Selective area electron diffraction from the galactomannan of guar gum

1988 ◽  
Vol 183 (1) ◽  
pp. 131-134 ◽  
Author(s):  
Kasinadar Veluraja ◽  
Edward D.T. Atkins
Keyword(s):  
Electron Diffraction ◽  
Guar Gum ◽  
Selective Area ◽  
Selective Area Electron Diffraction

Preparation of water-dispersible graphene using N-methylmorpholine N-oxide monohydrate and its application for the preparation of nanocomposites using PEDOT

2015 ◽  
Vol 3 (27) ◽  
pp. 7105-7117 ◽  
Author(s):  
Dong-Hun Kim ◽  
Loon-Seng Tan ◽  
Soo-Young Park
Keyword(s):  
Electron Diffraction ◽  
Saed Pattern ◽  
Water Dispersible ◽  
Selective Area ◽  
Sem And Tem ◽  
Selective Area Electron Diffraction

SEM and TEM images (inset: selective area electron diffraction (SAED) pattern) of mono-layered water dispersible graphene (GPN) sheet by treatment ofN-methylmorpholineN-oxide monohydrate (NMMOm).

Observation of Domains and Phase Separation in Hydrated Lipid Bilayers

1975 ◽  
Vol 33 ◽  
pp. 496-497
Author(s):  
S. W. Hui ◽  
D. F. Parsons
Keyword(s):  
Phase Separation ◽  
Transition Temperature ◽  
Electron Diffraction ◽  
Lipid Bilayers ◽  
Dark Field ◽  
Selective Area ◽  
Observation Area ◽  
Field Electron Microscopy ◽  
Diffraction Patterns ◽  
Selective Area Electron Diffraction

The domain structure and phase separation in lipid single bilayers were observed directly by selective area electron diffraction (SAED) and selected reflection dark field electron microscopy (SRDFEM), using an environmental stage for a Siemens Elmiskop IA. The specimens were viewed in a fully hydrated state in the temperature range between 0°C and 50°C. Below the transition temperature, three orders of a hexagonal pattern were recorded, whereas diffuse rings only were seen above the transition temperature.Selective area electron diffraction were done by restricting the illumination area to few micrometers in diameter, using a pointed filament and a 10 μm second condenser aperture. Below the transition temperature of dipalmitoylphosphatidylchoiine bilayers, differentially oriented diffraction patterns were distinguishable between adjacent membranes areas (domains) five micrometers apart. Occasionally, two or more superimposed patterns were recorded from the same area, indicating the observation area covered several domains.

SYNTHESIS OF GRAPHITE OXIDE (GO)/Cu2O NANOCOMPOSITE AND ITS CATALYTIC PERFORMANCE UNDER THE ULTRASOUND

NANO ◽  
2013 ◽  
Vol 08 (03) ◽  
pp. 1350032 ◽  
Author(s):  
CHUNNIAN CHEN ◽  
CHENWEI YU ◽  
WEN FU
Keyword(s):  
Fourier Transform ◽  
Electrostatic Interactions ◽  
Catalytic Performance ◽  
X Ray ◽  
Selective Area ◽  
Transmission Electron ◽  
Vis Spectroscopy ◽  
Ft Ir ◽  
Ir And Raman ◽  
Selective Area Electron Diffraction

GO/ Cu2O nanocomposite had been successfully synthesized by electrostatic interactions method. X-ray powder diffraction (XRD), transmission electron microscope (TEM), selective-area electron diffraction (SAED), Fourier transform infrared spectroscopy (FT-IR) and Raman spectra confirmed the structure of the Cu2O and GO/ Cu2O nanocomposite. The catalytic degradation of Rhodamine B under the condition of ultrasound was investigated and the result of UV-Vis spectroscopy demonstrated that the nanocomposite can efficiently degraded it.

