scholarly journals Identification of Secondary Phases in Cu2ZnSnS4 Layers by In-depth Resolved X-ray Photoelectron Spectroscopy Analysis

2017 ◽  
Author(s):  
Xianfeng Zhang ◽  
M. Kobayashi
Keyword(s):  
Photoelectron Spectroscopy ◽  
Film Surface ◽  
Secondary Phase ◽  
Czts Film ◽  
Xps Analysis ◽  
Secondary Phases ◽  
Phase Layer ◽  
X Ray ◽  
Depth Direction ◽  
Nanoparticle Ink

A Cu2ZnSnS4 (CZTS) film with a thickness of approximately 1.5 μm was fabricated on a Mo-coated glass substrate by annealing a CZTS precursor fabricated from nanoparticle ink. The chemical states of the elements in the CZTS thin film in the depth direction were studied to identify the presence of secondary phases, which are detrimental to the performance of solar cells containing CZTS. X-ray diffraction was unable to detect any secondary phases in CZTS because of their small relative amount. Instead, X-ray photoelectron spectroscopy (XPS), which is highly sensitive to chemical state, was conducted at different depths in the CZTS film to further check the presence of secondary phases. XPS analysis revealed peaks shift consistent with the presence of secondary phases. For the CZTS film annealed in a S atmosphere at 575 °C for 3 h, the film surface consisted of a secondary-phase layer composed of CuS, ZnS, and SnSx (x=1 or 2) originating from the decomposition of CZTS. At depths below 80 nm, the film was pure CZTS. Formation of MoS2 at the CZTS–Mo interface was confirmed by XPS analysis of Mo and S.

scholarly journals In-Depth Characterization of Secondary Phases in Cu2ZnSnS4 Film and Its Application to Solar Cells

Nanomaterials ◽  
2019 ◽  
Vol 9 (6) ◽  
pp. 855 ◽  
Author(s):  
Xianfeng Zhang ◽  
Hongde Wu ◽  
Engang Fu ◽  
Yuehui Wang
Keyword(s):  
Solar Cell ◽  
Conversion Efficiency ◽  
Photoelectron Spectroscopy ◽  
Czts Film ◽  
Elemental Distribution ◽  
Secondary Phases ◽  
X Ray Diffraction ◽  
X Ray ◽  
Chemical States ◽  
Czts Thin Films

Secondary phases are common in Cu2ZnSnS4 (CZTS) thin films, which can be fatal to the performance of solar cell devices fabricated from this material. They are difficult to detect by X-Ray diffraction (XRD) because of the weak peak in spectra compared with the CZTS layer. Herein, it was found that in-depth elemental distribution by a secondary ion mass spectroscopy method illustrated uniform film composition in the bulk with slight fluctuation between different grains. X-ray photoelectron spectroscopy (XPS) measurement was conducted after sputtering the layer with different depths. An Auger electron spectrum with Auger parameter were used to check the chemical states of elements and examine the distribution of secondary phases in the CZTS films. Secondary phases of CuS, ZnS and SnS were detected at the surface of the CZTS film within a 50-nm thickness while no secondary phases were discovered in the bulk. The solar cell fabricated with the as-grown CZTS films showed a conversion efficiency of 2.1% (Voc: 514.3 mV, Jsc: 10.4 mA/cm2, FF: 39.3%) with an area of 0.2 cm2 under a 100 mW/cm2 illumination. After a 50-nm sputtering on the CZTS film, the conversion efficiency of the solar cell was improved to 6.2% (Voc: 634.0 mV, Jsc: 17.3 mA/cm2, FF: 56.9%).

scholarly journals Surface Stoichiometry and Depth Profile of Tix-CuyNz Thin Films Deposited by Magnetron Sputtering

Materials ◽  
2021 ◽  
Vol 14 (12) ◽  
pp. 3191
Author(s):  
Arun Kumar Mukhopadhyay ◽  
Avishek Roy ◽  
Gourab Bhattacharjee ◽  
Sadhan Chandra Das ◽  
Abhijit Majumdar ◽  
...  
Keyword(s):  
Magnetron Sputtering ◽  
Photoelectron Spectroscopy ◽  
Film Surface ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Relative Composition ◽  
Transmission Electron ◽  
Deposited Film ◽  
Deposited Films

We report the surface stoichiometry of Tix-CuyNz thin film as a function of film depth. Films are deposited by high power impulse (HiPIMS) and DC magnetron sputtering (DCMS). The composition of Ti, Cu, and N in the deposited film is investigated by X-ray photoelectron spectroscopy (XPS). At a larger depth, the relative composition of Cu and Ti in the film is increased compared to the surface. The amount of adventitious carbon which is present on the film surface strongly decreases with film depth. Deposited films also contain a significant amount of oxygen whose origin is not fully clear. Grazing incidence X-ray diffraction (GIXD) shows a Cu3N phase on the surface, while transmission electron microscopy (TEM) indicates a polycrystalline structure and the presence of a Ti3CuN phase.

