Radiation damages on mesoporous silica thin films and bulk materials

2013 ◽  
Vol 1514 ◽  
pp. 69-74
Author(s):  
X. Deschanels ◽  
S. Dourdain ◽  
C. Rey ◽  
G. Toquer ◽  
A. Grandjean ◽  
...  

ABSTRACTMesoporous silicas are highly potential materials for applications in the nuclear field like separation, recycling or nuclear wastes confinement. In this work, the effects of the radiation damage on the mesoporous network were investigated by XRR (X-Rays Reflectivity) and nitrogen adsorption isotherm on respectively mesoporous organized thin films (SBA) and disordered bulk mesoporous materials (Vycor glass). The article attempts to answer the question of the existence of a relationship between the rigidity of the mesoporous silica network, and the behavior of silica materials under irradiation.

2014 ◽  
Vol 70 (a1) ◽  
pp. C892-C892
Author(s):  
Yasuhiro Sakamoto

Materials with mesoscale structural characteristics have attracted great attention across the fields of chemistry, physics, and materials science. A typical example is mesoporous silica, which are synthesized in water/surfactant/silica systems, and has well-defined mesopores resulting in high surface area. Mesoporous silicas have two defining structural characteristics: (i) disorder at the atomic scale, i.e. only short-range order; and (ii) distinct order at the mesoscale, i.e. long-range order. Atomic-scale structural characterization by common diffraction techniques, such as X-ray single crystal diffraction, is challenging for these partially ordered materials. This is because of the difficulty in obtaining large (> 10 µm) single crystals, and because large-distance periodic features cause diffraction intensities to fall off rapidly with scattering angle, so that only limited small-angle data are available. On the other hand, transmission electron microscopy (TEM) is a powerful tool for structural characterization at the mesoscale level due to the stronger interaction of electrons with matter compared to X-rays, enabling the use of very small crystals. In particular, high-resolution TEM (HRTEM) images give the phase and the amplitude of the crystal structure factors experimentally, leading to a 3D structural model by electron crystallography. Cage-type anionic-surfactant-templated mesoporous silicas display rich structural diversity. Among them, cage-type mesoporous silica with tetrahedrally close-packed (TCP) structures can be described by four types of polyhedra, 5^12, 5^12 6^2, 5^12 6^3, and 5^12 6^4.[1] A variety of structural polymorph have been observed and characterized by TEM. Their structures show a close resemblance to the Frank-Kasper phases, which are well known in intermetallic compounds. We found mesoporous silica with dodecagonal quasicrystalline ordering as one of the TCP structures (Figure).[2] In this presentation, I will discuss structural characterization of aperiodic crystals at the mesoscale, such as mesoporous silicas and binary colloidal crystals, by electron microscopy.


2007 ◽  
Vol 1056 ◽  
Author(s):  
Kenji Murakami ◽  
Kiyoshi Fuda ◽  
Mikio Sugai

ABSTRACTMesoporous silicas functionalized with aminopropyl groups were synthesized by co-condensation of tetraethoxysilane (TEOS) and 3-aminopropyl triethoxysilane (APTES) and characterized by nitrogen adsorption-desorption measurements. The pore volume drastically decreased from about 900 mm3/g for the unfunctionalized mesoporous silica to about 300 mm3/g for the aminopropyl-functionalized mesoporous silica (1.65 mmol-NH2/g). This result was explained in terms of the surface density of the aminopropyl groups in the pore.


RSC Advances ◽  
2021 ◽  
Vol 11 (17) ◽  
pp. 10010-10017
Author(s):  
Ping-Chung Kuo ◽  
Zhi-Xun Lin ◽  
Tzi-Yi Wu ◽  
Chun-Han Hsu ◽  
Hong-Ping Lin ◽  
...  

Mesoporous silica films were used as supports with high loading capacity and enzyme activity.


1988 ◽  
Vol 32 ◽  
pp. 105-114 ◽  
Author(s):  
H. Schwenke ◽  
W. Berneike ◽  
J. Knoth ◽  
U. Weisbrod

AbstractThe total reflection of X-rays is mainly determined by three parameters , that is the orltical angle, the reflectivity and the penetration depth. For X-ray fluorescence analysis the respective characteristic features can be exploited in two rather different fields of application. In the analysis of trace elements in samples placed as thin films on optical flats, detection limits as low as 2 pg or 0.05 ppb, respectively, have been obtained. In addition, a penetration depth in the nanometer regime renders Total Reflection XRF an inherently sensitive method for the elemental analysis of surfaces. This paper outlines the main physical and constructional parameters for instrumental design and quantitation in both branches of TXRF.


2000 ◽  
Vol 361-362 ◽  
pp. 130-134 ◽  
Author(s):  
M.E Beck ◽  
T Weiss ◽  
D Fischer ◽  
S Fiechter ◽  
A Jäger-Waldau ◽  
...  

2006 ◽  
Vol 05 (04n05) ◽  
pp. 627-631 ◽  
Author(s):  
M. J. SUN ◽  
G. P. ZHAO ◽  
J. LIANG ◽  
G. ZHOU ◽  
H. S. LIM ◽  
...  

A simplified micromagnetic model has been proposed to calculate the hysteresis loops of nanostructured permanent magnets for various configurations, including thin films, exchange-coupled double-layer systems and bulk materials. The reversal part of the hysteresis is based on the Stoner–Wohlfarth coherent rotational model and the coercivity mechanism is due mainly to the motion of the transition region (a domain wall like magnetic moment distribution in the grain boundary). The elements of nucleation and pinning models are also incorporated.


2005 ◽  
Vol 17 (8) ◽  
pp. 1035-1039 ◽  
Author(s):  
H. Fukumoto ◽  
S. Nagano ◽  
N. Kawatsuki ◽  
T. Seki

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