scholarly journals Effect of Ion Irradiation on Nanoindentation Fracture and Deformation in Silicon Carbide

JOM ◽  
2021 ◽  
Author(s):  
Alexander J. Leide ◽  
Richard I. Todd ◽  
David E. J. Armstrong
Keyword(s):  
Mechanical Properties ◽  
Silicon Carbide ◽  
Residual Stresses ◽  
Focused Ion Beam ◽  
Electron Backscatter Diffraction ◽  
Ion Irradiation ◽  
Ion Beam ◽  
Resolution Electron ◽  
Radiation Induced ◽  
Compressive Residual Stresses

AbstractSilicon carbide is desirable for many nuclear applications, making it necessary to understand how it deforms after irradiation. Ion implantation combined with nanoindentation is commonly used to measure radiation-induced changes to mechanical properties; hardness and modulus can be calculated from load–displacement curves, and fracture toughness can be estimated from surface crack lengths. Further insight into indentation deformation and fracture is required to understand the observed changes to mechanical properties caused by irradiation. This paper investigates indentation deformation using high-resolution electron backscatter diffraction (HR-EBSD) and Raman spectroscopy. Significant differences exist after irradiation: fracture is suppressed by swelling-induced compressive residual stresses, and the plastically deformed region extends further from the indentation. During focused ion beam cross-sectioning, indentation cracks grow, and residual stresses are modified. The results clarify the mechanisms responsible for the modification of apparent hardness and apparent indentation toughness values caused by the compressive residual stresses in ion-implanted specimens.

3D-EBSD Studies of Deformation, Recrystallization and Phase Transformations

2012 ◽  
Vol 715-716 ◽  
pp. 41-50 ◽  
Author(s):  
Michael Ferry ◽  
Wan Qiang Xu ◽  
M. Zakaria Quadir ◽  
Nasima Afrin Zinnia ◽  
Kevin J. Laws ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Thermomechanical Processing ◽  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
Void Formation ◽  
Data Generation ◽  
Serial Sectioning ◽  
Resolution Electron ◽  
Plastic Forming ◽  
Backscatter Diffraction

A focused ion beam (FIB) coupled with high resolution electron backscatter diffraction (EBSD) has emerged as a useful tool for generating crystallographic information in reasonably large volumes of microstructure. In principle, data generation is reasonably straightforward whereby the FIB is used as a high precision serial sectioning device for generating consecutive milled surfaces suitable for mapping by EBSD. The successive EBSD maps generated by serial sectioning are combined using various post-processing methods to generate crystallographic volumes of the microstructure. This paper provides an overview of the use of 3D-EBSD in the study of various phenomena associated with thermomechanical processing of both crystalline and semi-crystalline alloys and includes investigations on the crystallographic nature of microbands, void formation at particles, phase redistribution during plastic forming, and nucleation of recrystallization within various regions of the deformation microstructure.

The Application of 3D-EBSD for Investigating Texture Development in Metals and Alloys

2011 ◽  
Vol 702-703 ◽  
pp. 469-474
Author(s):  
Michael Ferry ◽  
M. Zakaria Quadir ◽  
Nasima Afrin Zinnia ◽  
Lori Bassman ◽  
Cassandra George ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
Low Carbon Steel ◽  
Texture Development ◽  
Data Generation ◽  
Low Carbon ◽  
Resolution Electron ◽  
Multi Phase ◽  
Backscatter Diffraction

A focused ion beam (FIB) coupled with high resolution electron backscatter diffraction (EBSD) has emerged as a useful tool for generating crystallographic information in reasonably large volumes of microstructure. In principle, data generation is reasonably straightforward whereby the FIB is used as a high precision serial sectioning device for generating consecutive milled surfaces suitable for mapping by EBSD. However, there are several challenges facing the technique including the need for accurate reconstruction of the EBSD slice data and the development of methods for representing the myriad microstructural features of interest including, for example, orientation gradients arising from plastic deformation through to the structure of grains and their interfaces in both single-phase and multi-phase materials. This paper provides an overview of the use of 3D-EBSD in the study of texture development in alloys during deformation and annealing and includes an update on current research on the crystallographic nature of microbands in some body centred and face centred cubic alloys and the nucleation and growth of grains in an extra low carbon steel.

