Influence of Nanostructured Fibers on Properties of Building Composites

2012 ◽  
Vol 249-250 ◽  
pp. 958-961
Author(s):  
Natalya Valentinovna Makarova ◽  
Vasiliy Petrovich Pogodaev ◽  
Anton Vasilyevich Pogodaev ◽  
Andrey Vladimirovich Kozin ◽  
Aleksey Sergeevich Lipovoy
Keyword(s):  
Plain Concrete ◽  
Concrete Surface ◽  
Cement Composites ◽  
High Modulus ◽  
Micro Hardness ◽  
Mineral Fibers ◽  
Force Microscopy ◽  
Hardness Tester ◽  
Atomic Force ◽  
Strength And Deformation

Currently, interest in nanotechnology concept for cement composites is steadily growing. Results of investigations of the concrete surface, reinforced with nanostructured mineral fibers by using atomic force microscopy (AFM) and dynamic ultra-micro hardness tester (DUMHT) of the specific areas of surface are presented. For comparison plain concrete and concrete with addition of single mineral fibers investigated as well. The analysis of the obtained data has shown that as a result of the directed microdisperse structurization provided by nanoinitiators on a surface of fibers, increase strength and deformation characteristics of a material. The main objective of this paper is to research the mechanisms of pattern formation surface of the concrete contained the High-modulus basalt microfiber (HMBMF) as a solid carrier for nanoparticles.

scholarly journals Preparation and Optical Application of SiO2-TiO2 Composite Hardening Coatings with Controllable Refractive Index by Synchronous Polymerization

Coatings ◽  
2021 ◽  
Vol 11 (2) ◽  
pp. 129
Author(s):  
Weiping Du ◽  
Shuting Cai ◽  
Yang Zhang ◽  
Huifang Chen
Keyword(s):  
Refractive Index ◽  
Titanium Isopropoxide ◽  
Hard Coatings ◽  
Reaction Conditions ◽  
Optical Lens ◽  
Force Microscopy ◽  
Hardness Tester ◽  
Hardening Coatings ◽  
Atomic Force ◽  
Particle Size Analyzer

The homogeneous SiO2-TiO2 composite sols were prepared by organic-inorganic synchronous polymerization with titanium isopropoxide and tetrabutyl silicate as precursor. The organic-inorganic composite hard coating with Si-O-Ti as the framework was prepared by adding compound crosslinkers (up-401) and 3-Methacryloxypropyltrimethoxysilane (KH-560). The structure of the coating and the hardened film were characterized by infrared spectrum, scanning electron microscopy, atomic force microscopy, particle size analyzer and thermogravimetry. The refractive index, transmittance and hardness of the hardened film were measured by ellipsometry, UV-Vis spectrophotometer and hardness tester. By adjusting the ratio of Si/Ti and optimizing the reaction conditions, the hardness of the hardened film could reach 6H, and the refractive index could be adjusted from 1.55 to 1.76. At the same time, the application of hard coatings on the surface of optical lens were studied.

Adhesion Strength and Deformation Behavior of Al(Cu-Si)/BPDA-PDA Layered Structures

1997 ◽  
Vol 476 ◽  
Author(s):  
P. Abramowitz ◽  
E. Ogawa ◽  
P. S. Ho ◽  
J. Wetzel
Keyword(s):  
Thin Films ◽  
Deformation Behavior ◽  
Deformation Energy ◽  
Entire System ◽  
Metal Interface ◽  
Adhesive Properties ◽  
Force Microscopy ◽  
Atomic Force ◽  
Polymer Metal ◽  
Strength And Deformation

AbstractThe adhesion of Al(Cu-Si) line structures on thin films of BPDA-PDA with different surface preconditioning were examined by measuring the deformation energy of the metal and interface. The properties of BPDA-PDA/Al(Cu-Si) were examined with atomic force microscopy (AFM). Although different sputtering treatments profoundly affect the adhesive properties, the sputtering does not appreciably change the topology of the BPDA-PDA. We also found evidence that even though the thickness of the interface can be very small (3–5 nm), the polymer/metal interface can greatly affect the deformation behavior of the entire system.

