scholarly journals Occurrence and Molecular Identification of Microcotyle sebastis Isolated from Fish Farms of the Korean Rockfish, Sebastes schlegelii

2021 ◽  
Vol 59 (1) ◽  
pp. 89-95
Author(s):  
Jun-Young Song ◽  
Keun-Yong Kim ◽  
Seo-Woo Choi
Keyword(s):  
Ribosomal Rna ◽  
Phylogenetic Trees ◽  
Parasitic Infections ◽  
Cytochrome C Oxidase I ◽  
Fish Farms ◽  
Sebastes Schlegelii ◽  
Korean Rockfish ◽  
The Mean ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes

Microcotyle sebastis is a gill monogenean ectoparasite that causes serious problems in the mariculture of the Korean rockfish, Sebastes schlegelii. In this study, we isolated the parasite from fish farms along the coasts of Tongyeong, South Korea in 2016, and characterized its infection, morphology and molecular phylogeny. The prevalence of M. sebastis infection during the study period ranged from 46.7% to 96.7%, and the mean intensity was 2.3 to 31.4 ind./fish, indicating that the fish was constantly exposed to parasitic infections throughout the year. Morphological observations under light and scanning electron microscopes of the M. sebastis isolates in this study showed the typical characteristics of the anterior prohaptor and posterior opisthaptor of monogenean parasites. In phylogenetic trees reconstructed using the nuclear 28S ribosomal RNA gene and the mitochondrial cytochrome c oxidase I gene (cox1), they consistently clustered together with their congeneric species, and showed the closest phylogenetic relationships to M. caudata and M. kasago in the cox1 tree.

Divisions cellulaires au niveau de l'épiderme de l'hypocotyle du lin (Linum usitatissimum) cultivé in vitro

1985 ◽  
Vol 63 (10) ◽  
pp. 1691-1695 ◽  
Author(s):  
M. Sqalli ◽  
H. Chlyah
Keyword(s):  
Cell Division ◽  
Culture Cell ◽  
Epidermal Cells ◽  
Isolated Cells ◽  
Initiation And Propagation ◽  
A Cell ◽  
The Mean ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes

A study of the initiation and propagation of cell divisions in the epidermis of flax hypocotyl segments cultured in vitro was made using surface observations (light and scanning electron microscopes) as well as transverse and longitudinal sections. Epidermal cells were of two types: long, narrow cells and short, wide cells. The latter, less numerous, rarely participated in cell division. Nuclear activation and the first mitoses appeared very early (after 4–8 h of culture). Cell division began in isolated cells and spread progressively to surrounding cells arranged transversely. At 24 h, approximately 50 cells in division or newly divided were observed on an epidermal strip of 10 × 2 mm composed of about 8000 original cells. At 48 h, about 110 cells had divided forming 22 division centers; 26 prophase, 10 metaphase, and 7 telophase figures were observed. The mean number of original cells which participated in the formation of a cell division center was three at 12 h, five at 72 h, with no increase thereafter. The percentage of cells in mitosis or already divided remained low (1.9%) in relation to the total number of epidermal cells. For 22 division centers, only 7 would participate in vegetative bud formation.

Imaging the Probe Skirt in the Environmental SEM

2000 ◽  
Vol 6 (S2) ◽  
pp. 794-795
Author(s):  
B.L. Thiel ◽  
I.C. Bache ◽  
P. Smith
Keyword(s):  
Mean Free Path ◽  
High Energy ◽  
Large Area ◽  
Resolution Imaging ◽  
The Mean ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Primary Electrons ◽  
Environmental Sem ◽  
Better Than

In low vacuum scanning electron microscopes, the primary beam is partially scattered by the gas present in the specimen chamber. The development of these microscopes, in particular the so-called ‘Environmental’ SEM, was initiated when it was realized that this scattering does not necessarily compromise the imaging capabilities of the instrument. Indeed, some modern commercial instruments are capable of better than 2 nanometer resolution at gas pressures of several torr. The accepted explanation for this is as follows: The mean-free-path of the high energy primary electrons is several millimeters in one torr of water vapour (for example). Because the actual pathlength of electrons travelling through the gas is only a few millimeters, most of them do not scatter at all. Those that do scatter are supposedly distributed over a relatively large area. Thus, the probe features a high-intensity central region surrounded by a slowly decaying low-intensity skirt. High resolution imaging is possible because the signal-to-(skirt)background ratio is high.

