Comparative Analysis of the Nucleation and Growth of Copper on Different Low-k Polymers

2001 ◽  
Vol 714 ◽  
Author(s):  
V. Zaporojtchenko ◽  
J. Erichsen ◽  
T. Strunskus ◽  
K. Behnke ◽  
F. Faupel ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Ion Beam ◽  
Depth Profiling ◽  
Nucleation And Growth ◽  
Force Microscopy ◽  
Teflon Af ◽  
Atomic Force ◽  
Transmission Electron ◽  
Beam Depth ◽  
Low K

ABSTRACTIn this work we present investigations of the nucleation and growth of evaporated copper on several low-k polymers. The evolving interfaces were characterized using transmission electron microscopy (TEM), x-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM). The results were compared between the PMDA/ODA polyimide, Teflon AF 1601 and Silk®. A diffusion coefficient for copper atoms in Silk® determined by low energy ion-beam depth profiling in conjunction with XPS is reported.

Ion Beam Deposited Gmr Materials

2001 ◽  
Vol 690 ◽  
Author(s):  
J. M. Lannon ◽  
C.C. Pace ◽  
D. Temple ◽  
G.E McGuire ◽  
A.F. Hebard ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Beam Energy ◽  
Giant Magnetoresistance ◽  
Ion Beam ◽  
Energy Distributions ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
The Monte Carlo Method ◽  
Secondary Ion

ABSTRACTIon beam sputter deposition (IBSD) techniques for deposition of giant magnetoresistance (GMR) films have been studied using an automated IBSD system designed and built in-house. We have studied the properties of Fe/Cr multilayers deposited using either Ar or Xe ions with the primary ion beam energy varying from 500 eV to 1100 eV. The films were characterized using transmission electron microscopy (TEM), atomic force microscopy (AFM), Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), secondary ion mass spectroscopy (SIMS), magnetization measurements, and magnetoresistance measurements. The maximum value of GMR obtained was 49% (measured at 10K). For the Cr spacer thickness layer chosen, this GMR ratio is larger than the values reported for polycrystalline Fe/Cr multilayers deposited by magnetron sputtering. In general, we have found that GMR ratios for the Fe/Cr multilayers increase with decreasing primary ion beam energy, and are greater for films deposited using Xe ions than for films deposited using Ar ions. We explain the observed effects on the basis of energy distributions of sputtered atoms and backscattered working gas atoms (neutrals). The energy distributions were calculated using TRIM (Transport of Ions in Matter) software based on the Monte Carlo method.

Curcumin delivery by modified biosourced carbon-based nanoparticles

Nanomedicine ◽  
2022 ◽  
Author(s):  
Hossein Danafar ◽  
Marziyeh Salehiabar ◽  
Murat Barsbay ◽  
Hossein Rahimi ◽  
Mohammadreza Ghaffarlou ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Free System ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Good Biocompatibility ◽  
Drug Free ◽  
Mcf 7 ◽  
Carbon Based

Aim: To prepare a novel hybrid system for the controlled release and delivery of curcumin (CUR). Methods: A method for the ultrasound-assisted fabrication of protein-modified nanosized graphene oxide-like carbon-based nanoparticles (CBNPs) was developed. After being modified with bovine serum albumin (BSA), CUR was loaded onto the synthesized hybrid (labeled CBNPs@BSA–CUR). The structure and properties of the synthesized nanoparticles were elucidated using transmission electron microscopy (TEM), atomic force microscopy (AFM), ultraviolet-visible spectroscopy (UV-Vis), Fourier-transform infrared spectroscopy (FTIR) and x-ray photoelectron spectroscopy (XPS) methods. Results: CBNPs@BSA–CUR showed pH sensitivity and were calculated as controlled CUR release behavior. The drug-free system exhibited good biocompatibility and was nontoxic. However, CBNPs@BSA–CUR showed acceptable antiproliferative ability against MCF-7 breast cancer cells. Conclusion: CBNPs@BSA–CUR could be considered a highly promising nontoxic nanocarrier for the delivery of CUR with good biosafety.

Stable Low Resistance Ohmic Contacts To p-GaN

2001 ◽  
Vol 680 ◽  
Author(s):  
Mi-Ran Park ◽  
Wayne A. Anderson
Keyword(s):  
Contact Resistance ◽  
Photoelectron Spectroscopy ◽  
Ohmic Contacts ◽  
Depth Profiling ◽  
Force Microscopy ◽  
Low Resistance ◽  
Atomic Force ◽  
Current Voltage ◽  
Thermionic Field Emission ◽  
P Type

