Mechanical Strength and Microstructural Characterization of SUS304 Brazed Joints with BNi-2 Filler Metal: Influence of Brazing Temperature and Time

2007 ◽  
pp. 1673-1676
Author(s):  
Yong Won Lee ◽  
Jong Hoon Kim ◽  
Young Sik Song ◽  
Chang Sung Seok
Keyword(s):  
Mechanical Strength ◽  
Filler Metal ◽  
Microstructural Characterization ◽  
Brazed Joints

Mechanical Strength and Microstructural Characterization of SUS304 Brazed Joints with BNi-2 Filler Metal: Influence of Brazing Temperature and Time

2007 ◽  
Vol 124-126 ◽  
pp. 1673-1676 ◽  
Author(s):  
Yong Won Lee ◽  
Jong Hoon Kim ◽  
Young Sik Song ◽  
Chang Sung Seok
Keyword(s):  
Mechanical Properties ◽  
Mechanical Strength ◽  
Intermetallic Compounds ◽  
Melting Temperature ◽  
Base Metal ◽  
Filler Metal ◽  
Microstructural Characterization ◽  
Brazed Joints ◽  
General Material

The formation of intermetallic compounds in brazed joints between SUS304 and nickel-based filler metal is a major concern, since they considerably degrade the mechanical properties of joints. In this study, the SUS304, which is used widespread, as a general material was vacuum brazed with BNi-2 filler metal, and discussed to determine the influence of different brazing temperature and time on the strength of brazed joints. The results showed that, the mechanical properties of brazing layer could be stabilized through increasing the brazing temperature over 100° C more than melting temperature of filler metal, and increasing the brazing time over 120min. long, and diffusing enough the intermetallic compounds formed in the brazing layer to the base metal.

Microstructural characterization of brazing turbine blade by Cu-Ti filler metal alloy

2017 ◽  
Vol 62 (1) ◽  
pp. 131-143
Author(s):  
Muhannad J. Mohammed ◽  
Fadhil A. Hashim ◽  
Hassan H. Mahdi
Keyword(s):  
Turbine Blade ◽  
Filler Metal ◽  
Microstructural Characterization ◽  
Metal Alloy

Microstructural Characterization of Glass-to-Metal Brazed Joint

2012 ◽  
Vol 616-618 ◽  
pp. 1732-1735 ◽  
Author(s):  
Xi Hai Shen ◽  
Yu Gang Zheng ◽  
Liang Chang ◽  
Jin Jia Guo ◽  
Song Bin Ye ◽  
...  
Keyword(s):  
Thermal Power ◽  
Microstructural Characterization ◽  
Xrd Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Solar Thermal Power ◽  
Brazed Joints ◽  
Brazed Joint ◽  
Scanning Electron

Aiming at the glass-to-metal seals serving in the Solar Thermal Power (STP), glass-to-metal vacuum brazed joints were studied. Scanning electron microscopy (SEM) and X-ray diffraction (XRD) analysis were performed to examine the microstructure and element contents of interface seam on the glass-to-metal vacuum brazed joints. Also, the compositional concentration of the interface seam was measured by using energy dispersive spectroscopy (EDS).

Microstructural characterization of CoPtCr/Cr thin film disks by cross-section TEM and elongated probe micro-diffraction

1991 ◽  
Vol 49 ◽  
pp. 762-763
Author(s):  
M.A. Parker ◽  
K.E. Johnson ◽  
C. Hwang ◽  
A. Bermea
Keyword(s):  
Magnetic Recording ◽  
Electron Probe ◽  
Microstructural Characterization ◽  
Crystallographic Structure ◽  
Recording Media ◽  
Layer By Layer ◽  
Cross Sectional ◽  
New Techniques ◽  
Polished Side

We have reported the dependence of the magnetic and recording properties of CoPtCr recording media on the thickness of the Cr underlayer. It was inferred from XRD data that grain-to-grain epitaxy of the Cr with the CoPtCr was responsible for the interaction observed between these layers. However, no cross-sectional TEM (XTEM) work was performed to confirm this inference. In this paper, we report the application of new techniques for preparing XTEM specimens from actual magnetic recording disks, and for layer-by-layer micro-diffraction with an electron probe elongated parallel to the surface of the deposited structure which elucidate the effect of the crystallographic structure of the Cr on that of the CoPtCr.XTEM specimens were prepared from magnetic recording disks by modifying a technique used to prepare semiconductor specimens. After 3mm disks were prepared per the standard XTEM procedure, these disks were then lapped using a tripod polishing device. A grid with a single 1mmx2mm hole was then glued with M-bond 610 to the polished side of the disk.

Microstructural Characterization of Au-Ge-Ni based ohmic contacts to GaAs/AlGaAs modfet device

1987 ◽  
Vol 45 ◽  
pp. 326-327
Author(s):  
A.K. Rai ◽  
A.K. Petford-Long ◽  
A. Ezis ◽  
D.W. Langer
Keyword(s):  
Contact Resistance ◽  
Ohmic Contact ◽  
Ohmic Contacts ◽  
Microstructural Characterization ◽  
Almost Everywhere ◽  
Spacer Layer ◽  
Good Contact ◽  
The Relationship ◽  
Lower Contact

Considerable amount of work has been done in studying the relationship between the contact resistance and the microstructure of the Au-Ge-Ni based ohmic contacts to n-GaAs. It has been found that the lower contact resistivity is due to the presence of Ge rich and Au free regions (good contact area) in contact with GaAs. Thus in order to obtain an ohmic contact with lower contact resistance one should obtain a uniformly alloyed region of good contact areas almost everywhere. This can possibly be accomplished by utilizing various alloying schemes. In this work microstructural characterization, employing TEM techniques, of the sequentially deposited Au-Ge-Ni based ohmic contact to the MODFET device is presented.The substrate used in the present work consists of 1 μm thick buffer layer of GaAs grown on a semi-insulating GaAs substrate followed by a 25 Å spacer layer of undoped AlGaAs.

Microstructural characterization of a cast RENi5-based alloy

1993 ◽  
Vol 51 ◽  
pp. 1176-1177
Author(s):  
G. M. Micha ◽  
L. Zhang
Keyword(s):  
Electron Microscopy ◽  
Rare Earth ◽  
Microstructural Characterization ◽  
Binary Compound ◽  
Nickel Metal ◽  
Cast Material ◽  
Nickel Metal Hydride ◽  
Transmission Electron ◽  
Cast Condition

RENi5 (RE: rare earth) based alloys have been extensively evaluated for use as an electrode material for nickel-metal hydride batteries. A variety of alloys have been developed from the prototype intermetallic compound LaNi5. The use of mischmetal as a source of rare earth combined with transition metal and Al substitutions for Ni has caused the evolution of the alloy from a binary compound to one containing eight or more elements. This study evaluated the microstructural features of a complex commercial RENi5 based alloy using scanning and transmission electron microscopy.The alloy was evaluated in the as-cast condition. Its chemistry in at. pct. determined by bulk techniques was 12.1 La, 3.2 Ce, 1.5 Pr, 4.9 Nd, 50.2 Ni, 10.4 Co, 5.3 Mn and 2.0 Al. The as-cast material was of low strength, very brittle and contained a multitude of internal cracks. TEM foils could only be prepared by first embedding pieces of the alloy in epoxy.

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