Afm Study of CeO2 Growth on Sapphire as a Buffer Layer for YBa2Cu3O7

1995 ◽  
Vol 401 ◽  
Author(s):  
M. W. Denhoff ◽  
B. F. Mason ◽  
H. T. Tran ◽  
P. D. Grant
Keyword(s):  
Ybco Film ◽  
Three Dimensional ◽  
Layer Growth ◽  
Granular Structure ◽  
Atomic Scale ◽  
Laser Deposition ◽  
Layer By Layer ◽  
Temperature Dependent ◽  
Force Microscopy ◽  
Atomic Force

AbstractThe structure of CeO2 films grown on (1102) sapphire and on YBCO thin films was investigated. The films reported on here were grown by pulsed excimer laser deposition and their surface structure was probed using atomic force microscopy. We found that CeO2 films grown on sapphire were epitaxial with a granular structure which is smooth on an atomic scale. We see evidence of a surface reconstruction on a very smooth CeO2 (100) oriented surface. At higher growth temperatures, three dimensional islands begin to form. When a CeO2 film is grown on top of a YBCO film, the growth mode is two dimensional. The steps in this layer by layer growth are a surprisingly large 2 nm. This is about equal to 4 times the CeO2 lattice constant. This step height appears to be temperature dependent.

Preparation of (111)-Oriented Pt Electrode Films with Quasi-Monocrystal Properties on MgO/TiN Buffered Si(100) by PLD

2007 ◽  
Vol 280-283 ◽  
pp. 823-826 ◽  
Author(s):  
Tong Lai Chen ◽  
Xiao Min Li
Keyword(s):  
High Energy ◽  
Layer Growth ◽  
Atomic Scale ◽  
Layer By Layer ◽  
X Ray Diffraction ◽  
Pt Electrode ◽  
Force Microscopy ◽  
Atomic Force

Atomic-scale smooth Pt electrode films have been deposited on MgO/TiN buffered Si (100) by the pulsed laser deposition (PLD) technique. The whole growth process of the multilayer films was monitored by using in-situ reflection high energy electron diffraction (RHEED) apparatus. The Pt/MgO/TiN/Si(100) stacked structure was also characterized by X-ray diffraction (XRD), atomic force microscopy (AFM) and scanning electron microscopy (SEM). The HREED observations show that the growth mode of the Pt electrode film is 2D layer-by-layer growth. It is found that the (111)-oriented Pt electrode film has a crystallinity comparable to that of monocrystals. The achievement of the quasi-single-crystal Pt electrode film with an atomic-scale smooth surface is ascribed to the improved crystalline quality of the MgO film.

FORCE-DETECTED SCANNED PROBE MAGNETIC RESONANCE MICROSCOPY

2002 ◽  
Vol 16 (20n22) ◽  
pp. 3378-3378
Author(s):  
P. C. HAMMEL
Keyword(s):  
Magnetic Resonance ◽  
Three Dimensional ◽  
High Sensitivity ◽  
Atomic Scale ◽  
Magnetic Resonance Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Unique Method ◽  
Magnetic Resonance Imaging Mri ◽  
Non Destructive

Magnetic Resonance Force Microscopy (MRFM) is a novel scanned probe technique that combines the three-dimensional imaging capabilities of magnetic resonance imaging (MRI) with the high sensitivity and resolution of atomic force microscopy (AFM). This emerging technology holds clear potential for resolution at the atomic scale. When fully realized, MRFM will provide a unique method for non-destructive, chemically specifc, subsurface imaging with applicability to a wide variety of materials. I will review results to date spanning applications of MRFM to nuclear spin, electron spin, and ferromagnetic resonance. I will outline the MRFM technique, discuss its present status and indicate future directions of our effort.

