Nano-Contact Force Calculation Method of Different Tip Radius of Curvature and the Specimen Surface of AFM

2015 ◽  
Vol 723 ◽  
pp. 952-957
Author(s):  
Guo Dong Cheng ◽  
Xiao Jing Yang
Keyword(s):  
Atomic Force Microscope ◽  
Contact Force ◽  
Calculation Model ◽  
Specimen Surface ◽  
Radius Of Curvature ◽  
Force Model ◽  
Atomic Force ◽  
Working Principle ◽  
Tip Radius ◽  
Force Calculation

Atomic Force Microscope (AFM) works by the force between the probe tip and specimen surface. The nanocontact force between the probe tip and specimen surface has an important influence on the detection surface. Base on the analysis of the working principle of the AFM and nanocontact force calculation model, according to Hamaker assumptions, using continuum method established the theoretical contact force model of the AFM tip. the contact force calculation methods of contact pressure in process has been obtained. The variation of the force between the probe tip and specimen surface has been found by calculation model and programming calculation of Matlab. Provide the basis for improving the accuracy of an atomic force microscope surface inspection and error analysis

Flexoelectric control of beams with atomic force microscope probe excitation

2020 ◽  
Vol 234 (13) ◽  
pp. 2537-2549 ◽  
Author(s):  
Xufang Zhang ◽  
Wen Yu ◽  
Jiahong Fu ◽  
Hornsen Tzou
Keyword(s):  
Atomic Force Microscope ◽  
Actuation Voltage ◽  
Bending Moment ◽  
Radius Of Curvature ◽  
Atomic Force Microscope Probe ◽  
Control Effect ◽  
Probe Radius ◽  
Flexoelectric Effect ◽  
Atomic Force ◽  
Microscope Probe

Based on the converse flexoelectric effect, flexoelectric actuator is designed and used to control the dynamic displacement of cantilever beams. First, shell-type stress expression based on double-curvature shell induced by the converse flexoelectric effect is developed, which can be simplified to a flexoelectric-laminated cantilever beam by applying two Lamé parameters and beam radius of curvature. Then, the flexoelectric actuator is designed with a conductive atomic force microscope probe and a flexoelectric layer. An inhomogeneous electric field is generated when the external voltage is applied on the atomic force microscope probe and the flexoelectric layer, which leads to stress in the longitudinal direction of beam and control moment. With the flexoelectric-induced bending moment, displacement induced by the external force and flexoelectric actuator is derived. The displacement is related to many parameters, such as actuation voltage, atomic force microscope probe radius and flexoelectric layer thickness. Cases are studied to optimize the control effect with different parameters. Results show that vibration control effect is enhanced with a higher actuation voltage and a smaller atomic force microscope probe radius for each mode. Besides, the thicker flexoelectric layer enhances the control effect with a larger bending moment arm for each mode. Dynamic vibration is controlled effectively by converse flexoelectric effect.

scholarly journals False Engagements in AFM

1999 ◽  
Vol 7 (2) ◽  
pp. 26-27
Author(s):  
Chetan Dandavate
Keyword(s):  
Laser Beam ◽  
Atomic Force Microscope ◽  
Contact Force ◽  
Feedback Circuit ◽  
Contact Mode ◽  
Voltage Difference ◽  
Atomic Force ◽  
Photo Detectors

In scanning microscopes, like the Atomic Force Microscope (AFM), used in contact mode, scanning begins with engaging the tip with the sample at some contact force, which can be adjusted by the setpoint* (this is common to Digital Instruments' AFMs). It may differ for other brands. For a system that detects the motion of the cantilever with a laser beam, the setpoint basically gives an idea of the voltage difference between the top and bottom photo detectors, When the tip comes into contact, the feedback circuit adjusts the tip deflection according to the required contact force, This is the method commonly followed for the constant deflection method.

