Быстродействующая атомно-силовая и сканирующая капиллярная микроскопия в решении задач материаловедения, биологии и медицины

2020 ◽  
Vol 13 (3-4) ◽  
pp. 222-228
Author(s):  
И.В. Яминский ◽  
А.И. Ахметова
Keyword(s):  
Antibiotic Resistance ◽  
Early Detection ◽  
Biomedical Research ◽  
Drug Screening ◽  
Targeted Delivery ◽  
High Speed ◽  
Scanning Probe ◽  
Biological Processes ◽  
Atomic Force ◽  
Probe Microscope

Разработка высокоэффективных режимов быстродействующего сканирующего зондового микроскопа, в первую очередь атомно-силовой и сканирующей капиллярной микроскопии, представляет особый интерес для успешного проведения биомедицинских исследований: изучения биологических процессов и морфологии биополимеров, определения антибио­тикорезистентности бактерий, адресной доставки биомакромолекул, скринингу лекарств, раннему обнаружению биологических агентов (вирусов и бактерий) и др. The development of highly efficient modes of a high-speed scanning probe microscope, primarily atomic force and scanning capillary microscopy, is of particular interest for successful biomedical research: studying biological processes and the morphology of biopolymers, determining antibiotic resistance of bacteria, targeted delivery of biomacromolecules, drug screening, early detection agents (viruses and bacteria), etc.

A Study of the Photoelectric Effect Caused by a Laser Beam Used in a Beam Bounce Technique in a C-AFM System

2008 ◽  
Author(s):  
Hung-Sung Lin ◽  
Mong-Sheng Wu
Keyword(s):  
Laser Beam ◽  
Failure Analysis ◽  
Atomic Force Microscope ◽  
Photoelectric Effect ◽  
Scanning Probe ◽  
Nanometer Scale ◽  
Electrical Characteristics ◽  
Atomic Force ◽  
Probe Microscope ◽  
Probe Head

Abstract The use of a scanning probe microscope (SPM), such as a conductive atomic force microscope (C-AFM) has been widely reported as a method of failure analysis in nanometer scale science and technology [1-6]. A beam bounce technique is usually used to enable the probe head to measure extremely small movements of the cantilever as it is moved across the surface of the sample. However, the laser beam used for a beam bounce also gives rise to the photoelectric effect while we are measuring the electrical characteristics of a device, such as a pn junction. In this paper, the photocurrent for a device caused by photon illumination was quantitatively evaluated. In addition, this paper also presents an example of an application of the C-AFM as a tool for the failure analysis of trap defects by taking advantage of the photoelectric effect.

SCANNING PROBE MICROSCOPY BASED NANOSCALE PATTERNING AND FABRICATION

COSMOS ◽  
2007 ◽  
Vol 03 (01) ◽  
pp. 1-21 ◽  
Author(s):  
XIAN NING XIE ◽  
HONG JING CHUNG ◽  
ANDREW THYE SHEN WEE
Keyword(s):  
Integrated Circuits ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Nanoscale Patterning ◽  
Atomic Force ◽  
Probe Microscope ◽  
Molecular Manipulation

Nanotechnology is vital to the fabrication of integrated circuits, memory devices, display units, biochips and biosensors. Scanning probe microscope (SPM) has emerged to be a unique tool for materials structuring and patterning with atomic and molecular resolution. SPM includes scanning tunneling microscopy (STM) and atomic force microscopy (AFM). In this chapter, we selectively discuss the atomic and molecular manipulation capabilities of STM nanolithography. As for AFM nanolithography, we focus on those nanopatterning techniques involving water and/or air when operated in ambient. The typical methods, mechanisms and applications of selected SPM nanolithographic techniques in nanoscale structuring and fabrication are reviewed.

Structural and Magnetic Investigation of Cu, Co Substituted NiFe2O4 Thin Films by Scanning Probe Microscopy (AFM, MFM)

2015 ◽  
Vol 830-831 ◽  
pp. 589-591 ◽  
Author(s):  
Hakikat Sharma ◽  
N.S. Negi
Keyword(s):  
Thin Films ◽  
Grain Size ◽  
Microstructural Analysis ◽  
Secondary Phase ◽  
Scanning Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Magnetic Investigation ◽  
Probe Microscope ◽  
Xrd Patterns

In the present study we prepared NiFe2O4, Ni0.95Cu0.05Fe2O4and Ni0.94Cu0.05Co0.01Fe2O4thin films by metallo-organic decomposition method (MOD) using spin coating technique. The samples were characterized by XRD. XRD patterns of thin films confirmed the formation of cubic spinel structure without any secondary phase. For microstructural analysis we characterized samples by Scanning Probe Microscope (SPM). From Atomic force microscopy (AFM), we analyzed surface morphology, calculated grain size, roughness and porosity. It has been found that grain size and roughness affected by Cu, Co substitution. After this we carried out magnetic force microscopy (MFM) on the samples. Effect of substitution on magnetic grains was observed from MFM.

Bacteria and viruses in the objective of probe microscopy

2021 ◽  
Vol 3 ◽  
Author(s):  
I.V. Yaminsky ◽  
Keyword(s):  
Atomic Force Microscopy ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Probe Microscope

The article is devoted to the study of viruses and bacteria using a scanning probe microscope in the atomic force microscopy mode, in particular, to the question, what data can be obtained using this method and how to interpret it.