Layer-by-layer growth and decomposition of an organic crystal observed in real time by atomic force microscopy

1994 ◽  
Vol 6 (4) ◽  
pp. 307-311 ◽  
Author(s):  
Thomas Schimmel ◽  
Bettina Winzer ◽  
Rainer Kemnitzer ◽  
Thomas Koch ◽  
Jürgen Küppers ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Real Time ◽  
Layer Growth ◽  
Organic Crystal ◽  
Layer By Layer ◽  
Force Microscopy ◽  
Atomic Force

Layer by Layer Growth of GaN Films by Low Temperature Cyclic Process

2001 ◽  
Vol 693 ◽  
Author(s):  
P. Sanguino ◽  
S. Koynov ◽  
M. Niehusl ◽  
L. V. Melo ◽  
R. Schwarz ◽  
...  
Keyword(s):  
Group Iii Nitrides ◽  
Nitrogen Plasma ◽  
Layer Growth ◽  
Cyclic Process ◽  
Layer By Layer ◽  
X Ray Diffraction ◽  
Group Iii ◽  
Force Microscopy ◽  
Atomic Force ◽  
Deposited Films

AbstractRecently we have proposed a new layer-by-layer method for deposition of group-III nitrides from elemental precursors (Ga, N2). This technique is based on a two-step cyclic process, which alternates Pulsed Laser Deposition (PLD) and nitrogen plasma treatment. We have shown that such a process allows to control independently the structure and the N-content of the growing film. The objective of this work is to develop the cyclic process for achieving high quality GaN films. We explore the opportunities to grow stoichiometric epitaxial films on different substrates at relatively low temperatures (400°C to 600°C). This will gives us the possibility to use ZnO epitaxial layers as a buffer without thermal degradation. UV- Visible transmission spectra, X-ray diffraction scans and Atomic Force Microscopy are some of the tools used to characterise and compare the deposited films.

Improvements in fundamental performance of in-liquid frequency modulation atomic force microscopy

Microscopy ◽  
2020 ◽  
Vol 69 (6) ◽  
pp. 340-349
Author(s):  
Takeshi Fukuma
Keyword(s):  
Atomic Force Microscopy ◽  
Frequency Modulation ◽  
Three Dimensional ◽  
Atomic Scale ◽  
Atomic Resolution ◽  
Scanning Method ◽  
Force Microscopy ◽  
Atomic Force ◽  
Hydration Structure ◽  
Force Resolution

Abstract In-liquid frequency modulation atomic force microscopy (FM-AFM) has been used for visualizing subnanometer-scale surface structures of minerals, organic thin films and biological systems. In addition, three-dimensional atomic force microscopy (3D-AFM) has been developed by combining it with a three-dimensional (3D) tip scanning method. This method enabled the visualization of 3D distributions of water (i.e. hydration structures) and flexible molecular chains at subnanometer-scale resolution. While these applications highlighted the unique capabilities of FM-AFM, its force resolution, speed and stability are not necessarily at a satisfactory level for practical applications. Recently, there have been significant advancements in these fundamental performances. The force resolution was dramatically improved by using a small cantilever, which enabled the imaging of a 3D hydration structure even in pure water and made it possible to directly compare experimental results with simulated ones. In addition, the improved force resolution allowed the enhancement of imaging speed without compromising spatial resolution. To achieve this goal, efforts have been made for improving bandwidth, resonance frequency and/or latency of various components, including a high-speed phase-locked loop (PLL) circuit. With these improvements, now atomic-resolution in-liquid FM-AFM imaging can be performed at ∼1 s/frame. Furthermore, a Si-coating method was found to improve stability and reproducibility of atomic-resolution imaging owing to formation of a stable hydration structure on a tip apex. These improvements have opened up new possibilities of atomic-scale studies on solid-liquid interfacial phenomena by in-liquid FM-AFM.

scholarly journals Examination of Dentin Surface Using AFM (Our Experience)

2004 ◽  
Vol 47 (4) ◽  
pp. 343-346 ◽  
Author(s):  
Zdeňka Zapletalová ◽  
Roman Kubínek ◽  
Milan Vůjtek ◽  
Radko Novotný
Keyword(s):  
Scanning Probe Microscopy ◽  
Three Dimensional ◽  
Atomic Scale ◽  
Scanning Probe ◽  
Contact Method ◽  
Third Molars ◽  
Human Teeth ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scanning Electron

Atomic force microscopy (AFM) as one the technique of Scanning Probe Microscopy is useful for imaging of surface structure. This method can yield three-dimensional high-resolution topographic images of sample surfaces by using a scanning technique for conductors and insulators on atomic scale. It is based upon mapping of atomic-forces on a surface of an investigated sample. The method is useful not only in physics and chemistry; it can be also applied in biological fields. Special construction of AFM scanner enables to follow biological samples in liquid environments. Artifacts caused by dehydration of samples are removed this way. Dentin of human teeth is a vital hydrated tissue. It is strongly sensitive to dehydration and drying that are commonly used in preparation of samples in examinations by Scanning Electron Microscopy (SEM). We describe our experience in examination of dentin surfaces of extracted human third molars using contact method of AFM under moist conditions.