Magnetic Properties of Bulk Zn0.95-XMnXFe0.05O2 Prepared by Sol-Gel Method and Subsequent Hot Pressing

2011 ◽  
Vol 268-270 ◽  
pp. 356-359 ◽  
Author(s):  
Wen Song Lin ◽  
C. H. Wen ◽  
Liang He
Keyword(s):  
Magnetic Properties ◽  
Photoelectron Spectroscopy ◽  
Raw Materials ◽  
Sol Gel ◽  
Secondary Phase ◽  
X Ray Diffraction ◽  
Gel Method ◽  
X Ray ◽  
Sol Gel Method ◽  
Doped Zno

Mn, Fe doped ZnO powders (Zn0.95-xMnxFe0.05O2, x≤0.05) were synthesized by an ameliorated sol-gel method, using Zn(CH3COO)2, Mn(CH3COO)2and FeCl2as the raw materials, with the addition of vitamin C as a kind of chemical reducer. The resulting powder was subsequently compacted under pressure of 10 MPa at the temperature of 873K in vacuum. The crystal structure and magnetic properties of Zn0.95-xMnxFe0.05O2powder and bulk samples have been investigated by X-ray diffraction (XRD) and vibrating sample magnetometer (VSM). X-ray photoelectron spectroscopy (XPS) was used to study chemical valence of manganese, iron and zinc in the samples. The x-ray diffraction (XRD) results showed that Zn0.95-xMnxFe0.05O (x≤0.05) samples were single phase with the ZnO-like wurtzite structure. No secondary phase was found in the XRD spectrum. X-ray photoelectron spectroscopy (XPS) showed that Fe and Mn existed in Zn0.95-xMnxFe0.05O2samples in Fe2+and Mn2+states. The results of VSM experiment proved the room temperature ferromagnetic properties (RTFP) of Mn, Fe co-doped ZnO samples.

Formation of GaN Self-Organized Nanotips by Nanomasking Effect

2001 ◽  
Vol 707 ◽  
Author(s):  
Harumasa Yoshida ◽  
Tatsuhiro Urushido ◽  
Hideto Miyake ◽  
Kazumasa Hiramtsu
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Aspect Ratio ◽  
Formation Mechanism ◽  
High Aspect Ratio ◽  
Photoelectron Spectroscopy ◽  
Nanometer Scale ◽  
Xps Analysis ◽  
X Ray ◽  
Self Organized

ABSTRACTWe have successfully fabricated self-organized GaN nanotips by reactive ion etching using chlorine plasma, and have revealed the formation mechanism. Nanotips with a high density and a high aspect ratio have been formed after the etching. We deduce from X-ray photoelectron spectroscopy (XPS) analysis that the nanotip formation is attributed to nanometer-scale masks of SiO2 on GaN. The structures calculated by Monte Carlo simulation of our formation mechanism are very similar to the experimental nanotip structures.

Comparative Study of Time-Dependent PAES and XPS on a Ni/Pd Surface

2017 ◽  
Vol 373 ◽  
pp. 313-316 ◽  
Author(s):  
Samantha Zimnik ◽  
Christian Piochacz ◽  
Sebastian Vohburger ◽  
Christoph Hugenschmidt
Keyword(s):  
Photoelectron Spectroscopy ◽  
Electron Spectroscopy ◽  
Auger Electron ◽  
Structural Changes ◽  
Time Dependent ◽  
Xps Analysis ◽  
Time Constants ◽  
X Ray ◽  
Residual Gas ◽  
Rule Out

We report on time-dependent Positron annihilation induced Auger Electron Spectroscopy (PAES) study on 0.5 monolayers (ML) Ni on polycrystalline Pd accompanied by complementary X-ray induced Photoelectron Spectroscopy (XPS). The normalized PAES spectra showed a significant decrease in the Ni intensity and an increase in the Pd intensity as a function of time. To rule out varying influence on the elements e.g. from surface contaminates due to the residual gas, a time-dependent XPS analysis was performed on pure Ni and Pd as well as to analyze the main contaminants C and O. The O fraction was found to be constant within the measurement time and the time constants for C significantly differ from those of Ni and Pd in the PAES data. Consequently, it was concluded that the PAES data show a superposition of C contamination and structural changes at the surface of Ni/Pd.

