scholarly journals Modified Cryo-Preparation for Studying Salt Glands in the Turf Grass Zoysia matrella

2008 ◽  
Vol 16 (2) ◽  
pp. 44-45
Author(s):  
Sheetal Rao ◽  
Michael W. Pendleton ◽  
Marla L. Binzel ◽  
E. Ann Ellis
Keyword(s):  
Electron Microscope ◽  
Leaf Surface ◽  
Salt Gland ◽  
Specimen Preparation ◽  
Preparation Technique ◽  
Salt Glands ◽  
Turf Grass ◽  
Zoysia Matrella ◽  
Transmission Electron ◽  
Salt Secretion

Zoysia, a common turf grass, is characterized by the presence of functional salt glands. These glands are specialized structures through which the plants excrete excess salt. Research on the mechanism of salt secretion in Zoysia matrella (Manila grass) prompted the development of a specimen preparation technique that would preserve the secreted salt and salt gland. Conventional aqueous preparative techniques wash away the secreted salt on the leaf surface. A specimen preparation technique was modified from a simple cryo-preparative technique for examining hydrogels in the transmission electron microscope.

scholarly journals Rapid Cross-Section TEM Specimen Preparation of III-V Materials

2003 ◽  
Vol 11 (1) ◽  
pp. 29-32 ◽  
Author(s):  
R. Beanland
Keyword(s):  
Electron Microscope ◽  
Cross Section ◽  
Transmission Electron Microscope ◽  
Limited Resources ◽  
Specimen Preparation ◽  
Preparation Technique ◽  
Sample Type ◽  
Transmission Electron ◽  
Conventional Methods ◽  
The Cross

AbstractCross-section transmission electron microscope (TEM) specimen preparation of Ill-V materials using conventional methods can be a painful and time-consuming activity, with a day or more from receipt of a sample to examination in the TEM being the norm. This article describes the cross-section TEM specimen preparation technique used at Bookham Caswell. The usual time from start to finish is <1 hour. Up to 10 samples can be prepared at once, depending upon sample type. Most of the tools used are widely available and inexpensive, making the technique ideal for use in institutions with limited resources.

The relationship between salt gland density and sodium accumulation/secretion in a wide selection from three Zoysia species

2016 ◽  
Vol 64 (4) ◽  
pp. 277 ◽  
Author(s):  
Akihiro Yamamoto ◽  
Masatsugu Hashiguchi ◽  
Ryo Akune ◽  
Takahito Masumoto ◽  
Melody Muguerza ◽  
...  
Keyword(s):  
Salt Stress ◽  
Salt Gland ◽  
Salt Tolerant ◽  
Salt Accumulation ◽  
Adaxial Side ◽  
Salt Glands ◽  
Sodium Accumulation ◽  
Zoysia Matrella ◽  
Morphological Differences ◽  
Salt Secretion

Several zoysiagrasses (Zoysia spp.) have been reported to have leaf-epidermal salt glands, and it has been suggested that salt gland density, salt secretion and salt tolerance are positively correlated. The economically most important Zoysia species are Zoysia japonica Steud., Zoysia matrella Merr., and Zoysia pacifica (Goudswaard) M. Hotta & Kuroki, and among these, Z. matrella is considered to be the most salt-tolerant. In this study, we investigated the salt gland density, and characterised the secretion and accumulation of Na+ of 48 accessions of the three Zoysia species. We did not find any morphological differences in salt glands of Z. japonica and Z. pacifica, but large bicellular salt glands were found only on the adaxial side of Z. matrella. In addition, salt gland density differed significantly within and between the species. Under salt stress, all accessions accumulated and secreted Na+ at different rates. Z. japonica was a salt-accumulating type, whereas Z. matrella and Z. pacifica secreted most of the absorbed salt. However, the correlation between salt gland density and salt accumulation/secretion were not observed. Furthermore, Z. pacifica had the lowest gland density but showed the highest Na+ uptake and a secretion rate similar to most salt-tolerant Z. matrella. These results suggest that response to salt stress, namely, salt accumulation/secretion, is different between species, and that salt gland density and salt secretion are not always positively correlated.

An Evaluation of FIB Cross-Sectioning Using a Cooling Stage for Metals and Alloys with Low Melting Point

2013 ◽  
Vol 753 ◽  
pp. 3-6 ◽  
Author(s):  
Hideki Matsushima ◽  
Toshiaki Suzuki ◽  
Takeshi Nokuo
Keyword(s):  
Electron Microscope ◽  
Melting Point ◽  
Low Temperature ◽  
Advanced Materials ◽  
Specimen Preparation ◽  
Preparation Technique ◽  
Electron Microscopic ◽  
Cooling Stage ◽  
Transmission Electron ◽  
Microscopic Evaluation

Functions of an observation and an analysis in electron microscope, such as scanning electron microscope (SEM) or transmission electron microscope (TEM) are indispensable to evaluate advanced materials. Therefore a specimen preparation technique, that is a front end of the electron microscopy, has become highly important, thus a choice of it affects a result of the evaluation. The authors was combined a cooling stage in FIB and applied it for evaluation of metals with low melting point. The electron microscopic evaluation of Lead solder, Indium, Tin and Bismuth, metals with low melting point, has been always discussed if the results represent the actual physics. Metals with low melting point are heat sensitive materials, so the comparison of cross-sectioning with room and low temperature, it can be said that low temperature cross-sectioning has less effect and keeps the actual physics of the sample. In this paper, some knowledge from comparisons of cross-sectioning with room and low temperature for metals with low melting point are reported.

