scholarly journals Towards a Fully Automated Scanning Probe Microscope for Biomedical Applications

Sensors ◽  
2021 ◽  
Vol 21 (9) ◽  
pp. 3027
Author(s):  
Witold K. Szeremeta ◽  
Robert L. Harniman ◽  
Charlotte R. Bermingham ◽  
Massimo Antognozzi
Keyword(s):  
Scanning Probe Microscopy ◽  
Total Internal Reflection ◽  
Biomedical Applications ◽  
Scanning Probe ◽  
Force Sensitivity ◽  
Parallel Increase ◽  
Total Internal Reflection Microscopy ◽  
Probe Microscope ◽  
Automated Scanning ◽  
Instrument Configuration

The increase in capabilities of Scanning Probe Microscopy (SPM) has resulted in a parallel increase in complexity that limits the use of this technique outside of specialised research laboratories. SPM automation could substantially expand its application domain, improve reproducibility and increase throughput. Here, we present a bottom-up design in which the combination of positioning stages, orientation, and detection of the probe produces an SPM design compatible with full automation. The resulting probe microscope achieves sub-femtonewton force sensitivity whilst preserving low mechanical drift (2.0±0.2 nm/min in-plane and 1.0±0.1 nm/min vertically). The additional integration of total internal reflection microscopy, and the straightforward operations in liquid, make this instrument configuration particularly attractive to future biomedical applications.

SCANNING PROBE MICROSCOPY BASED NANOSCALE PATTERNING AND FABRICATION

COSMOS ◽  
2007 ◽  
Vol 03 (01) ◽  
pp. 1-21 ◽  
Author(s):  
XIAN NING XIE ◽  
HONG JING CHUNG ◽  
ANDREW THYE SHEN WEE
Keyword(s):  
Integrated Circuits ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Nanoscale Patterning ◽  
Atomic Force ◽  
Probe Microscope ◽  
Molecular Manipulation

Nanotechnology is vital to the fabrication of integrated circuits, memory devices, display units, biochips and biosensors. Scanning probe microscope (SPM) has emerged to be a unique tool for materials structuring and patterning with atomic and molecular resolution. SPM includes scanning tunneling microscopy (STM) and atomic force microscopy (AFM). In this chapter, we selectively discuss the atomic and molecular manipulation capabilities of STM nanolithography. As for AFM nanolithography, we focus on those nanopatterning techniques involving water and/or air when operated in ambient. The typical methods, mechanisms and applications of selected SPM nanolithographic techniques in nanoscale structuring and fabrication are reviewed.

scholarly journals Research of the Possibility of Applying Nanomarking on Steel Surfaces with a Scanning Probe Microscope

2020 ◽  
pp. 44-49
Author(s):  
Tatyana Kislova
Keyword(s):  
Spatial Resolution ◽  
Scanning Probe Microscopy ◽  
Metal Layer ◽  
Scanning Probe ◽  
Micro Milling ◽  
Innovative Technology ◽  
Probe Microscope ◽  
Metal Products ◽  
Steel Surfaces ◽  
Counterfeit Products

Recently, an increasing number of products are subject to protective labeling-application of digital and letter designations, barcodes that individualize the product. This has become especially relevant with the release of counterfeit products and mass theft of vehicles. The number usually individualizes a specific instance of the product. In the case of manufacturing cars, weapons, and precious items, this makes it possible to register and strictly account for these items. Marking numbers can be applied directly to the material they are made of, or to attached metal or polymer plates. Marking symbols are applied in various ways. They are applied to steel products by stamping, micro-milling or laser engraving. As expert practice shows, such markings on metal products are either completely removed by milling, cutting or sawing the metal layer with various tools and devices, or changed, or new markings are applied to the place of destroyed marks. The paper studies the possibility of creating protective markings of the nanometer level of spatial resolution on steel products of different hardness using a new innovative technology-scanning probe microscopy, which provides one hundred percent verification of items and objects.