ABSTRACTStable and low-resistance Ohmic contacts are especially important for laser diodes where high current levels are required. Good contacts are especially difficult on p-type GaN which was the motivation for this study. The GaN was epitaxially grown on (0001) sapphire substrates by MOCVD. Resistivity of this layer was 3.5 Ohm-cm and thickness was 2 microns. After conventional cleaning followed by treatment in boiling HNO3: HCl (1:3), metallization was by thermally evaporating 40 nm Au / 60 nm Ni or 70 nm Au / 55 nm Pd. Heat treatment in O2 + N2 at various temperatures followed, with best results at 600 °C or 700 °C, respectively. Best values of the contact resistance were 1.8×10−4 Ohm-cm2 for Pd/Au and 2.65×10−4 Ohm-cm2 for Ni/Au contacts. After repetitive cycling from room temperature to 600 °C, the Ni contacts were very stable and more stable than the Pd contacts. X-ray photoelectron spectroscopy depth profiling showed the Ni contacts to be NiO followed by Au at the interface for the Ni/Au contacts whereas the Pd/Au contacts exhibited a Pd: Au solid solution. Some contacts were quenched in liquid nitrogen following sintering. These contacts were much more uniform under atomic force microscopy examination and gave a 3 times lower contact resistance with the Ni/Au design. Current-voltage-temperature analysis revealed that conduction was predominantly by thermionic field emission.

Surface and Interface Characterization of Ion Beam Re-crystallized Si

2002 ◽  
Vol 750 ◽  
Author(s):  
P. K. Sahoo ◽  
B. Satpati ◽  
S. Dey ◽  
P. V. Satyam ◽  
T. Som ◽  
...  
Keyword(s):  
Ion Beam ◽  
Amorphous Layer ◽  
Amorphous Structure ◽  
Average Height ◽  
Force Microscopy ◽  
Surface And Interface ◽  
Atomic Force ◽  
Nano Crystalline ◽  
Transmission Electron

ABSTRACTIn the present work we have studied efficacy of ion beam induced epitaxial crystallization (IBIEC) to recover amorphous layers (300 – 350 nm) produced by MeV Kr ions in Si(100) and studied the associated changes occurring on surface and interface of the recrystallized region. IBIEC experiments were carried out at sample temperatures in the range of 200 − 400°C using 1 MeV N+ ion beam. Rutherford backscattering-Channeling technique showed planar and gradual recovery of the amorphous layer as a function of temperature. Transmission electron microscopy measurements show good crystalline structure of the recovered region at 400°C while at lower temperatures nano-crystalline Si formation embedded in the amorphous structure is evident. The surface topography studied by atomic force microscopy shows development of islands after IBIEC. The rms roughness is around 0.5 nm and average height of the islands is found to be 1.8 nm. The observed epitaxial growth and the surface topographical features have been correlated.

Ta2O5-Incorporated WO3 Nanocomposite Film for Improved Electrochromic Performance in an Acidic Condition

2006 ◽  
Vol 6 (11) ◽  
pp. 3572-3576 ◽  
Author(s):  
Hee-Sang Shim ◽  
Hyo-Jin Ahn ◽  
Youn-Su Kim ◽  
Yung-Eun Sung ◽  
Won Bae Kim
Keyword(s):  
Surface Roughness ◽  
Photoelectron Spectroscopy ◽  
Potential Cycling ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Continuous Potential ◽  
Chemical States ◽  
The Stability

We report electrochromic and electrochemical properties of a WO3-Ta2O5 nanocomposite electrode that was fabricated from co-sputtering. Transmission electron microscopy (TEM)images of the WO3-Ta2O5 nanocomposite electrode revealed that morphology of the WO3 film was changed by incorporation of Ta2O5 nanoparticles, and their chemical states were confirmed to be W6+ and Ta5+ oxides from X-ray photoelectron spectroscopy (XPS). The introduction of Ta2O5 to the WO3 film played a role in alleviating surface roughness increase during continuous potential cycling; whereas the surface roughness of the WO3 film was increased from ca. 3.0 nm to ca. 13.4 nm after 400 cycles, the roughness increase on the WO3-Ta2O5 was significantly reduced to 4.2 nm after 400 cycles, as investigated by atomic force microscopy (AFM). This improvement of the stability by adding Ta2O5 may be responsible for the enhanced electrochemical and optical properties over long-term cycling with the WO3-Ta2O5 nanocomposite electrode.

