Design, Manufacturing, and Characterization of Integrated Inductors With Two Magnetic Layers

2020 ◽  
Vol 56 (12) ◽  
pp. 1-7
Author(s):  
D. D. Yaya ◽  
M. Koularambaye ◽  
M. H. Bechir ◽  
A. Desire ◽  
S. Capraro ◽  
...  
Keyword(s):  
Integrated Inductors ◽  
Magnetic Layers

scholarly journals Design, Manufacturing and characterization of integrated inductors with magnetic layers for DC-DC converter

2012 ◽  
Vol 1 (2) ◽  
pp. 58 ◽  
Author(s):  
D. Yaya ◽  
D. Allassem ◽  
M. Youssouf ◽  
A. Siblini ◽  
J. P. Chatelon ◽  
...  
Keyword(s):  
Rf Sputtering ◽  
Low Frequency ◽  
Spiral Inductor ◽  
Gold Films ◽  
High Frequencies ◽  
Integrated Inductors ◽  
Magnetic Layers ◽  
Simulation Results ◽  
Fabrication And Characterization

This paper presents the conception, fabrication and characterization of integrated inductors containing magnetic layers. We require different steps of micro-technologies: preparation of glass and ferrite substrates, RF sputtering, photolithography, etching and finally electroplating techniques for copper and gold films. The geometrical magnitudes are determined by using HFSS simulator software. The measurements performed at low and high frequencies (up to 1 GHz) permit to verify the correlation between experiment and simulation results. The inductance of the manufactured spiral inductor is about 200 nH and it is constant from low frequency up to 0.9 GHz.

scholarly journals Fully Analytical Characterization of the Series Inductance of Tapered Integrated Inductors

2014 ◽  
Vol 60 (1) ◽  
pp. 65-69 ◽  
Author(s):  
Fabio Passos ◽  
M. Helena Fino ◽  
Elisenda R. Moreno
Keyword(s):  
Element Model ◽  
Technological Parameters ◽  
Integrated Inductors ◽  
Integrated Inductor ◽  
Lumped Element ◽  
Evaluation Of Performance ◽  
Lumped Element Model ◽  
General Method

Abstract In this paper a general method for the determination of the series inductance of polygonal tapered inductors is presented. The value obtained can be integrated into any integrated inductor lumped element model, thus granting the overall characterization of the device and the evaluation of performance parameters such as the quality factor or the resonance frequency. In this work, the inductor is divided into several segments and the corresponding self and mutual inductances are calculated. In the end, results obtained for several working examples are compared against electromagnetic (EM) simulations are performed in order to check the validity of the model for square, hexagonal, octagonal and tapered inductors. The proposed method depends exclusively on the geometric characteristics of the inductor as well as the technological parameters. This allows its straight forward application to any inductor shape or technology.

scholarly journals Characterization of integrated inductors with one and two YIG layers for low-power converters (1 W)

2014 ◽  
Vol 75 ◽  
pp. 06002
Author(s):  
D.D. Yaya ◽  
M.B. Bechir ◽  
M.K. Youssouf ◽  
M. Soultan ◽  
F. Kahlouche ◽  
...  
Keyword(s):  
Low Power ◽  
Power Converters ◽  
Integrated Inductors

Magnetic Film Analysis by RBS, PIXE, HFS and NRA

2002 ◽  
Vol 721 ◽  
Author(s):  
Luncun Wei
Keyword(s):  
Coating Layer ◽  
Layer Structure ◽  
Magnetic Film ◽  
Nuclear Reaction Analysis ◽  
X Ray ◽  
Depth Profiles ◽  
Magnetic Layers ◽  
Nitrogen Contents ◽  
Magnetic Coating

AbstractCharacterization of thin magnetic coating layer is always challenging, different analytical methods are required to characterize layer structure and composition. In the present paper, Rutherford backscattering (RBS)[1], particle induced x-ray emission (PIXE)[2], hydrogen forward scattering (HFS)[3] and nuclear reaction analysis (NRA)[4] are used to measure three typical magnetic film structures and coating layer. Carbon, oxygen, nitrogen contents are measured by deuteron NRA and hydrogen content by HFS. Magnetic layers beneath diamond-like carbon (DLC) layer are characterized by RBS and PIXE: PIXE for relative ratios of Cr, Fe, Co and Ni, and RBS for thickness and depth profiles. The analytical results of one test example shown in this paper demonstrate that the combination of these four methods can give complete and precise layer structure and composition.

