Memory disc defect characterization using SEM and energy-dispersive x-ray analysis
In this era of computers, users of storage devices are requesting increased quantities of storage while maintaining or reducing the size of the package. This has meant a reduction in the size of a data bit and increased the susceptability of the media to microscopic defects, which occur in many shapes and sizes and at all stages of media processing. These processes are the machining of the raw substrates, coating the substrates, polishing the media and assembling the media in modules.In the past many of these defects could be overlooked since they didn't introduce missing bits in the read write process. The reason for this was the fact that the recording did not require a high track per inch or bit per inch packing density. Since all media specifications include requirements dealing with the quantity of missing bits or extra bit errors and their sizes; a study of media defects was implemented and the results are presented in this paper.