scholarly journals An 8-bit Radix-4 Non-Volatile Parallel Multiplier

Electronics ◽  
2021 ◽  
Vol 10 (19) ◽  
pp. 2358
Author(s):  
Chengjie Fu ◽  
Xiaolei Zhu ◽  
Kejie Huang ◽  
Zheng Gu
Keyword(s):  
Supply Voltage ◽  
Random Access ◽  
Resistive Random Access Memory ◽  
Computational Time ◽  
Short Delay ◽  
Data Movement ◽  
Parallel Multiplier ◽  
Modern Computer ◽  
Critical Issues ◽  
Processing And Storage

The data movement between the processing and storage units has been one of the most critical issues in modern computer systems. The emerging Resistive Random Access Memory (RRAM) technology has drawn tremendous attention due to its non-volatile ability and the potential in computation application. These properties make them a perfect choice for application in modern computing systems. In this paper, an 8-bit radix-4 non-volatile parallel multiplier is proposed, with improved computational capabilities. The corresponding booth encoding scheme, read-out circuit, simplified Wallace tree, and Manchester carry chain are presented, which help to short the delay of the proposed multiplier. While the presence of RRAM save computational time and overall power as multiplicand is stored beforehand. The area of the proposed non-volatile multiplier is reduced with improved computing speed. The proposed multiplier has an area of 785.2 μm2 with Generic Processing Design Kit 45 nm process. The simulation results show that the proposed multiplier structure has a low computing power at 161.19 μW and a short delay of 0.83 ns with 1.2 V supply voltage. Comparative analyses are performed to demonstrate the effectiveness of the proposed multiplier design. Compared with conventional booth multipliers, the proposed multiplier structure reduces the energy and delay by more than 70% and 19%, respectively.

scholarly journals A Survey of ReRAM-Based Architectures for Processing-In-Memory and Neural Networks

2018 ◽  
Vol 1 (1) ◽  
pp. 75-114 ◽  
Author(s):  
Sparsh Mittal
Keyword(s):  
Machine Learning ◽  
Random Access ◽  
Random Access Memory ◽  
Resistive Random Access Memory ◽  
Low Energy ◽  
Power Budget ◽  
Access Memory ◽  
Computing Systems ◽  
Data Movement ◽  
Similarities And Differences

As data movement operations and power-budget become key bottlenecks in the design of computing systems, the interest in unconventional approaches such as processing-in-memory (PIM), machine learning (ML), and especially neural network (NN)-based accelerators has grown significantly. Resistive random access memory (ReRAM) is a promising technology for efficiently architecting PIM- and NN-based accelerators due to its capabilities to work as both: High-density/low-energy storage and in-memory computation/search engine. In this paper, we present a survey of techniques for designing ReRAM-based PIM and NN architectures. By classifying the techniques based on key parameters, we underscore their similarities and differences. This paper will be valuable for computer architects, chip designers and researchers in the area of machine learning.

Comparative Assessment of Optical Techniques for Semi-Invasive SRAM Data Read-out on an MSP430 Microcontroller

2018 ◽  
Author(s):  
Tuba Kiyan ◽  
Heiko Lohrke ◽  
Christian Boit
Keyword(s):  
Supply Voltage ◽  
Photon Emission ◽  
Random Access ◽  
Integration Time ◽  
Security Evaluation ◽  
Testing And Debugging ◽  
Advantages And Disadvantages ◽  
The Core ◽  
Voltage Signal ◽  
Chip Testing

Abstract This paper compares the three major semi-invasive optical approaches, Photon Emission (PE), Thermal Laser Stimulation (TLS) and Electro-Optical Frequency Mapping (EOFM) for contactless static random access memory (SRAM) content read-out on a commercial microcontroller. Advantages and disadvantages of these techniques are evaluated by applying those techniques on a 1 KB SRAM in an MSP430 microcontroller. It is demonstrated that successful read out depends strongly on the core voltage parameters for each technique. For PE, better SNR and shorter integration time are to be achieved by using the highest nominal core voltage. In TLS measurements, the core voltage needs to be externally applied via a current amplifier with a bias voltage slightly above nominal. EOFM can use nominal core voltages again; however, a modulation needs to be applied. The amplitude of the modulated supply voltage signal has a strong effect on the quality of the signal. Semi-invasive read out of the memory content is necessary in order to remotely understand the organization of memory, which finds applications in hardware and software security evaluation, reverse engineering, defect localization, failure analysis, chip testing and debugging.