Observation and Removal of Atmospheric Micro-Contaminants on SUS304 Steel

2011 ◽  
Vol 189-193 ◽  
pp. 876-880
Author(s):  
Rong Guang Wang ◽  
Mitsuo Kido ◽  
Suketsuku Nakanishi ◽  
Takuji Okabe
Keyword(s):  
Stainless Steel ◽  
Atomic Force Microscope ◽  
Organic Substance ◽  
Large Change ◽  
Specimen Surface ◽  
Contaminant Removal ◽  
Illumination Time ◽  
Sus304 Stainless Steel ◽  
Uv Illumination ◽  
Atomic Force

Micro-contaminants on SUS304 stainless steel were observed and confirmed by atomic force microscope, and the micro-contaminant removal was carried out by ultraviolet (UV) illumination. The amount of micro-contaminants on the specimen surface decreased with an increase in the UV illumination time, with extensive removal of the organic substance in the contaminants but leaving part of the contained water in the contaminants. The surface for macro-droplets after the UV illumination became hydrophilic, while no large change of the wettability for micro-droplets on the same surface can be observed.

Chemical Mechanical Polishing Friction Measurements With Silica Atomic Force Microscope Tips

2007 ◽  
Author(s):  
Joo Hoon Choi ◽  
Yangro Lee ◽  
Louis E. DeMarco ◽  
Richard T. Leveille ◽  
Joseph A. Levert ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Atomic Force Microscope ◽  
Chemical Mechanical Polishing ◽  
Surface Damage ◽  
Mechanical Polishing ◽  
Radius Of Curvature ◽  
Liquid Environment ◽  
Atomic Force ◽  
Friction Measurements ◽  
Circuit Components

The feature sizes on Integrated Circuits (ICs) continue to decrease to provide higher device densities and smaller chip designs. To accomplish this, current fabrication and processing technology must be advanced to achieve these goals. In particular, Chemical Mechanical Polishing (CMP), which is used for planarization of wafers and logic circuit components during IC fabrication, can cause severe surface damage to components in the form of delamination or distortion of surface features. CMP utilizes polishing particles suspended between a polymeric pad and the substrate to be polished. To control the process with higher precision the fundamentals of friction between CMP surfaces need to be analyzed. To investigate the friction contributions of the polishing particles in the CMP process, individual CMP abrasive particles are modeled by a silica atomic force microscope (AFM) probe with a radius of curvature on the order of 200 nm that is utilized in a scanning probe microscope (SPM). Lateral forces are measured that occur in simulated polishing of silica substrates and polyurethane pad material in a liquid environment. Results are obtained as a function of pH and environment and are compared with macroscopic friction results obtained using a high precision tribometer with a glass ball.

High-Speed Atomic Force Microscope Technology：A Review

2021 ◽  
Vol 17 ◽  
Author(s):  
Ke Xu ◽  
Qiang An ◽  
Peng Li
Keyword(s):  
High Resolution ◽  
Atomic Force Microscope ◽  
High Speed ◽  
Control Method ◽  
Scanning Speed ◽  
Atomic Force ◽  
Wide Range ◽  
Working Principle ◽  
And Control ◽  
Dynamics Process

: The atomic force microscope (AFM) is widely used in many fields such as biology, materials, and physics due to its advantages of simple sample preparation, high-resolution topography measurement and wide range of applications. However, the low scanning speed of traditional AFM limits its dynamics process monitoring and other further application. Therefore, the improvement of AFM scanning speed has become more and more important. In this review, the working principle of AFM is first proposed. Then, we introduce the improvements of cantilever, drive mechanism, and control method of the high-speed atomic force microscope (HS-AFM). Finally, we provide the next developments of HS-AFM.

Fast contact force calculation method for a wire mesh based on support vector machine

2017 ◽  
Vol 06 (01) ◽  
pp. 1750009 ◽  
Author(s):  
Jun Li ◽  
Xiaofei Ma ◽  
Tuanjie Li
Keyword(s):  
Support Vector Machine ◽  
Contact Force ◽  
Electromagnetic Waves ◽  
Calculation Model ◽  
Contact Forces ◽  
Wire Mesh ◽  
Support Vector ◽  
The Wire ◽  
Wire Meshes ◽  
Force Calculation

The wire mesh of a space mesh reflector antenna is a core component that reflects electromagnetic waves, greatly influencing the functions of the antenna. Due to the complex weaving structure of the wire mesh, there are thousands of contact nodes per square meter. Therefore, modeling and analyzing the wire mesh becomes very difficult. It is both time-consuming and labor-intensive to calculate the contact force of the wire mesh. In this paper, fast contact force calculation for a wire mesh based on support vector machine (SVM) was developed. First, the wire mesh was discretized into small-sized wire meshes with the same shape. Then, the contact forces of the discretized wire meshes with different boundary conditions can be obtained by the finite element method. Afterwards, a (SVM) model was established based on a small part of the contact forces. Finally, the accuracy and efficiency of the fast calculation model was validated through the numerical examples.

