Anisotropic Behavior of Single Grain Cu6Sn5 Intermetallic

2014 ◽  
Author(s):  
Soud Farhan Choudhury ◽  
Leila Ladani
Keyword(s):  
Grain Size ◽  
Yield Strength ◽  
Solder Joint ◽  
Single Crystal ◽  
Solder Joints ◽  
Reflow Process ◽  
Plastic Properties ◽  
Growth Orientation ◽  
Loading Direction ◽  
Single Grain

Intermetallic (IMC) layers (Cu6Sn5 and Cu3Sn) are an essential component of a solder joint for good metallurgical bonding. However, the mechanical and physical properties of IMC layers differ significantly from the solder and substrate, and excessive IMC layers can lower the reliability of solder joints due to their brittle nature. Moreover, continuous miniaturization of packages and joints has increased the volume fraction of IMCs to a point where smaller joints could be completely composed of IMCs. Further miniaturization of joints may result in statistical grain size effects. One of the most common types of IMCs in microelectronic joints is Cu6Sn5, which is formed in a variety of bonding materials with different compositions of Sn, Cu, and Ag. Due to its large percentage of volume in solder joint; to predict the reliability of micro solder joints, it is necessary to characterize single crystal Cu6Sn5 IMC completely. This study reports the information on grain growth orientation and elastic-plastic properties such as young’s modulus, hardness, yield strength and strain hardening exponent of single grain of Cu6Sn5 in Sn-3.5Ag/Cu solder alloy system. IMCs materials were grown using reflow process using an experiment in which the time and temperature of reflow process was varied. Electron backscatter diffraction (EBSD) analysis was conducted after the reflow to measure the grain size and determine the preferred grain orientation. It was found that the growth orientation is in the orientation of the c-axis. Nanoindentation was carried out in 4 individual grains with different crystallographic orientation along normal to the growth axis to determine the elastic properties of Cu6Sn5 single crystal. Plastic properties were predicted using the nanoindentation results and Dao reverse analysis model. The results indicate that the hardness for Cu6Sn5 grains with different orientation along normal to growth axis is statistically indistinguishable. Lower elastic modulus was observed for a grain with [010] direction parallel to the loading direction. Yield strength of a grain with (001) plane parallel to the loading direction was slightly lower than other grain orientations. Overall, the experimental results obtained were found to be within the range shown in the literature.

Effects of doping trace Ni element on interfacial behavior of Sn/Ni (polycrystal/single-crystal) joints

2021 ◽  
Vol ahead-of-print (ahead-of-print) ◽  
Author(s):  
Jianing Wang ◽  
Jieshi Chen ◽  
Zhiyuan Zhang ◽  
Peilei Zhang ◽  
Zhishui Yu ◽  
...  
Keyword(s):  
Solder Joint ◽  
Single Crystal ◽  
Microstructure Evolution ◽  
Thermal Aging ◽  
Interfacial Layer ◽  
Aging Treatment ◽  
Growth Behavior ◽  
Reflow Process ◽  
Content Type ◽  
Ni Substrate

Purpose The purpose of this article is the effect of doping minor Ni on the microstructure evolution of a Sn-xNi (x = 0, 0.05 and 0.1 wt.%)/Ni (Poly-crystal/Single-crystal abbreviated as PC Ni/SC Ni) solder joint during reflow and aging treatment. Results showed that the intermetallic compounds (IMCs) of the interfacial layer of Sn-xNi/PC Ni joints were Ni3Sn4 phase, while the IMCs of Sn-xNi/SC Ni joints were NiSn4 phase. After the reflow process and thermal aging of different joints, the growth behavior of interfacial layer was different due to the different mechanism of element diffusion of the two substrates. The PC Ni substrate mainly provided Ni atoms through grain boundary diffusion. The Ni3Sn4 phase of the Sn0.05Ni/PC Ni joint was finer, and the diffusion flux of Sn and Ni elements increased, so the Ni3Sn4 layer of this joint was the thickest. The SC Ni substrate mainly provided Ni atoms through the lattice diffusion. The Sn0.1Ni/SC Ni joint increases the number of Ni atoms at the interface due to the doping of 0.1Ni (wt.%) elements, so the joint had the thickest NiSn4 layer. Design/methodology/approach The effects of doping minor Ni on the microstructure evolution of an Sn-xNi (x = 0, 0.05 and 0.1 Wt.%)/Ni (Poly-crystal/Single-crystal abbreviated as PC Ni/SC Ni) solder joint during reflow and aging treatment was investigated in this study. Findings Results showed that the intermetallic compounds (IMCs) of the interfacial layer of Sn-xNi/PC Ni joints were Ni3Sn4 phase, while the IMCs of Sn-xNi/SC Ni joints were NiSn4 phase. After the reflow process and thermal aging of different joints, the growth behavior of the interfacial layer was different due to the different mechanisms of element diffusion of the two substrates. Originality/value In this study, the effect of doping Ni on the growth and formation mechanism of IMCs of the Sn-xNi/Ni (single-crystal) solder joints (x = 0, 0.05 and 0.1 Wt.%) was investigated.