Contrast from epitaxially sandwiched macromolecules

1978 ◽  
Vol 36 (2) ◽  
pp. 226-227
Author(s):  
M. Talianker ◽  
D.G. Brandon
Keyword(s):  
Gold Film ◽  
Lattice Defect ◽  
Gold Foil ◽  
Specimen Preparation ◽  
Preparation Technique ◽  
Resolution Limit ◽  
Transmission Electron ◽  
Crystal Lattice Defect ◽  
Void Effect ◽  
Lattice Resolution

A new specimen preparation technique for visualizing macromolecules by conventional transmission electron microscopy has been developed. In this technique the biopolymer-molecule is embedded in a thin monocrystalline gold foil. Such embedding can be performed in the following way: the biopolymer is deposited on an epitaxially-grown thin single-crystal gold film. The molecule is then occluded by further epitaxial growth. In such an epitaxial sandwich an occluded molecule is expected to behave as a crystal-lattice defect and give rise to contrast in the electron microscope.The resolution of the method should be limited only by the precision with which the epitaxially grown gold reflects the details of the molecular structure and, in favorable cases, can approach the lattice resolution limit.In order to estimate the strength of the contrast due to the void-effect arising from occlusion of the DNA-molecule in a gold crystal some calculations were performed.

The ionic strength dependence of chromatin folding

1978 ◽  
Vol 36 (2) ◽  
pp. 220-221
Author(s):  
F. Thoma ◽  
TH. Koller
Keyword(s):  
Electron Microscopy ◽  
Electron Microscope ◽  
Ionic Strength ◽  
Specimen Preparation ◽  
Preparation Technique ◽  
Carbon Supports ◽  
Ionic Strength Dependence ◽  
Chromatin Folding ◽  
Strength Dependence ◽  
Preparation Techniques

Under a variety of electron microscope specimen preparation techniques different forms of chromatin appearance can be distinguished: beads-on-a-string, a 100 Å nucleofilament, a 250 Å fiber and a compact 300 to 500 Å fiber.Using a standardized specimen preparation technique we wanted to find out whether there is any relation between these different forms of chromatin or not. We show that with increasing ionic strength a chromatin fiber consisting of a row of nucleo- somes progressively folds up into a solenoid-like structure with a diameter of about 300 Å.For the preparation of chromatin for electron microscopy the avoidance of stretching artifacts during adsorption to the carbon supports is of utmost importance. The samples are fixed with 0.1% glutaraldehyde at 4°C for at least 12 hrs. The material was usually examined between 24 and 48 hrs after the onset of fixation.

Focused Ion Beam Analysis of Low-K Dielectrics

2000 ◽  
Author(s):  
H. J. Bender ◽  
R. A. Donaton
Keyword(s):  
Electron Microscope ◽  
Cross Section ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Single Step ◽  
Specimen Preparation ◽  
Transmission Electron ◽  
Beam Analysis ◽  
Low K ◽  
Scanning Electron

Abstract The characteristics of an organic low-k dielectric during investigation by focused ion beam (FIB) are discussed for the different FIB application modes: cross-section imaging, specimen preparation for transmission electron microscopy, and via milling for device modification. It is shown that the material is more stable under the ion beam than under the electron beam in the scanning electron microscope (SEM) or in the transmission electron microscope (TEM). The milling of the material by H2O vapor assistance is strongly enhanced. Also by applying XeF2 etching an enhanced milling rate can be obtained so that both the polymer layer and the intermediate oxides can be etched in a single step.

Transmission Electron Microscopy (TEM) Specimen Preparation Technique using Focused Ion Beam (FIB): Application to Material Characterization of Chemical Vapor Deposition of Tungsten (W) and Tungsten Silicides (WSix)

1997 ◽  
Author(s):  
K. Doong ◽  
J.-M. Fu ◽  
Y.-C. Huang
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Chemical Vapor Deposition ◽  
Vapor Deposition ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Chemical Vapor ◽  
Specimen Preparation ◽  
Preparation Technique ◽  
Transmission Electron

Abstract The specimen preparation technique using focused ion beam (FIB) to generate cross-sectional transmission electron microscopy (XTEM) samples of chemical vapor deposition (CVD) of Tungsten-plug (W-plug) and Tungsten Silicides (WSix) was studied. Using the combination method including two axes tilting[l], gas enhanced focused ion beam milling[2] and sacrificial metal coating on both sides of electron transmission membrane[3], it was possible to prepare a sample with minimal thickness (less than 1000 A) to get high spatial resolution in TEM observation. Based on this novel thinning technique, some applications such as XTEM observation of W-plug with different aspect ratio (I - 6), and the grain structure of CVD W-plug and CVD WSix were done. Also the problems and artifacts of XTEM sample preparation of high Z-factor material such as CVD W-plug and CVD WSix were given and the ways to avoid or minimize them were suggested.

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