Xenon ion irradiation of superconducting YBa2Cu3O7 thin films

1990 ◽  
Vol 48 (4) ◽  
pp. 92-93
Author(s):  
H. Watanabe ◽  
B. Kabius ◽  
B. Roas ◽  
K. Urban
Keyword(s):  
Defect Formation ◽  
Ion Irradiation ◽  
High Resolution Electron Microscopy ◽  
Structural Disorder ◽  
Flux Lines ◽  
Pinning Effect ◽  
Magnetic Flux Lines ◽  
Resolution Electron ◽  
Radiation Induced ◽  
Induced Defects

Recently it was reported that the critical current density(Jc) of YBa2Cu2O7, in the presence of magnetic field, is enhanced by ion irradiation. The enhancement is thought to be due to the pinning of the magnetic flux lines by radiation-induced defects or by structural disorder. The aim of the present study was to understand the fundamental mechanisms of the defect formation in association with the pinning effect in YBa2Cu3O7 by means of high-resolution electron microscopy(HRTEM).The YBa2Cu3O7 specimens were prepared by laser ablation in an insitu process. During deposition, a substrate temperature and oxygen atmosphere were kept at about 1073 K and 0.4 mbar, respectively. In this way high quality epitaxially films can be obtained with the caxis parallel to the <100 > SrTiO3 substrate normal. The specimens were irradiated at a temperature of 77 K with 173 MeV Xe ions up to a dose of 3.0 × 1016 m−2.

Metallic Nanoneedles Arrays for TEM Sample Preparation “Lift-Out”

2012 ◽  
Author(s):  
Romaneh Jalilian ◽  
David Mudd ◽  
Neil Torrez ◽  
Jose Rivera ◽  
Mehdi M. Yazdanpanah ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Electron Microscope ◽  
Sample Preparation ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Beam System ◽  
Transmission Electron ◽  
Nanoneedle Array ◽  
Superior Mechanical Properties ◽  
And Performance

Abstract The sample preparation for transmission electron microscope can be done using a method known as "lift-out". This paper demonstrates a method of using a silver-gallium nanoneedle array for a quicker sharpening process of tungsten probes with better sample viewing, covering the fabrication steps and performance of needle-tipped probes for lift-out process. First, an array of high aspect ratio silver-gallium nanoneedles was fabricated and coated to improve their conductivity and strength. Then, the nanoneedles were welded to a regular tungsten probe in the focused ion beam system at the desired angle, and used as a sharp probe for lift-out. The paper demonstrates the superior mechanical properties of crystalline silver-gallium metallic nanoneedles. Finally, a weldless lift-out process is described whereby a nano-fork gripper was fabricated by attaching two nanoneedles to a tungsten probe.

scholarly journals Artificial generation of representative single Li-ion electrode particle architectures from microscopy data

2021 ◽  
Vol 7 (1) ◽  
Author(s):  
Orkun Furat ◽  
Lukas Petrich ◽  
Donal P. Finegan ◽  
David Diercks ◽  
Francois Usseglio-Viretta ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
Lithium Ion ◽  
Scale Model ◽  
Multi Scale ◽  
Physics Modeling ◽  
Microscopy Data ◽  
Microscopy Techniques ◽  
Backscatter Diffraction

AbstractAccurately capturing the architecture of single lithium-ion electrode particles is necessary for understanding their performance limitations and degradation mechanisms through multi-physics modeling. Information is drawn from multimodal microscopy techniques to artificially generate LiNi0.5Mn0.3Co0.2O2 particles with full sub-particle grain detail. Statistical representations of particle architectures are derived from X-ray nano-computed tomography data supporting an ‘outer shell’ model, and sub-particle grain representations are derived from focused-ion beam electron backscatter diffraction data supporting a ‘grain’ model. A random field model used to characterize and generate the outer shells, and a random tessellation model used to characterize and generate grain architectures, are combined to form a multi-scale model for the generation of virtual electrode particles with full-grain detail. This work demonstrates the possibility of generating representative single electrode particle architectures for modeling and characterization that can guide synthesis approaches of particle architectures with enhanced performance.

