scholarly journals Low-Power Laser Micro-Shaping of Dye-Volatile Cocrystals: The Gentle Cutting Edge of Photoresponsive Materials

2021 ◽  
Author(s):  
Tristan Borchers ◽  
Filip Topic ◽  
Jan-Constantin Christopherson ◽  
Oleksandr S. Bushuyev ◽  
Jogirdas Vainauskas ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Laser Light ◽  
Ion Beam ◽  
Volatile Component ◽  
Supramolecular Interactions ◽  
Power Laser ◽  
Machining Processes ◽  
Covalent Bonds ◽  
Visible Laser ◽  
Conventional Laser

Cocrystallisation of a fluorinated azobenzene with volatile cocrystal components dioxane or pyrazine yields halogen-bonded cocrystals that can be cut, carved or engraved with low-powered visible laser light. This process, termed cocrystal laser micro-shaping (CLMS), is enabled by cocrystallisation of a visible light dye with a volatile component, giving rise to materials that can be selectively disassembled with micrometer precision using gentle, non-burning irradiation in a commercial confocal microscope setup. The ability to shape and even machine cocrystals in 3D using laser powers between 0.5 and 20 mW, which are 2-4 orders of magnitude lower compared to laser powers used for machining metals, ceramics or polymers, is rationalized by CLMS targeting the disruption of weak supramolecular interactions between cocrystal components, rather than the breaking of covalent bonds in polymers or disruption of ionic structures required for conventional laser beam or focused ion beam machining processes, mainly by high-power laser heating.<br>

scholarly journals Low-Power Laser Micro-Shaping of Dye-Volatile Cocrystals: The Gentle Cutting Edge of Photoresponsive Materials

2021 ◽  
Author(s):  
Tristan Borchers ◽  
Filip Topic ◽  
Jan-Constantin Christopherson ◽  
Oleksandr S. Bushuyev ◽  
Jogirdas Vainauskas ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Laser Light ◽  
Ion Beam ◽  
Volatile Component ◽  
Supramolecular Interactions ◽  
Power Laser ◽  
Machining Processes ◽  
Covalent Bonds ◽  
Visible Laser ◽  
Conventional Laser

Cocrystallisation of a fluorinated azobenzene with volatile cocrystal components dioxane or pyrazine yields halogen-bonded cocrystals that can be cut, carved or engraved with low-powered visible laser light. This process, termed cocrystal laser micro-shaping (CLMS), is enabled by cocrystallisation of a visible light dye with a volatile component, giving rise to materials that can be selectively disassembled with micrometer precision using gentle, non-burning irradiation in a commercial confocal microscope setup. The ability to shape and even machine cocrystals in 3D using laser powers between 0.5 and 20 mW, which are 2-4 orders of magnitude lower compared to laser powers used for machining metals, ceramics or polymers, is rationalized by CLMS targeting the disruption of weak supramolecular interactions between cocrystal components, rather than the breaking of covalent bonds in polymers or disruption of ionic structures required for conventional laser beam or focused ion beam machining processes, mainly by high-power laser heating.<br>

The Effect of the Laser Beam Wavelength and Pulse Width on Micro Grooving: Comparison of Nanosecond and Femtosecond Laser

2012 ◽  
Author(s):  
Shinri Nonaka ◽  
Tastuhiro Mori ◽  
Yasuyuki Takata ◽  
Masamichi Kohno
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Processing Technique ◽  
Machining Processes ◽  
Setup Costs ◽  
Micro Grooving ◽  
Micro Total Analysis Systems ◽  
Processing Accuracy ◽  
Total Analysis ◽  
Micro Reactors

Processing technique of micro grooves and channels is very important to study the phenomenon of fluids in micro scale. Micro grooves and microchannels play an important role in various devices, such as μ-TAS (Micro-Total Analysis Systems) and micro reactors. Laser processing is currently widely used for drilling and grooving of various materials including metals, polymers, glasses and composite materials, since laser machining can avoid the problems that conventional machining methods have. For example wear of a working tool, lowering of processing accuracy, and wear debris becoming contaminants are some of the problems of the conventional method. Additionally, compared to other non-contact machining processes such as electron beam machining (EBM) and focused ion beam (FIB), machining a vacuum is not required. Therefore, applicability is wider and setup costs can be more economical.

