14nm BEOL TDDB reliability testing and defect analysis

2015 ◽  
Author(s):  
Terence Kane
Keyword(s):  
Reliability Testing ◽  
Defect Analysis

Application Of Electron Microscopy To Automotive Finish Defect Analysis

1990 ◽  
Vol 48 (2) ◽  
pp. 258-259
Author(s):  
Martin J. Mahon ◽  
Patrick W. Keating ◽  
John T. McLaughlin
Keyword(s):  
Electron Microscopy ◽  
Zero Tolerance ◽  
Polymeric Materials ◽  
Plant Management ◽  
Defect Analysis ◽  
X Ray ◽  
Root Cause ◽  
Cutting Out ◽  
Foreign Materials ◽  
Automotive Finish

Coatings are applied to appliances, instruments and automobiles for a variety of reasons including corrosion protection and enhancement of market value. Automobile finishes are a highly complex blend of polymeric materials which have a definite impact on the eventual ability of a car to sell. Consumers report that the gloss of the finish is one of the major items they look for in an automobile.With the finish being such an important part of the automobile, there is a zero tolerance for paint defects by auto assembly plant management. Owing to the increased complexity of the paint matrix and its inability to be “forgiving” when foreign materials are introduced into a newly applied finish, the analysis of paint defects has taken on unparalleled importance. Scanning electron microscopy with its attendant x-ray analysis capability is the premier method of examining defects and attempting to identify their root cause.Defects are normally examined by cutting out a coupon sized portion of the autobody and viewing in an SEM at various angles.

Toward quantitative defect analysis using HREM

1994 ◽  
Vol 52 ◽  
pp. 714-715
Author(s):  
David J. Smith
Keyword(s):  
Electron Microscope ◽  
Unit Cell ◽  
Defect Analysis ◽  
Significant Progress ◽  
Detailed Characterization ◽  
Small Unit ◽  
Resolution Electron ◽  
High Resolution Electron Microscope ◽  
Large Unit Cell ◽  
Made In

The electron microscope has evolved to the level where it is now straightforward to record highresolution images from thin samples (t∼10 to 20nm) that are directly interpretable in terms of atomic arrangements. Whilst recorded images necessarily represent two-dimensional projections of the structure, many defects such as dislocations and interfaces may be linear or planar in nature and thus might be expected to be amenable to detailed characterization. In this review, we briefly consider the recent significant progress that has been made in quantitative defect analysis using the high-resolution electron microscope and then discuss some drawbacks to the technique as well as potential scope for further improvements. Surveys of defect modelling for some small-unit-cell materials and interfaces have recently been published, and reference should be made to other papers in this symposium for further examples.The technique of structure imaging originated in the early '70s with observations of large-unit-cell block oxides.

Pengaruh Motivasi Kerja Dan Lingkungan Kerja Terhadap Kinerja Karyawan Bappeda Kabupaten Wonosobo Tahun 2013

2017 ◽  
Vol 1 (2) ◽  
pp. 135-147
Author(s):  
Ary Sutrischastini ◽  
Ratna Setyani
Keyword(s):  
Work Environment ◽  
Work Motivation ◽  
Employee Performance ◽  
Linear Regression Analysis ◽  
Test Validity ◽  
Multiple Linear Regression Analysis ◽  
Reliability Testing ◽  
Evaluation Influence ◽  
Environment Variables ◽  
Research Goal

This research goal is to identification and evaluation influence of work motivation and work environment to employee’s performance in BAPPEDA Kabupaten Wonosobo. The object of this research is 37 employees of Badan Perencanaan Pembangunan Kabupaten Wonosobo. And the location of this research is at Badan Perencanaan Pembangunan Kabupaten Wonosobo. The analysis used is test validity, reliability testing, and test the hypothesis, with the help of the computer program SPSS version 17, using multiple linear regression analysis. Based on calculations of data and analysis used, the regression equation is obtained: Y = 11.733 + 0.320 X1 +0.334 X2 + ε, by using the equation regression analytical method can conclude that (X1) take effect positively against employees performance. With t value in amount of 2,219 (bigger than t in table in amount of 1,690) and significance value in amount of 0,33. By applying significance limited value in amount of 0,05, it means, hypothesis that claim if work motivation take effect against employees performance can be accepted. There is a positive and significant correlation between work environment variables (X2) against employees. With t value in amount of 2,219 (bigger than t in table in amount of 1,690) and significance value in amount of 0,33 (smaller than 0,5). Simultaneously, work motivation take effect positively and significantly against employees performance with the F value in amount of 11,562 (bigger than 0.05), then obtained significance value 0.000. It can be concluded that the work motivation and work environment has a positive and significant influence on employee performance in BAPPEDA Kabupaten Wonosobo.

Performance and Reliability of a MEMS-based tunable optical filter operating in the 1565 nm-1525 nm wavelength range

2002 ◽  
Vol 722 ◽  
Author(s):  
T. S. Sriram ◽  
B. Strauss ◽  
S. Pappas ◽  
A. Baliga ◽  
A. Jean ◽  
...  
Keyword(s):  
Silicon Nitride ◽  
Line Width ◽  
Insertion Loss ◽  
Optical Filter ◽  
Single Mode ◽  
Single Mode Fiber ◽  
Reliability Testing ◽  
Silicon Nitride Membrane ◽  
Tunable Optical Filter ◽  
Extensive Performance

AbstractThis paper describes the results of extensive performance and reliability characterization of a silicon-based surface micro-machined tunable optical filter. The device comprises a high-finesse Fabry-Perot etalon with one flat and one curved dielectric mirror. The curved mirror is mounted on an electrostatically actuated silicon nitride membrane tethered to the substrate using silicon nitride posts. A voltage applied to the membrane allows the device to be tuned by adjusting the length of the cavity. The device is coupled optically to an input and an output single mode fiber inside a hermetic package. Extensive performance characterization (over operating temperature range) was performed on the packaged device. Parameters characterized included tuning characteristics, insertion loss, filter line-width and side mode suppression ratio. Reliability testing was performed by subjecting the MEMS structure to a very large number of actuations at an elevated temperature both inside the package and on a test board. The MEMS structure was found to be extremely robust, running trillions of actuations without failures. Package level reliability testing conforming to Telcordia standards indicated that key device parameters including insertion loss, filter line-width and tuning characteristics did not change measurably over the duration of the test.

