Measuring Performance of Energy-Dispersive X-ray Systems

1998 ◽  
Vol 4 (6) ◽  
pp. 605-615 ◽  
Author(s):  
Peter J. Statham
Keyword(s):  
Room Temperature ◽  
Compositional Analysis ◽  
Energy Dispersive ◽  
X Rays ◽  
New Techniques ◽  
X Ray ◽  
Advantages And Disadvantages ◽  
Electron Beam Excitation ◽  
Mathematical Algorithms ◽  
Beam Excitation

As Si(Li) detector technology has matured, many of the fundamental problems have been addressed in the competition among manufacturers and there is now an expectation, implied by many textbooks, that all energy-dispersive X-ray (EDX) detectors are made and will perform in the same way. Although there has been some convergence in Si(Li) systems and these are still the most common, manufacturing recipes still differ and there are many alternative EDX devices, such as microcalorimeters and room temperature detectors, that have both advantages and disadvantages over Si(Li). Rather than emphasizing differences in technologies, performance measures should reveal benefits relevant to the intended application. The instrument is inevitably going to be a “black box” of integrated components; this article reviews some of the methods that have been applied and introduces some new techniques that can be used to assess performance without resorting to complex software or sophisticated mathematical algorithms. Sensitivity, resolution, artefacts, and stability are discussed with particular application to compositional analysis using electron beam excitation of X-rays in the 100-eV to 10-keV energy region.

The Gas Proportional Scintillation Counter as a Room-Temperature Detector For Energy-Dispersive X-Ray Fluorescence Analysis

1981 ◽  
Vol 25 ◽  
pp. 39-44 ◽  
Author(s):  
C. A. N. Conde ◽  
L. F. Requicha Ferreira ◽  
A. J. de Campos
Keyword(s):  
Room Temperature ◽  
Scintillation Counter ◽  
Fluorescence Analysis ◽  
Energy Dispersive ◽  
X Rays ◽  
Mercuric Iodide ◽  
X Ray ◽  
Temperature Detector ◽  
Portable Instruments ◽  
Physical Principles

AbstractA review of the basic physical principles of the gas proportional scintillation counter is presented. Its performance is discussed and compared with that of other room-temperature detectors in regard to applications to portable instruments for energy-dispersive X-ray fluorescence analysis. It is concluded that the gas proportional scintillation counter is definitely superior to all other room-temperature detectors, except the mercuric iodide (HgI2) detector. For large areas or soft X-rays it is also superior to the HgI2 detector.

X-Ray Fluorescence Analysis at Room Temperature with an Energy Dispersive Mercuric Iodide Spectrometer

1979 ◽  
Vol 23 ◽  
pp. 249-256
Author(s):  
M. Singh ◽  
A.J. Dabrowski ◽  
G.C. Huth ◽  
J.S. Iwanczyk ◽  
B.C. Clark ◽  
...  
Keyword(s):  
Room Temperature ◽  
Fluorescence Analysis ◽  
Low Energy ◽  
Cryogenic Cooling ◽  
Energy Dispersive ◽  
Entrance Window ◽  
X Rays ◽  
Mercuric Iodide ◽  
X Ray ◽  
Present Design

We have previously reported on the uniqueness and potential of room-temperature spectrometry of low-energy x-rays with a mercuric iodide (HgI2) detector (1,2,3). In this paper we emphasize the use of HgI2 detectors for x-ray fluorescence (XRF) analysis.Because no vacuum plumbing or cryogenic cooling is required, the design of a mercuric iodide room-temperature x-ray spectrometer is extremely simple. Our present design consists of coupling a detector directly to the first-stage FET in a modified Tennelec 161 D preamplifier and making the configuration “light-tight”. Aside from providing a suitable entrance window, there are no other requirements for routine spectroscopy.

PHAX-SCAN: Functional integration of a Scanning Electron Microscope and an energy-dispersive x-ray analyser

1989 ◽  
Vol 47 ◽  
pp. 56-57
Author(s):  
Marc H. Peeters ◽  
Max T. Otten
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
Functional Integration ◽  
Energy Dispersive ◽  
X Rays ◽  
X Ray ◽  
High Speed Analysis ◽  
Scanning Electron

Over the past decades, the combination of energy-dispersive analysis of X-rays and scanning electron microscopy has proved to be a powerful tool for fast and reliable elemental characterization of a large variety of specimens. The technique has evolved rapidly from a purely qualitative characterization method to a reliable quantitative way of analysis. In the last 5 years, an increasing need for automation is observed, whereby energy-dispersive analysers control the beam and stage movement of the scanning electron microscope in order to collect digital X-ray images and perform unattended point analysis over multiple locations.The Philips High-speed Analysis of X-rays system (PHAX-Scan) makes use of the high performance dual-processor structure of the EDAX PV9900 analyser and the databus structure of the Philips series 500 scanning electron microscope to provide a highly automated, user-friendly and extremely fast microanalysis system. The software that runs on the hardware described above was specifically designed to provide the ultimate attainable speed on the system.