Toward High-Resolution Low-Voltage SEM

1988 ◽  
Vol 46 ◽  
pp. 218-219
Author(s):  
Zhifeng Shao
Keyword(s):  
Low Voltage ◽  
Spherical Aberration ◽  
Chromatic Aberration ◽  
Limiting Factor ◽  
Operating Voltage ◽  
Probe Radius ◽  
Non Local ◽  
Electron Microscopes ◽  
Image Position ◽  
Scanning Electron Microscopes

Recently, low voltage (≤5kV) scanning electron microscopes have become popular because of their unprecedented advantages, such as minimized charging effects and smaller specimen damage, etc. Perhaps the most important advantage of LVSEM is that they may be able to provide ultrahigh resolution since the interaction volume decreases when electron energy is reduced. It is obvious that no matter how low the operating voltage is, the resolution is always poorer than the probe radius. To achieve 10Å resolution at 5kV (including non-local effects), we would require a probe radius of 5∽6 Å. At low voltages, we can no longer ignore the effects of chromatic aberration because of the increased ratio δV/V. The 3rd order spherical aberration is another major limiting factor. The optimized aperture should be calculated as

Current State of Biological High-Resolution Scanning Electron Microscopy

1988 ◽  
Vol 46 ◽  
pp. 180-181 ◽  
Author(s):  
Klaus-Ruediger Peters
Keyword(s):  
High Performance ◽  
Low Voltage ◽  
Backscattered Electrons ◽  
Lens Position ◽  
Low Voltage Operation ◽  
Signal Collection ◽  
Probe Size ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Scanning Electron

A new generation of high performance field emission scanning electron microscopes (FSEM) is now commercially available (JEOL 890, Hitachi S 900, ISI OS 130-F) characterized by an "in lens" position of the specimen where probe diameters are reduced and signal collection improved. Additionally, low voltage operation is extended to 1 kV. Compared to the first generation of FSEM (JE0L JSM 30, Hitachi S 800), which utilized a specimen position below the final lens, specimen size had to be reduced but useful magnification could be impressively increased in both low (1-4 kV) and high (5-40 kV) voltage operation, i.e. from 50,000 to 200,000 and 250,000 to 1,000,000 x respectively.At high accelerating voltage and magnification, contrasts on biological specimens are well characterized1 and are produced by the entering probe electrons in the outmost surface layer within -vl nm depth. Backscattered electrons produce only a background signal. Under these conditions (FIG. 1) image quality is similar to conventional TEM (FIG. 2) and only limited at magnifications >1,000,000 x by probe size (0.5 nm) or non-localization effects (%0.5 nm).

Chromatic aberration and low-voltage SEM

1987 ◽  
Vol 45 ◽  
pp. 546-547
Author(s):  
Zhifeng Shao ◽  
A.V. Crewe
Keyword(s):  
Electron Energy ◽  
Low Voltage ◽  
Spherical Aberration ◽  
Chromatic Aberration ◽  
Primary Electron ◽  
Probe Size ◽  
Non Local ◽  
Optical Treatment ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes

For scanning electron microscopes, it is plausible that by lowering the primary electron energy, one can decrease the volume of interaction and improve resolution. As shown by Crewe /1/, at V0 =5kV a 10Å resolution (including non-local effects) is possible. To achieve this, we would need a probe size about 5Å. However, at low voltages, the chromatic aberration becomes the major concern even for field emission sources. In this case, δV/V = 0.1 V/5kV = 2x10-5. As a rough estimate, it has been shown that /2/ the chromatic aberration δC should be less than ⅓ of δ0 the probe size determined by diffraction and spherical aberration in order to neglect its effect. But this did not take into account the distribution of electron energy. We will show that by using a wave optical treatment, the tolerance on the chromatic aberration is much larger than we expected.