Microscopic Techniques for Characterization of Magnetic Layers

1999 ◽  
Vol 591 ◽  
Author(s):  
N. Meyendorf ◽  
I. Altpeter ◽  
U. Netzelmann ◽  
J. Hoffmann ◽  
W. Nichtlpecher ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Magnetic Materials ◽  
High Importance ◽  
Sensor Actuator ◽  
New Methods ◽  
Nano Crystalline ◽  
Magnetic Layers ◽  
Memory Applications ◽  
Microscopic Techniques

ABSTRACTIn recent years increasing interest in magnetic materials especially amorphous and nano crystalline layers has arised. Due to the magnetostrictive and magnetoresistive properties magnetic materials obtained high importance in sensor, actuator and memory applications. Therefore new methods to characterize magnetic and mechanical properties of magnetic materials are required. Two new microscopic techniques will be presented in this paper.

scholarly journals Fabrication and characterization of micro-inductors deposited on magnetic thin and thick layers

2014 ◽  
Vol 2 (3) ◽  
pp. 44 ◽  
Author(s):  
A. Désiré ◽  
A. Kriga ◽  
M. Youssouf ◽  
A. Siblini ◽  
C. M. Jean-Pierre ◽  
...  
Keyword(s):  
High Frequency ◽  
Magnetic Layer ◽  
Thick Layer ◽  
Rf Magnetron Sputtering ◽  
Magnetic Core ◽  
Integrated Inductors ◽  
Electromagnetic Shield ◽  
Manufacturing Techniques ◽  
Thick Layers

This paper presents two fabrication techniques of spiral integrated inductors based on magnetic materials. For the first one, the magnetic core is a thin film deposited by RF magnetron sputtering, for the second technique the magnetic core is a thick layer of YIG obtained by micromachining. The addition of the magnetic material is expected to improve the performances of the integrated structure with electromagnetic shield. Low and high frequency equipment are used to characterize the manufactured components. A good correlation is obtained between the results by simulation and measurements for the two manufacturing techniques. These results show that the inductance increases when the thickness of the magnetic layer increases, we can double the inductance value for a thickness sufficiently high.

Hrem Characterization of Magnetic Tunnel Junctions and Discontinuous Multilayers

1998 ◽  
Vol 4 (S2) ◽  
pp. 798-799
Author(s):  
David J. Smith ◽  
Fuding Ge ◽  
C.L. Piatt ◽  
S. Sankar ◽  
A.E. Berkowitz
Keyword(s):  
Room Temperature ◽  
Tunnel Junctions ◽  
Magnetic Tunnel Junctions ◽  
Cross Sectional ◽  
Metal Insulator ◽  
Magnetic Layers ◽  
Magnetic Metal ◽  
Oxide Barrier ◽  
Metal Layers

There is much current interest in the magnetotransport properties of systems consisting of two (or more) magnetic metal layers separated by thin insulating layers. Traditional magnetic tunnel junctions (MTJs) are comprised of simple ferromagnet-insulator-ferromagnet trilayer structures and the conductance depends on the relative alignments of the magnetizations in the two ferromagnets. In the case of discontinuous metal/insulator multilayers, negative magnetoresistance (MR) results from spindependent tunneling. In both types of systems, the tunneling phenomena are strongly influenced by the microstructure of the films, particularly the metal/insulator interfaces and the nature and uniformity of the thin oxide barrier layers. In this study, we have used cross-sectional HREM to characterize a variety of magnetic tunnel junctions and discontinuous multilayers.The MTJs were prepared by rf and dc magnetron sputtering onto thermally oxidized (100) silicon wafers at room temperature. The magnetic layers consisted of thin films of Co, Fe and/or CoFe alloys with thicknesses ∼ 30-50nm, and the barriers included MgO, HfO2, CoO, SiO2 as well as Al2O3 (thicknesses in the range 2-10nm).

Growth and Characterization of Magnetic Nanostructures on Carbon Nanotube Templates

2001 ◽  
Vol 676 ◽  
Author(s):  
Yihong Wu ◽  
Peiwen Qiao ◽  
Towchong Chong
Keyword(s):  
Magnetic Field ◽  
Carbon Nanotube ◽  
Magnetic Particles ◽  
Microwave Plasma ◽  
Chemical Vapour ◽  
Magnetic Nanostructures ◽  
Magnetic Nanowires ◽  
Magnetic Layers ◽  
The Magnetic Field

ABSTRATWe describe the growth of magnetic nanostructures on carbon nanotube templates. The nanotubes were grown by microwave plasma enhanced chemical vapour deposition. The as grown nanotubes were aligned reasonably well around the substrate normal directions. Although the nanotubes were quite straight, there were still some bent and tilt as revealed by the scanning electron microscope observations. Magnetic field has been used to re-align or re-assemble the nanotubes before they were used as the templates to grow magnetic nanostructures. Depending on whether there is a magnetic particle on the top tip of each nanotube and the density of the nanotubes, there are two different consequences of applying a magnetic field to the nanotubes. For nanotubes with magnetic particles attached to their top tips, the post-growth treatment by the magnetic field resulted in re-assembly of the nanotubes into micro-umbrella type of structures. For those without magnetic particles, however, the effect of magnetic field treatment is negligible; but after the deposition of thin magnetic layers, the field treatment made the nanotubes much straighter than what they originally were and aligned almost vertically to the substrates. The re-aligned or re-assembled nanotubes were used as the templates to grow magnetic nanostructures. It was found that most of the magnetic nanostructures exhibited characteristics similar to those of magnetic nanowires.

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