Comparison of high-angle take-off and low-angle take-off EDX detector geometry of the HF-2000 FE-TEM

1993 ◽  
Vol 51 ◽  
pp. 252-253
Author(s):  
Y. Sato ◽  
T. Hashimoto ◽  
M. Ichihashi ◽  
Y. Ueki ◽  
K. Hirose ◽  
...  
Keyword(s):  
Quantitative Analysis ◽  
Field Emission ◽  
Solid Angle ◽  
Energy Dispersive ◽  
Objective Lens ◽  
X Rays ◽  
High Angle ◽  
X Ray ◽  
Detector Geometry

Analytical TEMs have two variations in x-ray detector geometry, high and low angle take off. The high take off angle is advantageous for accuracy of quantitative analysis, because the x rays are less absorbed when they go through the sample. The low take off angle geometry enables better sensitivity because of larger detector solid angle.Hitachi HF-2000 cold field emission TEM has two versions; high angle take off and low angle take off. The former allows an energy dispersive x-ray detector above the objective lens. The latter allows the detector beside the objective lens. The x-ray take off angle is 68° for the high take off angle with the specimen held at right angles to the beam, and 22° for the low angle take off. The solid angle is 0.037 sr for the high angle take off, and 0.12 sr for the low angle take off, using a 30 mm2 detector.

Identification of Nd163 phase in melt-textured NdBa2Cu3O7−δ bulk samples

2003 ◽  
Vol 18 (9) ◽  
pp. 2050-2054 ◽  
Author(s):  
Marcello Gombos ◽  
Vicente Gomis ◽  
Anna Esther Carrillo ◽  
Antonio Vecchione ◽  
Sandro Pace ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Optical Microscopy ◽  
Room Temperature ◽  
Polarized Light ◽  
Energy Dispersive ◽  
X Ray ◽  
Spontaneous Formation ◽  
The Stability ◽  
Scanning Electron

In this work, we report on the observation of Nd1Ba6Cu3O10,5 (Nd163) phase of the NdBaCuO system in melt-textured Nd123 bulk samples grown from a mixture of Nd123 and Nd210 phase powders. The observation was performed with polarized light optical microscopy and scanning electron microscopy–energy dispersive x-ray analyses. Images of the identified phase crystals show an aspect quite different from Nd422 crystals. Unexpectedly, Nd163 was individuated, even in “pure” Nd123 samples. Moreover, after long exposure to air, Nd163 disappeared completely in samples synthesized from powders containing Nd210. Thermogravimetry analyses of powders show that the stability of this phase in air is limited to temperatures higher than 900 °C, so Nd163 is unstable and highly reactive at room temperature. Moreover, an explanation of the observation of Nd163 in Nd210 free samples, based on the spontaneous formation of Nd163 phase in a Nd123 melt, is proposed.

scholarly journals Synthesis and Characterisation of Thin Films of Bismuth Triiodide for Semiconductor Radiation Detectors

2014 ◽  
Vol 2014 ◽  
pp. 1-3 ◽  
Author(s):  
Alka Garg ◽  
Monika Tomar ◽  
Vinay Gupta
Keyword(s):  
Thin Films ◽  
Absorption Coefficient ◽  
Room Temperature ◽  
Active Material ◽  
Visible Region ◽  
Radiation Detectors ◽  
Radiation Absorption ◽  
X Rays ◽  
X Ray ◽  
Bismuth Iodide

Bismuth iodide is a potentially active material for room temperature radiation detector, as it is well reported in the literature that it has both wide energy band gap and high atomic absorption coefficient. Crystalline films of high atomic number and high radiation absorption coefficient can absorb the X-rays and convert them directly into electrical charges which can be read by imaging devices. Therefore, it was proposed to grow thin films of Bismuth iodide on glass substrate using thermal evaporation technique in vacuum to avoid the inclusion of impurities in the films. The structural studies of the films were carried out using XRD and optical absorption measurement was carried out in the UV/VIS region using spectrophotometer. All Bismuth iodide films grown at room temperature are polycrystalline and show X-ray diffraction peaks at angles reported in research papers. The optical transmission spectra of BiI3 films show a high transmission of about 80% in visible region with a sharp fall near the fundamental absorption at 650 nm. Resistivity of the as-grown film was found to be around 1012 ohm-cm suitable value for X-ray detection application. Films were subjected to scanning electron microscopy to study the growth features of both as-grown and annealed films.

