Total Ionizing Dose Effect and Single Event Burnout of VDMOS with Different Inter Layer Dielectric and Passivation
2017 ◽
Vol 33
(2)
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pp. 255-259
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2008 ◽
Vol 55
(4)
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pp. 1926-1946
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2017 ◽
Vol 64
(8)
◽
pp. 2046-2053
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2018 ◽
Vol 65
(8)
◽
pp. 1928-1934
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Keyword(s):
2018 ◽
Vol 88-90
◽
pp. 891-897
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Keyword(s):