Investigation of Growth Evolution in c-Axis SrBi2Nb2O9 Epitaxial Thin Films

1999 ◽  
Vol 574 ◽  
Author(s):  
J. Lettieri ◽  
M. A. Zurbuchen ◽  
G. W. Brown ◽  
Y. Jia ◽  
W. Tian ◽  
...  
Keyword(s):  
Thin Films ◽  
Rutherford Backscattering Spectrometry ◽  
Growth Conditions ◽  
Layer Growth ◽  
Spiral Growth ◽  
Layer By Layer ◽  
Epitaxial Thin Films ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron

Abstract(001)-oriented epitaxial SrBi2Nb2O9 thin films have been grown by pulsed laser deposition on (001) SrTiO3 and (001) LaAlO3—Sr2AlTaO6 substrates at optimized growth conditions. 4-circle x-ray diffraction, Rutherford backscattering spectrometry, and transmission electron microscopy reveal highly oriented epitaxial films. Atomic force microscopy indicates spiral growth for films grown on SrTiO3 and layer-by-layer growth for films grown on LaAlO3—Sr2AlTaO6.

Observation of the Early Stages of B-Axis Oriented Prba2Cu3O7-x Thin Film Growth by AFM

1995 ◽  
Vol 388 ◽  
Author(s):  
Gun Yong Sung ◽  
Jeong Dae Suh ◽  
Sang-Don Jung
Keyword(s):  
Surface Roughness ◽  
Film Growth ◽  
Thin Film Growth ◽  
Laser Deposition ◽  
Growth Mode ◽  
Layer By Layer ◽  
Oriented Growth ◽  
Force Microscopy ◽  
Atomic Force ◽  
Deposition Conditions

AbstractThe initial stages of the growth of b-axis oriented PrBa2Cu3O7-x (PBCO) films on LaSrGaO4 (100) substrates were investigated by atomic force microscopy to follow the growth of the thin films. Series of films with thickness ranging between 0.34 nm and 100 nm were prepared under identical pulsed laser deposition conditions. No sprial-topped or flat-topped islands were observed and the scale of the surface roughness was lower than that of the c-axis oriented growth mode. the 300 nm-thick in-plane aligned a-axis oriented YBCO films have the root mean square (RMS) surface roughness of 2 nm. It is considered that the b-axis oriented PBCO films on LaSrGaO4 (100) substrates were nucleated and grown by layer-by-layer like growth mode.

scholarly journals Investigations of the formation of zeolite ZSM-39 (MTN)

2019 ◽  
Vol 97 (12) ◽  
pp. 840-847 ◽  
Author(s):  
Zheng Sonia Lin ◽  
Donghan Chen ◽  
Heng-Yong Nie ◽  
Y.T. Angel Wong ◽  
Yining Huang
Keyword(s):  
Eutectic Mixture ◽  
Solvent System ◽  
Layer Growth ◽  
Layer By Layer ◽  
X Ray Diffraction ◽  
Fluoride Ions ◽  
Subsequent Formation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Crystallization Conditions

Crystallization of zeolite ZSM-39 (MTN), a clathrate and silicate analogue of the 17 Å cubic gas hydrate, was examined in a solvent system involving a tetramethylammonium chloride – 1,6-hexanediol deep eutectic mixture and significant amount of water. The crystallization process was followed by powder X-ray diffraction (PXRD), and solid-state nuclear magnetic resonance (SSNMR) techniques involving several nuclei such as 19F, 29Si, and 13C. The results indicate that the crystallization starts from the arrangement of amorphous Si–O–Si species around the tetramethylammonium ions and subsequent formation of the cages in the precursors similar to [51264] cages in the MTN topology. The larger [51264] cages are then connected via the smaller [512] cages containing the fluoride ions to form the final MTN structure. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) analyses show that the crystal growth rates along <100> and <111> directions are roughly the same, suggesting that the (100) and (111) planes have similar stability under the crystallization conditions used. AFM study also shows that the freshly born nuclei on the (100) face are of a height of 2 nm, suggesting a layer by layer growth of the polyhedral crystal.

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