Low-frequency noises as a tool for UV detector characterisation
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AbstractUltraviolet (UV) semiconductor detectors are mainly made of materials with wide energy gap, i.e., of AlGaN, GaP, SiC, and diamond. The article describes methodology of measurements of characteristics of low-frequency noises of UV detectors and presents the developed measuring system. Basing on analysis of noise characteristics of detectors, an optimal working point of detector can be determined. The results of measurements of noise characteristics of UV detectors made of AlGaN are shown. The measurements have been carried out in wide range of temperatures for several values of a detector supply voltage.