The structure of trititanate nanotubes

2002 ◽  
Vol 58 (4) ◽  
pp. 587-593 ◽  
Author(s):  
Q. Chen ◽  
G.H. Du ◽  
S. Zhang ◽  
L.-M. Peng
Keyword(s):  
Average Diameter ◽  
High Resolution Electron Microscopy ◽  
Tube Axis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Selective Area ◽  
Resolution Electron ◽  
Axis Parallel ◽  
New Type ◽  
Selective Area Electron Diffraction

A comprehensive chemical and structural analysis is made of a new type of trititanate nanotube, which is synthesized via the reaction of TiO2 particles with NaOH aqueous solution. It is found that the trititanate nanotubes are multi-walled scroll nanotubes with an inter-shell spacing of about 0.78 nm and an average diameter of about 9 nm. An atomic model of the nanotube is derived based on information from powder X-ray diffraction, selective-area electron diffraction, high-resolution electron microscopy and structure simulations. A model nanotube may be constructed by wrapping a (100) sheet of H2Ti3O7 along [001] with the tube axis parallel to [010].

Microwave Activation of Exfoliation in Ion–cut Silicon Layer Transfer

2007 ◽  
Vol 994 ◽  
Author(s):  
Douglas C. Thompson ◽  
T. L. Alford ◽  
J. W. Mayer ◽  
T. Hochbauer ◽  
J. K. Lee ◽  
...  
Keyword(s):  
Rutherford Backscattering Spectrometry ◽  
Silicon Layer ◽  
Silicon On Insulator ◽  
Cross Sectional ◽  
Selective Area ◽  
Atomic Force ◽  
Transmission Electron ◽  
Microwave System ◽  
Diffraction Patterns ◽  
Selective Area Electron Diffraction

AbstractMicrowave heating is used to initiate the ion-cut process for transfer of coherent silicon-layers onto insulator substrates. Hydrogen and boron co-implanted silicon was bonded to an insulative substrate before processing inside a 2.45 GHz, 1300 W cavity applicator microwave system. Sample temperatures measured using a pyrometer were comparable to previous ion – cut studies. Selected samples were further annealed to repair any damage created in the ion implant process. Rutherford backscattering spectrometry and selective area electron diffraction patterns show high crystallinity in transferred layers. RUMP simulation of backscattering spectra and cross-sectional transmission electron microscopy demonstrate that thicknesses of the transferred layers are comparable to previous ion-cut exfoliation techniques. Surface quality as characterized by an atomic force microscope compares well with previous ion-cut studies. Hall measurements were used to characterize electrical properties of transferred layers. The mobility and carrier density of microwave activated ion – cut silicon on insulator processed samples compares well with previous annealing techniques.

Transmission Electron Microscopy Observations on the Precipitates in Al-Zn-Mg Based Sacrificial Anode Alloy

2011 ◽  
Vol 704-705 ◽  
pp. 989-992
Author(s):  
Jing Ling Ma ◽  
Jiu Ba Wen ◽  
Quan An Li ◽  
Jun Feng Li
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Cast Alloy ◽  
Hexagonal Structure ◽  
Sacrificial Anode ◽  
Orthorhombic Structure ◽  
Selective Area ◽  
Transmission Electron ◽  
Cubic Structure ◽  
Selective Area Electron Diffraction

nanoscale precipitates in the Al-Zn-In-Mg-Ti-Mn alloy were investigated by regular and high resolution transmission electron microscopy (TEM and HRTEM) and by selective area electron diffraction (SAED). The cast alloy contains the hexagonal structure MgZn2 and the orthorhombic structure Al6Mn precipitates, but after aged the precipitates of the cubic structure Mg2Zn11 were found. The Mg2Zn11 precipitates can act as activation centre, make the alloy pitting. But the activation of Al6Mn precipitates is very little.

