Adhesion and Friction Coupling in Atomic Force Microscope-Based Nanopushing

2012 ◽  
Vol 135 (1) ◽  
Author(s):  
Fakhreddine Landolsi ◽  
Fathi H. Ghorbel ◽  
James B. Dabney
Keyword(s):  
Numerical Simulations ◽  
Atomic Force Microscope ◽  
Contact Mechanics ◽  
Interaction Model ◽  
Research Interest ◽  
Visual Sensing ◽  
Atomic Force ◽  
Proposed Model ◽  
Theoretical Investigations ◽  
Afm Cantilever

The use of the atomic force microscope (AFM) as a tool to manipulate matter at the nanoscale has received a large amount of research interest in the last decade. Experimental and theoretical investigations have showed that the AFM cantilever can be used to push, cut, or pull nanosamples. However, AFM-based nanomanipulation suffers a lack of repeatability and controllability because of the complex mechanics in tip-sample interactions and the limitations in AFM visual sensing capabilities. In this paper, we will investigate the effects of the tip-sample interactions on nanopushing manipulation. We propose the use of an interaction model based on the Maugis–Dugdale contact mechanics. The efficacy of the proposed model to reproduce experimental observations is demonstrated via numerical simulations. In addition, the coupling between adhesion and friction at the nanoscale is analyzed.

Effect of Interaction Modeling in AFM-Based Nanomanipulation

2008 ◽  
Author(s):  
Fakhreddine Landolsi ◽  
Fathi H. Ghorbel ◽  
James B. Dabney
Keyword(s):  
Experimental Data ◽  
Numerical Simulations ◽  
Interaction Model ◽  
Collision Process ◽  
Visual Sensing ◽  
Proposed Model ◽  
Interaction Modeling

AFM-based nanomanipulation is very challenging because of the complex mechanics in tip-sample interactions and the limitations in AFM visual sensing capabilities. In the present paper, we investigate the modeling of AFM-based nanomanipulation emphasizing the effects of the relevant interactions at the nanoscale. The major contribution of the present work is the use of a combined DMT-JKR interaction model in order to describe the complete collision process between the AFM tip and the sample. The coupling between the interactions and the friction at the nanoscale is emphasized. The efficacy of the proposed model to reproduce experimental data is demonstrated via numerical simulations.

Modeling the Thermomechanical Interaction Between an Atomic Force Microscope Cantilever and Laser Light

2012 ◽  
Author(s):  
Aarti Chigullapalli ◽  
Jason V. Clark
Keyword(s):  
Laser Beam ◽  
Resonance Frequency ◽  
Atomic Force Microscope ◽  
Laser Power ◽  
Laser Light ◽  
Laser Spot ◽  
Design Parameters ◽  
Atomic Force ◽  
Voltage Signal ◽  
Afm Cantilever

In this paper, we present the first computational model of the thermomechanical interaction between an atomic force microscope (AFM) cantilever and laser light. We validate simulation with experiment. Design parameters of our model include AFM laser power, laser spot position, and geometric and material properties of the cantilever. In the area of nanotechnology, the laser beam deflection method has been widely used in AFMs for detecting the cantilever’s deflection and resonance frequency. The laser deflection method consists of reflecting a laser beam off of an AFM cantilever onto a photo diode, which is converted to a voltage signal. Deflection of the cantilever results in a change in the laser reflection angle and a change in voltage signal. The mechanical properties of the cantilever affect the amount of deflection. Although much work has been done on increasing the sensitivity of the AFM, little work has been done on investigating the thermal effect of the laser-cantilever interaction. We observe that laser-induced thermal expansions in the AFM cantilever are measureable. Our simulated results suggest that both the laser power and spot positions significantly change the resonant response of the cantilevers. The resonance response is critical for the AFM tapping mode. In considering various laser powers, we observe that as we increase the power, the average temperature of the beam increases, which causes a decrease in resonance frequency. In considering various laser reflection spot positions, we find that as the laser spot moves away from the clamped end of the cantilever, the dissipation to the sample which is 6 m below the cantilever tip decreases, causing an increase in temperature but decrease in material softening. The results of our models are close to the experimental results with a relative error of 0.1%.

DMCMN: Experimental/Analytical Evaluation of the Effect of Tip Mass on Atomic Force Microscope Cantilever Calibration

2009 ◽  
Vol 131 (6) ◽  
Author(s):  
Matthew S. Allen ◽  
Hartono Sumali ◽  
Peter C. Penegor
Keyword(s):  
Atomic Force Microscope ◽  
Fundamental Mode ◽  
Spring Constant ◽  
Mode Shapes ◽  
Contact Mode ◽  
Modified Method ◽  
Atomic Force ◽  
Afm Cantilever ◽  
Cantilever Probes ◽  
Tip Mass

