A hybrid tomographic reconstruction algorithm for high speed X-ray tomography

2015 ◽  
Vol 196 ◽  
pp. 27-35 ◽  
Author(s):  
Xiaogang Yang ◽  
J. Ruud van Ommen ◽  
Jasper Schoormans ◽  
Robert F. Mudde
Keyword(s):  
High Speed ◽  
Tomographic Reconstruction ◽  
Reconstruction Algorithm ◽  
X Ray

scholarly journals Correlative 3D x-ray fluorescence and ptychographic tomography of frozen-hydrated green algae

2018 ◽  
Vol 4 (11) ◽  
pp. eaau4548 ◽  
Author(s):  
Junjing Deng ◽  
Yuan Hung Lo ◽  
Marcus Gallagher-Jones ◽  
Si Chen ◽  
Alan Pryor ◽  
...  
Keyword(s):  
Mammalian Cells ◽  
Tomographic Reconstruction ◽  
Reconstruction Algorithm ◽  
Three Dimensions ◽  
Light Sources ◽  
X Ray ◽  
Reconstruction Quality ◽  
Wide Range ◽  
Conventional Tomography ◽  
Efficient Data

Accurate knowledge of elemental distributions within biological organisms is critical for understanding their cellular roles. The ability to couple this knowledge with overall cellular architecture in three dimensions (3D) deepens our understanding of cellular chemistry. Using a whole, frozen-hydrated Chlamydomonas reinhardtii cell as an example, we report the development of 3D correlative microscopy through a combination of simultaneous cryogenic x-ray ptychography and x-ray fluorescence microscopy. By taking advantage of a recently developed tomographic reconstruction algorithm, termed GENeralized Fourier Iterative REconstruction (GENFIRE), we produce high-quality 3D maps of the unlabeled alga’s cellular ultrastructure and elemental distributions within the cell. We demonstrate GENFIRE’s ability to outperform conventional tomography algorithms and to further improve the reconstruction quality by refining the experimentally intended tomographic angles. As this method continues to advance with brighter coherent light sources and more efficient data handling, we expect correlative 3D x-ray fluorescence and ptychographic tomography to be a powerful tool for probing a wide range of frozen-hydrated biological specimens, ranging from small prokaryotes such as bacteria, algae, and parasites to large eukaryotes such as mammalian cells, with applications that include understanding cellular responses to environmental stimuli and cell-to-cell interactions.

Scanning x-ray fluorescence microscopy and principal component analysis

1992 ◽  
Vol 50 (2) ◽  
pp. 1752-1753
Author(s):  
Brian Cross
Keyword(s):  
Principal Component Analysis ◽  
Fluorescence Microscopy ◽  
Spatial Resolution ◽  
High Speed ◽  
Image Acquisition ◽  
Principal Component ◽  
Fluorescence Microscope ◽  
Acquisition Rate ◽  
X Ray ◽  
Speed Up

A relatively new entry, in the field of microscopy, is the Scanning X-Ray Fluorescence Microscope (SXRFM). Using this type of instrument (e.g. Kevex Omicron X-ray Microprobe), one can obtain multiple elemental x-ray images, from the analysis of materials which show heterogeneity. The SXRFM obtains images by collimating an x-ray beam (e.g. 100 μm diameter), and then scanning the sample with a high-speed x-y stage. To speed up the image acquisition, data is acquired "on-the-fly" by slew-scanning the stage along the x-axis, like a TV or SEM scan. To reduce the overhead from "fly-back," the images can be acquired by bi-directional scanning of the x-axis. This results in very little overhead with the re-positioning of the sample stage. The image acquisition rate is dominated by the x-ray acquisition rate. Therefore, the total x-ray image acquisition rate, using the SXRFM, is very comparable to an SEM. Although the x-ray spatial resolution of the SXRFM is worse than an SEM (say 100 vs. 2 μm), there are several other advantages.

PHAX-SCAN: Functional integration of a Scanning Electron Microscope and an energy-dispersive x-ray analyser

1989 ◽  
Vol 47 ◽  
pp. 56-57
Author(s):  
Marc H. Peeters ◽  
Max T. Otten
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
Functional Integration ◽  
Energy Dispersive ◽  
X Rays ◽  
X Ray ◽  
High Speed Analysis ◽  
Scanning Electron

Over the past decades, the combination of energy-dispersive analysis of X-rays and scanning electron microscopy has proved to be a powerful tool for fast and reliable elemental characterization of a large variety of specimens. The technique has evolved rapidly from a purely qualitative characterization method to a reliable quantitative way of analysis. In the last 5 years, an increasing need for automation is observed, whereby energy-dispersive analysers control the beam and stage movement of the scanning electron microscope in order to collect digital X-ray images and perform unattended point analysis over multiple locations.The Philips High-speed Analysis of X-rays system (PHAX-Scan) makes use of the high performance dual-processor structure of the EDAX PV9900 analyser and the databus structure of the Philips series 500 scanning electron microscope to provide a highly automated, user-friendly and extremely fast microanalysis system. The software that runs on the hardware described above was specifically designed to provide the ultimate attainable speed on the system.