Characterization of High Resolution Resists and Metal Shims by Scanning Probe Microscopy

2000 ◽  
Vol 6 (2) ◽  
pp. 129-136 ◽  
Author(s):  
B. A. Sexton ◽  
R. J. Marnock
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
Scanning Probe Microscopy ◽  
Electron Beam Lithography ◽  
Scanning Probe ◽  
Feedback Process ◽  
Probe Microscope ◽  
Etched Silicon ◽  
Micro Patterns

Technologies such as compact disc (CD) manufacturing, hologram embossing, and security printing rely on the reproduction of micro-patterns generated on surfaces by optical or electron-beam lithographic writing onto electron-beam or photoresists. The periodicity of such patterns varies from sub-micron to several microns, with depths up to 0.5 μm. The scanning probe microscope (SPM) is becoming a routine tool for analysis of these micro-patterns, to check on depths and lateral dimensions of features. Direct scanning of resist-covered plates is now possible, without damage, using resonant low-contact force SPM with etched silicon cantilevers. Metal shims produced from the master resist plates can also be scanned and checked for defects prior to production of embossed foils. The present article discusses examples of the use of a Digital Instruments 3100 microscope in analysis of production electron-beam lithography plates with a 0.5 μm resist thickness. We also examine features of nickel replicas (father and mother shims) produced by electroforming from the original plate. With SPM measurements of the development profile of a particular plate, corrections can be made to exposures and development times during production to correct errors. An example is given of such a feedback process.

Non-contact scanning probe microscopy with sub-piconewton force sensitivity

1997 ◽  
Vol 70 (1-2) ◽  
pp. 45-55 ◽  
Author(s):  
Takaaki Aoki ◽  
Michio Hiroshima ◽  
Kazuo Kitamura ◽  
Makio Tokunaga ◽  
Toshio Yanagida
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Force Sensitivity

Automated Scanning Probe Microscopy for Combinatorial Polymer Research

2005 ◽  
Vol 894 ◽  
Author(s):  
Daan Wouters ◽  
Alexander Alexeev ◽  
Dmitri Kozodaev ◽  
Sergey Saunin ◽  
Ulrich Schubert
Keyword(s):  
High Throughput ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Thin Polymer Film ◽  
Characterization Methods ◽  
Probe Microscopy ◽  
Materials Research ◽  
Polymer Research ◽  
Combinatorial Materials ◽  
Automated Scanning

AbstractWith the development of combinatorial materials research (CMR) methods and high throughput experimentation (HTE) workflows for polymer research applications, the demand for automated, high throughput characterization methods is evident. Solution-based characterization methods like NMR, GPC, viscosimetry, for example and UV-Vis as well as fluorescence plate readers are available. Here we report on the incorporation of automated scanning probe microscopy in the HTE-workflow by demonstrating the evaluation of surface properties and topographies for thin polymer film libraries.

Couple Passive Voltage Contrast with Scanning Probe Microscope to Identify Invisible Implant Issue

2005 ◽  
Author(s):  
Cha-Ming Shen ◽  
Shi-Chen Lin ◽  
Chen-May Huang ◽  
Huay-Xan Lin ◽  
Chi-Hong Wang
Keyword(s):  
Scanning Probe Microscopy ◽  
Electrical Characterization ◽  
Defect Mode ◽  
Scanning Probe ◽  
Electrical Characteristics ◽  
Differential Analysis ◽  
Probe Microscope ◽  
Compound Method ◽  
Voltage Contrast

Abstract This paper presents a judicious reasoning method by coupling passive voltage contrast (PVC) with scanning probe microscopy (SPM) for revealing particular invisible defect modes, which were imperceptible to observe and very difficult to identify by means of traditional physical failure analysis techniques. In order to certify this compound method, it is applied to an implant issue as a case study. Through solving this particular defect mode, whose exact failure position could not be determined even with the most sensitive PVC or high-resolution SPM current mapping, the procedures and contentions are illustrated further. The significance of the reasoning method is based on electrical characterization and differential analysis. By coupling PVC with SPM, the capability to identify tiny defects is not limited to just distinguishing leakage or high-resistance under contacts. PVC can detect abnormal N+ contacts due to improper implanting, and SPM can provide the precise electrical characteristics.

Automated Scanning Probe Microscopy as a New Tool for Combinatorial Polymer Research: Conductive Carbon Black/Poly(dimethylsiloxane) Composites

2003 ◽  
Vol 24 (1) ◽  
pp. 113-117 ◽  
Author(s):  
Riadh Neffati ◽  
Alexander Alexeev ◽  
Sergey Saunin ◽  
José C. M. Brokken-Zijp ◽  
Daan Wouters ◽  
...  
Keyword(s):  
Carbon Black ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Conductive Carbon Black ◽  
Polymer Research ◽  
Automated Scanning
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