Cross section and linear polarization of tagged photons

1988 ◽  
Vol 66 (12) ◽  
pp. 1079-1087 ◽  
Author(s):  
J. Asai ◽  
H. S. Caplan ◽  
D. M. Skopik ◽  
W. Del Bianco ◽  
L. C. Maximon
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Linear Polarization ◽  
Coordinate Systems ◽  
Tagged Photons ◽  
Under Construction

Formulae for bremsstrahlung cross sections and polarizations are usually presented in coordinate systems not very suitable for application by experimental physicists to devices such as photon-tagging monochromators. In this paper the transformations between the different coordinate systems are presented, along with examples of the calculated cross sections and polarizations in a form convenient from the experimental standpoint. These examples also give the predicted characteristics of the photon tagger currently under construction at the Saskatchewan Accelerator Laboratory.

scholarly journals Emission cross sections for energetic O+(4S,2D,2P)–N2 collisions

2020 ◽  
Vol 34 (29) ◽  
pp. 2050280
Author(s):  
M. R. Gochitashvili ◽  
R. Y. Kezerashvili ◽  
D. F. Kuparashvili ◽  
M. Schulz ◽  
N. O. Mosulishvili ◽  
...  
Keyword(s):  
Cross Section ◽  
Metastable State ◽  
Cross Sections ◽  
Linear Polarization ◽  
Molecular Nitrogen ◽  
Emission Cross Section ◽  
Incident Beam ◽  
Molecular Ions ◽  
Collision System ◽  
Negative Band

Measurements of emission cross sections for the [Formula: see text] collision system with the incident beam of 1–10 keV [Formula: see text] in the ground [Formula: see text]) and metastable [Formula: see text] and [Formula: see text] states are reported. The emission cross section induced by incident ions in the metastable state [Formula: see text] is much larger than that for the ground [Formula: see text] state. The emission cross section of [Formula: see text] ion for [Formula: see text], [Formula: see text], and [Formula: see text] bands system is measured and the ratio of intensities for these bands is established as [Formula: see text] It is shown that the cross sections for the [Formula: see text] ions emissions in the dissociative charge exchange processes increase with the increase of the incident ion energy. The energy dependence of the emission cross section of the band [Formula: see text] [Formula: see text] nm of the first-negative band system of the [Formula: see text] and degree of linear polarization of emission in [Formula: see text] collision are measured for the first time. An influence of an admixture of the ion metastable state on a degree of linear polarization is revealed. The mechanism of the processes realized during collisions of ground and metastable oxygen ions on molecular nitrogen have been established. It is demonstrated that for [Formula: see text] collision system the degree of linear polarization by metastable [Formula: see text] ions is less compared to those that are in the ground [Formula: see text] state and the sign of emission of degree of linear polarization of excited molecular ions does not change.

Bremsstrahlung linear polarization

1989 ◽  
Vol 67 (6) ◽  
pp. 545-561
Author(s):  
W. Del Bianco ◽  
M. Carignan
Keyword(s):  
Differential Cross Section ◽  
Cross Section ◽  
Cross Sections ◽  
Linear Polarization ◽  
Differential Cross ◽  
Born Approximation ◽  
Gamma Ray ◽  
High Energy ◽  
Scattered Electron ◽  
Triple Differential Cross Section

The dependence of the bremsstrahlung perpendicular and parallel triple differential cross sections and the linear polarization on the angles and energies of the incident and scattered electron and of the emitted gamma-ray has been studied in the high-energy small-angle hypothesis. The expression used for the bremsstrahlung triple differential cross section is valid in the Born approximation and for an unscreened Coulomb potential of the nucleus.

Electron Irradiation Effects in Polyoxymethylene Crystals Grown Inside Trioxane Crystals

1971 ◽  
Vol 29 ◽  
pp. 78-79
Author(s):  
J. P. Colson ◽  
D. H. Reneker
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Detailed Examination ◽  
The Other ◽  
Electron Micrograph ◽  
Irradiation Effects ◽  
Threefold Axis ◽  
Typical Sample ◽  
Polymer Crystals ◽  
Chain Axis

Polyoxymethylene (POM) crystals grow inside trioxane crystals which have been irradiated and heated to a temperature slightly below their melting point. Figure 1 shows a low magnification electron micrograph of a group of such POM crystals. Detailed examination at higher magnification showed that three distinct types of POM crystals grew in a typical sample. The three types of POM crystals were distinguished by the direction that the polymer chain axis in each crystal made with respect to the threefold axis of the trioxane crystal. These polyoxymethylene crystals were described previously.At low magnifications the three types of polymer crystals appeared as slender rods. One type had a hexagonal cross section and the other two types had rectangular cross sections, that is, they were ribbonlike.