Nondestructive Inspection of Thin, Low-Z Samples using Multiplexed Compton Scatter Tomography

1997 ◽  
Vol 503 ◽  
Author(s):  
B. L. Evans ◽  
J. B. Martin ◽  
L. W. Burggraf
Keyword(s):  
Signal To Noise Ratio ◽  
Reconstruction Algorithm ◽  
Filtered Backprojection ◽  
Line Broadening ◽  
Compton Scatter ◽  
X Ray ◽  
Tomography System ◽  
Transmission Computed Tomography ◽  
High Purity Germanium ◽  
Scattered Energy

ABSTRACTThe viability of a Compton scattering tomography system for nondestructively inspecting thin, low Z samples for corrosion is examined. This technique differs from conventional x-ray backscatter NDI because it does not rely on narrow collimation of source and detectors to examine small volumes in the sample. Instead, photons of a single energy are backscattered from the sample and their scattered energy spectra are measured at multiple detector locations, and these spectra are then used to reconstruct an image of the object. This multiplexed Compton scatter tomography technique interrogates multiple volume elements simultaneously. Thin samples less than 1 cm thick and made of low Z materials are best imaged with gamma rays at or below 100 keV energy. At this energy, Compton line broadening becomes an important resolution limitation. An analytical model has been developed to simulate the signals collected in a demonstration system consisting of an array of planar high-purity germanium detectors. A technique for deconvolving the effects of Compton broadening and detector energy resolution from signals with additive noise is also presented. A filtered backprojection image reconstruction algorithm with similarities to that used in conventional transmission computed tomography is developed. A simulation of a 360–degree inspection gives distortion-free results. In a simulation of a single-sided inspection, a 5 mm × 5 mm corrosion flaw with 50% density is readily identified in 1-cm thick aluminum phantom when the signal to noise ratio in the data exceeds 28.

X-Ray Nanotomography (XRMT) Tool for Non-Destructive High-Resolution Imaging of ICs

2001 ◽  
Author(s):  
Wenbing Yun ◽  
Steve Wang ◽  
David Scott ◽  
Kenneth W. Nill ◽  
Waleed S. Haddad
Keyword(s):  
High Resolution ◽  
Process Development ◽  
3D Visualization ◽  
Tomographic Reconstruction ◽  
Reconstruction Algorithms ◽  
X Ray ◽  
Visualization Software ◽  
Volumetric Reconstruction ◽  
Resolution Imaging ◽  
Non Destructive

Abstract A high-resolution table-sized x-ray nanotomography (XRMT) tool has been constructed that shows the promise of nondestructively imaging the internal structure of a full IC stack with a spatial resolution better than 100 nm. Such a tool can be used to detect, localize, and characterize buried defects in the IC. By collecting a set of X-ray projections through the full IC (which may include tens of micrometers of silicon substrate and several layers of Cu interconnects) and applying tomographic reconstruction algorithms to these projections, a 3D volumetric reconstruction can be obtained, and analyzed for defects using 3D visualization software. XRMT is a powerful technique that will find use in failure analysis and IC process development, and may facilitate or supplant investigations using SEM, TEM, and FIB tools, which generally require destructive sample preparation and a vacuum environment.

Growth Mechanisms of Faceted Al 3Fe Intermetallic Revealed by High-Speed Synchrotron X-Ray Quantification

2020 ◽  
Author(s):  
Zihan Song ◽  
Oxana Magdysyuk ◽  
Lei Tang ◽  
Tay Sparks ◽  
Biao Cai
Keyword(s):  
High Speed ◽  
Growth Mechanisms ◽  
X Ray

scholarly journals X-ray Determination of Compressive Residual Stresses in Spring Steel Generated by High-Speed Water Quenching

Materials ◽  
2019 ◽  
Vol 12 (7) ◽  
pp. 1154
Author(s):  
Diego E. Lozano ◽  
George E. Totten ◽  
Yaneth Bedolla-Gil ◽  
Martha Guerrero-Mata ◽  
Marcel Carpio ◽  
...  
Keyword(s):  
Heat Treatment ◽  
Residual Stresses ◽  
High Speed ◽  
Spring Steel ◽  
X Ray Diffraction ◽  
Laboratory Equipment ◽  
X Ray ◽  
Water Chamber ◽  
Hardened Case ◽  
Compressive Residual Stresses

Automotive components manufacturers use the 5160 steel in leaf and coil springs. The industrial heat treatment process consists in austenitizing followed by the oil quenching and tempering process. Typically, compressive residual stresses are induced by shot peening on the surface of automotive springs to bestow compressive residual stresses that improve the fatigue resistance and increase the service life of the parts after heat treatment. In this work, a high-speed quenching was used to achieve compressive residual stresses on the surface of AISI/SAE 5160 steel samples by producing high thermal gradients and interrupting the cooling in order to generate a case-core microstructure. A special laboratory equipment was designed and built, which uses water as the quenching media in a high-speed water chamber. The severity of the cooling was characterized with embedded thermocouples to obtain the cooling curves at different depths from the surface. Samples were cooled for various times to produce different hardened case depths. The microstructure of specimens was observed with a scanning electron microscope (SEM). X-ray diffraction (XRD) was used to estimate the magnitude of residual stresses on the surface of the specimens. Compressive residual stresses at the surface and sub-surface of about −700 MPa were obtained.