Deformation Behavior of SAC305 Solder Joints With Multiple Grains

2020 ◽  
Author(s):  
Debabrata Mondal ◽  
Abdullah Fahim ◽  
KM Rafidh Hassan ◽  
Jeffrey C. Suhling ◽  
Pradeep Lall
Keyword(s):  
Grain Size ◽  
Solder Joint ◽  
Deformation Behavior ◽  
Thermal Loading ◽  
Solder Joints ◽  
Lead Free ◽  
External Loading ◽  
Lead Free Solder ◽  
Material Anisotropy ◽  
Free Solder

Abstract Lead-free solder joints are the most widely used interconnects in electronic packaging industries. Usually solder joints in most of the electronic devices are exposed to an environment where variation of temperature exists, which indicates cyclic thermal loading to be a very common type of external loading. Moreover, due to difference in the coefficient of thermal expansion (CTE) among dissimilar contact materials, shear stress develops in junctions under thermal loading, which significantly deteriorates the overall reliability. Hence, characterization of lead-free solder materials under thermal loading is essential to predict the performance and deformation behavior of joints in practical applications. A significant portion of the studies in this field are concerned with thermal loading of lead-free solder interconnects, each of which has a very small diameter, in sub-millimeter range. Although the solder balls have very small dimensions, most of the analyses considered them as a bulk material with homogeneous and isotropic properties. However, with the decrease of specimen dimensions, size effects and material directionality play a significant role in deformation mechanisms. Since a very few grains exist in a small specimen, individual grain properties play a vital role on overall material response. Therefore, modeling from the grain structure and orientation point of view could be an effective and more accurate way to predict solder joint deformation behavior under thermal loading. In this study, the effect of grain size and orientation of SAC305 is investigated for predicting anisotropic behavior of solder joints under thermal load. A simplified three-dimensional model of beach-ball configuration solder joint was generated and simulated using ABAQUS finite element (FE) software. Experimentally obtained directional properties such as elastic modulus and CTE were assigned to the computational geometry to create material anisotropy. The effects of material anisotropy were studied for varying grain size specimens, as well as for specimens with varying grain orientation.

Prediction of Liquid Formation for Solder and Non-Solder Mask Defined Array Packages

1999 ◽  
Vol 124 (1) ◽  
pp. 37-44 ◽  
Author(s):  
Wen-Hwa Chen ◽  
Kuo-Ning Chiang ◽  
Shu-Ru Lin
Keyword(s):  
Solder Joint ◽  
Solder Joints ◽  
Reflow Process ◽  
Surface Evolver ◽  
Restoring Force ◽  
Solder Mask ◽  
The Difference ◽  
Design Factors ◽  
Joint Volume ◽  
Liquid Formation

This study presents an efficient method to accurately predict solder joint geometry after a reflow process. The proposed method can be utilized for Solder Mask Defined (SMD), Non-Solder Mask Defined (NSMD), or C4 type solder joints. The reflow process involves several design factors capable of influencing the final shape of the molten solder joint, such as solder joint volume, restoring force, surface tension, contact angle, pad thickness, and pad size. These factors are all considered in the calculations. The computed results are compared with those using the Surface Evolver program and also with available numerical/experimental results. Their excellent agreement shows that the method developed herein can be practically applied to predict the reflow shape of SMD/NSMD solder joints. The difference between SMD and NSMD is also examined in detail. Results in this study provide designers with a fundamental guideline for accurately predicting the liquid formation of solder joints during the reflow process.