Electron Diffraction of Wet Biological Membranes

1974 ◽  
Vol 32 ◽  
pp. 158-159
Author(s):  
S.W. Hui ◽  
D.F. Parsons
Keyword(s):  
Electron Diffraction ◽  
Data Collection ◽  
Biological Membranes ◽  
Small Areas ◽  
Electron Diffraction Technique ◽  
Electron Microscopes ◽  
Collection Time ◽  
Camera Length

The development of the hydration stages for electron microscopes has opened up the application of electron diffraction in the study of biological membranes. Membrane specimen can now be observed without the artifacts introduced during drying, fixation and staining. The advantages of the electron diffraction technique, such as the abilities to observe small areas and thin specimens, to image and to screen impurities, to vary the camera length, and to reduce data collection time are fully utilized. Here we report our pioneering work in this area.

Analysis of electron-diffraction intensity profiles using a photodiode-array detection system

1983 ◽  
Vol 41 ◽  
pp. 322-323
Author(s):  
J. B. Warren
Keyword(s):  
Electron Diffraction ◽  
Diffraction Pattern ◽  
Detection System ◽  
High Energy ◽  
Photographic Emulsion ◽  
Diffraction Intensity ◽  
Silicon Photodiode ◽  
Photodiode Array Detection ◽  
Analog To Digital ◽  
Photodiode Array

Electron diffraction intensity profiles have been used extensively in studies of polycrystalline and amorphous thin films. In previous work, diffraction intensity profiles were quantitized either by mechanically scanning the photographic emulsion with a densitometer or by using deflection coils to scan the diffraction pattern over a stationary detector. Such methods tend to be slow, and the intensities must still be converted from analog to digital form for quantitative analysis. The Instrumentation Division at Brookhaven has designed and constructed a electron diffractometer, based on a silicon photodiode array, that overcomes these disadvantages. The instrument is compact (Fig. 1), can be used with any unmodified electron microscope, and acquires the data in a form immediately accessible by microcomputer.Major components include a RETICON 1024 element photodiode array for the de tector, an Analog Devices MAS-1202 analog digital converter and a Digital Equipment LSI 11/2 microcomputer. The photodiode array cannot detect high energy electrons without damage so an f/1.4 lens is used to focus the phosphor screen image of the diffraction pattern on to the photodiode array.

Electron Diffraction Analysis of Microtwin Structures in Regrown (III) Silicon

1982 ◽  
Vol 40 ◽  
pp. 460-461
Author(s):  
P. Ling ◽  
R. Gronsky ◽  
J. Washburn
Keyword(s):  
Electron Diffraction ◽  
Ion Implantation ◽  
Diffraction Analysis ◽  
Diffraction Pattern ◽  
Direct Consequence ◽  
The Other ◽  
Electron Diffraction Analysis ◽  
Defect Microstructures ◽  
Ion Implanted

The defect microstructures of Si arising from ion implantation and subsequent regrowth for a (111) substrate have been found to be dominated by microtwins. Figure 1(a) is a typical diffraction pattern of annealed ion-implanted (111) Si showing two groups of extra diffraction spots; one at positions (m, n integers), the other at adjacent positions between <000> and <220>. The object of the present paper is to show that these extra reflections are a direct consequence of the microtwins in the material.

Pollutant Identification by Selected Area Electron Diffraction

1974 ◽  
Vol 32 ◽  
pp. 532-533
Author(s):  
R. E. Ferrell ◽  
G. G. Paulson ◽  
C. W. Walker
Keyword(s):  
Thermal Treatment ◽  
Electron Diffraction ◽  
Sample Preparation ◽  
Crystal Structures ◽  
Water Samples ◽  
Environmental Samples ◽  
Short Review ◽  
Selected Area Electron Diffraction ◽  
Multiple Component

Selected area electron diffraction (SAD) has been used successfully to determine crystal structures, identify traces of minerals in rocks, and characterize the phases formed during thermal treatment of micron-sized particles. There is an increased interest in the method because it has the potential capability of identifying micron-sized pollutants in air and water samples. This paper is a short review of the theory behind SAD and a discussion of the sample preparation employed for the analysis of multiple component environmental samples.

Sign in / Sign up

Export Citation Format

Share Document