Study of Optical and Structure Properties for Different Composition Tin-Antimony-Selenium Thin Film

2011 ◽  
Vol 227 ◽  
pp. 43-48
Author(s):  
Farid M. Abdel-Rahim
Keyword(s):  
Thin Films ◽  
Electron Microscope ◽  
Photon Absorption ◽  
X Ray Diffraction ◽  
Glass Substrates ◽  
Single Oscillator Model ◽  
Transmission Electron ◽  
Single Oscillator ◽  
Degree Of Crystallization ◽  
Structure Properties

Amorphous Se100-x (Sn Sb)x glasses with (0 ≤ x ≤ 20 at. %) were prepared by the usual melt quench technique. Thin films for these compositions were prepared by thermal evaporation onto ultrasonically cleaned glass substrates kept at room temperature. From the spectral dependence of the absorption coefficient, a direct electronic transition was mainly responsible for the photon absorption inside these films. The effects of composition on the optical properties of Se100-x(Sn Sb) x thin films was investigated. The refractive index, n, for the as-prepared and annealed films has been analyzed according to the Wwmple–DiDominico single oscillator model. The effect of addition (Sn Sb) on the nature and degree of crystallization has been investigated by studying the structure using transmission electron microscope, X-ray diffraction and scanning electron microscope.

Electrical Resistivity Improvement by Precipitation and Strain in Al-Cu Thin Films

2010 ◽  
Vol 305-306 ◽  
pp. 33-37 ◽  
Author(s):  
S. Lallouche ◽  
M.Y. Debili
Keyword(s):  
Thin Films ◽  
Copper Content ◽  
Room Temperature ◽  
Structural Features ◽  
X Ray Diffraction ◽  
X Ray ◽  
Glass Substrates ◽  
Transmission Electron ◽  
Hall Method

This work deals with Al-Cu thin films, deposited onto glass substrates by RF (13.56MHz) magnetron sputtering, and annealed at 773K. The film thickness was approximately the same 3-4µm. They are characterized with respect to microstructure, grain size, microstrain, dislocation density and resistivity versus copper content. Al (Cu) deposits containing 1.8, 7.21, 86.17 and 92.5at%Cu have been investigated. The use of X-ray diffraction analysis and transmission electron microscopy lead to the characterization of different structural features of films deposited at room temperature (< 400K) and after annealing (773K). The resistivity of the films was measured using the four-point probe method. The microstrain profile obtained from XRD thanks to the Williamson-Hall method shows an increase with increasing copper content.

Preparation and Characterization of Nanocomposite Ni-Al2O3 Thin Films by Ultrasonic-Electrodeposition Technology

2011 ◽  
Vol 130-134 ◽  
pp. 994-997
Author(s):  
Jin Dong Wang ◽  
Fa Feng Xia
Keyword(s):  
Thin Films ◽  
Electron Microscope ◽  
Steel Substrate ◽  
Al2o3 Nanoparticles ◽  
X Ray Diffraction ◽  
Technological Parameters ◽  
Transmission Electron ◽  
Metallurgical Structure ◽  
Al2o3 Particles

Nanocomposite Ni-Al2O3 thin film containing nanosized Al2O3 particles had been grown on steel substrate by ultrasonic-electrodeposited technology. The optimum technological parameters of nanocomposite Ni-Al2O3 thin films were obtained by experiments and analysis. X-ray diffraction analysis was utilized to detect the crystalline and amorphous characteristics of Ni-Al2O3 thin films. The surface morphology and metallurgical structure were analysed by high resolution transmission electron microscope, and scanning electron microscope. The test results showed that nanocomposite Ni-Al2O3 thin films prepared by proper ultrasonic-electrodeposited method consist of nanometer-sized Al2O3 particles and nickel grains. And the Al2O3 nanoparticles and Ni grains diameters in thin films are about 40nm and 80nm, respectively.

Production and characterization of TiO2 nanoparticle thin films for its application in DSSCs

2020 ◽  
Vol 117 (6) ◽  
pp. 622
Author(s):  
Saranyoo Chaiwichian ◽  
Sumneang Lunput
Keyword(s):  
Thin Films ◽  
Dye Sensitized Solar Cells ◽  
X Ray Diffraction ◽  
X Ray ◽  
Glass Substrates ◽  
Dye Sensitized ◽  
Photovoltaic Efficiency ◽  
Transmission Electron ◽  
Sensitized Solar Cells

In this research, TiO2 nanoparticle thin films were successfully prepared on FTO glass substrates through a doctor blade technique, and its application was tested in dye-sensitized solar cells (DSSCs) with different sensitizing dyes such as methylene blue (MB) and methyl orange (MO). The physicochemical properties of intended thin films were characterized using X-ray diffraction (XRD), transmission electron microscopy (TEM), energy-dispersive X-ray spectroscopy (EDX) and UV-vis diffuse reflectance spectra (UV-vis DRS) techniques. The experimental results revealed that dipped TiO2 nanoparticle thin films into MB dye solution showed a higher photovoltaic efficiency (1.45%) when compared with the MO dye solution. A reasonable mechanism of DSSCs was also proposed.

