Design of High-Speed Propellers for Nonuniform Flow

1970 ◽  
Author(s):  
Richard Hecker
Keyword(s):  
High Speed ◽  
Nonuniform Flow

Propeller Loading-Induced Velocity Field by Means of Unsteady Lifting Surface Theory

1973 ◽  
Vol 17 (03) ◽  
pp. 129-139
Author(s):  
W. R. Jacobs ◽  
S. Tsakonas
Keyword(s):  
Velocity Field ◽  
High Speed ◽  
Pressure Field ◽  
Numerical Procedure ◽  
Nonuniform Flow ◽  
Surface Theory ◽  
Loading Function ◽  
Lifting Surface ◽  
Space Function ◽  
Induced Velocity

An analysis based on the lifting surface theory has been developed for evaluation of the vibratory velocity field induced by the loading of an operating propeller in both uniform and nonuniform inflow fields. The analysis demonstrates that in the case of nonuniform flow the velocity at any field point is made up of a large number of combinations of the frequency constituents of the loading function with those of the space function (propagation or influence function). A numerical procedure has been developed adaptable to a high-speed digital computer (CDC 6600), and the existing program, which evaluates the steady and unsteady propeller loadings, the resulting hydrodynamic forces and moments, and the pressure field, has been extended to include evaluation of the velocity field as well. This program should thus become a highly versatile and useful tool for the ship researcher or designer.

Shock Propagation and MPT Noise From a Transonic Rotor in Nonuniform Flow

2012 ◽  
Vol 135 (1) ◽  
Author(s):  
Jeffrey J. Defoe ◽  
Zoltán S. Spakovszky
Keyword(s):  
High Speed ◽  
Acoustic Energy ◽  
Shock Propagation ◽  
Far Field ◽  
Nonuniform Flow ◽  
Mean Flow ◽  
Flow Distortion ◽  
Inlet Distortion ◽  
Circumferential Extent ◽  
Transonic Rotor

One of the major challenges in high-speed fan stages used in compact, embedded propulsion systems is inlet distortion noise. A body-force-based approach for the prediction of multiple-pure-tone (MPT) noise was previously introduced and validated. In this paper, it is employed with the objective of quantifying the effects of nonuniform flow on the generation and propagation of MPT noise. First-of-their-kind back-to-back coupled aero-acoustic computations were carried out using the new approach for conventional and serpentine inlets. Both inlets delivered flow to the same NASA/GE R4 fan rotor at equal corrected mass flow rates. Although the source strength at the fan is increased by 38 dB in sound power level due to the nonuniform inflow, far-field noise for the serpentine inlet duct is increased on average by only 3.1 dBA overall sound pressure level in the forward arc. This is due to the redistribution of acoustic energy to frequencies below 11 times the shaft frequency and the apparent cut-off of tones at higher frequencies including blade-passing tones. The circumferential extent of the inlet swirl distortion at the fan was found to be two blade pitches, or 1/11th of the circumference, suggesting a relationship between the circumferential extent of the inlet distortion and the apparent cut-off frequency perceived in the far field. A first-principles-based model of the generation of shock waves from a transonic rotor in nonuniform flow showed that the effects of nonuniform flow on acoustic wave propagation, which cannot be captured by the simplified model, are more dominant than those of inlet flow distortion on source noise. It demonstrated that nonlinear, coupled aerodynamic and aero-acoustic computations, such as those presented in this paper, are necessary to assess the propagation through nonuniform mean flow. A parametric study of serpentine inlet designs is underway to quantify these propagation effects.

Nonuniform Flow in a High Speed Compressor Due to Asymmetric Tip Clearance

2004 ◽  
pp. 269-283 ◽  
Author(s):  
Hyun Suk Joo ◽  
Seung Jin Song
Keyword(s):  
High Speed ◽  
Tip Clearance ◽  
Nonuniform Flow

Application of a Numerical Optimization Technique to the Design of Cavitating Propellers in Nonuniform Flow

1997 ◽  
Vol 41 (02) ◽  
pp. 93-107 ◽  
Author(s):  
Shigenori Mishima ◽  
Spyros A. Kinnas
Keyword(s):  
Optimization Algorithm ◽  
High Speed ◽  
Optimization Technique ◽  
Design Parameters ◽  
Nonuniform Flow ◽  
Surface Design ◽  
Sheet Cavitation ◽  
Propeller Design ◽  
Cavity Characteristics ◽  
Propeller Blades