Failure Analysis and Defect Inspection of Electronic Devices by High-Resolution Cathodoluminescence

2017 ◽  
Author(s):  
C. Monachon ◽  
M.S. Zielinski ◽  
D. Gachet ◽  
S. Sonderegger ◽  
S. Muckenhirn ◽  
...  
Keyword(s):  
Failure Analysis ◽  
Electronic Materials ◽  
Electronic Devices ◽  
Optical Emission ◽  
Large Field ◽  
Nanometer Scale ◽  
Defect Analysis ◽  
Defect Inspection ◽  
Spectrally Resolved ◽  
Non Destructive

Abstract Quantitative cathodoluminescence (CL) microscopy is a new optical spectroscopy technique that measures electron beam-induced optical emission over large field of view with a spatial resolution close to that of a scanning electron microscope (SEM). Correlation of surface morphology (SE contrast) with spectrally resolved and highly material composition sensitive CL emission opens a new pathway in non-destructive failure and defect analysis at the nanometer scale. Here we present application of a modern CL microscope in defect and homogeneity metrology, as well as failure analysis in semiconducting electronic materials

Unique Autoclave Stress Induced Failure Mechanism

2005 ◽  
Author(s):  
John Butchko ◽  
Bruce T. Gillette
Keyword(s):  
Corrosion Rate ◽  
Grain Boundary ◽  
Failure Analysis ◽  
Failure Mechanism ◽  
Metal Corrosion ◽  
Corrosion Mechanism ◽  
Reliability Testing ◽  
Process Change ◽  
Transistor Reliability ◽  
Pass Through

Abstract Autoclave Stress failures were encountered at the 96 hour read during transistor reliability testing. A unique metal corrosion mechanism was found during the failure analysis, which was creating a contamination path to the drain source junction, resulting in high Idss and Igss leakage. The Al(Si) top metal was oxidizing along the grain boundaries at a faster rate than at the surface. There was subsurface blistering of the Al(Si), along with the grain boundary corrosion. This blistering was creating a contamination path from the package to the Si surface. Several variations in the metal stack were evaluated to better understand the cause of the failures and to provide a process solution. The prevention of intergranular metal corrosion and subsurface blistering during autoclave testing required a materials change from Al(Si) to Al(Si)(Cu). This change resulted in a reduced corrosion rate and consequently prevented Si contamination due to blistering. The process change resulted in a successful pass through the autoclave testing.

The Application of FIB Voltage-Contrast Technique Combining with TEM on Subtle Defect Analysis: Via Delamination After TC

1997 ◽  
Author(s):  
X. Yang ◽  
X. Song
Keyword(s):  
Cross Section ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
New Product ◽  
Defect Analysis ◽  
Transmission Electron ◽  
Contrast Technique ◽  
Defect Mechanism ◽  
Open Defect ◽  
Voltage Contrast

Abstract Novel Focused Ion Beam (FIB) voltage-contrast technique combined with TEM has been used in this study to identify a certain subtle defect mechanism that caused reliability stress failures of a new product. The suspected defect was first isolated to a unique via along the row through electrical testing and layout analysis. Static voltage contrast of FIB cross-section was used to confirm the suspected open defect at the via. Precision Transmission Electron Microscope (TEM) was then used to reveal the detail of the defect. Based on the result, proper process changes were implemented. The failure mode was successfully eliminated and the reliability of the product was greatly improved.

Analisis Pemahaman Wajib Pajak dan Iklan Pajak Terhadap Tingkat Kepatuhan Wajib Pajak Dalam Pajak Bumi dan Bangunan di KPP Tangerang Timur

2012 ◽  
Vol 4 (1) ◽  
pp. 66-85
Author(s):  
Nico Darmawan
Keyword(s):  
Mass Media ◽  
Hypothesis Testing ◽  
Multiple Regression ◽  
Sampling Method ◽  
Pearson Correlation ◽  
Electronic Media ◽  
Reliability Testing ◽  
Test Hypothesis ◽  
Validity Test ◽  
Convenience Sampling

This research was conducted to analyze relationship between the understanding of the taxpayer and the tax advertising towards compliance of taxpayer to pay Land and Building Tax (PBB) in the Tax Office (KPP) East Tangerang especially in sub-district Ciledug. Objects of this research are taxpayers who pay PBB in KPP East Tangerang especially in sub-district Ciledug and had seen tax advertising in both mass media and electronic media. The samples were taken by non-probability sampling method by using convenience sampling. The total samples used in analysis are 100 respondents. In the technique of data analysts, this research do the validity test by pearson correlation, reliability testing with coefficient Cronbach’s alpha, the classical assumption test, hypothesis testing multiple regression, t test, and F test. The result showed that the understanding of taxpayer have a significant effect on compliance of taxpayer and the tax advertising have  insignificant effect on compliance of taxpayer, meanwhile the understanding of taxpayer and tax advertising simultaneously had a significant effect on compliance of taxpayer. Keywords: Tax Advertising, Compliance of Taypayer, The Understanding of Taxpayer

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