A quantitative approach to inner shell losses

1978 ◽  
Vol 36 (1) ◽  
pp. 526-527 ◽  
Author(s):  
R.D. Leapman ◽  
P. Rez ◽  
D.F. Mayers
Keyword(s):  
Energy Transfer ◽  
Cross Section ◽  
Cross Sections ◽  
Accurate Determination ◽  
Background Intensity ◽  
Core Excitation ◽  
Quantitative Basis ◽  
Cross Section Differential ◽  
Bound Electrons

Microanalysis by EELS has been developing rapidly and though the general form of the spectrum is now understood there is a need to put the technique on a more quantitative basis (1,2). Certain aspects important for microanalysis include: (i) accurate determination of the partial cross sections, σx(α,ΔE) for core excitation when scattering lies inside collection angle a and energy range ΔE above the edge, (ii) behavior of the background intensity due to excitation of less strongly bound electrons, necessary for extrapolation beneath the signal of interest, (iii) departures from the simple hydrogenic K-edge seen in L and M losses, effecting σx and complicating microanalysis. Such problems might be approached empirically but here we describe how computation can elucidate the spectrum shape.The inelastic cross section differential with respect to energy transfer E and momentum transfer q for electrons of energy E0 and velocity v can be written as

Oxygen K near edge structures studied with multiple scattering calculations

1988 ◽  
Vol 46 ◽  
pp. 504-505
Author(s):  
Xudong Weng ◽  
Peter Rez
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Partial Cross Section ◽  
Energy Window ◽  
Edge Structure ◽  
Fine Structures ◽  
Hydrogenic Model ◽  
Electron Energy Loss ◽  
Quantitative Chemical

In electron energy loss spectroscopy, quantitative chemical microanalysis is performed by comparison of the intensity under a specific inner shell edge with the corresponding partial cross section. There are two commonly used models for calculations of atomic partial cross sections, the hydrogenic model and the Hartree-Slater model. Partial cross sections could also be measured from standards of known compositions. These partial cross sections are complicated by variations in the edge shapes, such as the near edge structure (ELNES) and extended fine structures (ELEXFS). The role of these solid state effects in the partial cross sections, and the transferability of the partial cross sections from material to material, has yet to be fully explored. In this work, we consider the oxygen K edge in several oxides as oxygen is present in many materials. Since the energy window of interest is in the range of 20-100 eV, we limit ourselves to the near edge structures.

Absolute inner-shell cross section determination for EELS analysis

1988 ◽  
Vol 46 ◽  
pp. 534-535
Author(s):  
P.A. Crozier
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Absolute Cross Section ◽  
Specimen Thickness ◽  
Mass Thickness ◽  
Scattering Cross ◽  
Before And After ◽  
Estimated Error ◽  
Scattering Cross Sections ◽  
Electron Microscopist

Absolute inelastic scattering cross sections or mean free paths are often used in EELS analysis for determining elemental concentrations and specimen thickness. In most instances, theoretical values must be used because there have been few attempts to determine experimental scattering cross sections from solids under the conditions of interest to electron microscopist. In addition to providing data for spectral quantitation, absolute cross section measurements yields useful information on many of the approximations which are frequently involved in EELS analysis procedures. In this paper, experimental cross sections are presented for some inner-shell edges of Al, Cu, Ag and Au.Uniform thin films of the previously mentioned materials were prepared by vacuum evaporation onto microscope cover slips. The cover slips were weighed before and after evaporation to determine the mass thickness of the films. The estimated error in this method of determining mass thickness was ±7 x 107g/cm2. The films were floated off in water and mounted on Cu grids.

A technique for preparing semiconductor cross sections for both TEM and SEM analysis

1989 ◽  
Vol 47 ◽  
pp. 712-713
Author(s):  
Stanley J. Klepeis ◽  
J.P. Benedict ◽  
R.M Anderson
Keyword(s):  
Sample Preparation ◽  
Cross Section ◽  
Cross Sections ◽  
Sem Analysis ◽  
Preparation Technique ◽  
Ion Milling ◽  
Tem Analysis ◽  
Polished Cross Section ◽  
Area Of Interest ◽  
Polished Side

The ability to prepare a cross-section of a specific semiconductor structure for both SEM and TEM analysis is vital in characterizing the smaller, more complex devices that are now being designed and manufactured. In the past, a unique sample was prepared for either SEM or TEM analysis of a structure. In choosing to do SEM, valuable and unique information was lost to TEM analysis. An alternative, the SEM examination of thinned TEM samples, was frequently made difficult by topographical artifacts introduced by mechanical polishing and lengthy ion-milling. Thus, the need to produce a TEM sample from a unique,cross-sectioned SEM sample has produced this sample preparation technique.The technique is divided into an SEM and a TEM sample preparation phase. The first four steps in the SEM phase: bulk reduction, cleaning, gluing and trimming produces a reinforced sample with the area of interest in the center of the sample. This sample is then mounted on a special SEM stud. The stud is inserted into an L-shaped holder and this holder is attached to the Klepeis polisher (see figs. 1 and 2). An SEM cross-section of the sample is then prepared by mechanically polishing the sample to the area of interest using the Klepeis polisher. The polished cross-section is cleaned and the SEM stud with the attached sample, is removed from the L-shaped holder. The stud is then inserted into the ion-miller and the sample is briefly milled (less than 2 minutes) on the polished side. The sample on the stud may then be carbon coated and placed in the SEM for analysis.

