scholarly journals Advances in Microstructural Characterization of Metals by EBSD

Metals ◽  
2021 ◽  
Vol 11 (9) ◽  
pp. 1452
Author(s):  
Sónia Simões
Keyword(s):  
Material Characterization ◽  
Microstructural Characterization ◽  
Electron Backscattered Diffraction ◽  
Characterization Technique ◽  
Different Types

Electron backscattered diffraction (EBSD) is a material characterization technique that attracts many researchers to characterize different types of materials [...]

Microstructural Characterization of GaN on (0001) Sapphire

1998 ◽  
Vol 4 (S2) ◽  
pp. 628-629
Author(s):  
Zhigang Mao ◽  
Matthew T. Johnson ◽  
C. Barry Carter
Keyword(s):  
Microstructural Characterization ◽  
High Density ◽  
Defect Structures ◽  
Sapphire Substrates ◽  
The Poor ◽  
Different Types ◽  
Very High

III-V nitrides grown on (0001) sapphire substrates often contain a very high density of defects; this high density is usually attributed to the poor lattice and thermal match between the nitride and the sapphire [1]. There is thus a need to understand the defect structures in these materials. In the present study, a microstructural characterization of MBE-grown GaN films on (0001) sapphire using various TEM techniques was performed to evaluate defect structures in this material. This paper will outline some of the different types of defects found in these films and suggest some possible mechanisms by which they were formed.

scholarly journals A Survey of Different Types of Characterization Technique In Ultra Sonograms of the Thyroid Nodules

2012 ◽  
pp. 139-142
Author(s):  
Nikita Singh ◽  
Alka Jindal
Keyword(s):  
Thyroid Nodules ◽  
Thyroid Tissue ◽  
Endocrine Gland ◽  
Ultrasound Images ◽  
Characterization Technique ◽  
Imaging Result ◽  
Different Types ◽  
Processing Techniques ◽  
Texture Characterization

Thyroid is one of the endocrine Gland. Thyroid can be classified into normal, nodule and cancers thyroid. The characterization of the thyroid tissue in digital image processing techniques offer’s the texture description and using the ultrasound images. In this paper describe the various type of feature extraction techniques characterization and classification method. The texture characterization in medical images plays an important role as it helps into characterized the type of images, directions and extracting the features. This survey focuses on three types of characterization technique and methods that classify the thyroid nodule medical imaging. Result shows that comparatively analysis of these characterization techniques.

Electron Microscopy Characterization of Friction Stir Welded 5083-H111 and 7075-T651 Aluminum Alloys

2015 ◽  
Vol 231 ◽  
pp. 93-99 ◽  
Author(s):  
Izabela Kalemba ◽  
Mateusz Kopyściański
Keyword(s):  
Electron Microscopy ◽  
Aluminum Alloys ◽  
Microstructural Characterization ◽  
Electron Backscattered Diffraction ◽  
Friction Stir ◽  
Weld Microstructure ◽  
Dissimilar Weld ◽  
Zone Recrystallization ◽  
Wrought Aluminum Alloys

The microstructural characterization of butt friction stir welds of two different wrought aluminum alloys (work-hardened and heat treated) were studied. The detailed studies on the FSW process of dissimilar Al alloys are limited. In particular, the weld microstructure requires deeper characterization to better understand the phenomena occurring during mixing of dissimilar alloys.The characterization of friction stir welds was performed by scanning electron microscopy (an energy dispersive spectroscopy and an electron backscattered diffraction) and transmission electron microscopy. The dissimilar weld microstructure is complex, resembling a vortex-like structure. The microstructure of weld was highly asymmetrical with regard to the weld centerline. The research revealed a change in grain size in particular areas of the stirred zone. Recrystallization in the stirredzone occurred in particular areas in an irregular manner.

SURFACE MORPHOLOGY AND MICROSTRUCTURAL CHARACTERIZATION OF KCl CRYSTALS GROWN IN HALITE–SYLVITE BRINE SOLUTIONS BY ELECTRON BACKSCATTERED DIFFRACTION TECHNIQUES

2015 ◽  
Vol 22 (01) ◽  
pp. 1550012 ◽  
Author(s):  
JIBAN PODDER ◽  
RITWIK BASU ◽  
RICHARD WILLIAM EVITTS ◽  
ROBERT WILLIAM BESANT
Keyword(s):  
Surface Morphology ◽  
Extractive Metallurgy ◽  
Microstructural Characterization ◽  
X Ray Diffraction ◽  
Electron Backscattered Diffraction ◽  
Binary Solutions ◽  
X Ray ◽  
Nacl Concentration ◽  
The Stability