Quantitative studies of material properties and interfaces using the atomic force microscope (AFM) have important applications in engineering, biotechnology, and chemistry. Contrary to what the name suggests, the AFM actually measures the displacement of a microscale probe, so one must determine the stiffness of the probe to find the force exerted on a sample. Numerous methods have been proposed for determining the spring constant of AFM cantilever probes, yet most neglect the mass of the probe tip. This work explores the effect of the tip mass on AFM calibration using the method of Sader (1995, “Method for the Calibration of Atomic Force Microscope Cantilevers,” Rev. Sci. Instrum., 66, pp. 3789) and extends that method to account for a massive, rigid tip. One can use this modified method to estimate the spring constant of a cantilever from the measured natural frequency and Q-factor for any mode of the probe. This may be helpful when the fundamental mode is difficult to measure or to check for inaccuracies in the calibration obtained with the fundamental mode. The error analysis presented here shows that if the tip is not considered, then the error in the static stiffness is roughly of the same order as the ratio of the tip’s mass to the cantilever beam’s. The area density of the AFM probe is also misestimated if the tip mass is not accounted for, although the trends are different. The model presented here can be used to identify the mass of a probe tip from measurements of the natural frequencies of the probe. These concepts are applied to six low spring-constant, contact-mode AFM cantilevers, and the results suggest that some of the probes are well modeled by an Euler–Bernoulli beam with a constant cross section and a rigid tip, while others are not. One probe is examined in detail, using scanning electron microscopy to quantify the size of the tip and the thickness uniformity of the probe, and laser Doppler vibrometry is used to measure the first four mode shapes. The results suggest that this probe’s thickness is significantly nonuniform, so the models upon which dynamic calibration is based may not be appropriate for this probe.

Measuring intermolecular binding forces with the Atomic-Force Microscope: The magnetic jump method

1994 ◽  
Vol 52 ◽  
pp. 1054-1055
Author(s):  
J. H. Hoh ◽  
P. E. Hillner ◽  
P. K. Hansma
Keyword(s):  
Bond Strength ◽  
Atomic Force Microscope ◽  
Interaction Force ◽  
Intermolecular Forces ◽  
Atomic Force ◽  
Novel Approach ◽  
Binding Forces ◽  
Afm Cantilever ◽  
Paramagnetic Beads ◽  
Direct Readout

The atomic-force microscope (AFM) can measure forces between atoms and molecules with a sensitivity of <10−12 N. By coating the AFM tip with specific molecules the types of interactions that can be examined will be greatly extended. Recently tips with biotin attached have been used to probe surfaces coated with avidin or streptavidin, to measure the respective bond strength.We have developed a novel approach to measuring intermolecular forces with the AFM that employs paramagnetic beads coated with one of the molecules to be studied. Beads are incubated with a surface coated with the second molecule, and allowed to form a specific bond. A small magnet glued to an AFM cantilever is then advanced toward the bead until the bond with between the two molecules breaks and the bead “jumps” to the magnet. The deflection of the cantilever provides a direct readout of the interaction force at the “jump,” and thereby a measure of the bond strength.

Characterization of Heated Atomic Force Microscope Cantilevers in Air and Vacuum

2005 ◽  
Author(s):  
Jungchul Lee ◽  
Tanya L. Wright ◽  
Mark Abel ◽  
Erik Sunden ◽  
Alexei Marchenkov ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Single Crystal Silicon ◽  
Silicon On Insulator ◽  
Thermal Coupling ◽  
Electrical Measurements ◽  
Crystal Silicon ◽  
Laser Raman ◽  
Atomic Force ◽  
Afm Cantilever

This paper presents characterization of heated atomic force microscope (AFM) cantilevers in air and helium, both at atmospheric pressure and in a partially evacuated environment. The cantilevers are made of doped single-crystal silicon using a standard silicon-on-insulator cantilever fabrication process. The electrical measurements show the link between the cantilever temperature-dependant electrical characteristics, electrical resistive heating, and thermal properties of the heated AFM cantilever and its surroundings. Laser Raman thermometry measures temperature along the cantilever with resolution near 1 μm and 4°C. By modulating the gaseous environment surrounding the cantilever, it is possible to estimate the microscale thermal coupling between the cantilever and its environment. This work seeks to improve the calibration and design of heated AFM cantilevers.

scholarly journals Putting a Sphere on an Atomic Force Microscope Cantilever Tip

1997 ◽  
Vol 5 (10) ◽  
pp. 6-6 ◽  
Author(s):  
Stefan Zauscher
Keyword(s):  
Aqueous Solutions ◽  
Atomic Force Microscope ◽  
Van Der Waals ◽  
Great Precision ◽  
Atomic Force Microscope Cantilever ◽  
Quantitative Measurements ◽  
Atomic Force ◽  
Afm Cantilever ◽  
Repulsive Forces ◽  
Force Microscope Cantilever

Atomic Force Microscopes (AFM) can measure the force between a surface and the tip of a cantilever as a junction of separation with great precision. For example, van der Waals type forces and electrostatic repulsive forces can easily be measured in aqueous solutions using an AFM. The complex, pyramidal shape of the typical AFM cantilever is, however, not well suited for quantitative measurements. It is thus desirable to attach particles of known geometry (usually spheres) to the tip of a cantilever.

Increasing the Image Contrast of Atomic Force Microscope by Using Improved Rectangular Micro Cantilever

2011 ◽  
Vol 110-116 ◽  
pp. 4888-4892
Author(s):  
Ali Sadeghi
Keyword(s):  
Atomic Force Microscope ◽  
Contact Stiffness ◽  
Beam Theory ◽  
Flexural Vibration ◽  
Sample Surface ◽  
Limited Range ◽  
Image Contrast ◽  
Atomic Force ◽  
Afm Cantilever ◽  
Micro Cantilever

The resonant frequency of flexural vibrations for an atomic force microscope (AFM) cantilever has been investigated using the Euler-Bernoulli beam theory. The results show that for flexural vibration the frequency is sensitive to the contact position, the first frequency is sensitive only to the lower contact stiffness, but high order modes are sensitive in a larger range of contact stiffness. By increasing the height H, for a limited range of contact stiffness the sensitivity to the contact stiffness increases. This sensitivity controls the image contrast, or image quality. Furthermore, by increasing the angle between the cantilever and sample surface, the frequency decreases.

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