Quantitative mapping of high modulus materials at the nanoscale: comparative study between atomic force microscopy and nanoindentation

2020 ◽  
Vol 280 (1) ◽  
pp. 51-62
Author(s):  
R. COQ GERMANICUS ◽  
D. MERCIER ◽  
F. AGREBI ◽  
M. FÈBVRE ◽  
D. MARIOLLE ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Comparative Study ◽  
High Modulus ◽  
Force Microscopy ◽  
Atomic Force ◽  
Quantitative Mapping

Cryogenic atomic force microscopy

1991 ◽  
Vol 49 ◽  
pp. 54-55
Author(s):  
K. A. Fisher ◽  
M. G. L. Gustafsson ◽  
M. B. Shattuck ◽  
J. Clarke
Keyword(s):  
Room Temperature ◽  
Rapid Freezing ◽  
Cryogenic Temperatures ◽  
Soft Or ◽  
Electrically Conductive ◽  
Force Microscopy ◽  
Flexible Molecules ◽  
Advantages And Disadvantages ◽  
Atomic Force ◽  
Chemical Perturbation

The atomic force microscope (AFM) is capable of imaging electrically conductive and non-conductive surfaces at atomic resolution. When used to image biological samples, however, lateral resolution is often limited to nanometer levels, due primarily to AFM tip/sample interactions. Several approaches to immobilize and stabilize soft or flexible molecules for AFM have been examined, notably, tethering coating, and freezing. Although each approach has its advantages and disadvantages, rapid freezing techniques have the special advantage of avoiding chemical perturbation, and minimizing physical disruption of the sample. Scanning with an AFM at cryogenic temperatures has the potential to image frozen biomolecules at high resolution. We have constructed a force microscope capable of operating immersed in liquid n-pentane and have tested its performance at room temperature with carbon and metal-coated samples, and at 143° K with uncoated ferritin and purple membrane (PM).

AFM study of the dynamics of α-alumina surface faceting during high-temperature processing

1995 ◽  
Vol 53 ◽  
pp. 334-335 ◽  
Author(s):  
Michael W. Bench ◽  
Jason R. Heffelfinger ◽  
C. Barry Carter
Keyword(s):  
High Temperature ◽  
Thin Foil ◽  
Sem Analysis ◽  
Conductive Coatings ◽  
Force Microscopy ◽  
Minimal Sample ◽  
Atomic Force ◽  
Formation And Evolution ◽  
High Temperature Processing ◽  
Nominal Surface

To gain a better understanding of the surface faceting that occurs in α-alumina during high temperature processing, atomic force microscopy (AFM) studies have been performed to follow the formation and evolution of the facets. AFM was chosen because it allows for analysis of topographical details down to the atomic level with minimal sample preparation. This is in contrast to SEM analysis, which typically requires the application of conductive coatings that can alter the surface between subsequent heat treatments. Similar experiments have been performed in the TEM; however, due to thin foil and hole edge effects the results may not be representative of the behavior of bulk surfaces.The AFM studies were performed on a Digital Instruments Nanoscope III using microfabricated Si3N4 cantilevers. All images were recorded in air with a nominal applied force of 10-15 nN. The alumina samples were prepared from pre-polished single crystals with (0001), , and nominal surface orientations.

Scanning tunneling microscopy and atomic force microscopy: New tools for biology

1989 ◽  
Vol 47 ◽  
pp. 778-779
Author(s):  
CE Bracker ◽  
P. K. Hansma
Keyword(s):  
Physical Property ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Small Scale ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
New Family ◽  
Small Probe ◽  
Atomic Force ◽  
Transmission Electron

A new family of scanning probe microscopes has emerged that is opening new horizons for investigating the fine structure of matter. The earliest and best known of these instruments is the scanning tunneling microscope (STM). First published in 1982, the STM earned the 1986 Nobel Prize in Physics for two of its inventors, G. Binnig and H. Rohrer. They shared the prize with E. Ruska for his work that had led to the development of the transmission electron microscope half a century earlier. It seems appropriate that the award embodied this particular blend of the old and the new because it demonstrated to the world a long overdue respect for the enormous contributions electron microscopy has made to the understanding of matter, and at the same time it signalled the dawn of a new age in microscopy. What we are seeing is a revolution in microscopy and a redefinition of the concept of a microscope.Several kinds of scanning probe microscopes now exist, and the number is increasing. What they share in common is a small probe that is scanned over the surface of a specimen and measures a physical property on a very small scale, at or near the surface. Scanning probes can measure temperature, magnetic fields, tunneling currents, voltage, force, and ion currents, among others.