Effect of Micro Structure on Fatigue Characteristics of Lead Free Solder Joints

2011 ◽  
Author(s):  
Takahiro Akutsu ◽  
Qiang Yu
Keyword(s):  
Grain Size ◽  
Fatigue Crack ◽  
Fatigue Life ◽  
Solder Joint ◽  
Crack Propagation ◽  
Solder Joints ◽  
Lead Free ◽  
Lead Free Solder ◽  
Micro Structure ◽  
Free Solder

This paper presents the influence of the micro structure on the crack propagation in lead free solder joint. The author’s group have studied the Manson-Coffin’s law for lead free solder joint by using the isothermal fatigue test and FEM analytical approaches to establish the practicable evaluation of thermal fatigue life of solder joints, for example, for the Sn-Cu-Ni solder, because this solder is attracted from the aspect of the decrease of solder leach in the flow process and material cost. However, even if the same loading is given to the solder joints of BGA test piece, there was a large dispersion in the fatigue life. Even though the effect of the shape difference has been considered, the range of the dispersion could not been explained sufficiently. In the study, the fatigue crack propagation modes in the solder joints were investigated, and an internal fatigue crack mode and an interfacial fatigue crack mode were confirmed. And the tendency of a shorter on fatigue life in the interfacial fatigue mode was confirmed. To clarify the mechanism of these fatigue crack modes, the crystal grain size in the solder joints was investigated before the fatigue test and also after the test. Furthermore, the verification of the mechanism using FEM models considering the crystal grain size was carried out. First of all, each element in FEM models matching to the average crystal grain size was made. Second, the inelastic strain ranges in each FEM models were studied. As a result, it was shown that the influence of the crude density of the crystal grain to the fatigue crack progress can be evaluated. In addition, the micro structure of the solder joint of large-scale electronic devices is observed, and FEM model was made based on the observation result. As a result, it was shown that the influence of the directionality with the crystal grain to the fatigue crack progress can be evaluated.

Reflow of tiny 01005 capacitor/SAC305 solder joints in protective atmosphere

2017 ◽  
Vol 29 (3) ◽  
pp. 144-150 ◽  
Author(s):  
Yeqing Tao ◽  
Dongyan Ding ◽  
Ting Li ◽  
Jason Guo ◽  
Guoliang Fan
Keyword(s):  
Solder Joint ◽  
Oxygen Concentration ◽  
Solder Joints ◽  
Protective Atmosphere ◽  
Low Oxygen ◽  
Reflow Process ◽  
Sac305 Solder ◽  
Content Type ◽  
Placement Accuracy ◽  
Component Assembly

Purpose This paper aims to study the influence of reflow atmosphere and placement accuracy on the solderability of 01005 capacitor/SAC305 solder joints. Design/methodology/approach The 01005 capacitors were mounted on OSP-coated pads, and the samples were fabricated in four different atmospheres, i.e. 200 ppm O2/N2, 1,000 ppm O2/N2, 3,000 ppm O2/N2 and air. After the reflow process, visual inspection and X-ray detection were carried out to examine the solder joint shapes and possible defects. Some of the samples fabricated in different conditions were cross-sectioned and the solder joint microstructures were analyzed. On the other hand, besides placing the components on their normal pad positions, a 50 per cent offset of the x-axis (long axis) or y-axis (short axis) was introduced into the chip mounter programs to evaluate the 01005 capacitor’s assembly sensitivity to placement accuracy. The process-induced defects were investigated. Findings Experimental results indicated that an N2-based protective atmosphere was necessary for 01005 type assembly, as it could obviously improve the 01005 solder joint quality, compared with the air condition. The protective atmosphere had little effect on the appearance, quality and microstructure of solder joints when the oxygen concentration was below 3,000 ppm. But a very low oxygen concentration could increase the risk of tombstoning defects for the assembly process. The N2-based protective atmosphere containing 1,000-2000 ppm O2 was acceptable and appropriate for the assembly of tiny components. Originality/value The results of this work provide a set of reflow process parameters and recommendations for 01005 size component assembly in manufacturing.