Xps Analysis of the Sapphire Surface as a Function of High Temperature Vacuum Annealing

1989 ◽  
Vol 159 ◽  
Author(s):  
E.D. Richmond
Keyword(s):  
High Temperature ◽  
Binding Energy ◽  
Photoelectron Spectroscopy ◽  
Vacuum Annealing ◽  
Xps Analysis ◽  
Chemical Changes ◽  
Cleaning Procedure ◽  
Sapphire Surface ◽  
X Ray ◽  
First Time

ABSTRACTFor the first time the (1102) surface of sapphire has been investigated by X-ray photoelectron spectroscopy to ascertain chemical changes resulting from annealing in vacuum at 1300° C and 1450° C. As received substrates had a substantial surface C contaminant. For substrates that were chemically cleaned before inserting them into the MBE system no trace of carbon is detected. A residual flourine contaminant results from the cleaning procedure and is desorbed by the vacuum annealing. Spectra of annealed substrates are compared to the unannealed chemically cleaned substrates. The annealed substrates exhibit 0.4 to 0.5 eV shift to higher binding energy of the Al peak and a 0.3 eV shift to higher binding energy of the O peak. In addition, a 2% depletion of oxygen from the surface occurs.

scholarly journals Synthesis of 1-(2-Hydroxyphenyl) Dec-2-en-1-One Oxime and Its Flotation and Adsorption Behavior for Malachite

2020 ◽  
Vol 8 ◽  
Author(s):  
Liqing Li ◽  
Lin Yang ◽  
Fangxu Li
Keyword(s):  
Photoelectron Spectroscopy ◽  
Adsorption Behavior ◽  
Xps Analysis ◽  
X Ray ◽  
Benzohydroxamic Acid ◽  
Wide Ph Range ◽  
Flotation Performance ◽  
Ph Range

A novel collector of 1-(2-hydroxyphenyl) dec-2-en-1-one oxime (HPDO) was synthesized from 2-hydroxy acetophenone and octanal, and its flotation and adsorption behavior for malachite were studied by flotation tests and x-ray photoelectron spectroscopy (XPS) analysis. The flotation results of a single mineral show HPDO is a special collector for malachite. Compared with benzohydroxamic acid (BHA), isobutyl xanthate (SIBX), and dodecylamine (DA), HPDO exhibits excellent flotation performance for malachite and satisfied selectivity against quartz and calcite over a wide pH range. The HPDO with a concentration of 200 mg/L can float 94% malachite at pH 8, while only recovering 7.8% quartz and 28% calcite. XPS data give clear evidence for the formation of a Cu-oxime complex on malachite surfaces after HPDO adsorption.

The piezoresistive properties research of SiC thin films prepared by RF magnetron sputtering

2019 ◽  
Vol 33 (15) ◽  
pp. 1950152 ◽  
Author(s):  
Jing Wu ◽  
Xiaofeng Zhao ◽  
Chunpeng Ai ◽  
Zhipeng Yu ◽  
Dianzhong Wen
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Cantilever Beam ◽  
Photoelectron Spectroscopy ◽  
Film Surface ◽  
Rf Magnetron Sputtering ◽  
Micro Electro Mechanical System ◽  
Gauge Factor ◽  
X Ray ◽  
Sputtering Power

To research the piezoresistive properties of SiC thin films, a testing structure consisting of a cantilever beam, SiC thin films piezoresistors and a Cr/Pt electrode is proposed in this paper. The chips of testing structure were fabricated by micro-electro-mechanical system (MEMS) technology on a silicon wafer with [Formula: see text]100[Formula: see text] orientation, in which SiC thin films were deposited by using radio-frequency (13.56 MHz) magnetron sputtering method. The effect of sputtering power, annealing temperature and time on the microstructure and morphology of the SiC thin films were investigated by the X-ray diffraction (XRD) and scanning electron microscopy (SEM). It indicates that a good continuity and uniform particles on the SiC thin film surface can be achieved at sputtering power of 160 W after annealing. To verify the existence of Si–C bonds in the thin films, X-ray photoelectron spectroscopy (XPS) was used. Meanwhile, the piezoresistive properties of SiC thin films piezoresistors were measured using the proposed cantilever beam. The test result shows that it is possible to achieve a gauge factor of 35.1.

