Enhancement of Photocatalytic Degradation of MB by Recyclable Li/Mn3O4 Thin films.

2021 ◽  
Author(s):  
M. A. Amara ◽  
T. Larbi ◽  
N. Mahdhi ◽  
Faycel saadallah ◽  
M. Amlouk
Keyword(s):  
Thin Films ◽  
Light Exposure ◽  
Spray Pyrolysis Technique ◽  
Photocatalytic Efficiency ◽  
X Ray Diffraction ◽  
Electrical Measurements ◽  
Sem Images ◽  
X Ray ◽  
Hydrophilic Character ◽  
Li Content

Abstract Thin films of physical--mixture of Hausmannite Mn3O4 and lithium (Li) are synthesized by spray pyrolysis technique. Structural, morphological, optical, electrical, wettability and photocatalytic properties have been investigated. X-ray diffraction (XRD) and Raman spectra, Scanning electron microscope (SEM) images and electrical measurements show that Li nanoparticles are formed both on top surface of the film and inside grain boundaries. Bandgap and Urbach energies and optical relaxation time have been determined from transmittance T and reflectance R spectra. Impedance spectroscopy shows that charge separation increases with Li content, which improves photocatalytic efficiency of the film. The best photocatalytic efficiency is obtained for Li/Mn ratio of 15%. Indeed, the degradation of methylene blue (MB) under ultraviolet (UV) and visible light exposure, is improved by a factor of 5.7 and 2.4 respectively, when compared to undoped Mn3O4. In addition, this film exhibits a high photostability (10 cycles consecutively) under solar light. On the other hand, hydrophobicity reveals the hydrophilic character of the films.

Effect of F-doping on temperature dependence of resistivity of vanadium pentoxide thin films prepared by spray pyrolysis

2018 ◽  
Vol 32 (20) ◽  
pp. 1850229
Author(s):  
M. Mousavi ◽  
Gh. Khorami ◽  
A. Kompany ◽  
N. Shahtahmasebi
Keyword(s):  
Thin Films ◽  
Phase Transition ◽  
Vanadium Pentoxide ◽  
Metallic Phase ◽  
Electrical Characteristics ◽  
X Ray Diffraction ◽  
Electrical Measurements ◽  
Sem Images ◽  
X Ray ◽  
Transition Change

This paper reports structural and electrical characteristics of F-doped [Formula: see text]V2O5 thin films of different F concentrations. The films were analyzed by X-ray diffraction. It was found that F-doping in vanadium pentoxide affects the crystallinity of the samples. The SEM images have shown that by increasing the F-doping level, the size of the nanobelt increases. Electrical measurements indicated that the F-doping in [Formula: see text]V2O5 makes the temperature of phase transition change from semiconductor to metallic phase.

Crystallization of Zn-rich and P-rich amorphous Zn3P2 thin films

1988 ◽  
Vol 66 (5) ◽  
pp. 373-375 ◽  
Author(s):  
C. J. Arsenault ◽  
D. E. Brodie
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Activation Energy ◽  
Electrical Properties ◽  
Structural Properties ◽  
Crystallization Process ◽  
X Ray Diffraction ◽  
Electrical Measurements ◽  
Conductivity Activation Energy ◽  
X Ray

Zn-rich and P-rich amorphous Zn3P2 thin films were prepared by co-evaporation of the excess element during the normal Zn3P2 deposition. X-ray diffraction techniques were used to investigate the structural properties and the crystallization process. Agglomeration of the excess element within the as-made amorphous Zn3P2 thin film accounted for the structural properties observed after annealing the sample. Electrical measurements showed that excess Zn reduces the conductivity activation energy and increases the conductivity, while excess P up to 15 at.% does not alter the electrical properties significantly.

Dielectric and Room Temperature Tunable Properties of Mg-doped Ba0.96Ca0.04Ti0.84Zr0.16O3 Thin Films on Pt/MgO

2002 ◽  
Vol 720 ◽  
Author(s):  
T.S. Kalkur ◽  
Woo-Chul Yi ◽  
Elliott Philofsky ◽  
Lee Kammerdine
Keyword(s):  
Thin Films ◽  
Bottom Electrode ◽  
Dissipation Factor ◽  
X Ray Diffraction ◽  
Electrical Measurements ◽  
X Ray ◽  
High Tunability ◽  
High Dielectric ◽  
Mgo Substrate ◽  
Mg Doped

AbstractMg- doped Ba0.96 Ca0.04 Ti0.84Zr0.16O3 (BCTZ) thin films were fabricated on Pt/MgO substrate by metallorganic decomposition method. The structure of the films were analyzed by x-ray diffraction. The electrical measurements were performed on metal-ferroelectric-metal capacitors with platinum as the top and bottom electrode. The dielectric properties were improved after the capacitors were post annealed at 700 °C in oxygen atmosphere for 30 min. A high dielectric constant of 504 and a dissipation factor of less than 4% was obtained at 1 MHz. The Pt/BCTZ/Pt/MgO capacitors exhibited high tunability of 55% at an applied field of 55 kV/cm.