Morphology and development of flow-pattern defect with extended nonagitated Secco etching

1994 ◽  
Vol 52 ◽  
pp. 868-869
Author(s):  
Y. Pan
Keyword(s):  
Flow Pattern ◽  
Silicon Crystal ◽  
Gate Oxide ◽  
Crystal Growth Rate ◽  
Etch Depth ◽  
Force Microscopy ◽  
Etch Pit ◽  
Float Zone ◽  
Atomic Force ◽  
Multiple Step

The D defect, which causes the degradation of gate oxide integrities (GOI), can be revealed by Secco etching as flow pattern defect (FPD) in both float zone (FZ) and Czochralski (Cz) silicon crystal or as crystal originated particles (COP) by a multiple-step SC-1 cleaning process. By decreasing the crystal growth rate or high temperature annealing, the FPD density can be reduced, while the D defectsize increased. During the etching, the FPD surface density and etch pit size (FPD #1) increased withthe etch depth, while the wedge shaped contours do not change their positions and curvatures (FIG.l).In this paper, with atomic force microscopy (AFM), a simple model for FPD morphology by non-crystallographic preferential etching, such as Secco etching, was established.One sample wafer (FPD #2) was Secco etched with surface removed by 4 μm (FIG.2). The cross section view shows the FPD has a circular saucer pit and the wedge contours are actually the side surfaces of a terrace structure with very small slopes. Note that the scale in z direction is purposely enhanced in the AFM images. The pit dimensions are listed in TABLE 1.

Surface roughness measurements of vanadium-contaminated fluidized cracking catalysts by atomic force microscopy

1996 ◽  
Vol 54 ◽  
pp. 866-867
Author(s):  
H. Kinney ◽  
M.L. Occelli ◽  
S.A.C. Gould
Keyword(s):  
Surface Roughness ◽  
Zeolite Y ◽  
Atomic Level ◽  
Microporous Structure ◽  
Contact Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After ◽  
Roughness Measurements ◽  
Cracking Catalysts

For this study we have used a contact mode atomic force microscope (AFM) to study to topography of fluidized cracking catalysts (FCC), before and after contamination with 5% vanadium. We selected the AFM because of its ability to well characterize the surface roughness of materials down to the atomic level. It is believed that the cracking in the FCCs occurs mainly on the catalysts top 10-15 μm suggesting that the surface corrugation could play a key role in the FCCs microactivity properties. To test this hypothesis, we chose vanadium as a contaminate because this metal is capable of irreversibly destroying the FCC crystallinity as well as it microporous structure. In addition, we wanted to examine the extent to which steaming affects the vanadium contaminated FCC. Using the AFM, we measured the surface roughness of FCCs, before and after contamination and after steaming.We obtained our FCC (GRZ-1) from Davison. The FCC is generated so that it contains and estimated 35% rare earth exchaged zeolite Y, 50% kaolin and 15% binder.

Development of the UHV-STM

1990 ◽  
Vol 48 (1) ◽  
pp. 322-323
Author(s):  
M. Iwatsuki ◽  
S. Kitamura ◽  
A. Mogami
Keyword(s):  
Surface Science ◽  
Real Space ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Great Promise ◽  
Force Microscopy ◽  
Atomic Force ◽  
Stm Image ◽  
Surface Construction ◽  
Very High

Since Binnig, Rohrer and associates observed real-space topographic images of Si(111)-7×7 and invented the scanning tunneling microscope (STM),1) the STM has been accepted as a powerful surface science instrument.Recently, many application areas for the STM have been opened up, such as atomic force microscopy (AFM), magnetic force microscopy (MFM) and others. So, the STM technology holds a great promise for the future.The great advantages of the STM are its high spatial resolution in the lateral and vertical directions on the atomic scale. However, the STM has difficulty in identifying atomic images in a desired area because it uses piezoelectric (PZT) elements as a scanner.On the other hand, the demand to observe specimens under UHV condition has grown, along with the advent of the STM technology. The requirment of UHV-STM is especially very high in to study of surface construction of semiconductors and superconducting materials on the atomic scale. In order to improve the STM image quality by keeping the specimen and tip surfaces clean, we have built a new UHV-STM (JSTM-4000XV) system which is provided with other surface analysis capability.

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