In this paper, a study on the ternary NaCl – KCl – H 2 O system was carried out by an extractive metallurgy technique from mixed brine solutions of different compositions at room temperature (23°C). The surface morphology and microstructure were examined using a scanning electron microscope (SEM), electron backscattered diffraction (EBSD) and an energy dispersive X-ray (EDX) spectroscopy. The presence of [Formula: see text] was found to reduce the stability of the solutions and increase the crystallization induction period, interfacial energy, energy of formation of the nucleus and greatly reduce the nucleation rate of KCl crystal. The surface morphology of KCl crystals is significantly changed due to presence of 5 to 10% (w/w) of NaCl as impurities in the binary solutions and shows the formation of co-crystals of different crystallographic orientation of NaCl on the KCl surface. In addition X-ray diffraction studies performed on KCl crystals grown in halite–sylvite binary solutions reveals that these crystals are cubic in nature and its lattice constant is 6.2952 Å when the NaCl concentration is small.

Microstructural Characterization of Carbon Nanotubes (CNTs)-Reinforced Nickel Matrix Nanocomposites

2018 ◽  
Vol 25 (1) ◽  
pp. 180-186 ◽  
Author(s):  
Sónia Simões ◽  
Íris Carneiro ◽  
Filomena Viana ◽  
Marcos A. L. Reis ◽  
Manuel F. Vieira
Keyword(s):  
Electron Microscopy ◽  
Carbon Nanotubes ◽  
Transmission Electron Microscopy ◽  
Microstructural Characterization ◽  
Recovery Process ◽  
Single Step ◽  
Nickel Matrix ◽  
Electron Backscattered Diffraction ◽  
Transmission Electron

AbstractThis research focuses on the microstructural characterization of nickel matrix composites reinforced by carbon nanotubes (CNTs). The nanocomposites were produced by a conventional powder metallurgy process and the dispersion of CNTs and mixture with nickel powders was performed in a single step by ultrasonication. Microstructural characterization of Ni–CNT nanocomposites was performed by scanning and transmission electron microscopy, electron backscattered diffraction, high-resolution transmission electron microscopy, selected area electron diffraction, and fast Fourier transform analyses. This characterization revealed CNTs embedded in the nickel grains and mainly presented as clusters at the grain boundaries. CNTs hinder recrystallization during sintering, and dislocation cells and subgrains form as a result of the recovery process.

Microstructural Characterization of Ferroelectric Bismuth Ferrite (BiFeO3) Ceramic by Electron Backscattered Diffraction

2011 ◽  
Vol 702-703 ◽  
pp. 1011-1014
Author(s):  
Jayant Kolte ◽  
Devidas Gulwade ◽  
Aatish Daryapurkar ◽  
Prakash Gopalan
Keyword(s):  
Direct Evidence ◽  
Bismuth Ferrite ◽  
Microstructural Characterization ◽  
Secondary Phase ◽  
Future Generation ◽  
Potential Candidate ◽  
Electron Backscattered Diffraction ◽  
Secondary Phase Formation ◽  
Backscattered Electron

Ferroelectric BiFeO3 (BFO) is potential candidate for future generation of FeRAM due to its large polarization. However, BFO is very sensitive to secondary phase formation during synthesis because of volatility issues related to Bismuth. Investigation of the microstructure for phase purity is the key as impurities can destroy the desired properties. We have used backscattered electron diffraction to study the microstructure of BFO ceramic. The EBSD results provide a direct evidence of the appearance of secondary phase that XRD could not be detected in XRD.

Microstructural characterization of CoPtCr/Cr thin film disks by cross-section TEM and elongated probe micro-diffraction

1991 ◽  
Vol 49 ◽  
pp. 762-763
Author(s):  
M.A. Parker ◽  
K.E. Johnson ◽  
C. Hwang ◽  
A. Bermea
Keyword(s):  
Magnetic Recording ◽  
Electron Probe ◽  
Microstructural Characterization ◽  
Crystallographic Structure ◽  
Recording Media ◽  
Layer By Layer ◽  
Cross Sectional ◽  
New Techniques ◽  
Polished Side

We have reported the dependence of the magnetic and recording properties of CoPtCr recording media on the thickness of the Cr underlayer. It was inferred from XRD data that grain-to-grain epitaxy of the Cr with the CoPtCr was responsible for the interaction observed between these layers. However, no cross-sectional TEM (XTEM) work was performed to confirm this inference. In this paper, we report the application of new techniques for preparing XTEM specimens from actual magnetic recording disks, and for layer-by-layer micro-diffraction with an electron probe elongated parallel to the surface of the deposited structure which elucidate the effect of the crystallographic structure of the Cr on that of the CoPtCr.XTEM specimens were prepared from magnetic recording disks by modifying a technique used to prepare semiconductor specimens. After 3mm disks were prepared per the standard XTEM procedure, these disks were then lapped using a tripod polishing device. A grid with a single 1mmx2mm hole was then glued with M-bond 610 to the polished side of the disk.

