scholarly journals Towards accurate FPGA area models for FPGA architecture evaluation

2021 ◽  
Author(s):  
Farheen Fatima Khan

Field Programmable Gate Array (FPGA) devices are integrated circuit chips which can be configured by the end user. FPGA architectures have evolved into heterogeneous System-on-Chips (SoCs) devices in order to meet the diverse market demands. Integrating reconfigurable fabrics in SOCs require an accurate estimation of the layout area of the reconfigurable fabrics in order to properly accommodate early floor-planning. Hence, this work provides an evaluation on the accuracy of the minimum width transistor area models in ranking the actual layout area of FPGA architectures. Both the original VPR area model and the new COFFE area model are compared against the actual layouts with up to 3 metal layers for the various FPGA building blocks. We found that both models have significant variations with respect to the accuracy of their predictions across the building blocks. In particular, the original VPR model overestimates the layout area of larger buffers, full adders and multiplexers by as much as 38% while underestimates the layout area of smaller buffers and multiplexers by as much as 58% for an overall prediction error variation of 96%. The newer COFFE model also significantly overestimates the layout area of full adders by 13% and underestimates the layout area of multiplexers by a maximum of 60% for a prediction error variation of 73%. Such variations are particularly significant considering sensitivity analyses are not routinely performed in FPGA architectural studies. Our results suggest that such analyses are extremely important in studies that employ the minimum width area models so the tolerance of the architectural conclusions against the prediction error variations can be quantified. This work proposes a more accurate active area model to estimate the layout area of FPGA multiplexers by considering diffusion sharing and folding. In addition, we found that comparing to the minimum width transistor area model, the traditional metal area based stick diagrams, in lieu of actual layout, can provide much more accurate layout area estimations. In particular, minimum width transistor area can underestimate the layout area of LUT multiplexers by as much as a factor of 2-3 while stick diagrams can achieve over 85% -95% percent accuracy in layout area estimation. Based on our work, we present correction factors to the commonly used FPGA building blocks, so their actual layout area can be used to achieve a highly accurate ranking of the implementation area of FPGA architectures built upon these layouts.

2021 ◽  
Author(s):  
Farheen Fatima Khan

Field Programmable Gate Array (FPGA) devices are integrated circuit chips which can be configured by the end user. FPGA architectures have evolved into heterogeneous System-on-Chips (SoCs) devices in order to meet the diverse market demands. Integrating reconfigurable fabrics in SOCs require an accurate estimation of the layout area of the reconfigurable fabrics in order to properly accommodate early floor-planning. Hence, this work provides an evaluation on the accuracy of the minimum width transistor area models in ranking the actual layout area of FPGA architectures. Both the original VPR area model and the new COFFE area model are compared against the actual layouts with up to 3 metal layers for the various FPGA building blocks. We found that both models have significant variations with respect to the accuracy of their predictions across the building blocks. In particular, the original VPR model overestimates the layout area of larger buffers, full adders and multiplexers by as much as 38% while underestimates the layout area of smaller buffers and multiplexers by as much as 58% for an overall prediction error variation of 96%. The newer COFFE model also significantly overestimates the layout area of full adders by 13% and underestimates the layout area of multiplexers by a maximum of 60% for a prediction error variation of 73%. Such variations are particularly significant considering sensitivity analyses are not routinely performed in FPGA architectural studies. Our results suggest that such analyses are extremely important in studies that employ the minimum width area models so the tolerance of the architectural conclusions against the prediction error variations can be quantified. This work proposes a more accurate active area model to estimate the layout area of FPGA multiplexers by considering diffusion sharing and folding. In addition, we found that comparing to the minimum width transistor area model, the traditional metal area based stick diagrams, in lieu of actual layout, can provide much more accurate layout area estimations. In particular, minimum width transistor area can underestimate the layout area of LUT multiplexers by as much as a factor of 2-3 while stick diagrams can achieve over 85% -95% percent accuracy in layout area estimation. Based on our work, we present correction factors to the commonly used FPGA building blocks, so their actual layout area can be used to achieve a highly accurate ranking of the implementation area of FPGA architectures built upon these layouts.


VLSI Design ◽  
2015 ◽  
Vol 2015 ◽  
pp. 1-7 ◽  
Author(s):  
Xiao Wang ◽  
Zelin Shi

Being an essential part of infrared readout integrated circuit, correlated double sampling (CDS) circuits play important roles in both depressing reset noise and conditioning integration signals. To adapt applications for focal planes of large format and high density, a new structure of CDS circuit occupying small layout area is proposed, whose power dissipation has been optimized by using MOSFETs in operation of subthreshold region, which leads to 720 nW. Then the noise calculation model is established, based on which the noise analysis has been carried out by the approaches of transfer function and numerical simulations using SIMULINK and Verilog-A. The results are in good agreement, demonstrating the validity of the present noise calculation model. Thermal noise plays a dominant role in the long wave situation while 1/f noise is the majority in the medium wave situation. The total noise of long wave is smaller than medium wave, both of which increase with the integration capacitor and integration time increasing.


Sensors ◽  
2021 ◽  
Vol 21 (2) ◽  
pp. 599
Author(s):  
Jerry R. Meyer ◽  
Chul Soo Kim ◽  
Mijin Kim ◽  
Chadwick L. Canedy ◽  
Charles D. Merritt ◽  
...  