scholarly journals Fingerprinting shock-induced deformations via diffraction

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Avanish Mishra ◽  
Cody Kunka ◽  
Marco J. Echeverria ◽  
Rémi Dingreville ◽  
Avinash M. Dongare
Keyword(s):  
High Speed ◽  
Shock Loading ◽  
Dislocation Slip ◽  
Line Profiles ◽  
X Ray Diffraction ◽  
Final State ◽  
X Ray ◽  
Shock Testing ◽  
Local Pressures ◽  
Deformation Modes

AbstractDuring the various stages of shock loading, many transient modes of deformation can activate and deactivate to affect the final state of a material. In order to fundamentally understand and optimize a shock response, researchers seek the ability to probe these modes in real-time and measure the microstructural evolutions with nanoscale resolution. Neither post-mortem analysis on recovered samples nor continuum-based methods during shock testing meet both requirements. High-speed diffraction offers a solution, but the interpretation of diffractograms suffers numerous debates and uncertainties. By atomistically simulating the shock, X-ray diffraction, and electron diffraction of three representative BCC and FCC metallic systems, we systematically isolated the characteristic fingerprints of salient deformation modes, such as dislocation slip (stacking faults), deformation twinning, and phase transformation as observed in experimental diffractograms. This study demonstrates how to use simulated diffractograms to connect the contributions from concurrent deformation modes to the evolutions of both 1D line profiles and 2D patterns for diffractograms from single crystals. Harnessing these fingerprints alongside information on local pressures and plasticity contributions facilitate the interpretation of shock experiments with cutting-edge resolution in both space and time.

Simulation and Experiment on the Residual Stress in Super-High Speed Grinding

2010 ◽  
Vol 135 ◽  
pp. 238-242
Author(s):  
Yue Ming Liu ◽  
Ya Dong Gong ◽  
Wei Ding ◽  
Ting Chao Han
Keyword(s):  
Residual Stress ◽  
High Speed ◽  
Element Model ◽  
Residual Stress Distribution ◽  
X Ray Diffraction ◽  
Machined Surface ◽  
X Ray ◽  
High Speed Grinding ◽  
Simulation And Experiment ◽  
Cylindrical Workpiece

In this paper, effective finite element model have been developed to simulation the plastic deformation cutting in the process for a single particle via the software of ABAQUS, observing the residual stress distribution in the machined surface, the experiment of grinding cylindrical workpiece has been brought in the test of super-high speed grinding, researching the residual stress under the machined surface by the method of X-ray diffraction, which can explore the different stresses from different super-high speed in actual, and help to analyze the means of reducing the residual stresses in theory.

scholarly journals Correction for the Partial Volume Effects (PVE) in Nuclear Medicine Imaging: A Post-Reconstruction Analytic Method

2021 ◽  
Vol 11 (14) ◽  
pp. 6460
Author(s):  
Fabio Di Martino ◽  
Patrizio Barca ◽  
Eleonora Bortoli ◽  
Alessia Giuliano ◽  
Duccio Volterrani
Keyword(s):  
Nuclear Medicine ◽  
Imaging System ◽  
Tomographic Reconstruction ◽  
Mathematical Expression ◽  
Reconstruction Algorithm ◽  
Volume Effect ◽  
Nuclear Medicine Imaging ◽  
Theoretical Derivation ◽  
Reconstruction Process ◽  
Partial Volume

Quantitative analyses in nuclear medicine are increasingly used, both for diagnostic and therapeutic purposes. The Partial Volume Effect (PVE) is the most important factor of loss of quantification in Nuclear Medicine, especially for evaluation in Region of Interest (ROI) smaller than the Full Width at Half Maximum (FWHM) of the PSF. The aim of this work is to present a new approach for the correction of PVE, using a post-reconstruction process starting from a mathematical expression, which only requires the knowledge of the FWHM of the final PSF of the imaging system used. After the presentation of the theoretical derivation, the experimental evaluation of this method is performed using a PET/CT hybrid system and acquiring the IEC NEMA phantom with six spherical “hot” ROIs (with diameters of 10, 13, 17, 22, 28, and 37 mm) and a homogeneous “colder” background. In order to evaluate the recovery of quantitative data, the effect of statistical noise (different acquisition times), tomographic reconstruction algorithm with and without time-of-flight (TOF) and different signal-to-background activity concentration ratio (3:1 and 10:1) was studied. The application of the corrective method allows recovering the loss of quantification due to PVE for all sizes of spheres acquired, with a final accuracy less than 17%, for lesion dimensions larger than two FWHM and for acquisition times equal to or greater than two minutes.

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