scholarly journals OBTAINING LOCAL VALUES OF THE YOUNG'S MODULUS ON THE POLYMER SURFACE BY CONTACT ATOMIC FORCE SPECTROSCOPY

2020 ◽  
pp. 132-137
Author(s):  
Юлия Васильевна Кузнецова ◽  
Виолетта Андреевна Веролайнен ◽  
Светлана Сергеевна Капустина
Keyword(s):  
Young’S Modulus ◽  
Contact Force ◽  
Young's Modulus ◽  
Polymer Surface ◽  
Force Spectroscopy ◽  
Spectroscopy Method ◽  
Scanning Probe ◽  
Atomic Force Spectroscopy ◽  
Atomic Force ◽  
Probe Microscope

С помощью метода контактной силовой спектроскопии на установке сканирующего зондового микроскопа Solver P47 получены локальные значения модуля Юнга на поверхности полимеров. Local values of the young's modulus on the polymer surface are obtained using the contact force spectroscopy method on the Solver P47 scanning probe microscope.

scholarly journals IMPROVING THE EFFICIENCY OF THE CONTACT FORCE METHOD OF THE ATOMIC FORCE SPECTROSCOPY

2021 ◽  
pp. 243-249
Author(s):  
Юлия Васильевна Кузнецова
Keyword(s):  
Contact Force ◽  
Polymer Surface ◽  
Force Spectroscopy ◽  
Young Modulus ◽  
Control Program ◽  
Interaction Force ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Force Curves ◽  
Probe Microscope

Предложена методика, оптимизирующая метод контактной силовой спектроскопии. С помощью макроязыка, интегрированного в программное обеспечение NOVA установки сканирующего зондового микроскопа Solver P47, был разработан алгоритм, позволяющий анализировать силовые кривые, не покидая его основного интерфейса. Апробация метода выполнена на образцах синтезированного полимера, поскольку одним из важнейших механических свойств, определяющим их спектр областей применения, является упругость. В работе получены локальные значения модуля Юнга на поверхности полимера методом контактной силовой спектроскопии с применением скрипта YUNG, разработанного с помощью макроязыка, интегрированного в программу управления сканирующего зондового микроскопа. Показано, что применение скрипта YUNG позволяет оптимизировать метод контактной силовой спектроскопии по поиску показателя степени γ, выбору модели для расчета силы взаимодействия для дальнейшего определения локального модуля Юнга. We propose a technique that optimizing the method of contact force spectroscopy. With the help of a macro language integrated into the NOVA software of the Solver P47 scanning probe microscope, an algorithm was developed that allows analyzing force curves without leaving its main interface. The approbation of the method was done on samples of synthesized polymer, since one of the most important mechanical properties determining their range of applications is elasticity. In this paper, local values of the Young's modulus on the polymer surface are obtained by the method of contact force spectroscopy using the YUNG script developed using a macro language integrated into the control program of a scanning probe microscope. It is shown that the use of the YUNG script makes it possible to optimize the method of contact force spectroscopy by searching for the exponent γ, choosing a model for calculating the interaction force for further determination of the local Young modulus.

Microscopic Methods for Characterization of Selected Surface Properties of Biodegradable, Nanofibrous Tissue Engineering Scaffolds

2017 ◽  
Vol 890 ◽  
pp. 213-216 ◽  
Author(s):  
Adrian Chlanda ◽  
Ewa Kijeńska ◽  
Wojciech Święszkowski
Keyword(s):  
Mechanical Properties ◽  
Tissue Engineering ◽  
Young’S Modulus ◽  
Young's Modulus ◽  
Force Spectroscopy ◽  
Operating Mode ◽  
Tissue Engineering Scaffolds ◽  
Force Microscopy ◽  
Atomic Force

