scholarly journals FIB-SEM Investigation of Laser-Induced Periodic Surface Structures and Conical Surface Microstructures on D16T (AA2024-T4) Alloy

Metals ◽  
2020 ◽  
Vol 10 (1) ◽  
pp. 144 ◽  
Author(s):  
Igor A. Salimon ◽  
Sakellaris Mailis ◽  
Alexey I. Salimon ◽  
Evgenij Skupnevskiy ◽  
Svetlana A. Lipovskikh ◽  
...  
Keyword(s):  
Laser Treatment ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Weight Ratio ◽  
High Strength ◽  
Surface Structures ◽  
Confocal Laser ◽  
Formation Mechanisms ◽  
Sem Images ◽  
Periodic Surface

The use of aluminum alloy AA2024-T4 (Russian designation D16T) in applications requiring a high strength-to-weight ratio and fatigue resistance such as aircraft fuselage often demands the control and modification of surface properties. A promising route to surface conditioning of Al alloys is laser treatment. In the present work, the formation of ripples and conical microstructures under scanning with femtosecond (fs) laser pulses was investigated. Laser treatment was performed using 250 fs pulses of a 1033 nm Yb:YAG laser. The fluence of the pulses varied from 5 to 33 J/cm2. The scanning was repeated from 1 to 5 times for different areas of the sample. Treated areas were evaluated using focused ion beam (FIB)- scanning electron microscopy (SEM) imaging and sectioning, energy-dispersive X-ray (EDX) spectroscopy, atomic force microscopy (AFM), and confocal laser profilometry. The period of laser-induced periodic surface structures (LIPSS) and the average spacing of conical microstructures were deduced from SEM images by FFT. Unevenness of the treated areas was observed that is likely to have been caused by ablation debris. The structural and elemental changes of the material inside the conical microstructures was revealed by FIB-SEM and EDX. The underlying formation mechanisms of observed structures are discussed in this paper.

scholarly journals A Perspective to Control Laser-Induced Periodic Surface Structure Formation at Glancing-Incident Femtosecond Laser-Processed Surfaces

JOM ◽  
2021 ◽  
Author(s):  
Alexander Jelinek ◽  
Manuel J. Pfeifenberger ◽  
Reinhard Pippan ◽  
Daniel Kiener
Keyword(s):  
Femtosecond Laser ◽  
Focused Ion Beam ◽  
Removal Rate ◽  
Ion Beam ◽  
Milling Process ◽  
Model Material ◽  
Surface Structures ◽  
Periodic Surface ◽  
Periodic Surface Structure ◽  
Orientation Mapping

AbstractThe favorable combination of high material removal rate and low influence on the material beneath the ultra-short pulsed laser-processed surface are of particular advantage for sample preparation. This is especially true at the micrometer scale or for the pre-preparation for a subsequent focused ion beam milling process. Specific surface features, the laser-induced periodic surface structures, are generated on femtosecond laser-irradiated surfaces in most cases, which pose an issue for surface-sensitive mechanical testing or microstructural investigations. This work strives for an approach to enhance the surface quality of glancing-incident laser-processed surfaces on the model material copper with two distinctly different grain sizes. A new generalized perspective is presented, in which optimized parameter selection serves to counteract the formation of the laser-induced periodic surface structures, enabling, for example, grain orientation mapping directly on femtosecond laser processed surfaces.

scholarly journals Tribological Properties of High-Speed Uniform Femtosecond Laser Patterning on Stainless Steel

Lubricants ◽  
2019 ◽  
Vol 7 (10) ◽  
pp. 83 ◽  
Author(s):  
Iaroslav Gnilitskyi ◽  
Alberto Rota ◽  
Enrico Gualtieri ◽  
Sergio Valeri ◽  
Leonardo Orazi
Keyword(s):  
Stainless Steel ◽  
Tribological Properties ◽  
High Speed ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Surface Structures ◽  
Stribeck Curve ◽  
Periodic Surface ◽  
Surface Conditions ◽  
Laser Patterning

In this work, an analysis of the tribological performance of laser-induced periodic surface structures (LIPSS) treated X5CrNi1810 stainless steel was conducted. The approach followed by authors was to generate LIPSS-patterned circular tracks, composed of radial straight grooves with uniform angular periodicity. This permitted to measure the tribological properties in a pin-on-flat configuration, keeping fixed the orientation between the grooves and the sliding direction. A Stribeck curve was measured, as well as the consequent wear. A deep analysis of the sub-surface conditions after LIPSS generation was moreover performed using Focused Ion Beam (FIB) cross-section.

scholarly journals In Situ Delineation Etch Reveals Subtle Detail in SEM Images of Ion Milled Cross Sections Enabling In-Fab 3-D Metrology and Characterization

2000 ◽  
Vol 8 (2) ◽  
pp. 36-39
Author(s):  
Clive Chandler
Keyword(s):  
Sample Preparation ◽  
Cross Sections ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Automated System ◽  
Sem Images ◽  
Difficult Time ◽  
Device Structures ◽  
Wet Etch ◽  
Conventional Sample