Geometric size effect on IMC growth and elements diffusion in Cu/Sn/Cu solder joints

2017 ◽  
Vol 29 (2) ◽  
pp. 85-91 ◽  
Author(s):  
Yan Zhu ◽  
Fenglian Sun
Keyword(s):  
Solder Joint ◽  
Isothermal Aging ◽  
Design Methodology ◽  
Solder Joints ◽  
Control Element ◽  
Correlation Model ◽  
Reflow Process ◽  
Content Type ◽  
Root Cause ◽  
Geometric Size

Purpose The purpose of this paper is to investigate the effect of geometric size on intermetallic compound (IMC) growth and elements diffusion of Cu/Sn/Cu solder joint and establish the correlation model between the thickness of the IMC layer and size of the solder joint on the dozens of microns scale. Design/methodology/approach The sandwich-structured Cu/Sn/Cu solder joints with different gaps between two copper-clad plates (δ) are fabricated using a reflow process. The microstructure and composition of solder joints are observed and analyzed by scanning electron microscopy. Findings After reflow, the thickness of the IMC and Cu concentration in solder layers increase with the reduction of δ from 50, 40, 30, 20 to 10 μm. During isothermal aging, the thickness of the IMC fails to increase according to the traditional parabolic rule due to changes in Cu concentration. The reduction of δ is the root cause of changes in Cu concentration and the growth rule of the IMC layer. A correlation model between the thickness of the IMC layer and δ is established. It is found that the thickness of the IMC layer is the function of aging time and δ. With δ reducing, the main control element of IMC growth transfers from Cu to Sn. Originality/value This paper shows the changes of IMC thickness and elements concentration with the reduction of the size of solder joints on the dozens of microns scale. A correlation model is established to calculate the thickness of the IMC layer during aging.

Nanoindentation Testing of SAC305 Solder Joints Subjected to Thermal Cycling Loading

2019 ◽  
Author(s):  
Abdullah Fahim ◽  
S. M. Kamrul Hasan ◽  
Jeffrey C. Suhling ◽  
Pradeep Lall
Keyword(s):  
Mechanical Properties ◽  
Solder Joint ◽  
Thermal Cycling ◽  
Creep Behavior ◽  
Solder Joints ◽  
Test Results ◽  
Sac305 Solder ◽  
Nanoindentation Testing ◽  
Single Grain ◽  
Cycling Loading

Abstract Solder joints in electronic packages are frequently exposed to thermal cycling environment. Such exposures can occur in real life application as well as in accelerated thermal cycling tests used for the fatigue behavior characterization. Because of temperature variations and CTE mismatches of the assembly materials, cyclic temperature leads to damage accumulation and material property evolution in the solder joints. This eventually results in crack initiation, and subsequent crack growth and failure. In this study, the nanoindentation technique was used to understand the evolution of mechanical properties (modulus, hardness and creep behavior) of SAC305 BGA solder joints and Cu pad subjected to thermal cycling loading for various durations. In addition, microstructural changes in those joints that occur during thermal cycling were observed using both SEM and optical microscopy. BGA solder joint strip specimens were first prepared by cross sectioning BGA assemblies followed by surface polishing to facilitate SEM imaging and nanoindentation testing. The strip specimens were chosen to contain several single grain solder joints. This enabled large regions of solder material with equivalent mechanical behavior, which could then be indented several times after various durations of cycling. After preparation, the solder joint strip samples were thermally cycled from T = −40 to 125 °C in an environmental chamber. At various points in the cycling (e.g. after 0, 50, 100, and 250 cycles), the package was taken out from the chamber, and nanoindentation was performed on each single grain joint and joint Cu pads to obtain the modulus, hardness, and creep behavior at 25 °C. This allowed the evolution of the mechanical properties with the duration of thermal cycling to be determined. Moreover, microstructural changes were also observed after various durations of cycling using optical microscopy. From the nanoindentation test results, it was found that the modulus and hardness of the SAC305 solder joints dropped significantly with thermal cycling. However, the Cu pad did not show any change in the mechanical behavior during cycling. Moreover, the nanoindentation creep test results showed significant increases in the creep deformation for solder joints whereas Cu pad did now show any significant changes in creep behavior when both of them were subjected to thermal cycling up to 250 cycles.