Biodegradable polymeric fibers with nanoand submicron diameters, produced by electrospinning can be used as scaffolds in tissue engineering. It is necessary to characterize their mechanical properties especially at the nanoscale. The Force Spectroscopy is suitable atomic force microscopy mode, which allows to probe mechanical properties of the material, such as: reduced Young's modulus, deformation, adhesion, and dissipation. If combined with standard operating mode: contact or semicontact, it will also provide advanced topographical analysis. In this paper we are presenting results of Force Spectroscopy characterization of two kinds of electrospun fibers: polycaprolactone and polycaprolactone with hydroxyapatite addition. The average calculated from Johnson-Kendall-Roberts theory Young's modulus was 4 ± 1 MPa for pure polymer mesh and 20 ± 3 MPa for composite mesh.

Elastic Modulus Measurements on Large Diameter Nanowires Using a Nano-Assembled Platform

2014 ◽  
Vol 5 (2) ◽  
Author(s):  
Naveen K. R. Palapati ◽  
Adrienne Muth ◽  
Yujie Zhu ◽  
Chunsheng Wang ◽  
Arunkumar Subramanian
Keyword(s):  
Young’S Modulus ◽  
Lithium Iron Phosphate ◽  
Young's Modulus ◽  
Large Diameter ◽  
Force Spectroscopy ◽  
Lithium Ion ◽  
Element Model ◽  
Iron Phosphate ◽  
Material System ◽  
Atomic Force

This paper presents atomic force spectroscopy (AFM) results from large diameter nanowires (NWs), which range in radius from 150 nm to 300 nm, within a nano-assembled platform. The nanomechanical platform is constructed by assembling single NWs across pairs of gold nano-electrodes using dielectrophoresis and contains a short, suspended segment of the NW (in air) between the assembly electrodes. Atomic force microscope (AFM) force spectroscopy measurements are obtained by indenting the NW within this suspended segment and result in deformation of the NW involving a combination of both, bending and nano-indentation modes. This paper demonstrates the measurement technique using lithium iron phosphate NWs as a model system and presents a finite element model to extract the Young's modulus from nanomechanical data. The estimated Young's modulus of this material, which is an electrode material system of interest for next-generation lithium-ion batteries, was found to be diameter dependent and was observed to range in values between 100 MPa and 575 MPa.

A Study of the Photoelectric Effect Caused by a Laser Beam Used in a Beam Bounce Technique in a C-AFM System

2008 ◽  
Author(s):  
Hung-Sung Lin ◽  
Mong-Sheng Wu
Keyword(s):  
Laser Beam ◽  
Failure Analysis ◽  
Atomic Force Microscope ◽  
Photoelectric Effect ◽  
Scanning Probe ◽  
Nanometer Scale ◽  
Electrical Characteristics ◽  
Atomic Force ◽  
Probe Microscope ◽  
Probe Head

Abstract The use of a scanning probe microscope (SPM), such as a conductive atomic force microscope (C-AFM) has been widely reported as a method of failure analysis in nanometer scale science and technology [1-6]. A beam bounce technique is usually used to enable the probe head to measure extremely small movements of the cantilever as it is moved across the surface of the sample. However, the laser beam used for a beam bounce also gives rise to the photoelectric effect while we are measuring the electrical characteristics of a device, such as a pn junction. In this paper, the photocurrent for a device caused by photon illumination was quantitatively evaluated. In addition, this paper also presents an example of an application of the C-AFM as a tool for the failure analysis of trap defects by taking advantage of the photoelectric effect.