Control of layer thickness is critically important in the manufacture of semiconductor devices. Cross-sectioning exposes device structures for direct examination but conventional sample preparation procedures are difficult, time consuming, and grossly destructive. Cross sections created by focused ion beam (FIB) milling are easier, faster, and less destructive but have not offered the clear layer delineation provided by etching in the conventional sample preparation process. A new gas etch capability (Delineation Etch™ from FEI Company) offers results that are equivalent to conventional wet-etch preparations in a fraction of the time from a single, automated system in the fab without destroying the wafer. The new etch process also has application in milling high-aspect-ratio holes to create contacts to buried metal layers, and in deprocessing devices to reveal silicon and polysilicon structures.

scholarly journals Ion Irradiation-Induced Microstructural Evolution of Ni–Mo–Cr Low Alloy Steels

Materials ◽  
2018 ◽  
Vol 11 (11) ◽  
pp. 2268
Author(s):  
Hongying Sun ◽  
Penghui Lei ◽  
Guang Ran ◽  
Hui Wang ◽  
Jiyun Zheng ◽  
...  
Keyword(s):  
Irradiation Dose ◽  
Focused Ion Beam ◽  
Ion Irradiation ◽  
Ion Beam ◽  
High Strength ◽  
Positron Annihilation Spectroscopy ◽  
Small Scale ◽  
Low Alloy Steels ◽  
Dislocation Loops ◽  
S Parameter

As leading candidates of sheet steels for advanced nuclear reactors, three types of Ni–Mo–Cr high-strength low alloy (HSLA) steels named as CNST1, CNST2 and CNSS3 were irradiated by 400 keV Fe+ with peak fluence to 1.4 × 1014, 3.5 × 1014 and 7.0 × 1014 ions/cm2, respectively. The distribution and morphology of the defects induced by the sample preparation method and Fe+ irradiation dose were investigated by transmission electron microscopy (TEM) and positron-annihilation spectroscopy (PAS). TEM samples were prepared with two methods, i.e., a focused ion beam (FIB) technique and the electroplating and twin-jet electropolishing (ETE) method. Point defects and dislocation loops were observed in CNST1, CNST2 and CNSS3 samples prepared via FIB. On the other hand, samples prepared via the ETE method revealed that a smaller number of defects was observed in CNST1, CNST2 and almost no defects were observed in CNST3. It is indicated that artifact defects could be introduced by FIB preparation. The PAS S-W plots showed that the existence of two types of defects after ion implantation included small-scale defects such as vacancies, vacancy clusters, dislocation loops and large-sized defects. The S parameter of irradiated steels showed a clear saturation in PAS response with increasing Fe+ dose. At the same irradiation dose, higher values of the S-parameter were achieved in CNST1 and CNST2 samples when compared to that in CNSS3 samples. The mechanism and evolution behavior of irradiation-induced defects were analyzed and discussed.

Investigation of Ga ion implantation-induced damage in single-crystal 6H-SiC

2018 ◽  
Vol 1 (2) ◽  
pp. 115-123 ◽  
Author(s):  
Zhongdu He ◽  
Zongwei Xu ◽  
Mathias Rommel ◽  
Boteng Yao ◽  
Tao Liu ◽  
...  
Keyword(s):  
Ion Implantation ◽  
Single Crystal ◽  
Focused Ion Beam ◽  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
Implantation Dose ◽  
Formation Mechanisms ◽  
Schematic Model ◽  
Dose Threshold ◽  
Before And After

In order to investigate the damage in single-crystal 6H-silicon carbide (SiC) in dependence on ion implantation dose, ion implantation experiments were performed using the focused ion beam technique. Raman spectroscopy and electron backscatter diffraction were used to characterize the 6H-SiC sample before and after ion implantation. Monte Carlo simulations were applied to verify the characterization results. Surface morphology of the implantation area was characterized by the scanning electron microscope (SEM) and atomic force microscope (AFM). The ‘swelling effect’ induced by the low-dose ion implantation of 1014−1015 ions cm−2 was investigated by AFM. The typical Raman bands of single-crystal 6H-SiC were analysed before and after implantation. The study revealed that the thickness of the amorphous damage layer was increased and then became saturated with increasing ion implantation dose. The critical dose threshold (2.81 × 1014−3.26 × 1014 ions cm−2) and saturated dose threshold (˜5.31 × 1016 ions cm−2) for amorphization were determined. Damage formation mechanisms were discussed, and a schematic model was proposed to explain the damage formation.

scholarly journals Imaging and Documenting Gammarideans

2011 ◽  
Vol 2011 ◽  
pp. 1-9 ◽  
Author(s):  
Carolin Haug ◽  
Gerd Mayer ◽  
Verena Kutschera ◽  
Dieter Waloszek ◽  
Andreas Maas ◽  
...  
Keyword(s):  
Laser Scanning ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Polarized Light ◽  
Laser Scanning Microscopy ◽  
Confocal Laser ◽  
High Tech ◽  
Advantages And Disadvantages ◽  
Computed Microtomography ◽  
Document Structures

We give an overview of available techniques for imaging and documenting applied to gammarideans and discuss their advantages and disadvantages. Although recent techniques, such as confocal laser scanning microscopy (cLSM), focused ion beam scanning electron microscopy (FIB SEM), or computed microtomography (μCT), provide new possibilities to detect and document structures, these high-tech devices are expensive, and access to them is often limited. Alternatively, there are many possibilities to enhance the capabilities of established techniques such as macrophotography and light microscopy. We discuss improvements of the illumination with polarized light and the possibilities of utilizing the autofluorescence of animals such as the gammarideans. In addition, we present software-based enhancing tools such as image fusion and image stitching.

