Tribological investigation of quality of the industrial speed reducer synthetic lube oil used in material handling industry

2021 ◽  
Author(s):  
Dilip Kumar Bagal ◽  
Abhishek Barua ◽  
Siddharth Jeet ◽  
Dipti Acharjya ◽  
Ajit Kumar Pattanaik ◽  
...  
Keyword(s):  
Material Handling ◽  
Speed Reducer

scholarly journals The Application of a Neuro-Fuzzy Adaptive Crane Control System

2010 ◽  
Vol 14-15 (1) ◽  
pp. 247-258
Author(s):  
Jarosław Smoczek ◽  
Janusz Szpytko
Keyword(s):  
Control System ◽  
Material Handling ◽  
Fuzzy Controller ◽  
Laboratory Model ◽  
Crane Control ◽  
Neuro Fuzzy ◽  
To Come ◽  
Fuzzy Control Algorithm ◽  
Fuzzy Adaptive

The Application of a Neuro-Fuzzy Adaptive Crane Control SystemThe unconventional methods, mostly based on fuzzy logic, are often addressed to a problem of anti-sway crane control. The problem of practical application of those solutions is important owing to come the growing expectations for time and precision of transportation operations and exploitation quality of material handling devices. The paper presents the designing methods of an adaptive anti-sway crane control system based on the neuro-fuzzy controller, as well as the software and hardware equipments used to aid the programming realization the fuzzy control algorithm on a programmable logic controller (PLC). The proposed application of control system was tested on the laboratory model of an overhead traveling crane.

An Information-Theoretic Entropy Metric for Assessing Multi-Objective Optimization Solution Set Quality

2003 ◽  
Vol 125 (4) ◽  
pp. 655-663 ◽  
Author(s):  
Ali Farhang-Mehr ◽  
Shapour Azarm
Keyword(s):  
Evolutionary Algorithms ◽  
Pareto Frontier ◽  
Optimization Techniques ◽  
Solution Set ◽  
Multi Objective Optimization ◽  
Information Theoretic ◽  
Multi Objective ◽  
Speed Reducer ◽  
Quantitative Basis

An entropy-based metric is presented that can be used for assessing the quality of a solution set as obtained from multi-objective optimization techniques. This metric quantifies the “goodness” of a set of solutions in terms of distribution quality over the Pareto frontier. The metric can be used to compare the performance of different multi-objective optimization techniques. In particular, the metric can be used in analysis of multi-objective evolutionary algorithms, wherein the capabilities of such techniques to produce and maintain diversity among different solution points are desired to be compared on a quantitative basis. An engineering test example, the multi-objective design optimization of a speed-reducer, is provided to demonstrate an application of the proposed entropy metric.

scholarly journals Elements of perfect order rate research in logistics chains

2019 ◽  
Vol 49 (1) ◽  
pp. 25-35
Author(s):  
Ilona Jacyna-Gołda ◽  
Michał Kłodawski ◽  
Konrad Lewczuk ◽  
Marcin Łajszczak ◽  
Tomasz Chojnacki ◽  
...  
Keyword(s):  
Material Handling ◽  
Large Intensity ◽  
Safety Aspects ◽  
Order Rate ◽  
Standard Procedures ◽  
Perfect Order ◽  
Warehouse Workers ◽  
The Impact ◽  
Warehouse Operations

Perfect order rate (POR) is one of the superior measures of the logistics processes quality. POR is at the top of the hierarchy of key performance indicators (KPI) in supply chain and is considered as difficult to define and measure. Perfect order rate is composed of sub-measures touching technical, economic, quality and safety aspects of logistics processes. POR directly defines what the organization considers to be the perfect implementation of its tasks (and thus sets goals for the organization) and, secondly, measures the degree of achievement of these goals. The paper defines the concept of perfect order rate by including new elements to classic definition, so far rarely considered in the literature: possibility of order implementation according to standard procedures in organization and safety aspects. The concept of logistics chain and the impact of its functioning on the POR value have been defined. The picking and replenishment processes were discussed in detail as the basic elements affecting the quality of logistics processes and the value of POR. Next, the issues of logistic processes safety in warehouse facilities were discussed. The large intensity of warehouse operations along with their mechanization and automation very often leads to many hazards in warehouses and logistics chain. These hazard are usually related with warehouse workers safety. However, they can also lead to various delays or downtime in the material flows, as well as damage or reducing the quality of materials. So it was assumed that safety aspects can influencing the value of POR in the logistics chain. Due to conducted research and compiled reports indicate that many accidents in the warehouse are associated with the forklifts use as equipment for material handling. Therefore, in paper main attention was paid to hazards related with forklifts, warehouse safety speed, etc.