Structural Size Effect on Mechanical Behavior of Intermetallic Material in Solder Joints: Experimental Investigation

2014 ◽  
Vol 137 (1) ◽  
Author(s):  
Leila Ladani ◽  
Ousama Abdelhadi
Keyword(s):  
Elastic Modulus ◽  
Solder Joints ◽  
Electron Backscatter Diffraction ◽  
Plastic Properties ◽  
Soldering Temperature ◽  
Nano Indentation ◽  
Soldering Process ◽  
Loading Direction ◽  
Solid Liquid ◽  
Backscatter Diffraction

The elastic and plastic mechanical properties of intermetallic compound (IMC) phases of a lead-free Sn3.5Ag/Cu-substrate soldering system are investigated in different sized joints using nano-indentation. The specimens were prepared using solid–liquid interdiffusion soldering process with joint sizes ranging from 15 to 450 μm. Solder joints were subjected to 360 °C soldering temperature for 20 min and then air cooled to room temperature to create testable IMCs thicknesses. Nano-indentation was used to extract the elastic and plastic properties of Cu6Sn5, Cu3Sn, and Ag3Sn IMCs and β-tin and copper materials. Cu–Sn IMCs formed in specimens with smaller joint size show higher elastic modulus, hardness, and yield strength and lower work hardening exponent. This was attributed to the dimensional constraints associated with decreasing joint size and the local stresses developed during fabrication in joints with different sizes. Local elastic modulus and hardness of single grains of Cu6Sn5 were obtained using a combination of nano-indentation and electron backscatter diffraction (EBSD) techniques. Grains with c-axis at a 45 deg angle with respect to the nano-indentation loading direction show higher elastic modulus (∼8.70% higher) and hardness (8.85% higher) compared to the grains that have a c-axis that is almost perpendicular to the nano-indentation loading direction.

scholarly journals ODS EUROFER Steel Strengthened by Y-(Ce, Hf, La, Sc, and Zr) Complex Oxides

Metals ◽  
2019 ◽  
Vol 9 (11) ◽  
pp. 1148 ◽  
Author(s):  
Roman Husák ◽  
Hynek Hadraba ◽  
Zdeněk Chlup ◽  
Milan Heczko ◽  
Tomáš Kruml ◽  
...  
Keyword(s):  
Grain Size ◽  
Yield Strength ◽  
Complex Oxides ◽  
Oxide Dispersion Strengthened ◽  
Interparticle Spacing ◽  
Oxide Dispersion ◽  
Strengthening Effect ◽  
Dispersion Strengthening ◽  
Doping Element ◽  
Average Grain Size

Oxide dispersion-strengthened (ODS) materials contain homogeneous dispersions of temperature-stable nano-oxides serving as obstacles for dislocations and further pinning of grain boundaries. The strategy for dispersion strengthening based on complex oxides (Y-Hf, -Zr, -Ce, -La) was developed in order to refine oxide dispersion to enhance the dispersion strengthening effect. In this work, the strengthening of EUROFER steel by complex oxides based on Y and elements of the IIIB group (lanthanum, scandium) and IVB group (cerium, hafnium, zirconium) was explored. Interparticle spacing as a dispersoid characteristic appeared to be an important factor in controlling the dispersion strengthening contribution to the yield strength of ODS EUROFER steels. The dispersoid size and average grain size of ODS EUROFER steel were altered in the ranges of 5–13 nm and 0.6–1.7 µm, respectively. Using this strategy, the yield strength of the prepared alloys varied between 550 MPa and 950 MPa depending on the doping element.

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