The Effect of the Compounding Procedure on the Morphology and Mechanical Properties of PLA/PBAT-Based Nanocomposites

2021 ◽  
Vol 36 (2) ◽  
pp. 219-227
Author(s):  
P. Saiprasit ◽  
A. K. Schlarb
Keyword(s):  
Mechanical Properties ◽  
Residence Time ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Extrusion Process ◽  
Poly Lactic Acid ◽  
Silicon Dioxide Nanoparticles ◽  
Twin Screw ◽  
One Step ◽  
Thermodynamic Driving Force

Abstract Poly(lactic acid) (PLA)/poly(butylene adipate-co-terephthalate) (PBAT)-based nanocomposites filled with 1 vol.% silicon dioxide nanoparticles (nano-SiO2) were prepared using a co-rotating twin-screw extruder and injection molding. The nanocomposites with various blending sequences were investigated using PLA-based and PBAT-based nanocomposite masterbatches. Morphology of the PLA/PBAT/SiO2 nanocomposites was examined using a scanning electron microscope (SEM) and a focused ion beam (FIB) SEM. It is found that the nano-SiO2 locates in the original polymer phase, in which it is firstly incorporated in the masterbatch process, as well as at the interface between the two polymers. However, as the residence time in the extrusion process increases, the nanoparticles migrate from the original phase to the interface, governed by the thermodynamic driving force. The best optimization of mechanical properties is achieved by using the PBAT-based masterbatches with a one-step process or short residence time. The processing history, therefore, has a tremendous impact on the final properties of the resulting materials.

Mechanical Properties of Electroplated Copper Thin Films

1999 ◽  
Vol 594 ◽  
Author(s):  
R. Spolenak ◽  
C. A. Volkert ◽  
K. Takahashi ◽  
S. Fiorillo ◽  
J. Miner ◽  
...  
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Grain Size ◽  
Film Thickness ◽  
Yield Stress ◽  
Laser Scanning ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Cu Films ◽  
Electroplated Copper

AbstractIt is well known that the mechanical properties of thin films depend critically on film thickness However, the contributions from film thickness and grain size are difficult to separate, because they typically scale with each other. In one study by Venkatraman and Bravman, Al films, which were thinned using anodic oxidation to reduce film thickness without changing grain size, showed a clear increase in yield stress with decreasing film thickness.We have performed a similar study on both electroplated and sputtered Cu films by using chemical-mechanical polishing (CMP) to reduce the film thickness without changing the grain size. Stress-temperature curves were measured for both the electroplated and sputtered Cu films with thicknesses between 0.1 and 1.8 microns using a laser scanning wafer curvature technique. The yield stress at room temperature was found to increase with decreasing film thickness for both sets of samples. The sputtered films, however, showed higher yield stresses in comparison to the electroplated films. Most of these differences can be attributed to the different microstructures of the films, which were determined by focused ion beam (FIB) microscopy and x-ray diffraction.

scholarly journals Ion Irradiation-Induced Microstructural Evolution of Ni–Mo–Cr Low Alloy Steels

Materials ◽  
2018 ◽  
Vol 11 (11) ◽  
pp. 2268
Author(s):  
Hongying Sun ◽  
Penghui Lei ◽  
Guang Ran ◽  
Hui Wang ◽  
Jiyun Zheng ◽  
...  
Keyword(s):  
Irradiation Dose ◽  
Focused Ion Beam ◽  
Ion Irradiation ◽  
Ion Beam ◽  
High Strength ◽  
Positron Annihilation Spectroscopy ◽  
Small Scale ◽  
Low Alloy Steels ◽  
Dislocation Loops ◽  
S Parameter

As leading candidates of sheet steels for advanced nuclear reactors, three types of Ni–Mo–Cr high-strength low alloy (HSLA) steels named as CNST1, CNST2 and CNSS3 were irradiated by 400 keV Fe+ with peak fluence to 1.4 × 1014, 3.5 × 1014 and 7.0 × 1014 ions/cm2, respectively. The distribution and morphology of the defects induced by the sample preparation method and Fe+ irradiation dose were investigated by transmission electron microscopy (TEM) and positron-annihilation spectroscopy (PAS). TEM samples were prepared with two methods, i.e., a focused ion beam (FIB) technique and the electroplating and twin-jet electropolishing (ETE) method. Point defects and dislocation loops were observed in CNST1, CNST2 and CNSS3 samples prepared via FIB. On the other hand, samples prepared via the ETE method revealed that a smaller number of defects was observed in CNST1, CNST2 and almost no defects were observed in CNST3. It is indicated that artifact defects could be introduced by FIB preparation. The PAS S-W plots showed that the existence of two types of defects after ion implantation included small-scale defects such as vacancies, vacancy clusters, dislocation loops and large-sized defects. The S parameter of irradiated steels showed a clear saturation in PAS response with increasing Fe+ dose. At the same irradiation dose, higher values of the S-parameter were achieved in CNST1 and CNST2 samples when compared to that in CNSS3 samples. The mechanism and evolution behavior of irradiation-induced defects were analyzed and discussed.

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