SnO2:F Thin Films with High Fluorine Contents Produced by Spray Pyrolysis at Constant Substrate Temperature

1996 ◽  
Vol 441 ◽  
Author(s):  
D. R. Acosta ◽  
E. Zironi ◽  
W. Estrada ◽  
E. Montoya
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Spray Pyrolysis ◽  
Tin Oxide ◽  
Spray Pyrolysis Technique ◽  
Structural Parameters ◽  
Final Concentration ◽  
X Ray Diffraction ◽  
Electrical And Optical Properties ◽  
X Ray

AbstractFluorine doped tin oxide thin films were prepared from solutions with high fluorine contents using the spray pyrolysis technique; the resulting films were studied by electron and X-ray diffraction methods; the resonant nuclear reaction (RNR) method was used to determine the final concentration of fluorine atoms in our films for different doping levels. Also, electrical and optical properties of SnO2:F films were measured and correlated with deposition and structural parameters obtained from X-Ray diffraction and electron microscopy studies.

Deposition of Nano Fiber ZnO and Zn1-xCdxO Thin Films by a Simple Spray Pyrolysis and Characterizations for Optoelectronic Applications

2012 ◽  
Vol 545 ◽  
pp. 100-104 ◽  
Author(s):  
J. Podder ◽  
M.R Islam
Keyword(s):  
Thin Films ◽  
Spray Pyrolysis ◽  
Optical Band Gap ◽  
Zinc Alloy ◽  
X Ray Diffraction ◽  
Sem Images ◽  
X Ray ◽  
Vis Spectroscopy ◽  
Nano Fiber ◽  
Cadmium Zinc

ZnO and Zn1-xCdxO thin films have been deposited onto glass substrate using spray pyrolysis at 200°C. Cadmium-zinc alloy thin films have been prepared by taking different concentrations of cadmium (Cd). The elemental analysis and the surface morphology of the films were carried by the energy dispersive X-ray (EDX) and scanning electron microscopy (SEM). The EDX data show that the films are highly stoichiometric. The SEM images show that the film changes from nano fiber to grain with the increase of Cd concentrations. The X-ray diffraction pattern shows that the films are polycrystalline in nature. The crystal structure of the films changes from hexagonal-ZnO to cubic-CdO depending on the concentration of Zn and Cd in the Zn1-xCdxO films. The optical properties of these films were studied by UV-VIS spectroscopy. The optical band gap of the films was changed from 3.2 to 2.4 with the variation of cadmium.

Structural, Magnetic and Magneto-tranport Properties of Reactive-sputtered Fe3O4 Thin Films

2010 ◽  
Vol 1250 ◽  
Author(s):  
Xinghua Wang ◽  
Sarjoosing Goolaup ◽  
Peng Ren ◽  
Wen Siang Lew
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Single Phase ◽  
Native Oxide ◽  
X Ray Diffraction ◽  
Verwey Transition ◽  
Electrical Measurements ◽  
Metal Insulator ◽  
X Ray ◽  
Sample Measurement

AbstractThin films of magnetite (Fe3O4) are grown on a single-crystal Si/SiO2 (100) substrate with native oxide using DC reactive sputtering technique at room tempreture (RT) and 300C. The x-ray diffraction(XRD) result shows the thermal energy during deposition enhances the crystallization of the Fe3O4 and x-ray photoelectron spectroscopy confirms the film deposited at 300C is single-phase Fe3O4 while the film deposited at RT is mostly ν-Fe2O3. The electrical measurements show that the resistivity of the Fe3O4 film increases exponentially with decreasing temperature, and exhibit a sharp metal-insulator transition at around 100 K, indicating the Verwey transition feature. The saturation magnetization Ms of Fe3O4 film measured by vibrating sample measurement (VSM) at RT was found to be 445 emu/cm3.

Preparation and Electrical Properties of Bi0.9Nd0.1Fe0.925Mn0.075O3 Thin Films

2012 ◽  
Vol 557-559 ◽  
pp. 1933-1936
Author(s):  
Ning Yan ◽  
Sheng Hong Yang ◽  
Yue Li Zhang
Keyword(s):  
Thin Films ◽  
Remanent Polarization ◽  
Ferroelectric Properties ◽  
Sol Gel ◽  
X Ray Diffraction ◽  
Electrical Measurements ◽  
X Ray ◽  
Low Leakage ◽  
Bifeo3 Thin Films ◽  
Low Leakage Current