High-speed propulsor blades often experience moderate to substantial amounts of unsteady cavitation, and up to now have been designed via design methods for noncavitating blades combined with methods for the analysis of cavitating flows in a trial-and-error manner. In this paper, a numerical nonlinear optimization algorithm is developed for the automated, systematic design of cavitating blades. The method is first applied to the design of propeller blades in uniform flow. The blade mean camber surface is defined via a cubic B-spline polygon net in order to facilitate the handling of the geometry, and to reduce the number of the design parameters. Noncavitating blade geometries designed by the present method are directly compared with those designed via an existing lifting-line/lifting-surface design approach. Finally, the optimization algorithm is applied to the design of cavitating blades in nonuniform flow. The objective of the design is to obtain maximum propeller efficiency for given conditions by allowing controlled amounts of sheet cavitation. Several constraints on the unsteady cavity characteristics, such as the area of cavity planform and the amplitudes of the cavity volume velocity harmonics, are incorporated in the optimization technique. The effect of the constraints on the efficiency of the propeller design is demonstrated with various test cases.

Microfabrication research at the National Submicron Facility

1983 ◽  
Vol 41 ◽  
pp. 86-89
Author(s):  
E.D. Wolf
Keyword(s):  
Integrated Circuits ◽  
Particle Physics ◽  
High Speed ◽  
New Technology ◽  
High Energy ◽  
High Energy Particle ◽  
New Science ◽  
Wide Range ◽  
Intermediate Domain ◽  
Circuit Function

Most microelectronics devices and circuits operate faster, consume less power, execute more functions and cost less per circuit function when the feature-sizes internal to the devices and circuits are made smaller. This is part of the stimulus for the Very High-Speed Integrated Circuits (VHSIC) program. There is also a need for smaller, more sensitive sensors in a wide range of disciplines that includes electrochemistry, neurophysiology and ultra-high pressure solid state research. There is often fundamental new science (and sometimes new technology) to be revealed (and used) when a basic parameter such as size is extended to new dimensions, as is evident at the two extremes of smallness and largeness, high energy particle physics and cosmology, respectively. However, there is also a very important intermediate domain of size that spans from the diameter of a small cluster of atoms up to near one micrometer which may also have just as profound effects on society as “big” physics.

Vacuum System to Minimize the Specimen Contamination of High-Performance EM

1977 ◽  
Vol 35 ◽  
pp. 68-69
Author(s):  
N. Yoshimura ◽  
K. Shirota ◽  
T. Etoh
Keyword(s):  
Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
High Vacuum ◽  
Vacuum System ◽  
Pump System ◽  
Pumping System ◽  
Diffusion Pump ◽  
Almost All ◽  
Cascade Type

One of the most important requirements for a high-performance EM, especially an analytical EM using a fine beam probe, is to prevent specimen contamination by providing a clean high vacuum in the vicinity of the specimen. However, in almost all commercial EMs, the pressure in the vicinity of the specimen under observation is usually more than ten times higher than the pressure measured at the punping line. The EM column inevitably requires the use of greased Viton O-rings for fine movement, and specimens and films need to be exchanged frequently and several attachments may also be exchanged. For these reasons, a high speed pumping system, as well as a clean vacuum system, is now required. A newly developed electron microscope, the JEM-100CX features clean high vacuum in the vicinity of the specimen, realized by the use of a CASCADE type diffusion pump system which has been essentially improved over its predeces- sorD employed on the JEM-100C.

The on-line use of histogram data for high-speed correction and alignment of electron microscope images

1984 ◽  
Vol 42 ◽  
pp. 556-557
Author(s):  
William Krakow
Keyword(s):  
Power Spectrum ◽  
High Speed ◽  
Direct Memory Access ◽  
Digital Television ◽  
Contrast Transfer Function ◽  
The Past ◽  
High Resolution Tem ◽  
On Line ◽  
Correction Of Astigmatism ◽  
The Fourier Transform

In the past few years on-line digital television frame store devices coupled to computers have been employed to attempt to measure the microscope parameters of defocus and astigmatism. The ultimate goal of such tasks is to fully adjust the operating parameters of the microscope and obtain an optimum image for viewing in terms of its information content. The initial approach to this problem, for high resolution TEM imaging, was to obtain the power spectrum from the Fourier transform of an image, find the contrast transfer function oscillation maxima, and subsequently correct the image. This technique requires a fast computer, a direct memory access device and even an array processor to accomplish these tasks on limited size arrays in a few seconds per image. It is not clear that the power spectrum could be used for more than defocus correction since the correction of astigmatism is a formidable problem of pattern recognition.