Similarity and Equivalence of Nutating Mechanisms to Bevel Epicyclic Gear Trains for Modeling and Analysis

2005 ◽  
Vol 127 (2) ◽  
pp. 269-277 ◽  
Author(s):  
Carl A. Nelson ◽  
Raymond J. Cipra
Keyword(s):  
Kinematic Analysis ◽  
Power Flow ◽  
Similarity Index ◽  
Static Force ◽  
Modeling And Analysis ◽  
Epicyclic Gear ◽  
Speed Reducer ◽  
Gear Trains ◽  
Degree Of Similarity

This paper addresses similarities between various nutating or wobbling mechanisms, in particular kinematic similarities. A case is made for the generalization of these mechanisms into a mechanism “class” having common kinematic characteristics, which is typified by bevel epicyclic gear trains. A similarity index is proposed to describe the quality of kinematic similarity, with the best degree of similarity termed “equivalence.” It is proposed that kinematic analysis of mechanisms belonging to this “class” can be simplified by modeling them as bevel-gear trains, and that static-force, power-flow, and efficiency analyses can also be greatly simplified in the case of “equivalent” mechanisms. Simplified kinematic, force, and efficiency analyses are demonstrated for a unique wobbling speed reducer using this new concept of equivalent geared mechanisms.

Immunoferritin localization of intracellular antigens in positively stained frozen sections

1978 ◽  
Vol 36 (2) ◽  
pp. 168-169
Author(s):  
K. T. Tokuyasu
Keyword(s):  
Surface Tension ◽  
Water Surface ◽  
Thin Layers ◽  
The Other ◽  
Positive Staining ◽  
Frozen Sections ◽  
The Past ◽  
Ultrathin Frozen Sections ◽  
Definition Of

During the past investigations of immunoferritin localization of intracellular antigens in ultrathin frozen sections, we found that the degree of negative staining required to delineate u1trastructural details was often too dense for the recognition of ferritin particles. The quality of positive staining of ultrathin frozen sections, on the other hand, has generally been far inferior to that attainable in conventional plastic embedded sections, particularly in the definition of membranes. As we discussed before, a main cause of this difficulty seemed to be the vulnerability of frozen sections to the damaging effects of air-water surface tension at the time of drying of the sections.Indeed, we found that the quality of positive staining is greatly improved when positively stained frozen sections are protected against the effects of surface tension by embedding them in thin layers of mechanically stable materials at the time of drying (unpublished).

Lithography below 100 nm

1983 ◽  
Vol 41 ◽  
pp. 96-99
Author(s):  
L. D. Jackel
Keyword(s):  
Spatial Distribution ◽  
Electron Beam ◽  
Electron Scattering ◽  
Electron Beam Lithography ◽  
Substrate Material ◽  
Local Electron ◽  
Electron Dose ◽  
Positive Resist ◽  
Exposure Process

Most production electron beam lithography systems can pattern minimum features a few tenths of a micron across. Linewidth in these systems is usually limited by the quality of the exposing beam and by electron scattering in the resist and substrate. By using a smaller spot along with exposure techniques that minimize scattering and its effects, laboratory e-beam lithography systems can now make features hundredths of a micron wide on standard substrate material. This talk will outline sane of these high- resolution e-beam lithography techniques.We first consider parameters of the exposure process that limit resolution in organic resists. For concreteness suppose that we have a “positive” resist in which exposing electrons break bonds in the resist molecules thus increasing the exposed resist's solubility in a developer. Ihe attainable resolution is obviously limited by the overall width of the exposing beam, but the spatial distribution of the beam intensity, the beam “profile” , also contributes to the resolution. Depending on the local electron dose, more or less resist bonds are broken resulting in slower or faster dissolution in the developer.

