Oxidation behavior of TiN with a Ti interlayer on stainless steel

2004 ◽  
Vol 819 ◽  
Author(s):  
Ming-Hua Shiao ◽  
Ching-Chiun Wang ◽  
Chien-Ying Su ◽  
Fuh-Sheng Shieu
Keyword(s):  
Stainless Steel ◽  
Steel Substrate ◽  
Depth Profiling ◽  
Columnar Structure ◽  
304 Stainless Steel ◽  
Force Microscopy ◽  
Tin Coatings ◽  
Atomic Force ◽  
Transmission Electron ◽  
Tin Thin Films

AbstractCharacterization of the TiN coatings oxidized in air at temperatures at 600 and 700°C for 30 min was carried out by X-ray diffraction (XRD), atomic force microscopy (AFM), transmission electron microscopy (TEM) and Auger electron spectroscopy (AES). TiN thin films with a Ti interlayer were prepared by hollow cathode discharge ion plating on AISI 304 stainless steel. Both XRD and TEM results show that the TiN coatings and Ti interlayer have columnar structure with (111) and (0002) preferred orientations, respectively. AFM results show the existence of pinholes on the surface of specimens due to electropolishing process of the steel substrate, and the surface roughness (Ra) changes from 3.5 nm for the as-deposited specimen to 11.6 nm after oxidation at 700°. After oxidation, the TiO2 oxide layer formed on the specimen surface was porous and retained the columnar structure as the original TiN coating. The microstructure of the Ti interlayer gradually changed from columnar to polycrystalline structure due to grain growth. The Auger elemental depth profiling indicated that interdiffusion of the Ti interlayer with steel substrate had occurred during the oxidation process.

scholarly journals Mechanism of improvement of TiN-coated tool life by nitrogen implantation

2001 ◽  
Vol 16 (11) ◽  
pp. 3293-3303 ◽  
Author(s):  
S. J. Bull ◽  
Yu. P. Sharkeev ◽  
S. V. Fortuna ◽  
I. A. Shulepov ◽  
A. J. Perry
Keyword(s):  
Ion Implantation ◽  
Surface Composition ◽  
Slight Reduction ◽  
Nitrogen Implantation ◽  
Force Microscopy ◽  
Tin Coatings ◽  
Coated Tools ◽  
Atomic Force ◽  
Transmission Electron ◽  
Coated Tool

The life of TiN-coated tools can be improved by a post-coating ion implantation treatment, but the mechanism by which this occurs is still not clear. Nitrogen implantation of both physical-vapor-deposited TiN and CVD TiN leads to surface softening as the dose increases, which has been attributed to amorphization. In this study a combination of transmission electron microscopy and atomic force microscopy was used to characterize the microstructure of implanted TiN coatings on cemented carbide for comparison with mechanical property measurements (nanoindentation, residual stress, etc.), made on the same samples. Ion implantation leads to a slight reduction in the grain size of the TiN in the implanted zone, but there is no evidence for amorphization. Surface softening is observed for physical-vapor-deposited TiN, but this is probably due to a combination of changes in surface composition and the presence of a layer of bubbles generated by the very high implantation doses used.

Electrochemical Atomic Force Microscopy Study of the Dissolution Kinetics of 304 Stainless Steel

1996 ◽  
Vol 451 ◽  
Author(s):  
T. J. Mckrell ◽  
J. M. Galligan
Keyword(s):  
Stainless Steel ◽  
Electrical Potential ◽  
Dissolution Kinetics ◽  
Microscopy Study ◽  
304 Stainless Steel ◽  
Electrochemical Characteristics ◽  
Surface Kinetics ◽  
Chemical Surface ◽  
Force Microscopy ◽  
Atomic Force

ABSTRACTAn electrochemical atomic force microscope (ECAFM) has been employed to observe, in situ, the topographical and electrical changes that occur on 304 stainless steel as a function of an electrical potential. The concurrent acquisition of a polarization curve and topographical data allows direct correlation of variations in the surface roughness with the electrochemical characteristics of the passivation process. Also, the large AFM scan size, employed in this study, allows for the delineation and determination of the interdependence of the surface kinetics at various regions of the surface. Simultaneous measurements of topographical and electrical changes at these regions have established a correspondence of the competing kinetics between the reactions of dissolution and passivation. This provides a way to relate chemical surface reactions to surface topography.

Evolution of TiN Coating Surface Roughness during Physical Vapor Deposition on High Speed Steel Substrate

2014 ◽  
Vol 604 ◽  
pp. 67-70
Author(s):  
Leonid Kupchenko ◽  
Rauno Tali ◽  
Eron Adoberg ◽  
Valdek Mikli ◽  
Vitali Podgursky
Keyword(s):  
Surface Roughness ◽  
Vapor Deposition ◽  
Physical Vapor Deposition ◽  
High Speed ◽  
Steel Substrate ◽  
High Speed Steel ◽  
Growth Exponent ◽  
Force Microscopy ◽  
Tin Coatings ◽  
Atomic Force

TiN coatings with different thickness were prepared by arc ion plating (AIP) physical vapor deposition (PVD) on high speed steel (HSS) substrates. TiN coatings surface roughness was investigated by atomic force microscopy (AFM) and 3D optical profilometry and growth kinetics was described using scaling exponents β and α. The growth exponent β is 0.91-1.0 and the roughness exponent α is 0.77-0.81. Due to relatively high value of the exponent α, the surface diffusion is likely predominant smoothening mechanism of TiN growth.