Structural changes in silicon-on-insulator material during post-implantation annealing

1986 ◽  
Vol 44 ◽  
pp. 736-737
Author(s):  
C. O. Jung ◽  
S. J. Krause ◽  
S.R. Wilson
Keyword(s):  
Integrated Circuits ◽  
Oxide Layer ◽  
High Speed ◽  
Structural Changes ◽  
Device Fabrication ◽  
Silicon On Insulator ◽  
High Quality ◽  
Radiation Hardened ◽  
Post Implantation ◽  
Very High

Silicon-on-insulator (SOI) structures have excellent potential for future use in radiation hardened and high speed integrated circuits. For device fabrication in SOI material a high quality superficial Si layer above a buried oxide layer is required. Recently, Celler et al. reported that post-implantation annealing of oxygen implanted SOI at very high temperatures would eliminate virtually all defects and precipiates in the superficial Si layer. In this work we are reporting on the effect of three different post implantation annealing cycles on the structure of oxygen implanted SOI samples which were implanted under the same conditions.

An atomic-resolution microscope study of Al contracts on GaAs

1986 ◽  
Vol 44 ◽  
pp. 726-727
Author(s):  
Z. Liliental-Weber ◽  
C. Nelson ◽  
R. Ludeke ◽  
R. Gronsky ◽  
J. Washburn
Keyword(s):  
High Speed ◽  
Schottky Contacts ◽  
Detailed Knowledge ◽  
The Past ◽  
Semiconductor Interfaces ◽  
Deposited Metal ◽  
Microwave Applications ◽  
Free Interfaces ◽  
Potential Use

The properties of metal/semiconductor interfaces have received considerable attention over the past few years, and the Al/GaAs system is of special interest because of its potential use in high-speed logic integrated optics, and microwave applications. For such materials a detailed knowledge of the geometric and electronic structure of the interface is fundamental to an understanding of the electrical properties of the contact. It is well known that the properties of Schottky contacts are established within a few atomic layers of the deposited metal. Therefore surface contamination can play a significant role. A method for fabricating contamination-free interfaces is absolutely necessary for reproducible properties, and molecularbeam epitaxy (MBE) offers such advantages for in-situ metal deposition under UHV conditions

Scanning x-ray fluorescence microscopy and principal component analysis

1992 ◽  
Vol 50 (2) ◽  
pp. 1752-1753
Author(s):  
Brian Cross
Keyword(s):  
Principal Component Analysis ◽  
Fluorescence Microscopy ◽  
Spatial Resolution ◽  
High Speed ◽  
Image Acquisition ◽  
Principal Component ◽  
Fluorescence Microscope ◽  
Acquisition Rate ◽  
X Ray ◽  
Speed Up

A relatively new entry, in the field of microscopy, is the Scanning X-Ray Fluorescence Microscope (SXRFM). Using this type of instrument (e.g. Kevex Omicron X-ray Microprobe), one can obtain multiple elemental x-ray images, from the analysis of materials which show heterogeneity. The SXRFM obtains images by collimating an x-ray beam (e.g. 100 μm diameter), and then scanning the sample with a high-speed x-y stage. To speed up the image acquisition, data is acquired "on-the-fly" by slew-scanning the stage along the x-axis, like a TV or SEM scan. To reduce the overhead from "fly-back," the images can be acquired by bi-directional scanning of the x-axis. This results in very little overhead with the re-positioning of the sample stage. The image acquisition rate is dominated by the x-ray acquisition rate. Therefore, the total x-ray image acquisition rate, using the SXRFM, is very comparable to an SEM. Although the x-ray spatial resolution of the SXRFM is worse than an SEM (say 100 vs. 2 μm), there are several other advantages.

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