High-resolution observation of sintered alumina (Al2O3) using the specimen-heated and electron-beam-induced conductivity method in a UHR-SEM

1994 ◽  
Vol 52 ◽  
pp. 1046-1047
Author(s):  
K. Ogura ◽  
T. Suzuki ◽  
C. Nielsen
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
Specimen Preparation ◽  
Conductivity Method ◽  
Fine Grain ◽  
Grain Structures ◽  
Resolution Observation ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Charging Effect

In spite of the complicated specimen preparation, Transmission Electron Microscopes (TEM) have traditionally been used for the investigation of the fine grain structures of sintered ceramics. Scanning Electron Microscopes (SEM) have not been used much for the same purpose as TEM because of poor results caused by the specimen charging effect, and also the lack of sufficient resolution. Here, we are presenting a successful result of high resolution imaging of sintered alumina (pure Al2O3) using the Specimen Heated and Electron Beam Induced Conductivity (SHEBIC) method, which we recently reported, in an ultrahigh resolution SEM (UHR-SEM). The JSM-6000F, equipped with a Field Emission Gun (FEG) and an in-lens specimen position, was used for this application.After sintered Al2O3 was sliced into a piece approximately 0.5 mm in thickness, one side was mechanically polished to get a shiny plane for the observation. When the observation was started at 20 kV, an enormous charging effect occured, and it was impossible to obtain a clear Secondary Electron (SE) image (Fig.1).

High resolution at low voltage: A new approach

1989 ◽  
Vol 47 ◽  
pp. 76-77
Author(s):  
Arthur V. Jones
Keyword(s):  
Low Voltage ◽  
Emission Sources ◽  
New Approach ◽  
Design Concepts ◽  
Probe Diameter ◽  
Low Voltage Operation ◽  
Sufficient Intensity ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Immersion Type

With the introduction of field-emission sources and “immersion-type” objective lenses, the resolution obtainable with modern scanning electron microscopes is approaching that obtainable in STEM and TEM-but only with specific types of specimens. Bulk specimens still suffer from the restrictions imposed by internal scattering and the need to be conducting. Advances in coating techniques have largely overcome these problems but for a sizeable body of specimens, the restrictions imposed by coating are unacceptable.For such specimens, low voltage operation, with its low beam penetration and freedom from charging artifacts, is the method of choice.Unfortunately the technical dificulties in producing an electron beam sufficiently small and of sufficient intensity are considerably greater at low beam energies — so much so that a radical reevaluation of convential design concepts is needed.The probe diameter is usually given by

Observation of GaAs/AlAs Superlattice Structures in both Secondary and Backscattcred Electron Imaging Modes with an Ultrahigh Resolution Scanning Electron Microscope

1990 ◽  
Vol 48 (1) ◽  
pp. 404-405
Author(s):  
K. Ogura ◽  
A. Ono ◽  
S. Franchi ◽  
P.G. Merli ◽  
A. Migliori
Keyword(s):  
Gaas Layer ◽  
Objective Lens ◽  
Superlattice Structure ◽  
Backscattered Electron ◽  
Instrumental Resolution ◽  
Electron Microscopes ◽  
Superlattice Structures ◽  
Electron Imaging ◽  
Scanning Electron Microscopes ◽  
Scanning Electron

In the last few years the development of Scanning Electron Microscopes (SEM), equipped with a Field Emission Gun (FEG) and using in-lens specimen position, has allowed a significant improvement of the instrumental resolution . This is a result of the fine and bright probe provided by the FEG and by the reduced aberration coefficients of the strongly excited objective lens. The smaller specimen size required by in-lens instruments (about 1 cm, in comparison to 15 or 20 cm of a conventional SEM) doesn’t represent a serious limitation in the evaluation of semiconductor process techniques, where the demand of high resolution is continuosly increasing. In this field one of the more interesting applications, already described (1), is the observation of superlattice structures.In this note we report a comparison between secondary electron (SE) and backscattered electron (BSE) images of a GaAs / AlAs superlattice structure, whose cross section is reported in fig. 1. The structure consist of a 3 nm GaAs layer and 10 pairs of 7 nm GaAs / 15 nm AlAs layers grown on GaAs substrate. Fig. 2, 3 and 4 are SE images of this structure made with a JEOL JSM 890 SEM operating at an accelerating voltage of 3, 15 and 25 kV respectively. Fig. 5 is a 25 kV BSE image of the same specimen. It can be noticed that the 3nm layer is always visible and that the 3 kV SE image, in spite of the poorer resolution, shows the same contrast of the BSE image. In the SE mode, an increase of the accelerating voltage produces a contrast inversion. On the contrary, when observed with BSE, the layers of GaAs are always brighter than the AlAs ones , independently of the beam energy.