Pure BiFeO3(BFO) and Bi0.9Nd0.1Fe0.925Mn0.075O3(BNFM) thin films were deposited on Pt(111)/Ti/SiO2/Si substrate by sol-gel method. X-ray diffraction analysis showed that all the films were single perovskite structure and a phase transition appeared in Nd–Mn codoped BiFeO3 thin films. Electrical measurements indicated that the ferroelectric properties of BFO thin films were significantly improved by Nd and Mn codoping. BNFM films exhibit a low leakage current and a good P-E hysteresis loop. The remanent polarization (Pr) value of 74μC/cm2has been obtained in BNFM films, while the coercive field (Ec) is 184kV/cm.

scholarly journals Influence of Nd and Ce doping on the structural, optical and electrical properties of V2O5 thin films

2019 ◽  
Vol 14 (30) ◽  
pp. 73-82
Author(s):  
I. K. Jassim
Keyword(s):  
Thin Films ◽  
Spray Pyrolysis Technique ◽  
Chemical Spray Pyrolysis ◽  
X Ray Diffraction ◽  
Transition Band ◽  
X Ray ◽  
Chemical Spray ◽  
V2o5 Thin Films ◽  
P Type ◽  
Nano Grains

Nano-structural of vanadium pentoxide (V2O5) thin films weredeposited by chemical spray pyrolysis technique (CSPT). Nd and Cedoped vanadium oxide films were prepared, adding Neodymiumchloride (NdCl3) and ceric sulfate (Ce(SO4)2) of 3% in separatesolution. These precursor solutions were used to deposit un-dopedV2O5 and doped with Nd and Ce films on the p-type Si (111) andglass substrate at 250°C. The structural, optical and electricalproperties were investigated. The X-ray diffraction study revealed apolycrystalline nature of the orthorhombic structure with thepreferred orientation of (010) with nano-grains. Atomic forcemicroscopy (AFM) was used to characterize the morphology of thefilms. Un-doped V2O5 and doped with 3% concentration of Nd andCe films have direct allowed transition band gap. The mechanisms ofdc-conductivity of un-doped V2O5 and doped with Nd and Ce filmsat the range 303 K to 473 K have been discussed.

Effect of Deposition Time on Structural and Optical Properties of ZnO Thin Films Deposited by Spray Pyrolysis

2019 ◽  
Vol 397 ◽  
pp. 81-87 ◽  
Author(s):  
Farid Khediri ◽  
Abdelkader Hafdallah ◽  
Mouna Bouhelal
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Spray Pyrolysis ◽  
Deposition Time ◽  
Spray Pyrolysis Technique ◽  
Precursor Solution ◽  
Zno Thin Films ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
X Ray

In this work Zinc oxide thin films prepared by spray pyrolysis technique. A set of ZnO thin films were deposited with various deposition times, on glass substrate at 350 °C. The precursor solution is formed with zinc acetate in distilled methanol with 0.1 molarity. The deposition time was ranged from 2 to 8 min. The structural and optical properties of those films were examined by X-ray diffraction (XRD) and ultraviolet-visible spectrometer (UV). X-ray diffraction patterns of the ZnO thin films showed polycrystalline hexagonal wurtzite structure and the preferred orientation was along (002) plane when the grain size varied between 9.66 and 16.67nm. ZnO thin films were highly transparent in the visible with the maximum transmittance of 85% and the optical band gap was found between 3.25 and 3.28 eV.

Electrosynthesis and Studies on CdZnSe Thin Films

2011 ◽  
Vol 15 (1) ◽  
pp. 37-42
Author(s):  
T. Mahalingam ◽  
V. Dhanasekaran ◽  
S. Rajendran ◽  
R. Chandramohan ◽  
Luis Ixtlilco ◽  
...  
Keyword(s):  
Thin Films ◽  
Optical Band Gap ◽  
Ph Value ◽  
Bath Temperature ◽  
X Ray Diffraction ◽  
Optical Studies ◽  
Sem Images ◽  
X Ray ◽  
Predominant Orientation ◽  
Diffraction Patterns

Electrodeposited CdZnSe thin films have been prepared at various bath temperatures. The thickness of the films was estimated between 850 nm and 1500 nm by stylus method. The X-ray diffraction patterns revealed that the polycrystalline nature with cubic structure of CdZnSe alloy thin films. Microstructural properties such as, crystallite size, dislocation density, microstrain and number of crystallites per unit area were calculated using predominant orientation of the films. SEM images revealed that the surface morphology could be tailored suitably by adjusting the pH value during deposition. The surface roughness of the film was estimated using topographical studies. Optical properties of the film were analyzed from absorption and transmittance studies. Optical band gap of the films increased from 1.67 to 1.72 eV with the increase of bath temperature from 30 to 90℃. The optical constants (refractive index (n) and extinction coefficient (k)) of CdZnSe thin films were evaluated using optical studies.

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