Effect of Conductive Filament Temperature on ZrO2 based Resistive Random Access Memory Devices

2020 ◽  
Vol 12 (2) ◽  
pp. 02008-1-02008-4
Author(s):  
Pramod J. Patil ◽  
◽  
Namita A. Ahir ◽  
Suhas Yadav ◽  
Chetan C. Revadekar ◽  
...  
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Resistive Random Access Memory ◽  
Memory Devices ◽  
Access Memory ◽  
Conductive Filament ◽  
Filament Temperature

scholarly journals Improved Device Distribution in High-Performance SiNx Resistive Random Access Memory via Arsenic Ion Implantation

Nanomaterials ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 1401
Author(s):  
Te Jui Yen ◽  
Albert Chin ◽  
Vladimir Gritsenko
Keyword(s):  
High Performance ◽  
Conduction Mechanism ◽  
Random Access ◽  
Random Access Memory ◽  
Resistive Random Access Memory ◽  
Switching Behavior ◽  
Access Memory ◽  
Current Voltage ◽  
Current Voltage Characteristics ◽  
Limited Conduction

Large device variation is a fundamental challenge for resistive random access memory (RRAM) array circuit. Improved device-to-device distributions of set and reset voltages in a SiNx RRAM device is realized via arsenic ion (As+) implantation. Besides, the As+-implanted SiNx RRAM device exhibits much tighter cycle-to-cycle distribution than the nonimplanted device. The As+-implanted SiNx device further exhibits excellent performance, which shows high stability and a large 1.73 × 103 resistance window at 85 °C retention for 104 s, and a large 103 resistance window after 105 cycles of the pulsed endurance test. The current–voltage characteristics of high- and low-resistance states were both analyzed as space-charge-limited conduction mechanism. From the simulated defect distribution in the SiNx layer, a microscopic model was established, and the formation and rupture of defect-conductive paths were proposed for the resistance switching behavior. Therefore, the reason for such high device performance can be attributed to the sufficient defects created by As+ implantation that leads to low forming and operation power.

scholarly journals All-inorganic perovskite quantum dot light-emitting memories

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Meng-Cheng Yen ◽  
Chia-Jung Lee ◽  
Kang-Hsiang Liu ◽  
Yi Peng ◽  
Junfu Leng ◽  
...  
Keyword(s):  
Random Access ◽  
Optoelectronic Device ◽  
Resistive Random Access Memory ◽  
Access Memory ◽  
Light Emitting ◽  
Inorganic Perovskite ◽  
Emission Color ◽  
Perovskite Quantum Dots ◽  
In Series ◽  
First Time

AbstractField-induced ionic motions in all-inorganic CsPbBr3 perovskite quantum dots (QDs) strongly dictate not only their electro-optical characteristics but also the ultimate optoelectronic device performance. Here, we show that the functionality of a single Ag/CsPbBr3/ITO device can be actively switched on a sub-millisecond scale from a resistive random-access memory (RRAM) to a light-emitting electrochemical cell (LEC), or vice versa, by simply modulating its bias polarity. We then realize for the first time a fast, all-perovskite light-emitting memory (LEM) operating at 5 kHz by pairing such two identical devices in series, in which one functions as an RRAM to electrically read the encoded data while the other simultaneously as an LEC for a parallel, non-contact optical reading. We further show that the digital status of the LEM can be perceived in real time from its emission color. Our work opens up a completely new horizon for more advanced all-inorganic perovskite optoelectronic technologies.

Multilevel oxygen-vacancy conductive filaments in β-Ga2O3 based resistive random access memory

2021 ◽  
Vol 23 (10) ◽  
pp. 5975-5983
Author(s):  
Jie Hou ◽  
Rui Guo ◽  
Jie Su ◽  
Yawei Du ◽  
Zhenhua Lin ◽  
...  
Keyword(s):  
Oxygen Vacancy ◽  
Random Access ◽  
Random Access Memory ◽  
Resistive Random Access Memory ◽  
Access Memory ◽  
Low Resistance ◽  
Multilevel Storage

In this study, at least three kinds of VOs and conductive filaments with low resistance states and forming and set voltages are found for β-Ga2O3 memory. This suggests the great potential of β-Ga2O3 memory for multilevel storage application.

scholarly journals Improved Synaptic Device Properties of HfAlOx Dielectric on Highly Doped Silicon Substrate by Partial Reset Process

Metals ◽  
2021 ◽  
Vol 11 (5) ◽  
pp. 772
Author(s):  
Seunghyun Kim ◽  
Osung Kwon ◽  
Hojeong Ryu ◽  
Sungjun Kim
Keyword(s):  
Resistive Switching ◽  
Silicon Substrate ◽  
Photoelectron Spectroscopy ◽  
Random Access ◽  
Resistive Random Access Memory ◽  
Alloy Type ◽  
Switching Type ◽  
Neuromorphic System ◽  
Device Properties ◽  
Partial Reset

This work demonstrates the synaptic properties of the alloy-type resistive random-access memory (RRAM). We fabricated the HfAlOx-based RRAM for a synaptic device in a neuromorphic system. The deposition of the HfAlOx film on the silicon substrate was verified by X-ray photoelectron spectroscopy (XPS) analysis. It was found that both abrupt and gradual resistive switching could be implemented, depending on the reset stop voltage. In the reset process, the current gradually decreased at weak voltage, and at strong voltage, it tended to decrease rapidly by Joule heating. The type of switching determined by the first reset process was subsequently demonstrated to be stable switching by successive set and reset processes. A gradual switching type has a much smaller on/off window than abrupt switching. In addition, retention maintained stability up to 2000 s in both switching cases. Next, the multiple current states were tested in the gradual switching case by identical pulses. Finally, we demonstrated the potentiation and depression of the Cu/HfAlOx/Si device as a synapse in an artificial neural network and confirmed that gradual resistive switching was suitable for artificial synapses, using neuromorphic system simulation.

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