Interaction between Graphene Oxide and the Mycelia of Morchella sextelata

NANO ◽  
2020 ◽  
Vol 15 (03) ◽  
pp. 2050035
Author(s):  
Renhao Tan ◽  
Jiwei Li ◽  
Li Zhou ◽  
Lu Zhou ◽  
Jia Lei ◽  
...  
Keyword(s):  
Graphene Oxide ◽  
Photoelectron Spectroscopy ◽  
Growth Process ◽  
Culture Media ◽  
Xps Analysis ◽  
Potential Harm ◽  
X Ray ◽  
Nitrogen Doped ◽  
Mda Content ◽  
High Level

Graphene oxide (GO) is expected to be harmful to the environment due to the toxicity. Accordingly, this work aimed to assess the potential harm of GO to the environment by investigating the toxicity of GO to the M. sextelata, and the effects of M. sextelata to GO. The dry weights, IR spectra, morphology, ultra-structures of mycelia, pH, conductivities of culture media, the activity of superoxide dismutase (SOD) and malondialdehyde (MDA) contents were measured to display the potential hazards of GO to M. sextelata. Then the Raman spectroscopy, dispersibility, and X-ray photoelectron spectroscopy (XPS) of GO were measured to show the effect of M. sextelata on GO. The results indicated that the lower GO concentrations promoted the growth of M. sextelata while the high level of GO inhibited the growth process of M. sextelata. After 7 d of culture, the effect was suppressive, with the biomass significantly reduced by 10.10%, the MDA content of G200 increased by 69.06%. GO nanosheets covered the surface of mycelia which caused change of the mycelial microstructures. Correspondingly, M. sextelata induces more defects in GO, accompanied by poor dispersion of GO in ethanol. Based on the XPS analysis, in the G10, G50 and G200 treatments, their atomic percentage of nitrogen in GO increased by 3.03%, 4.28% and 2.2%, respectively, and the atomic percentage of oxygen in GO reduced by 8.61%, 9.42% and 4.09%, respectively. The effect of mycelia on GO is mainly in deoxygenated and nitrogen-doped. We expected that the above results would provide a reference for the environmental hazard of GO.

Vacuum tribological properties of a composite Mo–MoS2film after atomic oxygen exposure irradiation

2019 ◽  
Vol 233 (8) ◽  
pp. 1236-1244
Author(s):  
Guo-zheng Ma ◽  
Peng-fei He ◽  
Yi-wen Wang ◽  
Shu-ying Chen ◽  
Ming Liu ◽  
...  
Keyword(s):  
Tribological Properties ◽  
Photoelectron Spectroscopy ◽  
Atomic Oxygen ◽  
Sliding Friction ◽  
Film Surface ◽  
Superficial Layer ◽  
Solid Lubrication ◽  
X Ray ◽  
Nanomechanical Properties ◽  
Lubrication Film

A composite Mo–MoS2solid-lubrication film measuring approximately 2-µm thick was prepared using a two-step composite process involving magnetron sputtering of Mo film followed by low-temperature ion sulfurization. Microstructure of the said film was characterized using scanning electron microscopy, energy dispersive spectroscopy, X-ray diffraction, Auger electron spectroscopy, and X-ray photoelectron spectroscopy, and nanomechanical properties of the Mo and Mo–MoS2film were tested using a nanoindenter. The Mo–MoS2film and GCr15 substrate were irradiated by atomic oxygen with the self-developed MSTS-1 space tribometer system equipped with an atomic oxygen beam at a flux of 9 × 1019atoms/cm2. Subsequently, vacuum tribological properties of the said substrate and film were examined and compared. Results demonstrated that the Mo film possessed a smooth and dense structure with stable nanomechanical properties. Part of the elemental Mo translated into MoS2post sulfurizing, thereby forming the Mo–MoS2composite film with an alternating soft and hard structure. The Mo–MoS2film demonstrated a low and stable friction coefficient of approximately 0.15 along with only a slight wear in vacuum. The film surface could be oxidized and eroded when exposed to the highly active and energetic atomic oxygen. Post atomic oxygen erosion, the film thickness demonstrated a decrease, and small amounts of MoO3were observed on the surface. However, all structural and property changes were limited to the superficial layer. The excellent tribological performance of the film could be restored when the surface layer was removed after a certain period of sliding friction.

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