Pollen morphology of some Tamarix (Tamaricaceae) species of Iran

2020 ◽  
Vol 62 (1-2) ◽  
pp. 151-161
Author(s):  
T. Shagholi ◽  
M. Keshavarzi ◽  
M. Sheidai
Keyword(s):  
North Africa ◽  
Pollen Grains ◽  
Ecological Niches ◽  
Multivariate Statistical Methods ◽  
Multivariate Statistical ◽  
Qualitative And Quantitative ◽  
Petal Length ◽  
Electron Microscopes ◽  
High Level ◽  
Scanning Electron Microscopes

Tamarix L. (Tamaricaceae) is a halophytic shrub in different parts of Asia and North Africa. Taxonomy and species limitation of Tamarix is very complex. This genus has three sections as Tamarix, Oligadenia, and Polyadenia, which are mainly separated by petal length, the number of stamens, the shape of androecial disk and attachment of filament on the androecial disk. As there was no palynological data on pollen features of Tamarix species of Iran, in the present study 12 qualitative and quantitative pollen features were evaluated to find diagnostic ones. Pollen grains of 8 Tamarix species were collected from nature. Pollen grains were studied without any treatment. Measurements were based on at least 50 pollen grains per specimen. Light and scanning electron microscopes were used. Multivariate statistical methods were applied to clarify the species relationships based on pollen data. All species studied showed monad and tricolpate (except some individuals of T. androssowii). Some Tamarix species show a high level of variability, in response to ecological niches and phenotypic plasticity, which make Tamarix species separation much more difficult. Based on the results of the present study, pollen grains features are not in agreement with previous morphological and molecular genetics about the sectional distinction.

scholarly journals Characteristics of Lightweight Cellular Concrete and Effects on Mechanical Properties

Materials ◽  
2020 ◽  
Vol 13 (12) ◽  
pp. 2678 ◽  
Author(s):  
Wei Yu ◽  
Xu Liang ◽  
Frank Mi-Way Ni ◽  
Abimbola Grace Oyeyi ◽  
Susan Tighe
Keyword(s):  
Mechanical Properties ◽  
Pore Structure ◽  
High Definition ◽  
Pore Characteristics ◽  
Software Applications ◽  
Solid Part ◽  
Electron Microscopes ◽  
Lab Test ◽  
Scanning Electron Microscopes ◽  
Cellular Concrete

This study investigated the pore structure and its effects on mechanical properties of lightweight cellular concrete (LCC) in order to understand more and detailed characteristics of such structure. As part of investigation, environment scanning electron microscopes (ESEM) and industrial high-definition (HD) macro photography camera were separately used to capture and compare images of specimens. Physical properties of the pore structure, including pore area, size, perimeter, fit ellipse, and shape descriptors, were studied based on the image processing technology and software applications. Specimens with three different densities (400, 475, and 600 kg/m3) were prepared in the laboratory. Firstly, the effects of density on the characteristics of pore structure were investigated; furthermore, mechanical properties (compressive strength, modulus of elasticity and Poisson’s ratio, flexural strength and splitting tensile strength of LCC) were tested. The relationships among pore characteristics, density, and mechanical properties were analyzed. Based on the results obtained from the lab test—comparisons made between specimens with high-densities and those with low-densities—it was found significant variability in bubble size, thickness, and irregularity of pores. Furthermore, the increase of density is accompanied by better mechanical properties, and the main influencing factors are the thickness of the solid part and the shape of the bubble. The thicker of solid part and more regular pores of LCC has, the better mechanical properties are.

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