Experimental Studies Of Multilayer Glass Structures On Compression, Compression With Bending And Simple Bending

2019 ◽  
pp. 22-30
Keyword(s):  
Cross Section ◽  
Cross Sections ◽  
Applied Load ◽  
Experimental Studies ◽  
Strength Properties ◽  
Research Topic ◽  
Normative Values ◽  
Laminated Glass ◽  
The Cross ◽  
Experimental Values

The work of multilayer glass structures for central and eccentric compression and bending are considered. The substantiation of the chosen research topic is made. The description and features of laminated glass for the structures investigated, their characteristics are presented. The analysis of the results obtained when testing for compression, compression with bending, simple bending of models of columns, beams, samples of laminated glass was made. Overview of the types and nature of destruction of the models are presented, diagrams of material operation are constructed, average values of the resistance of the cross-sections of samples are obtained, the table of destructive loads is generated. The need for development of a set of rules and guidelines for the design of glass structures, including laminated glass, for bearing elements, as well as standards for testing, rules for assessing the strength, stiffness, crack resistance and methods for determining the strength of control samples is emphasized. It is established that the strength properties of glass depend on the type of applied load and vary widely, and significantly lower than the corresponding normative values of the strength of heat-strengthened glass. The effect of the connecting polymeric material and manufacturing technology of laminated glass on the strength of the structure is also shown. The experimental values of the elastic modulus are different in different directions of the cross section and in the direction perpendicular to the glass layers are two times less than along the glass layers.

ANALYSIS OF THE GENERAL EQUATIONS OF THE TRANSVERSE VIBRATION OF A PIECEWISE UNIFORM VISCOELASTIC PLATE

2020 ◽  
Vol 7 (3) ◽  
pp. 52-56
Author(s):  
MMATMATISA JALILOV ◽  
◽  
RUSTAM RAKHIMOV ◽  
Keyword(s):  
Cross Section ◽  
Transverse Vibration ◽  
Three Dimensional ◽  
Viscoelastic Plate ◽  
Constant Thickness ◽  
Regional Problem ◽  
Rigid Contact ◽  
Under Construction ◽  
Derivatives Of ◽  
Theoretical Results

This article discusses the analysis of the general equations of the transverse vibration of a piecewise homogeneous viscoelastic plate obtained in the “Oscillation of inlayer plates of constant thickness” [1]. In the present work on the basis of a mathematical method, the approached theory of fluctuation of the two-layer plates, based on plate consideration as three dimensional body, on exact statement of a three dimensional mathematical regional problem of fluctuation is stood at the external efforts causing cross-section fluctuations. The general equations of fluctuations of piecewise homogeneous viscoelastic plates of the constant thickness, described in work [1], are difficult on structure and contain derivatives of any order on coordinates x, y and time t and consequently are not suitable for the decision of applied problems and carrying out of engineering calculations. For the decision of applied problems instead of the general equations it is expedient to use confidants who include this or that final order on derivatives. The classical equations of cross-section fluctuation of a plate contain derivatives not above 4th order, and for piecewise homogeneous or two-layer plates the elementary approached equation of fluctuation is the equation of the sixth order. On the basis of the analytical decision of a problem the general and approached decisions of a problem are under construction, are deduced the equation of fluctuation of piecewise homogeneous two-layer plates taking into account rigid contact on border between layers, and also taking into account mechanical and rheological properties of a material of a plate. The received theoretical results for the decision of dynamic problems of cross-section fluctuation of piecewise homogeneous two-layer plates of a constant thickness taking into account viscous properties of their material allow to count more precisely the is intense-deformed status of plates at non-stationary external loadings.

Cross Section Analysis of Cu Filled TSVs Based on High Throughput Plasma-FIB Milling

2012 ◽  
Author(s):  
Frank Altmann ◽  
Jens Beyersdorfer ◽  
Jan Schischka ◽  
Michael Krause ◽  
German Franz ◽  
...  
Keyword(s):  
High Resolution ◽  
Cross Section ◽  
High Throughput ◽  
Cross Sections ◽  
Electron Backscatter Diffraction ◽  
Grain Structure ◽  
Electron Backscatter ◽  
Section Surface ◽  
Backscatter Diffraction ◽  
Section Analysis

Abstract In this paper the new Vion™ Plasma-FIB system, developed by FEI, is evaluated for cross sectioning of Cu filled Through Silicon Via (TSV) interconnects. The aim of the study presented in this paper is to evaluate and optimise different Plasma-FIB (P-FIB) milling strategies in terms of performance and cross section surface quality. The sufficient preservation of microstructures within cross sections is crucial for subsequent Electron Backscatter Diffraction (EBSD) grain structure analyses and a high resolution interface characterisation by TEM.

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