Synthesis of Magnetic Thin Films on Glass Substrates Using NH3 Vapors

2012 ◽  
Vol 710 ◽  
pp. 762-767
Author(s):  
Pawan Kumar ◽  
Sunil Kumar Khah ◽  
Subhash Chander Katyal ◽  
Rajesh Kumar
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Exposure Time ◽  
Magnetite Nanoparticles ◽  
Magnetic Thin Films ◽  
X Ray Diffraction ◽  
Glass Substrates ◽  
Transmission Electron ◽  
Low Exposure ◽  
20 Nm

Magnetic thin films in nanometer range have been synthesized on the glass substrates. The synthesis has been carried out using Fe2+ and Fe3+ ions in a PVA solution in H2O. A different approach has been used for the synthesis of the magnetic thin films by using NH3vapors. Obtained films have been characterized by scanning electron microscopy (SEM), transmission electron microscopy (TEM), X-ray diffraction (XRD) and magnetic property measurement system (MPMS). The size and distribution of the magnetite nanoparticles inside the films depends upon the supply of the NH3 vapor. For large exposure time of NH3 vapors, film contains magnetite nanoparticles of size up to 80 nm. While for low exposure time of NH3 vapors, small magnetite nanoparticles of size nearly 20 nm have been obtained. The particles are independent to each other with no aggregation and are uniformly distributed inside the film.

Characterization of Pb(ScTa)1−xTixO3 (x<0.3) Thin Films Grown on LaNiO3 Coated Si by MOCVD

1998 ◽  
Vol 541 ◽  
Author(s):  
C. H. Lin ◽  
H. C. Kuo ◽  
G. E. Stillman ◽  
Haydn Chen
Keyword(s):  
Thin Films ◽  
Electron Microscope ◽  
Chemical Vapor ◽  
Organic Chemical ◽  
X Ray Diffraction ◽  
X Ray ◽  
Si Substrates ◽  
Transmission Electron ◽  
Metal Organic

AbstractHighly (100) textured pseudo-cubic Pb(ScTa)1−xTixO3 (x=0-0.3) (PSTT) thin films were grown by metal-organic chemical vapor deposition (MOCVD) on LaNiO3 (LNO) electrode buffered Si substrates at 650 °C. The microstructure and chemical uniformity were studied using X-ray diffraction (XRD), scanning electron microscope (SEM), transmission electron microscope (TEM) and nanoprobe X-ray energy dispersive spectroscopy (EDS). The temperature dependence of dielectric properties and P-E behavior were measured. A shift of Curie temperature of these PST-based thin films due to Ti addition was demonstrated, Furthermore, the pyroelectric properties of these thin films were estimated.

scholarly journals Pulsed laser deposition to investigate structural and optical properties of lead sulfide nanostructure

2020 ◽  
Vol 18 (47) ◽  
pp. 21-32
Author(s):  
Emad J. Mohammed ◽  
Ahmed K. Abbas ◽  
Kadhim A. Aadim
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Lead Sulfide ◽  
Laser Energy ◽  
Laser Deposition ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
Glass Substrates ◽  
Atomic Force ◽  
Structure Properties

In this work, the structure properties of nano Lead sulfide PbS thin films are studied. Thin samples were prepared by pulse laser deposition and deposited on glass substrates at wavelength 1064nm wavelength with a various laser energies (200,300,400,500)nm. The study of atomic force microscope (AFM) and X-ray diffraction as well as the effect of changing the laser energy on the structural properties has been studied. It has been observed that the membrane formed is of the polycrystalline type and the predominant phase is the plane (111) and (200). The minimum grain size obtained was 16.5 nm at a laser energy about 200 mJ. The results showed that thin films of average granular sizes (75 nm) could be prepared.As for the optical properties, the effect of changing the laser energy on them was studied, and it was found that they have direct allowed transitions in the range of (1.55 to 2.45) eV

Microstructure of Ca3Co4O9 Single Crystals and Thin Films

2005 ◽  
Vol 886 ◽  
Author(s):  
Yufeng Hu ◽  
Eli Sutter ◽  
Weidong Si ◽  
Qiang Li
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Single Crystal ◽  
Single Crystals ◽  
Single Crystal Sample ◽  
X Ray Diffraction ◽  
Crystal Sample ◽  
Lattice Constants ◽  
Glass Substrates ◽  
Transmission Electron