Microstructure Observations of Graphite in Gray Cast Iron Using TEM

2016 ◽  
Vol 879 ◽  
pp. 1911-1914
Author(s):  
Makoto Takezawa ◽  
Seung Won Lee ◽  
Susumu Ikeno ◽  
Kenji Matsuda
Keyword(s):  
Cast Iron ◽  
Cross Section ◽  
Focused Ion Beam ◽  
Gray Cast Iron ◽  
Ion Beam ◽  
Iron Alloy ◽  
Ductile Cast Iron ◽  
Gray Cast ◽  
Formation Mechanisms ◽  
Flake Graphite

Cast iron is an iron alloy mainly composed of carbon and silicon, the amount of carbon is more than 2.1 mass%. Cast irons, gray cast iron and ductile cast iron, have been used as industrial parts and automobile parts widely because they have a good wear resistance and an excellent machinability. Graphite formation mechanism have been proposed, but, it is not established clearly yet. In this study, the microstructure of flake graphite was investigated to reveal the graphite formation mechanisms using FC250 alloy. Transmission electron microscopy (TEM) samples were prepared using focused ion beam (FIB). In the case of a cross section of flake graphite taken perpendicular to its elongated direction using TEM, internal microstructure of flake graphite was observed layered structure. In the case of a cross section of flake graphite taken parallel to its elongated direction, clear microstructure was not observed. Selected area electron diffraction (SAED) from flake graphite showed <0001> direction of graphite are mostly parallel to their thickness.

scholarly journals Stem-EDX and FIB-SEM Tomography of ALLVAC 718Plus Superalloy

2016 ◽  
Vol 61 (2) ◽  
pp. 535-542 ◽  
Author(s):  
A. Kruk ◽  
G. Cempura ◽  
S. Lech ◽  
A. Czyrska -Filemonowicz
Keyword(s):  
Electron Microscope ◽  
Focused Ion Beam ◽  
Electron Tomography ◽  
Ion Beam ◽  
High Strength ◽  
Strengthening Mechanism ◽  
Scanning Transmission Electron Microscope ◽  
Particle Analysis ◽  
Transmission Electron ◽  
Scanning Transmission

Abstract Allvac 718Plus (718Plus) is a high strength, corrosion resistant nickel- based superalloy used for application in power generation, aeronautics and aerospace industry. The 718Plus microstructure consists of a γ matrix with γ’-Ni3(Al,Ti) and some δ- Ni3Nb phases as well as lamellar particles (η-Ni3Ti, η*-Ni6AlNb or Ni6(Al,Ti)Nb) precipitated at the grain boundaries. The primary strengthening mechanism for this alloy is a precipitation hardening, therefore size and distribution of precipitates are critical for the performance of the alloy. The aim of this study was to characterize precipitates in the 718Plus superalloy using Scanning Transmission Electron Microscope combined with Energy Dispersive X-ray Spectroscopy (STEM-EDX) and Focused Ion Beam Scanning Electron Microscope (FIB-SEM). The STEM-EDX and FIB-SEM tomography techniques were used for 3D imaging and metrology of the precipitates. Transmission electron microscopy and EDX spectroscopy were used to reveal details of the 718Plus microstructure and allow determine chemical composition of the phases. The study showed that electron tomography techniques permit to obtain complementary information about microstructural features (precipitates size, shape and their 3D distribution) in the reconstructed volume with comparison to conventional particle analysis methods, e.g. quantitative TEM and SEM metallography

Experiment Research for Fracture Toughness of PAN-Based Carbon Fibers

2011 ◽  
Vol 462-463 ◽  
pp. 1361-1366 ◽  
Author(s):  
Bo Ming Zhang ◽  
Yu Fen Wu
Keyword(s):  
Fracture Toughness ◽  
Tensile Strength ◽  
Carbon Fibers ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Testing Machine ◽  
High Strength ◽  
Carbon Filaments ◽  
Fracture Theory ◽  
In Virtue Of

For the sake of the carbon filaments’ fracture toughness, using the focused ion beam (FIB) to etch the carbon fibers and got different tensile strength, and all specimens were stretched on an Instron-type filaments testing machine and got the samples’ tensile strength, The crack-to-mirror size ratio was assumed as a constant, In virtue of Griffith fracture theory, Fracture toughness (KΙC) of representative high-strength type PAN (polyacrylonitrile)-based carbon fibers, Torayca T300 and T800, were estimated to be 1MPam1/2 from the tensile strength vs. fracture mirror size relation.

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