Convergent Beam Electron Diffraction

1978 ◽  
Vol 36 (3) ◽  
pp. 304-315
Author(s):  
G. Lehmpfuhl
Keyword(s):  
Electron Diffraction ◽  
Diffraction Pattern ◽  
Crystal Surface ◽  
Diffraction Spot ◽  
Crystal Thickness ◽  
Large Area ◽  
Electron Microscopic ◽  
Additional Information ◽  
Microscopic Investigations

Introduction In electron microscopic investigations of crystalline specimens the direct observation of the electron diffraction pattern gives additional information about the specimen. The quality of this information depends on the quality of the crystals or the crystal area contributing to the diffraction pattern. By selected area diffraction in a conventional electron microscope, specimen areas as small as 1 µ in diameter can be investigated. It is well known that crystal areas of that size which must be thin enough (in the order of 1000 Å) for electron microscopic investigations are normally somewhat distorted by bending, or they are not homogeneous. Furthermore, the crystal surface is not well defined over such a large area. These are facts which cause reduction of information in the diffraction pattern. The intensity of a diffraction spot, for example, depends on the crystal thickness. If the thickness is not uniform over the investigated area, one observes an averaged intensity, so that the intensity distribution in the diffraction pattern cannot be used for an analysis unless additional information is available.

Observability of Very Thick Specimen by Using Transmission Scanning Electron Microscope

1971 ◽  
Vol 29 ◽  
pp. 26-27
Author(s):  
K. Shibatomi ◽  
T. Yamanoto ◽  
H. Koike
Keyword(s):  
Electron Microscope ◽  
Image Quality ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Image Contrast ◽  
Objective Lens ◽  
Thick Specimen ◽  
Transmission Electron ◽  
Scanning Electron

In the observation of a thick specimen by means of a transmission electron microscope, the intensity of electrons passing through the objective lens aperture is greatly reduced. So that the image is almost invisible. In addition to this fact, it have been reported that a chromatic aberration causes the deterioration of the image contrast rather than that of the resolution. The scanning electron microscope is, however, capable of electrically amplifying the signal of the decreasing intensity, and also free from a chromatic aberration so that the deterioration of the image contrast due to the aberration can be prevented. The electrical improvement of the image quality can be carried out by using the fascionating features of the SEM, that is, the amplification of a weak in-put signal forming the image and the descriminating action of the heigh level signal of the background. This paper reports some of the experimental results about the thickness dependence of the observability and quality of the image in the case of the transmission SEM.

Microbulldozing and Microchiseling

1969 ◽  
Vol 27 ◽  
pp. 134-135
Author(s):  
J.N. Ramsey ◽  
D.P. Cameron ◽  
F.W. Schneider
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Material Handling ◽  
Microprobe Analysis ◽  
Foreign Matter ◽  
Specific Location ◽  
Potential Problems ◽  
Knoop Indenter ◽  
Scanning Electron ◽  
Microhardness Tester

As computer components become smaller the analytical methods used to examine them and the material handling techniques must become more sensitive, and more sophisticated. We have used microbulldozing and microchiseling in conjunction with scanning electron microscopy, replica electron microscopy, and microprobe analysis for studying actual and potential problems with developmental and pilot line devices. Foreign matter, corrosion, etc, in specific locations are mechanically loosened from their substrates and removed by “extraction replication,” and examined in the appropriate instrument. The mechanical loosening is done in a controlled manner by using a microhardness tester—we use the attachment designed for our Reichert metallograph. The working tool is a pyramid shaped diamond (a Knoop indenter) which can be pushed into the specimen with a controlled pressure and in a specific location.

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