Creep, Hysteresis, and Vibration Compensation for Piezoactuators: Atomic Force Microscopy Application

1999 ◽  
Vol 123 (1) ◽  
pp. 35-43 ◽  
Author(s):  
D. Croft ◽  
G. Shed ◽  
S. Devasia
Keyword(s):  
High Precision ◽  
Scanning Probe Microscopy ◽  
High Speed ◽  
Scanning Probe ◽  
Optical Systems ◽  
Positioning Precision ◽  
Force Microscopy ◽  
Atomic Force ◽  
Vibration Compensation ◽  
Adverse Affects

This article studies ultra-high-precision positioning with piezoactuators and illustrates the results with an example Scanning Probe Microscopy (SPM) application. Loss of positioning precision in piezoactuators occurs (1) due to hysteresis during long range applications, (2) due to creep effects when positioning is needed over extended periods of time, and (3) due to induced vibrations during high-speed positioning. This loss in precision restricts the use of piezoactuators in high-speed positioning applications like SPM-based nanofabrication, and ultra-high-precision optical systems. An integrated inversion-based approach is presented in this article to compensate for all three adverse affects—creep, hysteresis, and vibrations. The method is applied to an Atomic Force Microscope (AFM) and experimental results are presented that demonstrate substantial improvements in positioning precision and operating speed.

scholarly journals High Speed, Large Scan Area, Distortion Free Operation of a Single-Chip Scanning Probe Microscope

2016 ◽  
Vol 22 (S3) ◽  
pp. 372-373
Author(s):  
N. Sarkar ◽  
G. Lee ◽  
D Strathearn ◽  
M. Olfat ◽  
R.R. Mansour
Keyword(s):  
High Speed ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Single Chip ◽  
Probe Microscope ◽  
Area Distortion

scholarly journals A scanning probe microscope for magnetoresistive cantilevers utilizing a nested scanner design for large-area scans

2015 ◽  
Vol 6 ◽  
pp. 451-461 ◽  
Author(s):  
Tobias Meier ◽  
Alexander Förste ◽  
Ali Tavassolizadeh ◽  
Karsten Rott ◽  
Dirk Meyners ◽  
...  
Keyword(s):  
Scanning Probe ◽  
Beam Deflection ◽  
Self Assembled Monolayers ◽  
Atomic Step ◽  
Large Area ◽  
Atomic Force ◽  
Optical Grating ◽  
Assembled Monolayers ◽  
Probe Microscope

We describe an atomic force microscope (AFM) for the characterization of self-sensing tunneling magnetoresistive (TMR) cantilevers. Furthermore, we achieve a large scan-range with a nested scanner design of two independent piezo scanners: a small high resolution scanner with a scan range of 5 × 5 × 5 μm3 is mounted on a large-area scanner with a scan range of 800 × 800 × 35 μm3. In order to characterize TMR sensors on AFM cantilevers as deflection sensors, the AFM is equipped with a laser beam deflection setup to measure the deflection of the cantilevers independently. The instrument is based on a commercial AFM controller and capable to perform large-area scanning directly without stitching of images. Images obtained on different samples such as calibration standard, optical grating, EPROM chip, self-assembled monolayers and atomic step-edges of gold demonstrate the high stability of the nested scanner design and the performance of self-sensing TMR cantilevers.

An Adjustable Inertia Balance Support for High-Speed Scanning Probe Microscope

2014 ◽  
Vol 1061-1062 ◽  
pp. 735-738
Author(s):  
Gang Yi Yan
Keyword(s):  
Traditional Method ◽  
High Speed ◽  
High Performance ◽  
Inertial Force ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Current Structure ◽  
Probe Microscope ◽  
Promising Application ◽  
Supporting Base

An adjustable inertia balance support is proposed to counterbalance the inertial force from the actuators for high performance scanning probe microscope. The adjusting method is based on voltage proportion control. In contrast with traditional method that adding or removing mass, it is very convenient to adjust to minimize the inertial force transmitted to the supporting base. It may have a promising application on the current inertia balance support structure, which is used in some high-speed scanning probe microscope. What is more, it has a very good compatibility with current structure.

scholarly journals OBTAINING LOCAL VALUES OF THE YOUNG'S MODULUS ON THE POLYMER SURFACE BY CONTACT ATOMIC FORCE SPECTROSCOPY

2020 ◽  
pp. 132-137
Author(s):  
Юлия Васильевна Кузнецова ◽  
Виолетта Андреевна Веролайнен ◽  
Светлана Сергеевна Капустина
Keyword(s):  
Young’S Modulus ◽  
Contact Force ◽  
Young's Modulus ◽  
Polymer Surface ◽  
Force Spectroscopy ◽  
Spectroscopy Method ◽  
Scanning Probe ◽  
Atomic Force Spectroscopy ◽  
Atomic Force ◽  
Probe Microscope

С помощью метода контактной силовой спектроскопии на установке сканирующего зондового микроскопа Solver P47 получены локальные значения модуля Юнга на поверхности полимеров. Local values of the young's modulus on the polymer surface are obtained using the contact force spectroscopy method on the Solver P47 scanning probe microscope.

Mapping Nanoscale Switching Behavior of PZT Domain Patterns by Scanning Probe Microscope

2016 ◽  
Vol 680 ◽  
pp. 30-34
Author(s):  
Yan Ping Wei ◽  
Huan Ming Lu ◽  
An Xiang Wei ◽  
Yong Li
Keyword(s):  
Coercive Field ◽  
Compressive Strain ◽  
Scanning Probe ◽  
Switching Behavior ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Probe Microscope ◽  
Bottom To Top ◽  
The Impact

The switching current of the PZT domain patterns was detected by the conductive atomic force microscopy. The impact of the scan rate on the current contrast was studied. Successive current images of domain evolution during the polarization switching process were obtained. The impact of the local force exerted by the tip and the polarization cycles of the patterns were studied. The results suggested that the compressive strain exerted by the tip can decrease the piezoelectric coercive field and the polarization fatigue can increase the piezoelectric coercive field in the polarization inversion process from bottom to top.

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