Period-Doubling Bifurcations in Atomic Force Microscopy

2009 ◽  
Author(s):  
Andrew J. Dick ◽  
Wei Huang
Keyword(s):  
Dynamic Response ◽  
Atomic Force Microscope ◽  
Period Doubling ◽  
Surface Force ◽  
Resonance Excitation ◽  
Force Model ◽  
Beam Model ◽  
Atomic Force ◽  
Local Material ◽  
Local Material Properties

The dynamic response of an atomic force microscope cantilever probe is studied for off-resonance excitation and interactions with a soft silicone rubber material. The dynamic response of the probe is simulated using a three-mode approximation of the Euler-Bernoulli beam model for excitation at two-and-a-half times the probe’s fundamental frequency. These simulations are conducted in order to reproduce the period-doubling bifurcation experimentally observed in the response of the probe of a commercial atomic force microscope. In order to duplicate this behavior, parameters within the surface force model are tuned to account for variations in the characteristics of the sample material. Through this work, the relationship between the sample material’s effective stiffness and the response behavior of the probe are studied in an effort to develop the means to identify the local material properties of a sample by characterize the nonlinear response of the probe.

Influence of Local Material Properties on the Nonlinear Dynamic Behavior of an Atomic Force Microscope Probe

2011 ◽  
Vol 6 (4) ◽  
Author(s):  
Wei Huang ◽  
Andrew J. Dick
Keyword(s):  
Atomic Force Microscope ◽  
Dynamic Behavior ◽  
Material Properties ◽  
Parametric Study ◽  
Period Doubling ◽  
Force Model ◽  
Atomic Force Microscope Probe ◽  
Atomic Force ◽  
The Relationship ◽  
Microscope Probe

In this paper, a study of the characteristics of period-doubling bifurcations in the dynamic behavior of an atomic force microscope probe for off-resonance excitation is presented. Using a three-mode approximation and excitation at two-and-a-half times the fundamental frequency, the relationship between the characteristics of the period-doubling bifurcation and the material properties is studied by using numerical simulations. Simulations are first used to successfully reproduce nonlinear response data collected experimentally by using a commercial atomic force microscope system and then to conduct a parametric study in order to examine the influence of variations in other system parameters on the relationship. These parameters are the excitation magnitude, the damping level, the cantilever stiffness, and the characteristics of the force model. Based upon the results of the parametric study, a new operation mode for obtaining localized material properties through an efficient scanning process is proposed. A preliminary scan simulation demonstrates the successful implementation of the relationship and its potential for providing localized material property information with nanoscale resolution.

scholarly journals Nanomechanics and Nanorheology of Microgels at Interfaces

Polymers ◽  
2018 ◽  
Vol 10 (9) ◽  
pp. 978 ◽  
Author(s):  
Sebastian Backes ◽  
Regine von Klitzing
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscope ◽  
Local Scale ◽  
Radius Of Curvature ◽  
Stimuli Responsive ◽  
Atomic Force ◽  
Dynamic Studies ◽  
Static Indentation ◽  
The Relationship

The review addresses nanomechanics and nanorheology of stimuli responsive microgels adsorbed at an interface. In order to measure the mechanical properties on a local scale, an atomic force microscope is used. The tip presents an indenter with a radius of curvature of a few 10 s of nm. Static indentation experiments and dynamic studies with an excited cantilever are presented. The effect of several internal and external parameters on the mechanical properties is reviewed. The focus is on the correlation between the swelling abilities of the gels and their mechanical properties. Several results are surprising and show that the relationship is not as simple as one might expect.

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