We describe how a midwave infrared photonic integrated circuit (PIC) that combines lasers, detectors, passive waveguides, and other optical elements may be constructed on the native GaSb substrate of an interband cascade laser (ICL) structure. The active and passive building blocks may be used, for example, to fabricate an on-chip chemical detection system with a passive sensing waveguide that evanescently couples to an ambient sample gas. A variety of highly compact architectures are described, some of which incorporate both the sensing waveguide and detector into a laser cavity defined by two high-reflectivity cleaved facets. We also describe an edge-emitting laser configuration that optimizes stability by minimizing parasitic feedback from external optical elements, and which can potentially operate with lower drive power than any mid-IR laser now available. While ICL-based PICs processed on GaSb serve to illustrate the various configurations, many of the proposed concepts apply equally to quantum-cascade-laser (QCL)-based PICs processed on InP, and PICs that integrate III-V lasers and detectors on silicon. With mature processing, it should become possible to mass-produce hundreds of individual PICs on the same chip which, when singulated, will realize chemical sensing by an extremely compact and inexpensive package.


2020 ◽  
Vol 10 (2) ◽  
pp. 472 ◽  
Author(s):  
Amir Mahdiyar ◽  
Danial Jahed Armaghani ◽  
Mohammadreza Koopialipoor ◽  
Ahmadreza Hedayat ◽  
Arham Abdullah ◽  
...  

Peak particle velocity (PPV) is a critical parameter for the evaluation of the impact of blasting operations on nearby structures and buildings. Accurate estimation of the amount of PPV resulting from a blasting operation and its comparison with the allowable ranges is an integral part of blasting design. In this study, four quarry sites in Malaysia were considered, and the PPV was simulated using gene expression programming (GEP) and Monte Carlo simulation techniques. Data from 149 blasting operations were gathered, and as a result of this study, a PPV predictive model was developed using GEP to be used in the simulation. In order to ensure that all of the combinations of input variables were considered, 10,000 iterations were performed, considering the correlations among the input variables. The simulation results demonstrate that the minimum and maximum PPV amounts were 1.13 mm/s and 34.58 mm/s, respectively. Two types of sensitivity analyses were performed to determine the sensitivity of the PPV results based on the effective variables. In addition, this study proposes a method specific to the four case studies, and presents an approach which could be readily applied to similar applications with different conditions.


2019 ◽  
Vol 39 (4) ◽  
pp. 405-413 ◽  
Author(s):  
Tiago M. de Carvalho ◽  
Eveline A. M. Heijnsdijk ◽  
Luc Coffeng ◽  
Harry J. de Koning

Background. Microsimulation models have been extensively used in the field of cancer modeling. However, there is substantial uncertainty regarding estimates from these models, for example, overdiagnosis in prostate cancer. This is usually not thoroughly examined due to the high computational effort required. Objective. To quantify uncertainty in model outcomes due to uncertainty in model parameters, using a computationally efficient emulator (Gaussian process regression) instead of the model. Methods. We use a microsimulation model of prostate cancer (microsimulation screening analysis [MISCAN]) to simulate individual life histories. We analyze the effect of parametric uncertainty on overdiagnosis with probabilistic sensitivity analyses (ProbSAs). To minimize the number of MISCAN runs needed for ProbSAs, we emulate MISCAN, using data pairs of parameter values and outcomes to fit a Gaussian process regression model. We evaluate to what extent the emulator accurately reproduces MISCAN by computing its prediction error. Results. Using an emulator instead of MISCAN, we may reduce the computation time necessary to run a ProbSA by more than 85%. The average relative prediction error of the emulator for overdiagnosis equaled 1.7%. We predicted that 42% of screen-detected men are overdiagnosed, with an associated empirical confidence interval between 38% and 48%. Sensitivity analyses show that the accuracy of the emulator is sensitive to which model parameters are included in the training runs. Conclusions. For a computationally expensive simulation model with a large number of parameters, we show it is possible to conduct a ProbSA, within a reasonable computation time, by using a Gaussian process regression emulator instead of the original simulation model.


Electronics ◽  
2019 ◽  
Vol 8 (3) ◽  
pp. 313
Author(s):  
Aaron Tan ◽  
Rui Toh ◽  
Alfred Lim ◽  
Yongfu Li ◽  
Zhi Kong

This paper analyzes the circuit complexity using Doherty power amplifier (DPA) as a case study and proposes a simplistic model to characterize the design complexity of a DPA circuit. Various fundamental building blocks of the DPA circuit are discussed and modeled to formulate the model. In one of our experiments, it is observed that a reduction of up to 400% in the normalized complexity factor (NCF) could enhance the gain performance by approximately up to 40% for UHF applications. This work can be used as a common benchmarking tool to compare various types of DPA architecture and allow design teams to optimize their building blocks in the DPA circuit. This model can also potentially become a platform for the improvement of many integrated circuit design components, allowing ready integration on a wide range of next generation applications, not only limited to DPA circuits.


Author(s):  
S.H. Goh ◽  
Wendy Lau ◽  
B.L. Yeoh ◽  
H.W. Ho ◽  
G.F. You ◽  
...  

Abstract A phase-locked loop (PLL) is commonly used in integrated circuit devices for frequency control. In a finished product, it comprises of sub-building blocks operating in a closed-loop control system which do not have register readback or test access points for easy debugging. Failure analysis becomes a challenge. This paper demonstrates the inherent limitation of relying only on dynamic fault isolation techniques, in specific frequency mapping for PLL failure debug. A systematic debug approach that combines volume failure characterization on test, additional characterization using dynamic photon emission and design simulation is then presented. Results are obtained on a 28 nm node device.


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