Reliability of Ceramic Column Grid Array (CCGA717) Interconnect Packages Under Extreme Temperatures for Space Applications*

Ceramic column grid array packages have been increasing in use based on their advantages such as high interconnect density, very good thermal and electrical performance, compatibility with standard surface-mount packaging assembly processes, and so on. CCGA packages are used in space applications such as in logic and microprocessor functions, telecommunications, flight avionics, and payload electronics. As these packages tend to have less solder joint strain relief than leaded packages, the reliability of CCGA packages is very important for short-term and long-term space missions. CCGA interconnect electronic package printed wiring boards (PWBs) of polyimide have been assembled, inspected nondestructively, and subsequently subjected to extreme temperature thermal cycling to assess the reliability for future deep space, short- and long-term, extreme temperature missions. In this investigation, the employed temperature range covers from −185°C to +125°C extreme thermal environments. The test hardware consists of two CCGA717 packages with each package divided into four daisy-chained sections, for a total of eight daisy chains to be monitored. The CCGA717 package is 33 mm × 33 mm with a 27 × 27 array of 80%/20% Pb/Sn columns on a 1.27 mm pitch. The resistance of daisy-chained, CCGA interconnects was continuously monitored as a function of thermal cycling. Electrical resistance measurements as a function of thermal cycling are reported and the tests to date have shown significant change in daisy chain resistance as a function of thermal cycling. The change in interconnect resistance becomes more noticeable as the number of thermal cycles increases. This paper will describe the experimental test results of CCGA testing under extreme temperatures. Standard Weibull analysis tools were used to extract the Weibull parameters to understand the CCGA failures. Optical inspection results clearly indicate that the solder joints of columns with the board and the ceramic package have failed as a function of thermal cycling. The first failure was observed at the 137th thermal cycle and 63.2% failures of daisy chains have occurred by about 664 thermal cycles. The shape parameter extracted from the Weibull plot was about 1.47, which indicates the failures were related to failures that occurred during the flat region or useful life region of the standard bathtub curve. Based on this experimental test data, one can use the CCGAs for the temperature range studied for ∼100 thermal cycles (ΔT = 310°C, 5°C/minute, and 15 min dwell) with a high degree of confidence for high reliability space and other applications.