Быстродействующая атомно-силовая и сканирующая капиллярная микроскопия в решении задач материаловедения, биологии и медицины

2020 ◽  
Vol 13 (3-4) ◽  
pp. 222-228
Author(s):  
И.В. Яминский ◽  
А.И. Ахметова
Keyword(s):  
Antibiotic Resistance ◽  
Early Detection ◽  
Biomedical Research ◽  
Drug Screening ◽  
Targeted Delivery ◽  
High Speed ◽  
Scanning Probe ◽  
Biological Processes ◽  
Atomic Force ◽  
Probe Microscope

Разработка высокоэффективных режимов быстродействующего сканирующего зондового микроскопа, в первую очередь атомно-силовой и сканирующей капиллярной микроскопии, представляет особый интерес для успешного проведения биомедицинских исследований: изучения биологических процессов и морфологии биополимеров, определения антибио­тикорезистентности бактерий, адресной доставки биомакромолекул, скринингу лекарств, раннему обнаружению биологических агентов (вирусов и бактерий) и др. The development of highly efficient modes of a high-speed scanning probe microscope, primarily atomic force and scanning capillary microscopy, is of particular interest for successful biomedical research: studying biological processes and the morphology of biopolymers, determining antibiotic resistance of bacteria, targeted delivery of biomacromolecules, drug screening, early detection agents (viruses and bacteria), etc.

Dysfunction of endothelial cells exposed to nanomaterials assessed by atomic force spectroscopy

Micron ◽  
2021 ◽  
Vol 145 ◽  
pp. 103062
Author(s):  
Agnieszka Maria Kolodziejczyk ◽  
Paulina Sokolowska ◽  
Aleksandra Zimon ◽  
Magdalena Grala ◽  
Marcin Rosowski ◽  
...  
Keyword(s):  
Endothelial Cells ◽  
Force Spectroscopy ◽  
Atomic Force Spectroscopy ◽  
Atomic Force

SCANNING PROBE MICROSCOPY BASED NANOSCALE PATTERNING AND FABRICATION

COSMOS ◽  
2007 ◽  
Vol 03 (01) ◽  
pp. 1-21 ◽  
Author(s):  
XIAN NING XIE ◽  
HONG JING CHUNG ◽  
ANDREW THYE SHEN WEE
Keyword(s):  
Integrated Circuits ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Nanoscale Patterning ◽  
Atomic Force ◽  
Probe Microscope ◽  
Molecular Manipulation

Nanotechnology is vital to the fabrication of integrated circuits, memory devices, display units, biochips and biosensors. Scanning probe microscope (SPM) has emerged to be a unique tool for materials structuring and patterning with atomic and molecular resolution. SPM includes scanning tunneling microscopy (STM) and atomic force microscopy (AFM). In this chapter, we selectively discuss the atomic and molecular manipulation capabilities of STM nanolithography. As for AFM nanolithography, we focus on those nanopatterning techniques involving water and/or air when operated in ambient. The typical methods, mechanisms and applications of selected SPM nanolithographic techniques in nanoscale structuring and fabrication are reviewed.

Structural and Magnetic Investigation of Cu, Co Substituted NiFe2O4 Thin Films by Scanning Probe Microscopy (AFM, MFM)

2015 ◽  
Vol 830-831 ◽  
pp. 589-591 ◽  
Author(s):  
Hakikat Sharma ◽  
N.S. Negi
Keyword(s):  
Thin Films ◽  
Grain Size ◽  
Microstructural Analysis ◽  
Secondary Phase ◽  
Scanning Probe ◽  
Force Microscopy ◽  
Atomic Force ◽  
Magnetic Investigation ◽  
Probe Microscope ◽  
Xrd Patterns

In the present study we prepared NiFe2O4, Ni0.95Cu0.05Fe2O4and Ni0.94Cu0.05Co0.01Fe2O4thin films by metallo-organic decomposition method (MOD) using spin coating technique. The samples were characterized by XRD. XRD patterns of thin films confirmed the formation of cubic spinel structure without any secondary phase. For microstructural analysis we characterized samples by Scanning Probe Microscope (SPM). From Atomic force microscopy (AFM), we analyzed surface morphology, calculated grain size, roughness and porosity. It has been found that grain size and roughness affected by Cu, Co substitution. After this we carried out magnetic force microscopy (MFM) on the samples. Effect of substitution on magnetic grains was observed from MFM.

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