Thermal Stability and Analysis of Laser Deposited Platinum Films

2000 ◽  
Vol 624 ◽  
Author(s):  
G.J. Berry ◽  
J.A. Cairns ◽  
M.R. Davidson ◽  
Y.C. Fan ◽  
A.G. Fitzgerald ◽  
...  
Keyword(s):  
Thermal Stability ◽  
Photoelectron Spectroscopy ◽  
Elevated Temperatures ◽  
Surface Composition ◽  
Direct Write ◽  
Force Microscopy ◽  
Annealing Conditions ◽  
Atomic Force ◽  
Transmission Electron ◽  
Induced Decomposition

ABSTRACTAs the trend towards device miniaturisation continues, surface effects and the thermal stability of metal deposits becomes increasingly important. We present here a study of the morphology and composition of platinum films, produced by the UV-induced decomposition of organometallic materials, under various annealing conditions. The surface composition of the metal deposits was studied by X-ray photoelectron spectroscopy, both as-deposited and following thermal treatment. In addition, the morphology of the surface was studied by atomic force microscopy which enabled the investigation of film restructuring. These studies were performed over a range of temperatures up to 1000°C in air and up to 600°C in reducing environments. Complementary information regarding the film morphology has been obtained from transmission electron microscopy. The data has been used to provide an insight into the effects of elevated temperatures on metal films deposited by a direct write method

Guided Control of Cu2O Nanodot Self-Assembly on SrTiO3 (100)

2004 ◽  
Vol 811 ◽  
Author(s):  
Yingge Du ◽  
Surajit Atha ◽  
Robert Hull ◽  
James F. Groves ◽  
Igor Lyubinetsky ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Self Assembly ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Photocatalytic Decomposition ◽  
Process Conditions ◽  
Photochemical Process ◽  
Force Microscopy ◽  
Atomic Force

ABSTRACTA method has been developed for specifying the growth location of Cu2O nanodotson SrTiO3 (100) substrates. Growth location has been specified by using a focused ion beam (FIB) to modify microscopic and nanoscopic regions of the SrTiO3substrate prior to Cu2O deposition. Deposition onto the modified regions under carefully selected process conditions has generated nanodot growth at the edge of microscopic FIB-induced features and on top of nanoscopic FIB-induced features. For this work, an array of evenly spaced FIB implants was first patterned into several regions of each substrate. Within each sub-division of the array, the FIB implants were identical in Ga+ energy and dosage and implant diameter and spacing. After FIB surface modification and subsequent in-situ substrate cleaning, Cu2O nanodots were synthesized on the patterned SrTiO3 substrates using oxygen plasma assisted molecular beam epitaxy. The substrates and nanodots were characterized using atomic force microscopy at various stages of the process; in-situ X-ray photoelectron spectroscopy and Auger electron spectroscopy analysis demonstrated that the final stoichiometry of the nanodots was Cu2O. The photocatalytic decomposition of water on Cu2O under visible light irradiation has been reported. If the Cu2O can be located in the form ofislands on a carefully selected substrate, then it could be possible to greatly enhance the efficiency of the photochemical process.

Electroless Synthesis of 1.4 nm Pd and Pt Nanoparticles on Self-Assembled Rosette Nanotubes

2011 ◽  
Vol 1301 ◽  
Author(s):  
Rahul Chhabra ◽  
Hicham Fenniri
Keyword(s):  
Electron Microscopy ◽  
Photoelectron Spectroscopy ◽  
Pt Nanoparticles ◽  
Hierarchical Organization ◽  
X Ray ◽  
Force Microscopy ◽  
Rosette Nanotubes ◽  
Atomic Force ◽  
Transmission Electron ◽  
Self Assembled

ABSTRACTElectroless synthesis and hierarchical organization of 1.4 nm Pd and Pt nanoparticles (NPs) on self-assembled Rosette Nanotubes (RNTs) is described. The nucleated NPs are nearly monodisperse and reveal supramolecular organizations guided by RNT templates. Interestingly, the narrow size distribution is attributable to unique templating behavior of RNTs. The resulting metal NP-RNT composites were characterized by Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM). X-ray Photoelectron Spectroscopy (XPS) was also performed to confirm the nature and composition of RNT-templated NPs.

FIB-assisted Pt Deposition for Carbon Nanotube Integration and 3-D Nanoengineering

2002 ◽  
Vol 739 ◽  
Author(s):  
K. Dovidenko ◽  
J. Rullan ◽  
R. Moore ◽  
K. A. Dunn ◽  
R. E. Geer ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Contact Lines ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Minimal Damage ◽  
Effective Use ◽  
Non Destructive

ABSTRACTIn this study, the Focused Ion Beam (FIB) instrument has been used for carbon nanotubes integration and nanoegineering studies. Results of thorough investigation (electrical, structural and chemical) of ultra-thin Pt contact lines and pads fabricated by the FIB, along with evaluation of nanomodification of the carbon nanotubes under the Ga+ ion beam and during Pt deposition are presented. The initial stages of FIB-assisted Pt deposition on multi-wall nanotubes are studied by transmission electron microscopy (TEM). The FIB parameters are optimized to provide non-destructive imaging and controllable Pt deposition with minimal damage on the nanotubes. We have demonstrated effective use of FIB-fabricated Pt pads as means of attaching the nanotubes to the substrate for atomic force and ultrasonic force microscopy studies.

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