scholarly journals Effect the Composition Ratio of Cobalt Oxide on the Structural and Optical Properties of Tin Oxide

2019 ◽  
Vol 24 (3) ◽  
Author(s):  
Ahmed K. Abass, ◽  
Sura A. Abd Al-Hassan
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Cobalt Oxide ◽  
Tin Oxide ◽  
Spray Pyrolysis Technique ◽  
Oxide Thin Film ◽  
Chemical Spray Pyrolysis ◽  
Force Microscopy ◽  
Atomic Force ◽  
Xrd Patterns

Tin oxide thin films were deposited on glass substrate at (400 ºC) by using chemical spray pyrolysis technique and its composed with cobalt oxide in different ratio. The structural, morphologic and optical properties of  thin films are investigated by: (XRD) X-Ray Diffraction, (AFM) Atomic Force Microscopy, (UV-Vis )Ultraviolet – Visible Spectroscopy. XRD patterns indicate that the structure of tin oxide thin film is tetragonal. All prepared films were nano materials as stated by Scherrer equation. It might have been found by AFM analysis, those surface roughness increase with increasing of cobalt ratio. By provision about Tauc plots, optical band gaps for thin                               

EFFECT OF SUBSTRATE TEMPERATURE ON THE STRUCTURAL AND THE OPTICAL PROPERTIES OF CdTe (100) EPITAXIAL FILMS GROWN ON GaAs (100) SUBSTRATES

2007 ◽  
Vol 14 (04) ◽  
pp. 755-759 ◽  
Author(s):  
D. U. LEE ◽  
J. H. JUNG ◽  
T. W. KIM ◽  
H. S. LEE ◽  
H. L. PARK ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Substrate Temperature ◽  
Misfit Dislocations ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Transmission Electron ◽  
Cdte Thin Films ◽  
Xrd Patterns

CdTe thin films were grown on GaAs (100) substrates by using molecular beam epitaxy at various temperatures. The results of the X-ray diffraction (XRD) patterns showed that the orientation of the grown CdTe thin films was the (100) orientation. XRD patterns, atomic force microscopy images, high-resolution transmission electron microscopy (HRTEM) images, and photoluminescence spectra showed that the crystallinity of CdTe (100) epilayers grown on GaAs (100) substrates was improved by increasing the substrate temperature. HRTEM images showed that misfit dislocations existed at the CdTe / GaAs heterointerface. These results can help improve understanding of the substrate temperature effect on the structural and the optical properties of CdTe (100)/ GaAs (100) heterostructures.

Structural and Magnetic Investigation of Cu, Co Substituted NiFe2O4 Thin Films by Scanning Probe Microscopy (AFM, MFM)

2015 ◽  
Vol 830-831 ◽  
pp. 589-591 ◽  
Author(s):  
Hakikat Sharma ◽  
N.S. Negi
Keyword(s):  
Thin Films ◽  
Grain Size ◽  
Microstructural Analysis ◽  
Secondary Phase ◽  
Scanning Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Magnetic Investigation ◽  
Probe Microscope ◽  
Xrd Patterns

In the present study we prepared NiFe2O4, Ni0.95Cu0.05Fe2O4and Ni0.94Cu0.05Co0.01Fe2O4thin films by metallo-organic decomposition method (MOD) using spin coating technique. The samples were characterized by XRD. XRD patterns of thin films confirmed the formation of cubic spinel structure without any secondary phase. For microstructural analysis we characterized samples by Scanning Probe Microscope (SPM). From Atomic force microscopy (AFM), we analyzed surface morphology, calculated grain size, roughness and porosity. It has been found that grain size and roughness affected by Cu, Co substitution. After this we carried out magnetic force microscopy (MFM) on the samples. Effect of substitution on magnetic grains was observed from MFM.

Transparent Conducting Indium-Tin-Oxide Thin Film with Extremely Flatted Surface

2001 ◽  
Vol 666 ◽  
Author(s):  
Hiromichi Ohta ◽  
Masahiro Orita ◽  
Masahiro Hirano ◽  
Hideo Hosono
Keyword(s):  
Thin Film ◽  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Film Growth ◽  
Oxide Thin Film ◽  
Force Microscopy ◽  
Atomic Force ◽  
Out Of Plane ◽  
Key Factor ◽  
Surface Microstructures

ABSTRACTIndium-tin-oxide films were grown hetero-epitaxially on YSZ surface at a substrate temperature of 900 °C, and their surface microstructures were observed by using atomic force microscopy. ITO films grown on (111) surface of YSZ exhibited very high crystal quality; full width at half maximum of out-of-plane rocking curve was 54 second. The ITO was grown spirally, with flat terraces and steps corresponding to (222) plane spacing of 0.29 nm. Oxygen pressure during film growth is another key factor to obtain atomically flat surfaced ITO thin film.

