HIGH GROWTH-RATE DEPOSITION OF μc-Si:H THIN FILM AT LOW TEMPERATURE WITH VHF-PECVD
2002 ◽
Vol 16
(28n29)
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pp. 4259-4262
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High growth rate deposition of μ c - Si:H film with VHF-PECVD at low temperature has been reported. Investigations showed that growth rates enhanced with higher excitation frequency and working pressure, but increased at first then decreased with the increase of plasma power. Optical emission spectroscopy (OES) was introduced to monitor VHF plasma. The relationship between the growth rates and the OES results has been discussed. Raman spectra were also used to study the a - Si:H /μ c - Si:H phase transition. Finally a high growth rate of 2.0nm/s has been obtained through the initially optimized condition.
2008 ◽
Vol 600-603
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pp. 115-118
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2008 ◽
Vol 254
(19)
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pp. 6072-6075
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1975 ◽
Vol 85
(1)
◽
pp. 189-191
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Keyword(s):
2006 ◽
Vol 527-529
◽
pp. 267-270
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2019 ◽
Vol 485
◽
pp. 381-390
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2015 ◽
Vol 821-823
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pp. 141-144
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