ABSTRACTWe present a comparative study of the microstructure of Ca3Co4O9 single crystals and c-axis oriented Ca3Co4O9 thin films grown on glass substrates. Though both crystals and films have similar values of Seekbeck coefficient and electric resistivity at room temperature, their microstructures are rather different. Extensive high resolution transmission electron microscopy (TEM) studies reveal that the films grown on glass substrates have abundant stacking faults, which is in contrast to the perfect crystalline structure found in the single crystal sample. The c-axis lattice constants derived from the x-ray diffraction (XRD) and TEM measurements for the single crystal sample and the thin film are virtually the same, suggesting that the thin film on the glass substrate was not strained.

Epitaxy and texture analysis of Bi-Sr-Ca-Cu-O thin films on (100) MgO using Transmission Electron Microscopy

1990 ◽  
Vol 48 (4) ◽  
pp. 68-69
Author(s):  
J. T. Sizemore ◽  
D. G. Schlom ◽  
Z. J. Chen ◽  
J. N. Eckstein ◽  
I. Bozovic ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Critical Currents ◽  
Unit Cell ◽  
X Ray Diffraction ◽  
Cell Axis ◽  
Transmission Electron ◽  
Synthesis Procedure

Investigators observe large critical currents for superconducting thin films deposited epitaxially on single crystal substrates. The orientation of these films is often characterized by specifying the unit cell axis that is perpendicular to the substrate. This omits specifying the orientation of the other unit cell axes and grain boundary angles between grains of the thin film. Misorientation between grains of YBa2Cu3O7−δ decreases the critical current, even in those films that are c axis oriented. We presume that these results are similar for bismuth based superconductors and report the epitaxial orientations and textures observed in such films.Thin films of nominally Bi2Sr2CaCu2Ox were deposited on MgO using molecular beam epitaxy (MBE). These films were in situ grown (during growth oxygen was incorporated and the films were not oxygen post-annealed) and shuttering was used to encourage c axis growth. Other papers report the details of the synthesis procedure. The films were characterized using x-ray diffraction (XRD) and transmission electron microscopy (TEM).

Palladium Nanowire Thin Films via Template Growth

2003 ◽  
Vol 775 ◽  
Author(s):  
Donghai Wang ◽  
David T. Johnson ◽  
Byron F. McCaughey ◽  
J. Eric Hampsey ◽  
Jibao He ◽  
...  
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Conductive Substrate ◽  
Palladium Nanowires ◽  
Efficient Route ◽  
Silica Thin Film

AbstractPalladium nanowires have been electrodeposited into mesoporous silica thin film templates. Palladium continually grows and fills silica mesopores starting from a bottom conductive substrate, providing a ready and efficient route to fabricate a macroscopic palladium nanowire thin films for potentially use in fuel cells, electrodes, sensors, and other applications. X-ray diffraction (XRD) and transmission electron microscopy (TEM) indicate it is possible to create different nanowire morphology such as bundles and swirling mesostructure based on the template pore structure.

Chemical synthesis and study of structural and optoelectronic properties of CdS thin films: Effect of SILAR growth cycles

2015 ◽  
Vol 9 (3) ◽  
pp. 2461-2469
Author(s):  
S. R. Gosavi ◽  
K. B. Chaudhari
Keyword(s):  
Thin Films ◽  
Average Crystallite Size ◽  
X Ray Diffraction ◽  
Silar Method ◽  
Growth Cycles ◽  
Glass Substrates ◽  
Layer Adsorption ◽  
Cds Thin Films ◽  
Structural And Optoelectronic Properties ◽  
Deposited Film

CdS thin films were deposited on glass substrates by using successive ionic layer adsorption and reaction (SILAR) method at room temperature. The effect of SILAR growth cycles on structural, morphological, optical and electrical properties of the films has been studied.  The thickness of the deposited film is measured by employing weight difference method. The X-ray diffraction (XRD) and field emission scanning electron microscopy (FE-SEM) studies showed that all the films exhibit polycrystalline nature and are covered well with glass substrates. The values of average crystallite size were found to be 53 nm, 58 nm, 63 nm and 71 nm corresponding to the thin films deposited with 30, 40, 50 and 60 SILAR growth cycles respectively. From the UV–VIS spectra of the deposited thin films, it was seen that both the absorption properties and energy bandgap of the films changes with increasing number of SILAR growth cycles. A decrease of electrical resistivity has been observed with increasing SILAR growth cycle. 

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