Synthesis and Atomic Force Microscopy Contact Current Images of Aluminum Doped ZnO Thin Films

2010 ◽  
Vol 644 ◽  
pp. 109-112
Author(s):  
N. Muñoz Aguirre ◽  
J. Eduardo Rivera-López ◽  
L. Martínez Pérez ◽  
Pedro A. Tamayo Meza
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Spray Pyrolysis Technique ◽  
Water Mist ◽  
Zno Thin Films ◽  
Electrical Characteristics ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Atomic Force ◽  
Doped Zno

Aluminum doped ZnO thin films were synthesized by the water-mist assisted spray pyrolysis technique. The structural characterization by means of X-Ray diffraction measurements is reported. By means of Atomic Force Microscopy, the superficial electrical characteristics of the thin films are studied. Specifically, contact current images are shown and discussed. It is important to emphasize that in spite of no voltage is applied to the Atomic Force Microscopy contact conductive tip, current images are getting.

scholarly journals Effect of Co Doping on Structural and Optical Properties of NiO Thin Films Prepared by Chemical Spray Pyrolysis Method

2014 ◽  
Vol 41 ◽  
pp. 15-30 ◽  
Author(s):  
Nabeel A. Bakr ◽  
Sabah A. Salman ◽  
Ahmed M. Shano
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Crystallite Size ◽  
Cobalt Oxide ◽  
Chemical Spray Pyrolysis ◽  
Structural And Optical Properties ◽  
Nickel Cobalt ◽  
Nickel Cobalt Oxide ◽  
Chemical Spray ◽  
Co Concentration

In this work, nickel-cobalt oxide (Ni(1-x)CoxO) thin films, where x = 0, 4, 6 and 8 % have been successfully deposited on glass substrates by chemical spray pyrolysis (CSP) technique at substrate temperature of (400 °C) and thickness of about 300 nm. The structural and optical properties of these films have been studied using XRD, AFM, and UV-Visible spectroscopy. The XRD results showed that all films are polycrystalline in nature with cubic structure and preferred orientation along (111) plane. The crystallite size was calculated using Scherrer formula and it is found that the undoped NiO sample has maximum crystallite size (51.16 nm). AFM results showed homogenous and smooth thin films. The absorbance and transmittance spectra have been recorded in the wavelength range of (300-900) nm in order to study the optical properties. The optical energy gap for allowed direct electronic transition was calculated using Tauc equation. It is found that the band gap decreases as the Co-concentration increases and the band gap values were in the range of 3.58-3.66 eV and 3.58 eV for the prepared Nickel-Cobalt Oxide thin films. The Urbach energy increases as the Co-concentration increases and the Urbach. The optical constants including (absorption coefficient, real and imaginary parts of dielectric constant) were also calculated as a function of photon energy. Refractive index and extinction coefficient for Nickel-Cobalt Oxide thin films were estimated as a function of wavelength.

Structural and Optical Properties of PbI2 Thin Films to Fabricate Perovskite Solar Cells

2020 ◽  
Vol 398 ◽  
pp. 140-146
Author(s):  
Kawther A. Khalaph ◽  
Zainab J. Shanan ◽  
Aqel Mashot Jafar ◽  
Falah Mustafa Al-Attar
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Energy Gap ◽  
Perovskite Solar Cells ◽  
Lead Iodide ◽  
Structural And Optical Properties ◽  
Solar Cell Application ◽  
Force Microscopy ◽  
Glass Substrates ◽  
Atomic Force

Recently, lead iodide is the most materials employment in the perovskite solar cell application. This paper has studied the character of preparation, structural and optical properties of pbI2 materials. Structural properties are included investigation of the measurements X-Ray Diffraction (XRD), Scan Electron Microscopy (SEM), Fourier Transform InfraRed spectroscopy (FTIR) and Atomic Force Microscopy (AFM) tests to the PbI2 thin films samples. Optical properties are included the investigation UV-Vis test of the thin film samples deposited on glass substrates and investigated the Absorption, Transmittance and evaluated energy gap (Eg = 2.3 eV).

Electroplated CuO Thin Films from High Alkaline Solutions

2011 ◽  
Vol 15 (1) ◽  
pp. 49-55
Author(s):  
V. Dhanasekaran ◽  
T. Mahalingam ◽  
S. Rajendran ◽  
Jin Koo Rhee ◽  
D. Eapen
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Film Thickness ◽  
Structural Characteristics ◽  
Band Gap Energy ◽  
Alkaline Solutions ◽  
X Ray Diffraction ◽  
Force Microscopy ◽  
Microstructural Parameters ◽  
Atomic Force

CuO thin films were coated on ITO substrates by an electrodeposition route through potentiostatic mode. The electrodeposited CuO thin films were characterized and the role of copper sulphate concentration on the structural, morphological and optical properties of the CuO films was studied. Film thickness was measured by a stylus profilometer and found to be in the range between 800 and 1400 nm. The structural characteristics studies were carried out using X-ray diffraction and found that the films are polycrystalline in nature with a cubic structure. The preferential orientation of CuO thin films is found to be along (111) plane. The estimated microstructural parameters revealed that the crystallite size increases whereas the number of crystallites per unit area decreases with increasing film thickness. SEM studies show that the grain sizes of CuO thin films vary between 100 and 150 nm and also morphologies revealed that the electrodeposited CuO exhibits uniformity in size and shape. The surface roughness is estimated 15 nm of the CuO film were studied by atomic force microscopy. Optical properties of the films were analyzed from absorption and transmittance studies. The optical band gap energy was determined to be 1.5 eV from absorption coefficient. The variation of refractive index (n), extinction coefficient (k), with wavelength was studied and the results are discussed.

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