trends of the use of AFM on biological materials related to health and sickness. First, we present AFM components and its different imaging modes and we continue with combined imaging and coupled AFM systems. Then, we discuss the use of AFM to nanocharacterize collagen, the major fibrous protein of the human body, which has been correlated with many pathological conditions. In the next section, AFM nanolevel surface characterization as a tool to detect possible pathological conditions such as osteoarthritis and cancer is presented. Finally, we demonstrate the use of AFM for studying other pathological conditions, such as Alzheimer’s disease and human immunodeficiency virus (HIV), through the investigation of amyloid fibrils and viruses, respectively. Consequently, AFM stands out as the ideal research instrument for exploring the detection of pathological conditions even at very early stages, making it very attractive in the area of bio- and nanomedicine.

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