Effect of Annealing on Formation and Microstructure of ZnTiO3 Thin Films by DC Reactive Magnetron Co-Sputtering

2011 ◽  
Vol 687 ◽  
pp. 610-616 ◽  
Author(s):  
Yen Lin Huang ◽  
Ying Chieh Lee ◽  
Du Cheng Tsai ◽  
Fuh Sheng Shieu
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Annealing Temperature ◽  
Columnar Structure ◽  
Reactive Magnetron ◽  
Zinc Titanate ◽  
Force Microscopy ◽  
Unit Cell Size ◽  
Atomic Force ◽  
Transmission Electron

Thin films of zinc titanate (ZnTiO3) can be produced on Si(100) substrates at room temperature by DC reactive magnetron co-sputtering with Ti, Zn as the target and O2 as a reactive gas. In this work, the influence of annealing temperature (500–900 °C) on microstructure and formation of ZnTiO3 thin films were investigated. The samples are characterized by X-ray diffraction, transmission electron microscopy, scanning electron microscopy, atomic force microscopy, electron spectroscopy for chemical analysis. As-deposited films have an amorphous columnar structure. The crystallization phenomenon was observed with annealing temperature of 500 °C. After 600 °C 2 h annealing, crystalline phase with ZnTiO3 (hexagonal) and TiO2 (rutile) could be obtained and coexisted. Furthermore, the unit cell size of the ZnTiO3 and TiO2 crystal is a = ~5.062 Å, c = ~ 13.87 Å and a = ~4.58 Å, c = ~ 2.95 Å.

Comparative Analysis of the Nucleation and Growth of Copper on Different Low-k Polymers

2001 ◽  
Vol 714 ◽  
Author(s):  
V. Zaporojtchenko ◽  
J. Erichsen ◽  
T. Strunskus ◽  
K. Behnke ◽  
F. Faupel ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Ion Beam ◽  
Depth Profiling ◽  
Nucleation And Growth ◽  
Force Microscopy ◽  
Teflon Af ◽  
Atomic Force ◽  
Transmission Electron ◽  
Beam Depth ◽  
Low K

ABSTRACTIn this work we present investigations of the nucleation and growth of evaporated copper on several low-k polymers. The evolving interfaces were characterized using transmission electron microscopy (TEM), x-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM). The results were compared between the PMDA/ODA polyimide, Teflon AF 1601 and Silk®. A diffusion coefficient for copper atoms in Silk® determined by low energy ion-beam depth profiling in conjunction with XPS is reported.

scholarly journals Influence of W Addition on Microstructure and Resistance to Brittle Cracking of TiB2 Coatings Deposited by DCMS

Materials ◽  
2021 ◽  
Vol 14 (16) ◽  
pp. 4664
Author(s):  
Edyta Chudzik-Poliszak ◽  
Łukasz Cieniek ◽  
Tomasz Moskalewicz ◽  
Kazimierz Kowalski ◽  
Agnieszka Kopia ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Columnar Structure ◽  
Crystalline Size ◽  
Tungsten Content ◽  
X Ray Diffraction ◽  
Cracking Resistance ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron

The aim of this work was to determine the influence of the tungsten addition to TiB2 coatings on their microstructure and brittle cracking resistance. Four coatings of different compositions (0, 7, 15, and 20 at.% of W) were deposited by magnetron sputtering from TiB2 and W targets. The coatings were investigated by the following methods: X-ray diffraction (XRD), transmission electron microscopy (TEM), atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS). All coatings had a homogeneous columnar structure with decreasing column width as the tungsten content increased. XRD and XPS analysis showed the presence of TiB2 and nonstoichiometric TiBx phases with an excess or deficiency of boron depending on composition. The crystalline size decreased from 27 nm to 10 nm with increasing W content. The brittle cracking resistance improved with increasing content of TiBx phase with deficiency of B and decreasing crystalline size.

Scanning tunneling microscopy and atomic force microscopy: New tools for biology

1989 ◽  
Vol 47 ◽  
pp. 778-779
Author(s):  
CE Bracker ◽  
P. K. Hansma
Keyword(s):  
Physical Property ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Small Scale ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
New Family ◽  
Small Probe ◽  
Atomic Force ◽  
Transmission Electron

A new family of scanning probe microscopes has emerged that is opening new horizons for investigating the fine structure of matter. The earliest and best known of these instruments is the scanning tunneling microscope (STM). First published in 1982, the STM earned the 1986 Nobel Prize in Physics for two of its inventors, G. Binnig and H. Rohrer. They shared the prize with E. Ruska for his work that had led to the development of the transmission electron microscope half a century earlier. It seems appropriate that the award embodied this particular blend of the old and the new because it demonstrated to the world a long overdue respect for the enormous contributions electron microscopy has made to the understanding of matter, and at the same time it signalled the dawn of a new age in microscopy. What we are seeing is a revolution in microscopy and a redefinition of the concept of a microscope.Several kinds of scanning probe microscopes now exist, and the number is increasing. What they share in common is a small probe that is scanned over the surface of a specimen and measures a physical property on a very small scale, at or near the surface. Scanning probes can measure temperature, magnetic fields, tunneling currents, voltage, force, and ion currents, among others.

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