High‐quality focused‐ion‐beam‐made mirrors for InGaP/InGaAlP visible‐laser diodes

1993 ◽  
Vol 74 (12) ◽  
pp. 7048-7053
Author(s):  
M. H. F. Overwijk ◽  
J. A. de Poorter
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Laser Diodes ◽  
High Quality ◽  
Visible Laser

Nanocomposite Polyurethane Foams Via POSS Blends

2002 ◽  
Vol 733 ◽  
Author(s):  
Brock McCabe ◽  
Steven Nutt ◽  
Brent Viers ◽  
Tim Haddad
Keyword(s):  
High Temperature ◽  
Sample Preparation ◽  
Room Temperature ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Polyurethane Foams ◽  
Development Projects ◽  
Polymer Systems ◽  
Polyurethane Resin ◽  
Military Development

AbstractPolyhedral Oligomeric Silsequioxane molecules have been incorporated into a commercial polyurethane formulation to produce nanocomposite polyurethane foam. This tiny POSS silica molecule has been used successfully to enhance the performance of polymer systems using co-polymerization and blend strategies. In our investigation, we chose a high-temperature MDI Polyurethane resin foam currently used in military development projects. For the nanofiller, or “blend”, Cp7T7(OH)3 POSS was chosen. Structural characterization was accomplished by TEM and SEM to determine POSS dispersion and cell morphology, respectively. Thermal behavior was investigated by TGA. Two methods of TEM sample preparation were employed, Focused Ion Beam and Ultramicrotomy (room temperature).

An Study of Influence of Imperfections on the Delamination of Diamond-Like Carbon Films

2002 ◽  
Vol 719 ◽  
Author(s):  
Myoung-Woon Moon ◽  
Kyang-Ryel Lee ◽  
Jin-Won Chung ◽  
Kyu Hwan Oh
Keyword(s):  
Cross Sections ◽  
Focused Ion Beam ◽  
Imaging System ◽  
Ion Beam ◽  
Carbon Films ◽  
Diamond Like Carbon ◽  
Glass Substrates ◽  
Atomic Force ◽  
Initiation And Propagation

AbstractThe role of imperfections on the initiation and propagation of interface delaminations in compressed thin films has been analyzed using experiments with diamond-like carbon (DLC) films deposited onto glass substrates. The surface topologies and interface separations have been characterized by using the Atomic Force Microscope (AFM) and the Focused Ion Beam (FIB) imaging system. The lengths and amplitudes of numerous imperfections have been measured by AFM and the interface separations characterized on cross sections made with the FIB. Chemical analysis of several sites, performed using Auger Electron Spectroscopy (AES), has revealed the origin of the imperfections. The incidence of buckles has been correlated with the imperfection length.

Low Energy Ar Ion Milling of FIB TEM Specimens from 14 nm and Future FinFET Technologies

2018 ◽  
Author(s):  
C.S. Bonifacio ◽  
P. Nowakowski ◽  
M.J. Campin ◽  
M.L. Ray ◽  
P.E. Fischione
Keyword(s):  
Field Effect Transistor ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Specimen Preparation ◽  
Ion Milling ◽  
Transmission Electron ◽  
High Resolution Tem ◽  
Effect Transistor ◽  
20 Nm ◽  
Argon Ion

Abstract Transmission electron microscopy (TEM) specimens are typically prepared using the focused ion beam (FIB) due to its site specificity, and fast and accurate thinning capabilities. However, TEM and high-resolution TEM (HRTEM) analysis may be limited due to the resulting FIB-induced artifacts. This work identifies FIB artifacts and presents the use of argon ion milling for the removal of FIB-induced damage for reproducible TEM specimen preparation of current and future fin field effect transistor (FinFET) technologies. Subsequently, high-quality and electron-transparent TEM specimens of less than 20 nm are obtained.

Automated Diagonal Slice and View Solution for 3D Device Structure Analysis

2018 ◽  
Author(s):  
Sang Hoon Lee ◽  
Jeff Blackwood ◽  
Stacey Stone ◽  
Michael Schmidt ◽  
Mark Williamson ◽  
...  
Keyword(s):  
Cross Section ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Image Data ◽  
Planar Surface ◽  
Device Structure ◽  
Cross Sectional ◽  
Device Structures ◽  
The Cross ◽  
Planar Analysis

Abstract The cross-sectional and planar analysis of current generation 3D device structures can be analyzed using a single Focused Ion Beam (FIB) mill. This is achieved using a diagonal milling technique that exposes a multilayer planar surface as well as the cross-section. this provides image data allowing for an efficient method to monitor the fabrication process and find device design errors. This process saves tremendous sample-to-data time, decreasing it from days to hours while still providing precise defect and structure data.

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