about chemical bonding and molecular structure. This information can be used to detect th e types of organic materials present on the surface. 4.3.2.2. Raman spectroscopy (RS) [7, 8] It is used to examine the energy levels of molecules that cannot be well character-ized via infrared spectroscopy. Th e two techniques, however, are complimentary. In the RS, a sample is irradiated with a strong monochromatic light source (usu-ally a laser). Most of the radiation will scatter or "reflect off' the sample at the same energy as the incoming laser radiation. However, a small amount will scat-ter from the sample at a wavelength slightly shifted from the original wavelength. It is possible to study the molecular structure or determine the chemical identity of the sample. It is quite straightforward to identify compounds by spectral library search. Due to extensive library spectral information, the unique spectral finger-print of every compound, and the ease with which such analyses can be per-formed, the RS is a very useful technique for various applications. An important application of the RS is the rapid, nondestructive characterization of diamond, diamond-like, and amorphous-carbon films. 4.3.2.3. Scanning electron microscopy (SEM) / energy dispersive X-ra y analysis (EDX) [7, 8] The SEM produce s detailed photographs that provide important information about the surface structure and morphology of almost any kind of sample. Image analy-sis is often the first and most important step in problem solving and failure analy-sis. With SEM, a focused beam of high-energy electrons is scanned over the sur-face of a material, causing a variety of signals, secondary electrons, X-rays, photons, etc. - each of which may be used to characterize the material with re-spect to specific properties . The signals are used to modulate the brightness on a CRT display, thereb y providing a high-resolution map of the selected material property. It is a surface imaging technique, but with Energy Dispersive X-ray (EDX) it can identify elements in the near-surface region. This technique is most useful for imaging particles. 4.3.2.4. X-ray fluorescence (XRF) [7, 8] Incident X-rays are used to excite surface atoms. The atoms relax through the emission of an X-ray with energy characteristic of the parent atoms and the inten-sity proportional to the amount of the element present. It is a bulk or "total mate-rials" characterization technique for rapid, simultaneous, and nondestructive analysis of elements having an atomic number higher than that of boron. Tradi-tional bulk analysis applications include identifying metals and alloys, detecting trace elements in liquids, and identifying residues and deposits. 4.3.2.5. Total-reflection X-ray fluorescence (TXRF) [7, 8] It is a special XRF technique that provides extremely sensitive measures of the elements present in a material's outer surface. Applications include searching for metal contamination in thin films on silicon wafers and detecting picogram-levels o f arsenic, lead, mercury and cadmium on hazardous, chemical fume hoods.

2003 ◽  
pp. 43-45
Keyword(s):  
Molecular Structure ◽  
Energy Levels ◽  
Monochromatic Light ◽  
Surface Region ◽  
Carbon Films ◽  
Energy Dispersive ◽  
X Rays ◽  
Bulk Analysis ◽  
X Ray ◽  
High Resolution Map

Hydrogen Redistribution in Technically Pure Titanium Alloy under X-Ray Exposure at Room Temperature

2014 ◽  
Vol 880 ◽  
pp. 74-79 ◽  
Author(s):  
Viktor N. Kudiiarov ◽  
Andrey M. Lider ◽  
Natalya S. Pushilina
Keyword(s):  
Titanium Alloy ◽  
Surface Area ◽  
Exposure Time ◽  
Room Temperature ◽  
Hydrogen Diffusion ◽  
Pure Titanium ◽  
Hydrogen Desorption ◽  
X Rays ◽  
X Ray ◽  
State Increase

This paper presents experimental results in study of hydrogen redistribution in technically pure titanium alloy under X-ray exposure at room temperature. It is demonstrated that X-ray exposure to titanium with hydrogen affects hydrogen diffusion and redistribution from the surface area to the depth of the samples irrespective of hydrogen condition in titanium: in hydride form or dissolved state. Increase of the exposure time increases the amount of hydrogen redistributed. Hydrogen desorption during irradiation by X-rays at room temperature does not happen.

Near Edge X-Ray Absorption Fine Structure (NEXAFS) Microscopy: Chemical Analysis at Sub Visible Spatial Resolution

1997 ◽  
Vol 3 (S2) ◽  
pp. 851-852
Author(s):  
H. Ade
Keyword(s):  
Fine Structure ◽  
Compositional Analysis ◽  
High Sensitivity ◽  
Linear Dichroism ◽  
X Rays ◽  
X Ray ◽  
Absorption Fine ◽  
Nexafs Spectroscopy ◽  
Wide Range ◽  
X Ray Absorption

Infrared, Raman, and fluorescence/luminescence microspectroscopy/microscopy in many instances seek to provide high sensitivity compositional and functional information that goes beyond mere elemental composition. This goal is shared by NEXAFS microscopy, in which Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy is employed to provide chemical sensitivity and can be relatively easily adopted in a scanning transmission x-ray microscope (STXM). In addition to compositional information, NEXAFS microscopy can exploit the dependence of x-ray absorption resonances on the bond orientation relative to the linearly polarized x rays (linear dichroism microscopy). For compositional analysis, NEXAFS microscopy is analogous to Electron Energy Loss Spectroscopy (EELS) in an electron microscope. However, when utilizing near edge spectral features, NEXAFS microscopy requires a considerable lower dose than EELS microscopy which makes it very suitable to studying radiation sensitive materials such as polymers. NEXAFS has shown to have excellent sensitivity to a wide range of moieties in polymers, including sensitivity to substitution isomerism.

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