Microstructural Characterization of Au-Ge-Ni based ohmic contacts to GaAs/AlGaAs modfet device

1987 ◽  
Vol 45 ◽  
pp. 326-327
Author(s):  
A.K. Rai ◽  
A.K. Petford-Long ◽  
A. Ezis ◽  
D.W. Langer
Keyword(s):  
Contact Resistance ◽  
Ohmic Contact ◽  
Ohmic Contacts ◽  
Microstructural Characterization ◽  
Almost Everywhere ◽  
Spacer Layer ◽  
Good Contact ◽  
The Relationship ◽  
Lower Contact

Considerable amount of work has been done in studying the relationship between the contact resistance and the microstructure of the Au-Ge-Ni based ohmic contacts to n-GaAs. It has been found that the lower contact resistivity is due to the presence of Ge rich and Au free regions (good contact area) in contact with GaAs. Thus in order to obtain an ohmic contact with lower contact resistance one should obtain a uniformly alloyed region of good contact areas almost everywhere. This can possibly be accomplished by utilizing various alloying schemes. In this work microstructural characterization, employing TEM techniques, of the sequentially deposited Au-Ge-Ni based ohmic contact to the MODFET device is presented.The substrate used in the present work consists of 1 μm thick buffer layer of GaAs grown on a semi-insulating GaAs substrate followed by a 25 Å spacer layer of undoped AlGaAs.

Electron microscopic characterization of diamond thin films and substrates for diamond heteroepitaxial growth

1989 ◽  
Vol 47 ◽  
pp. 592-593
Author(s):  
J.B. Posthill ◽  
R.P. Burns ◽  
R.A. Rudder ◽  
Y.H. Lee ◽  
R.J. Markunas ◽  
...  
Keyword(s):  
Thin Films ◽  
Wide Band ◽  
Deposition Process ◽  
Heteroepitaxial Growth ◽  
Electron Microscopic ◽  
Wide Band Gap ◽  
Lattice Matching ◽  
Different Types ◽  
Diamond Thin Films

Because of diamond’s wide band gap, high thermal conductivity, high breakdown voltage and high radiation resistance, there is a growing interest in developing diamond-based devices for several new and demanding electronic applications. In developing this technology, there are several new challenges to be overcome. Much of our effort has been directed at developing a diamond deposition process that will permit controlled, epitaxial growth. Also, because of cost and size considerations, it is mandatory that a non-native substrate be developed for heteroepitaxial nucleation and growth of diamond thin films. To this end, we are currently investigating the use of Ni single crystals on which different types of epitaxial metals are grown by molecular beam epitaxy (MBE) for lattice matching to diamond as well as surface chemistry modification. This contribution reports briefly on our microscopic observations that are integral to these endeavors.

Microstructural characterization of a cast RENi5-based alloy

1993 ◽  
Vol 51 ◽  
pp. 1176-1177
Author(s):  
G. M. Micha ◽  
L. Zhang
Keyword(s):  
Electron Microscopy ◽  
Rare Earth ◽  
Microstructural Characterization ◽  
Binary Compound ◽  
Nickel Metal ◽  
Cast Material ◽  
Nickel Metal Hydride ◽  
Transmission Electron ◽  
Cast Condition

RENi5 (RE: rare earth) based alloys have been extensively evaluated for use as an electrode material for nickel-metal hydride batteries. A variety of alloys have been developed from the prototype intermetallic compound LaNi5. The use of mischmetal as a source of rare earth combined with transition metal and Al substitutions for Ni has caused the evolution of the alloy from a binary compound to one containing eight or more elements. This study evaluated the microstructural features of a complex commercial RENi5 based alloy using scanning and transmission electron microscopy.The alloy was evaluated in the as-cast condition. Its chemistry in at. pct. determined by bulk techniques was 12.1 La, 3.2 Ce, 1.5 Pr, 4.9 Nd, 50.2 Ni, 10.4 Co, 5.3 Mn and 2.0 Al. The as-cast material was of low strength, very brittle and contained a multitude of internal cracks. TEM foils could only be prepared by first embedding pieces of the alloy in epoxy.

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